DE69307476D1 - Vorrichtung zum Messen eines Lichtstroms - Google Patents

Vorrichtung zum Messen eines Lichtstroms

Info

Publication number
DE69307476D1
DE69307476D1 DE69307476T DE69307476T DE69307476D1 DE 69307476 D1 DE69307476 D1 DE 69307476D1 DE 69307476 T DE69307476 T DE 69307476T DE 69307476 T DE69307476 T DE 69307476T DE 69307476 D1 DE69307476 D1 DE 69307476D1
Authority
DE
Germany
Prior art keywords
measuring
luminous flux
luminous
flux
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69307476T
Other languages
English (en)
Other versions
DE69307476T2 (de
Inventor
Ohkubo Kazuaki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Application granted granted Critical
Publication of DE69307476D1 publication Critical patent/DE69307476D1/de
Publication of DE69307476T2 publication Critical patent/DE69307476T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/02Details
    • G01J1/04Optical or mechanical part supplementary adjustable parts
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/02Details
    • G01J1/04Optical or mechanical part supplementary adjustable parts
    • G01J1/0407Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings
    • G01J1/0455Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings having a throughhole enabling the optical element to fulfil an additional optical function, e.g. a mirror or grating having a through-hole for a light collecting or light injecting optical fibre
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/02Details
    • G01J1/04Optical or mechanical part supplementary adjustable parts
    • G01J2001/0481Preset integrating sphere or cavity
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/42Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J2001/4247Photometry, e.g. photographic exposure meter using electric radiation detectors for testing lamps or other light sources

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
DE69307476T 1992-11-27 1993-09-30 Vorrichtung zum Messen eines Lichtstroms Expired - Fee Related DE69307476T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP04317645A JP3117565B2 (ja) 1992-11-27 1992-11-27 光束計

Publications (2)

Publication Number Publication Date
DE69307476D1 true DE69307476D1 (de) 1997-02-27
DE69307476T2 DE69307476T2 (de) 1997-05-15

Family

ID=18090458

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69307476T Expired - Fee Related DE69307476T2 (de) 1992-11-27 1993-09-30 Vorrichtung zum Messen eines Lichtstroms

Country Status (4)

Country Link
US (1) US5430540A (de)
EP (1) EP0599024B1 (de)
JP (1) JP3117565B2 (de)
DE (1) DE69307476T2 (de)

Families Citing this family (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL1006779C2 (nl) * 1997-08-15 1999-02-16 Maars Holding Bv Lichtdetectorsamenstel.
US6424413B1 (en) * 1998-06-12 2002-07-23 Gretagmacbeth Llc Multi-channel integrating sphere
US6597195B1 (en) * 2000-07-28 2003-07-22 Labsphere, Inc. Method of and cassette structure for burn-in and life testing of multiple LEDs and the like
US7235280B2 (en) 2003-11-12 2007-06-26 Srs Technologies, Inc. Non-intrusive photogrammetric targets
KR100651031B1 (ko) * 2005-07-08 2006-11-29 장민준 온도 조절 수단을 구비한 적분구
WO2007122674A1 (ja) * 2006-04-12 2007-11-01 Panasonic Corporation 光学測定装置
JP4452737B2 (ja) 2007-10-25 2010-04-21 大塚電子株式会社 光束計および測定方法
KR100978246B1 (ko) * 2008-10-01 2010-08-26 한국표준과학연구원 발광소자의 전광선속 측정 장치 및 방법
WO2010084566A1 (ja) * 2009-01-20 2010-07-29 大塚電子株式会社 量子効率測定装置および量子効率測定方法
JP5286571B2 (ja) * 2009-05-22 2013-09-11 大塚電子株式会社 全光束測定装置および全光束測定方法
JP5608919B2 (ja) 2010-02-24 2014-10-22 大塚電子株式会社 光学測定装置
JP5640257B2 (ja) * 2010-03-18 2014-12-17 大塚電子株式会社 量子効率測定方法および量子効率測定装置
JP5643983B2 (ja) * 2010-03-25 2014-12-24 大塚電子株式会社 光学測定装置、光学測定システムおよびファイバ結合器
EP2748569B1 (de) 2011-10-13 2017-06-14 Otsuka Electronics Co., Ltd. Optisches messsystem, optisches messverfahren und spiegelplatte für ein optisches messsystem
CN102680106A (zh) * 2012-05-21 2012-09-19 南京汉德森科技股份有限公司 利用热电偶监控ssl照明产品光电测量的方法及其装置
JP5479543B2 (ja) 2012-07-19 2014-04-23 大塚電子株式会社 光学特性測定装置
JP6118801B2 (ja) * 2012-08-03 2017-04-19 パイオニア株式会社 光量測定装置及び光量測定方法
CN103344621B (zh) * 2013-07-03 2015-12-02 重庆大学 一种荧光量子效率测量装置及其测量方法
US9322776B2 (en) * 2014-08-19 2016-04-26 The Boeing Company Method and system for imaging a target

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2120869A (en) * 1933-12-14 1938-06-14 Gen Electric Apparatus for testing projection lamps
GB921703A (en) * 1958-07-07 1963-03-20 Nat Res Dev Improvements in or relating to light meters
DE1925337A1 (de) * 1969-05-16 1970-11-19 Krochmann Prof Dr Ing J Automatisches Lichtstromintegrationsverfahren mit kontinuierlicher,spiralfoermiger Abtastung des Lichtverteilungskoerpers
JPS5698624A (en) * 1980-01-09 1981-08-08 Matsushita Electric Ind Co Ltd High speed photometric device using multi light receiving elements
US4378159A (en) * 1981-03-30 1983-03-29 Tencor Instruments Scanning contaminant and defect detector
JPH02253123A (ja) * 1989-03-28 1990-10-11 Canon Inc 放射光束測定装置
FR2687781A1 (fr) * 1992-02-25 1993-08-27 Paris Aeroport Dispositif d'evaluation du balisage lumineux notamment sur les pistes et les voies d'acces des avions.

Also Published As

Publication number Publication date
DE69307476T2 (de) 1997-05-15
EP0599024B1 (de) 1997-01-15
EP0599024A1 (de) 1994-06-01
US5430540A (en) 1995-07-04
JP3117565B2 (ja) 2000-12-18
JPH06167388A (ja) 1994-06-14

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee