DE69735795D1 - Hybrid-Prüfadapter für Gebiete mit Standard- und beschränkter Zugänglichkeit - Google Patents

Hybrid-Prüfadapter für Gebiete mit Standard- und beschränkter Zugänglichkeit

Info

Publication number
DE69735795D1
DE69735795D1 DE69735795T DE69735795T DE69735795D1 DE 69735795 D1 DE69735795 D1 DE 69735795D1 DE 69735795 T DE69735795 T DE 69735795T DE 69735795 T DE69735795 T DE 69735795T DE 69735795 D1 DE69735795 D1 DE 69735795D1
Authority
DE
Germany
Prior art keywords
areas
standard
limited accessibility
hybrid test
test adapters
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69735795T
Other languages
German (de)
English (en)
Inventor
Tracy L Sayre
Robert A Slutz
Leanne C Pelzel
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Agilent Technologies Inc
Original Assignee
Agilent Technologies Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agilent Technologies Inc filed Critical Agilent Technologies Inc
Application granted granted Critical
Publication of DE69735795D1 publication Critical patent/DE69735795D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
    • G01R1/07328—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support for testing printed circuit boards
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
    • G01R1/07378—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch using an intermediate adapter, e.g. space transformers

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Tests Of Electronic Circuits (AREA)
DE69735795T 1996-10-29 1997-07-29 Hybrid-Prüfadapter für Gebiete mit Standard- und beschränkter Zugänglichkeit Expired - Lifetime DE69735795D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US08/741,151 US5773988A (en) 1996-10-29 1996-10-29 Standard- and limited-access hybrid test fixture

Publications (1)

Publication Number Publication Date
DE69735795D1 true DE69735795D1 (de) 2006-06-08

Family

ID=24979604

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69735795T Expired - Lifetime DE69735795D1 (de) 1996-10-29 1997-07-29 Hybrid-Prüfadapter für Gebiete mit Standard- und beschränkter Zugänglichkeit

Country Status (4)

Country Link
US (1) US5773988A (https=)
EP (1) EP0840130B1 (https=)
JP (1) JPH10170611A (https=)
DE (1) DE69735795D1 (https=)

Families Citing this family (27)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW360790B (en) 1996-10-28 1999-06-11 Atg Test Systems Gmbh Printed circuit board test apparatus and method
US5945836A (en) 1996-10-29 1999-08-31 Hewlett-Packard Company Loaded-board, guided-probe test fixture
US6407565B1 (en) 1996-10-29 2002-06-18 Agilent Technologies, Inc. Loaded-board, guided-probe test fixture
US5949243A (en) * 1997-02-27 1999-09-07 Star Technology Group, Inc. Translator fixture for use in circuit board testing
US5945838A (en) * 1997-06-26 1999-08-31 Star Technology Group, Inc. Apparatus for testing circuit boards
US6194908B1 (en) * 1997-06-26 2001-02-27 Delaware Capital Formation, Inc. Test fixture for testing backplanes or populated circuit boards
US6005405A (en) * 1997-06-30 1999-12-21 Hewlett Packard Company Probe plate assembly for high-node-count circuit board test fixtures
US6025729A (en) * 1997-09-11 2000-02-15 Delaware Capital Formation, Inc. Floating spring probe wireless test fixture
US6005402A (en) * 1998-05-08 1999-12-21 Delaware Capital Formation, Inc. Translator fixture for use in circuit board testing
EP0989409A1 (en) * 1998-09-23 2000-03-29 Delaware Capital Formation, Inc. Scan test machine for densely spaced test sites
US6268719B1 (en) 1998-09-23 2001-07-31 Delaware Capital Formation, Inc. Printed circuit board test apparatus
US6281692B1 (en) 1998-10-05 2001-08-28 International Business Machines Corporation Interposer for maintaining temporary contact between a substrate and a test bed
US6414504B2 (en) * 1999-05-20 2002-07-02 Delaware Capital Formation, Inc. Coaxial tilt pin fixture for testing high frequency circuit boards
US6255832B1 (en) 1999-12-03 2001-07-03 International Business Machines Corporation Flexible wafer level probe
US6559664B2 (en) * 2001-08-13 2003-05-06 Desimone Peter Probe plate assembly for a circuit board test fixture
US6788078B2 (en) * 2001-11-16 2004-09-07 Delaware Capital Formation, Inc. Apparatus for scan testing printed circuit boards
EP1491058A4 (en) * 2002-04-04 2005-10-05 MODULAR TELEVISION PRODUCTS
US7059046B2 (en) * 2002-06-24 2006-06-13 Delaware Capital Formation, Inc. Method for producing a captive wired test fixture and fixture therefor
US6784675B2 (en) * 2002-06-25 2004-08-31 Agilent Technologies, Inc. Wireless test fixture adapter for printed circuit assembly tester
DE102005030550B3 (de) * 2005-06-22 2006-10-26 JHS Technik Josef Schäfer Vorrichtung zum Prüfen von bestückten oder unbestückten Leiterplatten
JP4923494B2 (ja) * 2005-09-22 2012-04-25 富士通株式会社 多層回路基板設計支援方法、プログラム、装置及び多層回路基板
US7616019B2 (en) * 2006-05-08 2009-11-10 Aspen Test Engineering, Inc. Low profile electronic assembly test fixtures
DE102012016449A1 (de) * 2012-08-16 2014-03-13 Feinmetall Gmbh Prüfkopf für die elektrische Prüfung eines Prüflings
KR101462466B1 (ko) 2013-03-07 2014-11-17 대림산업 주식회사 올레핀의 중합 방법
EP3292415B1 (en) * 2015-05-07 2020-04-01 Technoprobe S.p.A Testing head having vertical probes, in particular for reduced pitch applications
CN111675298B (zh) * 2020-06-19 2021-06-29 绍兴皓诚环境建设工程有限公司 一种减少资源浪费的含银废水处理装置
US11293976B1 (en) * 2020-09-25 2022-04-05 Essai, Inc. Integrated circuit device test tooling with dual angle cavities

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4799007A (en) * 1985-11-01 1989-01-17 Hewlett-Packard Company Bendable pin board test fixture
US4818933A (en) * 1986-10-08 1989-04-04 Hewlett-Packard Company Board fixturing system
US4771234A (en) * 1986-11-20 1988-09-13 Hewlett-Packard Company Vacuum actuated test fixture
US4935696A (en) * 1987-04-16 1990-06-19 Teradyne, Inc. Test pin assembly for circuit board tester
US4977370A (en) * 1988-12-06 1990-12-11 Genrad, Inc. Apparatus and method for circuit board testing
FR2688975B1 (fr) * 1992-03-19 1996-10-04 Testelec Dispositif interface entre un appareil testeur et une carte de circuit imprime.
US5510722A (en) * 1992-12-18 1996-04-23 Tti Testron, Inc. Test fixture for printed circuit boards
DE4335841C1 (de) * 1993-10-20 1995-06-01 Siemens Nixdorf Inf Syst Vakuumadapter
US5450017A (en) * 1993-12-03 1995-09-12 Everett Charles Technologies, Inc. Test fixture having translator for grid interface
US5493230A (en) * 1994-02-25 1996-02-20 Everett Charles Technologies, Inc. Retention of test probes in translator fixtures
US5485096A (en) * 1994-04-05 1996-01-16 Aksu; Allen Printed circuit board tester having a test bed with spring probes and easily replaceable switch cards
US5506510A (en) * 1994-05-18 1996-04-09 Genrad, Inc. Adaptive alignment probe fixture for circuit board tester

Also Published As

Publication number Publication date
EP0840130A2 (en) 1998-05-06
EP0840130A3 (en) 1999-06-09
EP0840130B1 (en) 2006-05-03
JPH10170611A (ja) 1998-06-26
US5773988A (en) 1998-06-30

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Legal Events

Date Code Title Description
8332 No legal effect for de