DE602007012485D1 - Ermittlung des Typs eines Detektors von Störungspeaks für die Stromzufuhr zu einem integrierten Schaltkreis - Google Patents
Ermittlung des Typs eines Detektors von Störungspeaks für die Stromzufuhr zu einem integrierten SchaltkreisInfo
- Publication number
- DE602007012485D1 DE602007012485D1 DE602007012485T DE602007012485T DE602007012485D1 DE 602007012485 D1 DE602007012485 D1 DE 602007012485D1 DE 602007012485 T DE602007012485 T DE 602007012485T DE 602007012485 T DE602007012485 T DE 602007012485T DE 602007012485 D1 DE602007012485 D1 DE 602007012485D1
- Authority
- DE
- Germany
- Prior art keywords
- powering
- detector
- detecting
- type
- integrated circuit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/30—Marginal testing, e.g. by varying supply voltage
- G01R31/3004—Current or voltage test
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
- G01R19/16533—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the application
- G01R19/16538—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the application in AC or DC supplies
- G01R19/16552—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the application in AC or DC supplies in I.C. power supplies
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F21/00—Security arrangements for protecting computers, components thereof, programs or data against unauthorised activity
- G06F21/70—Protecting specific internal or peripheral components, in which the protection of a component leads to protection of the entire computer
- G06F21/71—Protecting specific internal or peripheral components, in which the protection of a component leads to protection of the entire computer to assure secure computing or processing of information
- G06F21/75—Protecting specific internal or peripheral components, in which the protection of a component leads to protection of the entire computer to assure secure computing or processing of information by inhibiting the analysis of circuitry or operation
- G06F21/755—Protecting specific internal or peripheral components, in which the protection of a component leads to protection of the entire computer to assure secure computing or processing of information by inhibiting the analysis of circuitry or operation with measures against power attack
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06K—GRAPHICAL DATA READING; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS
- G06K19/00—Record carriers for use with machines and with at least a part designed to carry digital markings
- G06K19/06—Record carriers for use with machines and with at least a part designed to carry digital markings characterised by the kind of the digital marking, e.g. shape, nature, code
- G06K19/067—Record carriers with conductive marks, printed circuits or semiconductor circuit elements, e.g. credit or identity cards also with resonating or responding marks without active components
- G06K19/07—Record carriers with conductive marks, printed circuits or semiconductor circuit elements, e.g. credit or identity cards also with resonating or responding marks without active components with integrated circuit chips
- G06K19/073—Special arrangements for circuits, e.g. for protecting identification code in memory
- G06K19/07309—Means for preventing undesired reading or writing from or onto record carriers
- G06K19/07363—Means for preventing undesired reading or writing from or onto record carriers by preventing analysis of the circuit, e.g. dynamic or static power analysis or current analysis
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/57—Protection from inspection, reverse engineering or tampering
- H01L23/576—Protection from inspection, reverse engineering or tampering using active circuits
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/001—Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing
- G01R31/002—Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing where the device under test is an electronic circuit
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/31721—Power aspects, e.g. power supplies for test circuits, power saving during test
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- General Physics & Mathematics (AREA)
- General Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Security & Cryptography (AREA)
- Power Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Mathematical Physics (AREA)
- Software Systems (AREA)
- Semiconductor Integrated Circuits (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR0652713 | 2006-06-29 |
Publications (1)
Publication Number | Publication Date |
---|---|
DE602007012485D1 true DE602007012485D1 (de) | 2011-03-31 |
Family
ID=37891710
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE602007012485T Active DE602007012485D1 (de) | 2006-06-29 | 2007-06-06 | Ermittlung des Typs eines Detektors von Störungspeaks für die Stromzufuhr zu einem integrierten Schaltkreis |
Country Status (3)
Country | Link |
---|---|
US (1) | US8283931B2 (de) |
EP (1) | EP1873537B1 (de) |
DE (1) | DE602007012485D1 (de) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI390213B (zh) * | 2009-05-13 | 2013-03-21 | Silicon Motion Inc | 量測直流電壓的方法及直流電壓量測器 |
US8952757B2 (en) * | 2012-07-11 | 2015-02-10 | Mediatek Inc. | Amplifiers with enhanced power supply rejection ratio at the output stage |
CN113391196B (zh) * | 2021-06-15 | 2022-07-26 | 卡斯柯信号有限公司 | 一种用于列车车载测速定位板卡的自检方法 |
Family Cites Families (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2557703B1 (fr) * | 1984-01-04 | 1986-07-25 | Vladimirsky Ruslan | Procede de controle de circuits integres et de systemes a circuits integres |
US4575683A (en) * | 1985-04-10 | 1986-03-11 | Harris Corporation | Apparatus and method for removing an offset signal |
US5594384A (en) * | 1995-07-13 | 1997-01-14 | Gnuco Technology Corporation | Enhanced peak detector |
US6362738B1 (en) * | 1998-04-16 | 2002-03-26 | Motorola, Inc. | Reader for use in a radio frequency identification system and method thereof |
US6366108B2 (en) * | 1998-12-01 | 2002-04-02 | Agilent Technologies, Inc. | System and method for detecting defects within an electrical circuit by analyzing quiescent current |
DE10120147B4 (de) * | 2001-04-25 | 2010-08-05 | Nxp B.V. | Schaltung zur Detektion von kurzen Spannungseinbrüchen in einer Versorgungsspannung |
US6828859B2 (en) * | 2001-08-17 | 2004-12-07 | Silicon Laboratories, Inc. | Method and apparatus for protecting devices in an RF power amplifier |
US6807507B2 (en) * | 2001-11-27 | 2004-10-19 | Vasudevan Seshadhri Kumar | Electrical over stress (EOS) monitor |
KR100440451B1 (ko) * | 2002-05-31 | 2004-07-14 | 삼성전자주식회사 | 전압 글리치 검출 회로, 그것을 구비하는 집적회로장치,그리고 전압 글리치 어택으로부터 집적회로장치를보호하는 장치 및 방법 |
JP2005057256A (ja) * | 2003-08-04 | 2005-03-03 | Samsung Electronics Co Ltd | 漏洩電流を利用した半導体検査装置および漏洩電流補償システム |
US7248124B2 (en) * | 2004-03-22 | 2007-07-24 | Mobius Microsystems, Inc. | Frequency calibration for a monolithic clock generator and timing/frequency reference |
FR2895115A1 (fr) * | 2005-12-20 | 2007-06-22 | St Microelectronics Sa | Detecteur de pics parasites dans l'alimentation d'un circuit integre |
EP1962054B1 (de) * | 2007-02-13 | 2011-07-20 | STMicroelectronics Srl | Mikroelektromechanisches Gyroskop mit Detektionsvorrichtung mit offenem Regelkreis und Verfahren zur Steuerung eines mikroelektromechanischen Gyroskops |
KR20080089867A (ko) * | 2007-04-02 | 2008-10-08 | 삼성에스디아이 주식회사 | 차동 신호 전송 시스템 및 이를 구비한 평판표시장치 |
JP4748181B2 (ja) * | 2008-05-07 | 2011-08-17 | 日本テキサス・インスツルメンツ株式会社 | 半導体装置の試験装置および試験方法 |
-
2007
- 2007-06-06 EP EP07109751A patent/EP1873537B1/de not_active Not-in-force
- 2007-06-06 DE DE602007012485T patent/DE602007012485D1/de active Active
- 2007-06-15 US US11/818,691 patent/US8283931B2/en active Active
Also Published As
Publication number | Publication date |
---|---|
EP1873537B1 (de) | 2011-02-16 |
US8283931B2 (en) | 2012-10-09 |
EP1873537A1 (de) | 2008-01-02 |
US20080012574A1 (en) | 2008-01-17 |
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