DE60337006D1 - Optisches mikroskop mit der fähigkeit zum betrieb mit einer schnellen dreidimensionalen modulation der position des beobachtungspunkts - Google Patents

Optisches mikroskop mit der fähigkeit zum betrieb mit einer schnellen dreidimensionalen modulation der position des beobachtungspunkts

Info

Publication number
DE60337006D1
DE60337006D1 DE60337006T DE60337006T DE60337006D1 DE 60337006 D1 DE60337006 D1 DE 60337006D1 DE 60337006 T DE60337006 T DE 60337006T DE 60337006 T DE60337006 T DE 60337006T DE 60337006 D1 DE60337006 D1 DE 60337006D1
Authority
DE
Germany
Prior art keywords
observation
path
specimen
optical
towards
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60337006T
Other languages
English (en)
Inventor
Mario Ettore Giardini
Mario Vittorio Corti
Stephen Charles Lauder Botcherby
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fondazione Istituto Italiano di Tecnologia
Original Assignee
Fondazione Istituto Italiano di Tecnologia
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fondazione Istituto Italiano di Tecnologia filed Critical Fondazione Istituto Italiano di Tecnologia
Application granted granted Critical
Publication of DE60337006D1 publication Critical patent/DE60337006D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0052—Optical details of the image generation
    • G02B21/0068—Optical details of the image generation arrangements using polarisation
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0052—Optical details of the image generation
    • G02B21/0076—Optical details of the image generation arrangements using fluorescence or luminescence
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/008—Details of detection or image processing, including general computer control
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/24—Base structure
    • G02B21/241—Devices for focusing

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • General Engineering & Computer Science (AREA)
  • Microscoopes, Condenser (AREA)
  • Mechanical Optical Scanning Systems (AREA)
DE60337006T 2002-07-10 2003-07-08 Optisches mikroskop mit der fähigkeit zum betrieb mit einer schnellen dreidimensionalen modulation der position des beobachtungspunkts Expired - Lifetime DE60337006D1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
IT2002TO000602A ITTO20020602A1 (it) 2002-07-10 2002-07-10 Microscopio ottico atto ad operare una modulazione tridimensionale rapida della posizione del punto di osservazione
PCT/EP2003/007315 WO2004008218A1 (en) 2002-07-10 2003-07-08 Optical microscope able to operate a rapid three dimensional modulation of the position of the observation point

Publications (1)

Publication Number Publication Date
DE60337006D1 true DE60337006D1 (de) 2011-06-16

Family

ID=11459483

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60337006T Expired - Lifetime DE60337006D1 (de) 2002-07-10 2003-07-08 Optisches mikroskop mit der fähigkeit zum betrieb mit einer schnellen dreidimensionalen modulation der position des beobachtungspunkts

Country Status (10)

Country Link
US (1) US20040252370A1 (de)
EP (1) EP1520199B1 (de)
JP (1) JP2005532596A (de)
AT (1) ATE508384T1 (de)
AU (1) AU2003250905A1 (de)
DE (1) DE60337006D1 (de)
ES (1) ES2365848T3 (de)
IT (1) ITTO20020602A1 (de)
PT (1) PT1520199E (de)
WO (1) WO2004008218A1 (de)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7668362B2 (en) 2000-05-03 2010-02-23 Aperio Technologies, Inc. System and method for assessing virtual slide image quality
EP1756750A4 (de) 2004-05-27 2010-10-20 Aperio Technologies Inc Systeme und verfahren zum erzeugen und betrachten dreidimensionaler virtueller folien
DE102004054262B4 (de) * 2004-11-09 2016-08-18 Leica Microsystems Cms Gmbh Vorrichtung zur Untersuchung und Manipulation von mikroskopischen Objekten
US8164622B2 (en) 2005-07-01 2012-04-24 Aperio Technologies, Inc. System and method for single optical axis multi-detector microscope slide scanner
US7781733B2 (en) * 2007-05-16 2010-08-24 International Business Machines Corporation In-situ high-resolution light-optical channel for optical viewing and surface processing in parallel with charged particle (FIB and SEM) techniques
JP5918658B2 (ja) * 2012-08-29 2016-05-18 株式会社日立エルジーデータストレージ 光学装置
DE102012019472B4 (de) * 2012-09-28 2023-05-04 Carl Zeiss Microscopy Gmbh Optische Filtervorrichtung, insbesondere für Mikroskope, und Mikroskop
MX2016011993A (es) 2014-03-14 2016-12-09 Novartis Ag Moleculas de anticuerpo que se unen a lag-3 y usos de las mismas.
CN111344620B (zh) * 2019-01-25 2024-02-13 敏捷焦点设计有限责任公司 用于宽场、共焦和多光子显微镜的动态聚焦和变焦系统

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3503586A1 (de) * 1985-02-02 1986-08-07 Honeywell Gmbh, 6050 Offenbach Vorrichtung zur bildabtastung
US4714310A (en) * 1986-04-21 1987-12-22 Sri International Method and apparatus for dynamic focusing control of a radiant energy beam
DE19733193B4 (de) * 1997-08-01 2005-09-08 Carl Zeiss Jena Gmbh Mikroskop mit adaptiver Optik
DE19837249A1 (de) * 1998-08-17 2000-02-24 Siemens Ag Mikroskop mit hoher Schärfentiefe
US6268948B1 (en) * 1999-06-11 2001-07-31 Creo Products Inc. Micromachined reflective light valve
JP4531895B2 (ja) * 1999-12-06 2010-08-25 オリンパス株式会社 レーザ集光光学系及びそれを用いたレーザ走査型顕微鏡
DE10012462B4 (de) * 2000-03-15 2004-07-08 Leica Microsystems Heidelberg Gmbh Beleuchtungsvorrichtung für die konfokale Fluoreszenz-Rastermikroskopie
DE10043992B4 (de) * 2000-09-05 2013-12-24 Leica Microsystems Cms Gmbh Verfahren zur Untersuchung einer Probe und konfokales Scan-Mikroskop
DE10043986B4 (de) * 2000-09-05 2020-01-16 Leica Microsystems Cms Gmbh Verfahren zur Untersuchung einer Probe und konfokales Scan-Mikroskop
DE10060111C1 (de) * 2000-12-04 2002-07-25 Siemens Production & Logistics Optische Ablenkvorrichtung

Also Published As

Publication number Publication date
WO2004008218A1 (en) 2004-01-22
JP2005532596A (ja) 2005-10-27
US20040252370A1 (en) 2004-12-16
PT1520199E (pt) 2011-05-23
ATE508384T1 (de) 2011-05-15
ITTO20020602A0 (it) 2002-07-10
ES2365848T3 (es) 2011-10-11
WO2004008218A8 (en) 2004-04-29
AU2003250905A1 (en) 2004-02-02
EP1520199B1 (de) 2011-05-04
EP1520199A1 (de) 2005-04-06
ITTO20020602A1 (it) 2004-01-12

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