DE60131558D1 - Auf rasterkraftmikroskopie basierende datenspeicherung und mikroskopie - Google Patents

Auf rasterkraftmikroskopie basierende datenspeicherung und mikroskopie

Info

Publication number
DE60131558D1
DE60131558D1 DE60131558T DE60131558T DE60131558D1 DE 60131558 D1 DE60131558 D1 DE 60131558D1 DE 60131558 T DE60131558 T DE 60131558T DE 60131558 T DE60131558 T DE 60131558T DE 60131558 D1 DE60131558 D1 DE 60131558D1
Authority
DE
Germany
Prior art keywords
rastermicroscopy
microscopy
data storage
based data
storage
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60131558T
Other languages
English (en)
Other versions
DE60131558T2 (de
Inventor
Gerd K Binnig
Michel Despont
Peter Vettiger
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
International Business Machines Corp
Original Assignee
International Business Machines Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by International Business Machines Corp filed Critical International Business Machines Corp
Publication of DE60131558D1 publication Critical patent/DE60131558D1/de
Application granted granted Critical
Publication of DE60131558T2 publication Critical patent/DE60131558T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/24—AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes
    • G01Q60/38—Probes, their manufacture, or their related instrumentation, e.g. holders
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B9/00—Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor
    • G11B9/12—Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor using near-field interactions; Record carriers therefor
    • G11B9/14—Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor using near-field interactions; Record carriers therefor using microscopic probe means, i.e. recording or reproducing by means directly associated with the tip of a microscopic electrical probe as used in Scanning Tunneling Microscopy [STM] or Atomic Force Microscopy [AFM] for inducing physical or electrical perturbations in a recording medium; Record carriers or media specially adapted for such transducing of information
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q20/00—Monitoring the movement or position of the probe
    • G01Q20/04—Self-detecting probes, i.e. wherein the probe itself generates a signal representative of its position, e.g. piezoelectric gauge
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B9/00—Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor
    • G11B9/12—Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor using near-field interactions; Record carriers therefor
    • G11B9/14—Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor using near-field interactions; Record carriers therefor using microscopic probe means, i.e. recording or reproducing by means directly associated with the tip of a microscopic electrical probe as used in Scanning Tunneling Microscopy [STM] or Atomic Force Microscopy [AFM] for inducing physical or electrical perturbations in a recording medium; Record carriers or media specially adapted for such transducing of information
    • G11B9/1409—Heads
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q80/00—Applications, other than SPM, of scanning-probe techniques
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B5/00—Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
    • G11B2005/0002—Special dispositions or recording techniques
    • G11B2005/0005—Arrangements, methods or circuits
    • G11B2005/0021—Thermally assisted recording using an auxiliary energy source for heating the recording layer locally to assist the magnetization reversal

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Radiology & Medical Imaging (AREA)
  • Semiconductor Memories (AREA)
  • Micromachines (AREA)
  • Automatic Analysis And Handling Materials Therefor (AREA)
  • Supporting Of Heads In Record-Carrier Devices (AREA)
DE60131558T 2000-11-03 2001-09-17 Auf rasterkraftmikroskopie basierende datenspeicherung und mikroskopie Expired - Lifetime DE60131558T2 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP00123992 2000-11-03
EP00123992 2000-11-03
PCT/IB2001/001688 WO2002037488A1 (en) 2000-11-03 2001-09-17 Afm-based data storage and microscopy

Publications (2)

Publication Number Publication Date
DE60131558D1 true DE60131558D1 (de) 2008-01-03
DE60131558T2 DE60131558T2 (de) 2008-09-25

Family

ID=8170286

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60131558T Expired - Lifetime DE60131558T2 (de) 2000-11-03 2001-09-17 Auf rasterkraftmikroskopie basierende datenspeicherung und mikroskopie

Country Status (8)

Country Link
EP (1) EP1330823B1 (de)
JP (1) JP4019188B2 (de)
KR (1) KR100690415B1 (de)
CN (1) CN1260721C (de)
AU (1) AU2001286156A1 (de)
DE (1) DE60131558T2 (de)
TW (1) TW550622B (de)
WO (1) WO2002037488A1 (de)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6982898B2 (en) 2002-10-15 2006-01-03 Nanochip, Inc. Molecular memory integrated circuit utilizing non-vibrating cantilevers
US20060146655A1 (en) * 2003-07-02 2006-07-06 Koninklijke Philips Electronics N.V. Server for routing connection to client device
EP1544859A1 (de) * 2003-12-17 2005-06-22 Hewlett-Packard Development Company, L.P. Schreib-/Leseanordnungen für Sonden
US7460462B2 (en) 2003-12-17 2008-12-02 Hewlett-Packard Development Company, L.P. Contact probe storage fet sensor and write heater arrangements
EP1550850A1 (de) 2003-12-29 2005-07-06 STMicroelectronics S.r.l. Lese-/-Schreib-Gerät für Massenspeichergerät und Lese-/-Schreibverfahren dafür
US7558185B2 (en) * 2004-01-29 2009-07-07 International Business Machines Corporation Storage device having flexible architecture and free scalability
EP1759389B1 (de) * 2004-06-22 2008-05-21 International Business Machines Corporation Datenspeichereinrichtung und verfahren zum betrieb einer datenspeichereinrichtung
CN1329905C (zh) * 2004-12-09 2007-08-01 江苏大学 一种通电压痕的纳米级加工方法
JP4979229B2 (ja) * 2005-01-13 2012-07-18 インターナショナル・ビジネス・マシーンズ・コーポレーション 基板に亘って走査するプローブ
TWI372868B (en) * 2005-01-13 2012-09-21 Ibm Probe for scanning over a substrate and data storage device
CN100585324C (zh) * 2005-09-08 2010-01-27 国际商业机器公司 用于感测探针位置的设备和方法
JP7219276B2 (ja) * 2017-11-15 2023-02-07 カプレス・アクティーゼルスカブ 供試標本の電気特性を試験するためのプローブ及び関連する近接度検出器
US11119118B2 (en) * 2019-05-03 2021-09-14 Bruker Nano, Inc. Torsion wing probe assembly

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4747698A (en) * 1986-04-30 1988-05-31 International Business Machines Corp. Scanning thermal profiler
KR950024146A (ko) * 1994-01-31 1995-08-21 모리시타 요이찌 정보기록재생장치 및 정보기록재생방법
US5929438A (en) * 1994-08-12 1999-07-27 Nikon Corporation Cantilever and measuring apparatus using it

Also Published As

Publication number Publication date
AU2001286156A1 (en) 2002-05-15
KR20030048086A (ko) 2003-06-18
CN1260721C (zh) 2006-06-21
JP2004513466A (ja) 2004-04-30
KR100690415B1 (ko) 2007-03-09
EP1330823A1 (de) 2003-07-30
EP1330823B1 (de) 2007-11-21
JP4019188B2 (ja) 2007-12-12
WO2002037488A1 (en) 2002-05-10
CN1473330A (zh) 2004-02-04
DE60131558T2 (de) 2008-09-25
TW550622B (en) 2003-09-01

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Legal Events

Date Code Title Description
8320 Willingness to grant licences declared (paragraph 23)
8364 No opposition during term of opposition