DE69502108T2 - Kugelrasterbuchsegehaüse - Google Patents

Kugelrasterbuchsegehaüse

Info

Publication number
DE69502108T2
DE69502108T2 DE69502108T DE69502108T DE69502108T2 DE 69502108 T2 DE69502108 T2 DE 69502108T2 DE 69502108 T DE69502108 T DE 69502108T DE 69502108 T DE69502108 T DE 69502108T DE 69502108 T2 DE69502108 T2 DE 69502108T2
Authority
DE
Germany
Prior art keywords
ball grid
grid sleeve
sleeve
ball
grid
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69502108T
Other languages
English (en)
Other versions
DE69502108D1 (de
Inventor
Dimitry Grabbe
Donald Milbrand
Daniel Ringler
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Whitaker LLC
Original Assignee
Whitaker LLC
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Whitaker LLC filed Critical Whitaker LLC
Publication of DE69502108D1 publication Critical patent/DE69502108D1/de
Application granted granted Critical
Publication of DE69502108T2 publication Critical patent/DE69502108T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/02—Contact members
    • H01R13/22—Contacts for co-operating by abutting
    • H01R13/24—Contacts for co-operating by abutting resilient; resiliently-mounted
    • H01R13/2464—Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the contact point
    • H01R13/2485—Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the contact point for contacting a ball
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0433—Sockets for IC's or transistors
    • G01R1/0483—Sockets for un-leaded IC's having matrix type contact fields, e.g. BGA or PGA devices; Sockets for unpackaged, naked chips
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R12/00—Structural associations of a plurality of mutually-insulated electrical connecting elements, specially adapted for printed circuits, e.g. printed circuit boards [PCB], flat or ribbon cables, or like generally planar structures, e.g. terminal strips, terminal blocks; Coupling devices specially adapted for printed circuits, flat or ribbon cables, or like generally planar structures; Terminals specially adapted for contact with, or insertion into, printed circuits, flat or ribbon cables, or like generally planar structures
    • H01R12/50—Fixed connections
    • H01R12/51—Fixed connections for rigid printed circuits or like structures
    • H01R12/52—Fixed connections for rigid printed circuits or like structures connecting to other rigid printed circuits or like structures
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K7/00—Constructional details common to different types of electric apparatus
    • H05K7/02—Arrangements of circuit components or wiring on supporting structure
    • H05K7/10—Plug-in assemblages of components, e.g. IC sockets
    • H05K7/1053—Plug-in assemblages of components, e.g. IC sockets having interior leads
    • H05K7/1076—Plug-in assemblages of components, e.g. IC sockets having interior leads co-operating by sliding
    • H05K7/1084—Plug-in assemblages of components, e.g. IC sockets having interior leads co-operating by sliding pin grid array package carriers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0433—Sockets for IC's or transistors
    • G01R1/0441—Details
    • G01R1/0466—Details concerning contact pieces or mechanical details, e.g. hinges or cams; Shielding
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L2224/81—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a bump connector
    • H01L2224/8112—Aligning
    • H01L2224/81136—Aligning involving guiding structures, e.g. spacers or supporting members
    • H01L2224/81138—Aligning involving guiding structures, e.g. spacers or supporting members the guiding structures being at least partially left in the finished device
    • H01L2224/81141—Guiding structures both on and outside the body
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L2224/81—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a bump connector
    • H01L2224/8119—Arrangement of the bump connectors prior to mounting
    • H01L2224/81193—Arrangement of the bump connectors prior to mounting wherein the bump connectors are disposed on both the semiconductor or solid-state body and another item or body to be connected to the semiconductor or solid-state body
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L2224/81—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a bump connector
    • H01L2224/8138—Bonding interfaces outside the semiconductor or solid-state body
    • H01L2224/81395—Bonding interfaces outside the semiconductor or solid-state body having an external coating, e.g. protective bond-through coating
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L2224/81—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a bump connector
    • H01L2224/818—Bonding techniques
    • H01L2224/81897—Mechanical interlocking, e.g. anchoring, hook and loop-type fastening or the like
    • H01L2224/81898—Press-fitting, i.e. pushing the parts together and fastening by friction, e.g. by compression of one part against the other
    • H01L2224/81899—Press-fitting, i.e. pushing the parts together and fastening by friction, e.g. by compression of one part against the other using resilient parts in the bump connector or in the bonding area
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/013—Alloys
    • H01L2924/0132—Binary Alloys
    • H01L2924/01322—Eutectic Alloys, i.e. obtained by a liquid transforming into two solid phases
DE69502108T 1994-09-06 1995-07-19 Kugelrasterbuchsegehaüse Expired - Fee Related DE69502108T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US30136894A 1994-09-06 1994-09-06
PCT/US1995/009031 WO1996008056A1 (en) 1994-09-06 1995-07-19 Ball grid array socket

Publications (2)

Publication Number Publication Date
DE69502108D1 DE69502108D1 (de) 1998-05-20
DE69502108T2 true DE69502108T2 (de) 1998-09-17

Family

ID=23163058

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69502108T Expired - Fee Related DE69502108T2 (de) 1994-09-06 1995-07-19 Kugelrasterbuchsegehaüse

Country Status (6)

Country Link
US (1) US5669774A (de)
EP (1) EP0780028B1 (de)
JP (1) JP3360179B2 (de)
DE (1) DE69502108T2 (de)
TW (1) TW302562B (de)
WO (1) WO1996008056A1 (de)

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US6064213A (en) * 1993-11-16 2000-05-16 Formfactor, Inc. Wafer-level burn-in and test
US6525555B1 (en) 1993-11-16 2003-02-25 Formfactor, Inc. Wafer-level burn-in and test
US6033935A (en) 1997-06-30 2000-03-07 Formfactor, Inc. Sockets for "springed" semiconductor devices
US5730606A (en) * 1996-04-02 1998-03-24 Aries Electronics, Inc. Universal production ball grid array socket
US6007348A (en) 1996-05-07 1999-12-28 Advanced Intercommunications Corporation Solder ball terminal
CN1145802C (zh) * 1996-05-17 2004-04-14 福姆法克特公司 微电子弹簧接触元件及电子部件
US5783461A (en) * 1996-10-03 1998-07-21 Micron Technology, Inc. Temporary semiconductor package having hard-metal, dense-array ball contacts and method of fabrication
TW406454B (en) 1996-10-10 2000-09-21 Berg Tech Inc High density connector and method of manufacture
KR100300666B1 (ko) * 1997-08-04 2001-10-27 기타지마 요시토시 수지밀봉형반도체장치와거기에사용되는회로부재및회로부재의제조방법
US6048744A (en) 1997-09-15 2000-04-11 Micron Technology, Inc. Integrated circuit package alignment feature
WO1999049536A1 (en) * 1998-03-24 1999-09-30 Raytheon Company Stacked electrical circuit having an improved interconnect and alignment system
US5947751A (en) * 1998-04-03 1999-09-07 Vlsi Technology, Inc. Production and test socket for ball grid array semiconductor package
WO1999066599A1 (en) * 1998-06-15 1999-12-23 Advanced Interconnections Corporation Solder ball terminal
US6272741B1 (en) * 1998-07-24 2001-08-14 Autosplice, Inc. Hybrid solder ball and pin grid array circuit board interconnect system and method
TW383955U (en) * 1998-08-31 2000-03-01 Hon Hai Prec Ind Co Ltd Module apparatus for slot connector
US6208156B1 (en) * 1998-09-03 2001-03-27 Micron Technology, Inc. Test carrier for packaging semiconductor components having contact balls and calibration carrier for calibrating semiconductor test systems
US6565364B1 (en) * 1998-12-23 2003-05-20 Mirae Corporation Wafer formed with CSP device and test socket of BGA device
TW385092U (en) * 1998-12-28 2000-03-11 Hon Hai Prec Ind Co Ltd Electrical connectors
US6168976B1 (en) 1999-01-06 2001-01-02 Intel Corporation Socketable BGA package
US6725536B1 (en) 1999-03-10 2004-04-27 Micron Technology, Inc. Methods for the fabrication of electrical connectors
JP4367730B2 (ja) * 1999-06-25 2009-11-18 株式会社エンプラス Ｉｃソケット及び該ｉｃソケットのバネ手段
DE19939580C2 (de) 1999-08-20 2003-11-27 Tyco Electronics Logistics Ag Elektrischer Steckverbinder
US6464513B1 (en) * 2000-01-05 2002-10-15 Micron Technology, Inc. Adapter for non-permanently connecting integrated circuit devices to multi-chip modules and method of using same
US6407566B1 (en) 2000-04-06 2002-06-18 Micron Technology, Inc. Test module for multi-chip module simulation testing of integrated circuit packages
US6413852B1 (en) 2000-08-31 2002-07-02 International Business Machines Corporation Method of forming multilevel interconnect structure containing air gaps including utilizing both sacrificial and placeholder material
US6866521B1 (en) * 2000-09-14 2005-03-15 Fci Americas Technology, Inc. High density connector
US7045889B2 (en) * 2001-08-21 2006-05-16 Micron Technology, Inc. Device for establishing non-permanent electrical connection between an integrated circuit device lead element and a substrate
US7049693B2 (en) * 2001-08-29 2006-05-23 Micron Technology, Inc. Electrical contact array for substrate assemblies
US6991960B2 (en) 2001-08-30 2006-01-31 Micron Technology, Inc. Method of semiconductor device package alignment and method of testing
US20030168738A1 (en) * 2002-03-08 2003-09-11 Intel Corporation Socketable IC package and associated methods
TWI222192B (en) * 2003-09-04 2004-10-11 Advanced Semiconductor Eng Substrate with net structure
TWI258255B (en) * 2005-05-20 2006-07-11 Ramtek Technology Inc Method of testing ball grid array packed device in real system and test socket assembly therefor
US20070054514A1 (en) * 2005-08-31 2007-03-08 International Business Machines Corporation Socket measurement apparatus and method
US20070126445A1 (en) * 2005-11-30 2007-06-07 Micron Technology, Inc. Integrated circuit package testing devices and methods of making and using same
US7393214B2 (en) * 2006-02-17 2008-07-01 Centipede Systems, Inc. High performance electrical connector
US7695287B2 (en) * 2006-07-06 2010-04-13 Harris Corporation Ball grid array (BGA) connection system and related method and ball socket
US7442045B1 (en) 2007-08-17 2008-10-28 Centipede Systems, Inc. Miniature electrical ball and tube socket with self-capturing multiple-contact-point coupling
US7888955B2 (en) * 2007-09-25 2011-02-15 Formfactor, Inc. Method and apparatus for testing devices using serially controlled resources
US7977959B2 (en) 2007-09-27 2011-07-12 Formfactor, Inc. Method and apparatus for testing devices using serially controlled intelligent switches
US20090164931A1 (en) * 2007-12-19 2009-06-25 Formfactor, Inc. Method and Apparatus for Managing Test Result Data Generated by a Semiconductor Test System
FR2928033B1 (fr) * 2008-02-22 2010-07-30 Commissariat Energie Atomique Composant de connexion muni d'inserts creux.
US20090224793A1 (en) * 2008-03-07 2009-09-10 Formfactor, Inc. Method And Apparatus For Designing A Custom Test System
US8122309B2 (en) 2008-03-11 2012-02-21 Formfactor, Inc. Method and apparatus for processing failures during semiconductor device testing
US8033877B2 (en) * 2008-07-22 2011-10-11 Centipede Systems, Inc. Connector for microelectronic devices
US8095841B2 (en) * 2008-08-19 2012-01-10 Formfactor, Inc. Method and apparatus for testing semiconductor devices with autonomous expected value generation
US7944225B2 (en) * 2008-09-26 2011-05-17 Formfactor, Inc. Method and apparatus for providing a tester integrated circuit for testing a semiconductor device under test
KR101070022B1 (ko) * 2009-09-16 2011-10-04 삼성전기주식회사 다층 세라믹 회로 기판, 다층 세라믹 회로 기판 제조방법 및 이를 이용한 전자 디바이스 모듈
FR2967296B1 (fr) 2010-11-05 2018-05-25 Commissariat A L'energie Atomique Et Aux Energies Alternatives Elements de connexion pour l'hybridation de circuits electroniques
TWI697160B (zh) * 2018-03-30 2020-06-21 唐虞企業股份有限公司 一種導電端子置件設備及其端子置件方法
FR3100391B1 (fr) * 2019-09-02 2022-03-04 Zodiac Aero Electric Ensemble électrique comprenant un composant électrique dissimulé assurant la connexion électrique entre un élément conducteur et une carte de communication
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DE69321708T2 (de) * 1992-02-12 1999-03-18 Berg Electronics Mfg Anschlussbuchse
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US5418471A (en) * 1994-01-26 1995-05-23 Emulation Technology, Inc. Adapter which emulates ball grid array packages
US5376010A (en) * 1994-02-08 1994-12-27 Minnesota Mining And Manufacturing Company Burn-in socket
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US5498970A (en) * 1995-02-06 1996-03-12 Minnesota Mining And Manufacturing Top load socket for ball grid array devices

Also Published As

Publication number Publication date
DE69502108D1 (de) 1998-05-20
TW302562B (de) 1997-04-11
EP0780028B1 (de) 1998-04-15
EP0780028A1 (de) 1997-06-25
US5669774A (en) 1997-09-23
JPH10508417A (ja) 1998-08-18
WO1996008056A1 (en) 1996-03-14
JP3360179B2 (ja) 2002-12-24

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee