DE69227473D1 - System zur Durchschaltung von elektrischen Kontakten - Google Patents
System zur Durchschaltung von elektrischen KontaktenInfo
- Publication number
- DE69227473D1 DE69227473D1 DE69227473T DE69227473T DE69227473D1 DE 69227473 D1 DE69227473 D1 DE 69227473D1 DE 69227473 T DE69227473 T DE 69227473T DE 69227473 T DE69227473 T DE 69227473T DE 69227473 D1 DE69227473 D1 DE 69227473D1
- Authority
- DE
- Germany
- Prior art keywords
- electrical contacts
- connecting electrical
- contacts
- electrical
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R4/00—Electrically-conductive connections between two or more conductive members in direct contact, i.e. touching one another; Means for effecting or maintaining such contact; Electrically-conductive connections having two or more spaced connecting locations for conductors and using contact members penetrating insulation
- H01R4/24—Connections using contact members penetrating or cutting insulation or cable strands
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R12/00—Structural associations of a plurality of mutually-insulated electrical connecting elements, specially adapted for printed circuits, e.g. printed circuit boards [PCB], flat or ribbon cables, or like generally planar structures, e.g. terminal strips, terminal blocks; Coupling devices specially adapted for printed circuits, flat or ribbon cables, or like generally planar structures; Terminals specially adapted for contact with, or insertion into, printed circuits, flat or ribbon cables, or like generally planar structures
- H01R12/70—Coupling devices
- H01R12/71—Coupling devices for rigid printing circuits or like structures
- H01R12/712—Coupling devices for rigid printing circuits or like structures co-operating with the surface of the printed circuit or with a coupling device exclusively provided on the surface of the printed circuit
- H01R12/714—Coupling devices for rigid printing circuits or like structures co-operating with the surface of the printed circuit or with a coupling device exclusively provided on the surface of the printed circuit with contacts abutting directly the printed circuit; Button contacts therefore provided on the printed circuit
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0433—Sockets for IC's or transistors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0433—Sockets for IC's or transistors
- G01R1/0441—Details
- G01R1/0466—Details concerning contact pieces or mechanical details, e.g. hinges or cams; Shielding
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K7/00—Constructional details common to different types of electric apparatus
- H05K7/02—Arrangements of circuit components or wiring on supporting structure
- H05K7/10—Plug-in assemblages of components, e.g. IC sockets
- H05K7/1015—Plug-in assemblages of components, e.g. IC sockets having exterior leads
- H05K7/103—Plug-in assemblages of components, e.g. IC sockets having exterior leads co-operating by sliding, e.g. DIP carriers
- H05K7/1046—J-shaped leads
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K7/00—Constructional details common to different types of electric apparatus
- H05K7/02—Arrangements of circuit components or wiring on supporting structure
- H05K7/10—Plug-in assemblages of components, e.g. IC sockets
- H05K7/1053—Plug-in assemblages of components, e.g. IC sockets having interior leads
- H05K7/1061—Plug-in assemblages of components, e.g. IC sockets having interior leads co-operating by abutting
- H05K7/1069—Plug-in assemblages of components, e.g. IC sockets having interior leads co-operating by abutting with spring contact pieces
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Hardware Design (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Connecting Device With Holders (AREA)
- Coupling Device And Connection With Printed Circuit (AREA)
- Multi-Conductor Connections (AREA)
- Connections Arranged To Contact A Plurality Of Conductors (AREA)
- Connections By Means Of Piercing Elements, Nuts, Or Screws (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US07/639,126 US5069629A (en) | 1991-01-09 | 1991-01-09 | Electrical interconnect contact system |
US07/801,694 US5207584A (en) | 1991-01-09 | 1991-12-02 | Electrical interconnect contact system |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69227473D1 true DE69227473D1 (de) | 1998-12-10 |
DE69227473T2 DE69227473T2 (de) | 1999-04-15 |
Family
ID=27093271
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69227473T Expired - Lifetime DE69227473T2 (de) | 1991-01-09 | 1992-01-08 | System zur Durchschaltung von elektrischen Kontakten |
Country Status (8)
Country | Link |
---|---|
US (1) | US5207584A (de) |
EP (1) | EP0498530B1 (de) |
JP (1) | JP2675710B2 (de) |
KR (1) | KR100215015B1 (de) |
CA (1) | CA2059117C (de) |
DE (1) | DE69227473T2 (de) |
ES (1) | ES2125883T3 (de) |
SG (1) | SG47018A1 (de) |
Families Citing this family (41)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5749738A (en) * | 1991-01-09 | 1998-05-12 | Johnstech International Corporation | Electrical interconnect contact system |
US5634801A (en) * | 1991-01-09 | 1997-06-03 | Johnstech International Corporation | Electrical interconnect contact system |
US5336094A (en) * | 1993-06-30 | 1994-08-09 | Johnstech International Corporation | Apparatus for interconnecting electrical contacts |
US5645433A (en) * | 1994-05-09 | 1997-07-08 | Johnstech International Corporation | Contacting system for electrical devices |
US5594355A (en) * | 1994-07-19 | 1997-01-14 | Delta Design, Inc. | Electrical contactor apparatus for testing integrated circuit devices |
US5609489A (en) * | 1994-12-21 | 1997-03-11 | Hewlett-Packard Company | Socket for contacting an electronic circuit during testing |
DE69632159T2 (de) * | 1995-02-07 | 2004-09-02 | Johnstech International Corp., Minneapolis | Gerät zur Steuerung der Impedanz von elektrischen Kontakten |
US6203329B1 (en) | 1995-07-07 | 2001-03-20 | Johnstech International Corporation | Impedance controlled interconnection device |
US5791912A (en) * | 1995-12-01 | 1998-08-11 | Riechelmann; Bernd | Contactor with multiple redundant connecting paths |
US5899755A (en) * | 1996-03-14 | 1999-05-04 | Johnstech International Corporation | Integrated circuit test socket with enhanced noise imminity |
DE19618717C1 (de) * | 1996-05-09 | 1998-01-15 | Multitest Elektronische Syst | Elektrische Verbindungseinrichtung |
JP2849070B2 (ja) * | 1996-08-02 | 1999-01-20 | 山一電機株式会社 | Icソケット |
US5984690A (en) * | 1996-11-12 | 1999-11-16 | Riechelmann; Bernd | Contactor with multiple redundant connecting paths |
US5888075A (en) * | 1997-02-10 | 1999-03-30 | Kabushiki Kaisha Nihon Micronics | Auxiliary apparatus for testing device |
US6019612A (en) * | 1997-02-10 | 2000-02-01 | Kabushiki Kaisha Nihon Micronics | Electrical connecting apparatus for electrically connecting a device to be tested |
SG88739A1 (en) * | 1997-05-15 | 2002-05-21 | Nihon Micronics Kk | Auxiliary apparatus for testing device |
MY128129A (en) * | 1997-09-16 | 2007-01-31 | Tan Yin Leong | Electrical contactor for testing integrated circuit devices |
US6529025B1 (en) * | 1997-09-18 | 2003-03-04 | Johnstech International Corporation | Electrical continuity enhancement for sockets/contactors |
AU2001296373A1 (en) * | 2000-09-29 | 2002-04-08 | Intel Corporation | A method and an apparatus for testing electronic devices |
US6597190B2 (en) | 2000-09-29 | 2003-07-22 | Intel Corporation | Method and apparatus for testing electronic devices |
US6854981B2 (en) * | 2002-06-03 | 2005-02-15 | Johnstech International Corporation | Small pin connecters |
US7059866B2 (en) * | 2003-04-23 | 2006-06-13 | Johnstech International Corporation | integrated circuit contact to test apparatus |
US7173442B2 (en) * | 2003-08-25 | 2007-02-06 | Delaware Capital Formation, Inc. | Integrated printed circuit board and test contactor for high speed semiconductor testing |
WO2006085388A1 (ja) * | 2005-02-08 | 2006-08-17 | Kabushiki Kaisha Nihon Micronics | 電気的接続装置 |
JP4472002B2 (ja) * | 2005-04-21 | 2010-06-02 | 株式会社日本マイクロニクス | 電気的接続装置 |
US7445465B2 (en) * | 2005-07-08 | 2008-11-04 | Johnstech International Corporation | Test socket |
US7639026B2 (en) * | 2006-02-24 | 2009-12-29 | Johnstech International Corporation | Electronic device test set and contact used therein |
TW200743268A (en) * | 2006-05-02 | 2007-11-16 | Hon Hai Prec Ind Co Ltd | Electrical connector |
US7737708B2 (en) * | 2006-05-11 | 2010-06-15 | Johnstech International Corporation | Contact for use in testing integrated circuits |
US7586056B2 (en) * | 2006-09-15 | 2009-09-08 | Shin-Etsu Polymer Co., Ltd | Resin molded body, receiving jig and method for manufacturing push button switch member |
JP2009043591A (ja) * | 2007-08-09 | 2009-02-26 | Yamaichi Electronics Co Ltd | Icソケット |
US7695286B2 (en) | 2007-09-18 | 2010-04-13 | Delaware Capital Formation, Inc. | Semiconductor electromechanical contact |
JP5029969B2 (ja) * | 2008-11-12 | 2012-09-19 | 山一電機株式会社 | 電気接続装置 |
US9274141B1 (en) | 2013-01-22 | 2016-03-01 | Johnstech International Corporation | Low resistance low wear test pin for test contactor |
PL2990182T3 (pl) * | 2014-08-28 | 2019-04-30 | Dukane Ias Llc | System zgrzewania ultradźwiękowego i sposób wykorzystania serwomotoru z opóźnionym ruchem |
US10114039B1 (en) * | 2015-04-24 | 2018-10-30 | Johnstech International Corporation | Selectively geometric shaped contact pin for electronic component testing and method of fabrication |
US9343830B1 (en) * | 2015-06-08 | 2016-05-17 | Xcerra Corporation | Integrated circuit chip tester with embedded micro link |
CN105807213A (zh) * | 2016-05-30 | 2016-07-27 | 青岛港湾职业技术学院 | 一种用于扁平引脚芯片的测试装置 |
WO2019060877A1 (en) * | 2017-09-25 | 2019-03-28 | Johnstech International Corporation | HIGH TEST PIN INSULATION SWITCH AND INTEGRATED CIRCUIT TEST HOUSING |
US10746703B2 (en) * | 2018-11-13 | 2020-08-18 | Dukane Ias, Llc | Automated ultrasonic press systems and methods for welding physically variant components |
JP2024064692A (ja) * | 2022-10-28 | 2024-05-14 | 株式会社日本マイクロニクス | コンタクトピンおよび電気的接続装置 |
Family Cites Families (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2495846A1 (fr) * | 1980-12-05 | 1982-06-11 | Cii Honeywell Bull | Dispositif de connexion electrique a haute densite de contacts |
US4511197A (en) * | 1983-08-01 | 1985-04-16 | Amp Incorporated | High density contact assembly |
US4593961A (en) * | 1984-12-20 | 1986-06-10 | Amp Incorporated | Electrical compression connector |
US4793814A (en) * | 1986-07-21 | 1988-12-27 | Rogers Corporation | Electrical circuit board interconnect |
WO1987004568A1 (en) * | 1986-01-15 | 1987-07-30 | Rogers Corporation | Electrical circuit board interconnect |
US4998886A (en) * | 1989-07-07 | 1991-03-12 | Teledyne Kinetics | High density stacking connector |
US5049084A (en) * | 1989-12-05 | 1991-09-17 | Rogers Corporation | Electrical circuit board interconnect |
US5061192A (en) * | 1990-12-17 | 1991-10-29 | International Business Machines Corporation | High density connector |
US5069629A (en) * | 1991-01-09 | 1991-12-03 | Johnson David A | Electrical interconnect contact system |
US5139427A (en) * | 1991-09-23 | 1992-08-18 | Amp Incorporated | Planar array connector and flexible contact therefor |
US5137456A (en) * | 1991-11-04 | 1992-08-11 | International Business Machines Corporation | High density, separable connector and contact for use therein |
-
1991
- 1991-12-02 US US07/801,694 patent/US5207584A/en not_active Expired - Lifetime
-
1992
- 1992-01-08 SG SG1996002167A patent/SG47018A1/en unknown
- 1992-01-08 EP EP92300145A patent/EP0498530B1/de not_active Expired - Lifetime
- 1992-01-08 DE DE69227473T patent/DE69227473T2/de not_active Expired - Lifetime
- 1992-01-08 ES ES92300145T patent/ES2125883T3/es not_active Expired - Lifetime
- 1992-01-09 CA CA002059117A patent/CA2059117C/en not_active Expired - Lifetime
- 1992-01-09 JP JP4038865A patent/JP2675710B2/ja not_active Expired - Lifetime
- 1992-01-09 KR KR1019920000199A patent/KR100215015B1/ko not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
JPH05174880A (ja) | 1993-07-13 |
JP2675710B2 (ja) | 1997-11-12 |
CA2059117A1 (en) | 1992-07-10 |
DE69227473T2 (de) | 1999-04-15 |
KR100215015B1 (ko) | 1999-08-02 |
EP0498530A3 (en) | 1994-11-30 |
US5207584A (en) | 1993-05-04 |
SG47018A1 (en) | 1998-03-20 |
EP0498530A2 (de) | 1992-08-12 |
KR920015666A (ko) | 1992-08-27 |
CA2059117C (en) | 2000-07-25 |
EP0498530B1 (de) | 1998-11-04 |
ES2125883T3 (es) | 1999-03-16 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8328 | Change in the person/name/address of the agent |
Representative=s name: PUSCHMANN & BORCHERT, 82041 OBERHACHING |