DE69734866T2 - Prüfadapter mit Kontaktstiftführung für bestückte Leiterplatten - Google Patents

Prüfadapter mit Kontaktstiftführung für bestückte Leiterplatten Download PDF

Info

Publication number
DE69734866T2
DE69734866T2 DE69734866T DE69734866T DE69734866T2 DE 69734866 T2 DE69734866 T2 DE 69734866T2 DE 69734866 T DE69734866 T DE 69734866T DE 69734866 T DE69734866 T DE 69734866T DE 69734866 T2 DE69734866 T2 DE 69734866T2
Authority
DE
Germany
Prior art keywords
test
probes
probe
board
mounting plate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69734866T
Other languages
German (de)
English (en)
Other versions
DE69734866D1 (de
Inventor
Tracy L. Sayre
Robert A. Slutz
Kris J. Kanack
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Agilent Technologies Inc
Original Assignee
Agilent Technologies Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agilent Technologies Inc filed Critical Agilent Technologies Inc
Publication of DE69734866D1 publication Critical patent/DE69734866D1/de
Application granted granted Critical
Publication of DE69734866T2 publication Critical patent/DE69734866T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
    • G01R1/07378—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch using an intermediate adapter, e.g. space transformers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
    • G01R1/07328—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support for testing printed circuit boards
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07357—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with flexible bodies, e.g. buckling beams
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
    • G01R1/07371—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch using an intermediate card or back card with apertures through which the probes pass

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Measuring Leads Or Probes (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
DE69734866T 1996-10-29 1997-07-29 Prüfadapter mit Kontaktstiftführung für bestückte Leiterplatten Expired - Fee Related DE69734866T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US08/739,387 US5945836A (en) 1996-10-29 1996-10-29 Loaded-board, guided-probe test fixture
US739387 1996-10-29

Publications (2)

Publication Number Publication Date
DE69734866D1 DE69734866D1 (de) 2006-01-19
DE69734866T2 true DE69734866T2 (de) 2006-08-03

Family

ID=24972051

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69734866T Expired - Fee Related DE69734866T2 (de) 1996-10-29 1997-07-29 Prüfadapter mit Kontaktstiftführung für bestückte Leiterplatten

Country Status (4)

Country Link
US (4) US5945836A (https=)
EP (5) EP1512980A3 (https=)
JP (1) JPH10186005A (https=)
DE (1) DE69734866T2 (https=)

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Publication number Publication date
DE69734866D1 (de) 2006-01-19
EP0840131B1 (en) 2005-12-14
EP0840131A2 (en) 1998-05-06
EP1512980A2 (en) 2005-03-09
US6469531B1 (en) 2002-10-22
EP1512977A2 (en) 2005-03-09
EP0840131A3 (en) 1999-06-09
JPH10186005A (ja) 1998-07-14
US6225817B1 (en) 2001-05-01
EP1512979A2 (en) 2005-03-09
EP1512979A3 (en) 2005-06-15
US5945836A (en) 1999-08-31
EP1512977A3 (en) 2005-06-15
US6414502B1 (en) 2002-07-02
EP1512978A2 (en) 2005-03-09
EP1512980A3 (en) 2005-06-15
EP1512978A3 (en) 2005-06-15

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