DE602006011510D1 - Prozesssystem und Prozessflüssigkeitszufuhrverfahren - Google Patents
Prozesssystem und ProzessflüssigkeitszufuhrverfahrenInfo
- Publication number
- DE602006011510D1 DE602006011510D1 DE602006011510T DE602006011510T DE602006011510D1 DE 602006011510 D1 DE602006011510 D1 DE 602006011510D1 DE 602006011510 T DE602006011510 T DE 602006011510T DE 602006011510 T DE602006011510 T DE 602006011510T DE 602006011510 D1 DE602006011510 D1 DE 602006011510D1
- Authority
- DE
- Germany
- Prior art keywords
- fluid supply
- supply method
- process fluid
- process system
- supply
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 239000012530 fluid Substances 0.000 title 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/304—Mechanical treatment, e.g. grinding, polishing, cutting
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67028—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
- H01L21/6704—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01F—MIXING, e.g. DISSOLVING, EMULSIFYING OR DISPERSING
- B01F23/00—Mixing according to the phases to be mixed, e.g. dispersing or emulsifying
- B01F23/40—Mixing liquids with liquids; Emulsifying
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01F—MIXING, e.g. DISSOLVING, EMULSIFYING OR DISPERSING
- B01F35/00—Accessories for mixers; Auxiliary operations or auxiliary devices; Parts or details of general application
- B01F35/20—Measuring; Control or regulation
- B01F35/21—Measuring
- B01F35/2132—Concentration, pH, pOH, p(ION) or oxygen-demand
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01F—MIXING, e.g. DISSOLVING, EMULSIFYING OR DISPERSING
- B01F35/00—Accessories for mixers; Auxiliary operations or auxiliary devices; Parts or details of general application
- B01F35/80—Forming a predetermined ratio of the substances to be mixed
- B01F35/82—Forming a predetermined ratio of the substances to be mixed by adding a material to be mixed to a mixture in response to a detected feature, e.g. density, radioactivity, consumed power or colour
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67028—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
- H01L21/6704—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
- H01L21/67051—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing using mainly spraying means, e.g. nozzles
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/6715—Apparatus for applying a liquid, a resin, an ink or the like
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01F—MIXING, e.g. DISSOLVING, EMULSIFYING OR DISPERSING
- B01F2101/00—Mixing characterised by the nature of the mixed materials or by the application field
- B01F2101/58—Mixing semiconducting materials, e.g. during semiconductor or wafer manufacturing processes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67242—Apparatus for monitoring, sorting or marking
- H01L21/67253—Process monitoring, e.g. flow or thickness monitoring
Landscapes
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Chemical & Material Sciences (AREA)
- Cleaning Or Drying Semiconductors (AREA)
- Weting (AREA)
- Cleaning By Liquid Or Steam (AREA)
- Feeding, Discharge, Calcimining, Fusing, And Gas-Generation Devices (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2005296953A JP4891589B2 (ja) | 2005-10-11 | 2005-10-11 | 液処理装置及び処理液供給方法並びに処理液供給プログラム |
Publications (1)
Publication Number | Publication Date |
---|---|
DE602006011510D1 true DE602006011510D1 (de) | 2010-02-11 |
Family
ID=37684924
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE602006011510T Active DE602006011510D1 (de) | 2005-10-11 | 2006-10-10 | Prozesssystem und Prozessflüssigkeitszufuhrverfahren |
DE602006005879T Active DE602006005879D1 (de) | 2005-10-11 | 2006-10-10 | Ein Flüssigkeitslieferungssystem und -verfahren |
Family Applications After (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE602006005879T Active DE602006005879D1 (de) | 2005-10-11 | 2006-10-10 | Ein Flüssigkeitslieferungssystem und -verfahren |
Country Status (6)
Country | Link |
---|---|
US (1) | US20070134822A1 (de) |
EP (2) | EP1775754B1 (de) |
JP (1) | JP4891589B2 (de) |
KR (1) | KR101019456B1 (de) |
DE (2) | DE602006011510D1 (de) |
TW (1) | TW200723381A (de) |
Families Citing this family (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4940123B2 (ja) | 2007-12-21 | 2012-05-30 | 東京エレクトロン株式会社 | 基板処理装置および基板処理方法 |
JP5313647B2 (ja) | 2008-03-25 | 2013-10-09 | 大日本スクリーン製造株式会社 | 基板処理装置及び基板処理方法 |
JP5466380B2 (ja) * | 2008-07-17 | 2014-04-09 | 大日本スクリーン製造株式会社 | 基板処理装置のスケジュール作成方法及びそのプログラム |
JP5355145B2 (ja) * | 2009-02-26 | 2013-11-27 | シスメックス株式会社 | 試薬調製装置、検体測定装置および試薬調製方法 |
JP5448521B2 (ja) * | 2009-03-27 | 2014-03-19 | 大日本スクリーン製造株式会社 | 処理液供給装置および処理液供給方法 |
JP5645516B2 (ja) * | 2009-09-11 | 2014-12-24 | 東京エレクトロン株式会社 | 基板液処理装置及び処理液生成方法並びに処理液生成プログラムを記録したコンピュータ読み取り可能な記録媒体 |
JP5323661B2 (ja) * | 2009-12-07 | 2013-10-23 | 東京エレクトロン株式会社 | 枚葉式の基板液処理装置における循環ラインの液交換方法 |
JP5780810B2 (ja) * | 2011-04-06 | 2015-09-16 | オルガノ株式会社 | 液体管理システム |
JP5791939B2 (ja) * | 2011-04-06 | 2015-10-07 | オルガノ株式会社 | 液体管理システム |
CN103221153B (zh) * | 2011-10-21 | 2014-12-24 | Fujiks株式会社 | 清洗液供给装置 |
JP6074338B2 (ja) * | 2013-08-27 | 2017-02-01 | 東京エレクトロン株式会社 | 液処理装置、濃度補正方法及び記憶媒体 |
JP6118739B2 (ja) * | 2014-01-31 | 2017-04-19 | 東京エレクトロン株式会社 | 基板液処理装置及び基板液処理方法並びに基板液処理プログラムを記録したコンピュータ読み取り可能な記録媒体 |
US9329071B2 (en) * | 2014-04-21 | 2016-05-03 | Asm Ip Holding B.V. | Substrate processing apparatus |
CN110828338B (zh) * | 2019-09-30 | 2022-08-09 | 长江存储科技有限责任公司 | 浓度的调节方法及调节系统 |
Family Cites Families (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH07278847A (ja) * | 1994-04-08 | 1995-10-24 | Sony Corp | 薬液濃度管理方法及び薬液濃度管理装置を備えた化学的処理装置 |
JP3442218B2 (ja) * | 1996-03-18 | 2003-09-02 | 大日本スクリーン製造株式会社 | 基板洗浄装置 |
JP3625120B2 (ja) * | 1997-03-19 | 2005-03-02 | 大日本スクリーン製造株式会社 | 基板処理装置 |
JP3529251B2 (ja) * | 1997-10-13 | 2004-05-24 | 大日本スクリーン製造株式会社 | 基板処理装置 |
JP2000124185A (ja) * | 1998-10-13 | 2000-04-28 | Dainippon Screen Mfg Co Ltd | 基板処理装置 |
JP2000218143A (ja) | 1999-01-29 | 2000-08-08 | Mitsubishi Kakoki Kaisha Ltd | 薬液混合設備および供給量制御方法 |
US6616760B2 (en) * | 1999-12-17 | 2003-09-09 | Tokyo Electron Limited | Film forming unit |
US6572255B2 (en) * | 2001-04-24 | 2003-06-03 | Coulter International Corp. | Apparatus for controllably mixing and delivering diluted solution |
JP2003017460A (ja) * | 2001-06-29 | 2003-01-17 | Shibaura Mechatronics Corp | 処理液の供給循環装置 |
US6878216B2 (en) * | 2001-09-03 | 2005-04-12 | Tokyo Electron Limited | Substrate processing method and substrate processing system |
US6849563B2 (en) * | 2002-12-09 | 2005-02-01 | International Business Machines Corporation | Method and apparatus for controlling coating thickness |
JP2005262031A (ja) * | 2004-03-17 | 2005-09-29 | Kurita Water Ind Ltd | 循環式ガス溶解水供給装置及び該装置の運転方法 |
-
2005
- 2005-10-11 JP JP2005296953A patent/JP4891589B2/ja active Active
-
2006
- 2006-09-19 KR KR1020060090543A patent/KR101019456B1/ko active IP Right Grant
- 2006-10-04 TW TW095136958A patent/TW200723381A/zh not_active IP Right Cessation
- 2006-10-05 US US11/543,256 patent/US20070134822A1/en not_active Abandoned
- 2006-10-10 DE DE602006011510T patent/DE602006011510D1/de active Active
- 2006-10-10 DE DE602006005879T patent/DE602006005879D1/de active Active
- 2006-10-10 EP EP06021231A patent/EP1775754B1/de not_active Expired - Fee Related
- 2006-10-10 EP EP08162953A patent/EP2001041B1/de not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
US20070134822A1 (en) | 2007-06-14 |
EP2001041A1 (de) | 2008-12-10 |
EP1775754A1 (de) | 2007-04-18 |
EP1775754B1 (de) | 2009-03-25 |
JP2007109738A (ja) | 2007-04-26 |
KR101019456B1 (ko) | 2011-03-07 |
TWI314757B (de) | 2009-09-11 |
TW200723381A (en) | 2007-06-16 |
JP4891589B2 (ja) | 2012-03-07 |
DE602006005879D1 (de) | 2009-05-07 |
KR20070040296A (ko) | 2007-04-16 |
EP2001041B1 (de) | 2009-12-30 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition |