DE4039743A1 - Optical imaging error correction in cable dia. measurement - subtracting measured values for standard pattern from defined values - Google Patents

Optical imaging error correction in cable dia. measurement - subtracting measured values for standard pattern from defined values

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Publication number
DE4039743A1
DE4039743A1 DE19904039743 DE4039743A DE4039743A1 DE 4039743 A1 DE4039743 A1 DE 4039743A1 DE 19904039743 DE19904039743 DE 19904039743 DE 4039743 A DE4039743 A DE 4039743A DE 4039743 A1 DE4039743 A1 DE 4039743A1
Authority
DE
Germany
Prior art keywords
correction values
measurement
optical imaging
values
error correction
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
DE19904039743
Other languages
German (de)
Inventor
Hans Hocke
Gerhard Freist
Bettina Lehnert
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Schwermaschinenbau Kombinat Ernst Thalmann VEB
Original Assignee
Schwermaschinenbau Kombinat Ernst Thalmann VEB
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Schwermaschinenbau Kombinat Ernst Thalmann VEB filed Critical Schwermaschinenbau Kombinat Ernst Thalmann VEB
Priority to DE19904039743 priority Critical patent/DE4039743A1/en
Publication of DE4039743A1 publication Critical patent/DE4039743A1/en
Ceased legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/024—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by means of diode-array scanning
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/08—Measuring arrangements characterised by the use of optical techniques for measuring diameters

Abstract

The method detects correction values for optical imageing errors in dia. measurement equipment using CCD rows involves measuring the separation distances between the lines of a standard bar pattern with defined separation intervals between bars. The correction values are obtained by subtraction of the measured standard intervals from the defined standard intervals. Interpolation is performed between the correction values obtained by measurement. USE/ADVANTAGE - E.g. for optical measurement of diameter in cable and rolled material industries. Enables correction values to be determined once in measurement plane of system.

Description

Die Erfindung findet im Zusammenhang mit optischen Durchmessermeßgeräten, die beispielsweise in der kabel- und walzgutherstellenden Industrie eingesetzt werden, Anwendung.The invention takes place in connection with optical Diameter measuring devices that are used, for example, in and the rolling industry, Application.

Es ist ein Verfahren zur Korrektur der optischen Abbildungsfehler des "Research Institute of Electrical Engineering" in Prag bekannt, bei dem anstelle des Meßgutes eine festgelegte Anzahl Prüfnormale in das Meßfeld eingebracht werden. Ausgehend davon, daß im Bereich der optischen Achse keine Abbildungsfehler auftreten, und unter der Bedingung, daß die Mitte der Prüfnormale exakt durch die optische Achse verläuft, können so eine angemessene Anzahl Korrekturwerte ermittelt werden. Dabei kann aber davon ausgegangen werden, daß das Wechseln der Prüfnormale recht aufwendig ist, da die mechanische Befestigung sehr exakt ausfallen muß. Außerdem wird bei einer größeren Anzahl von Prüfnormalen der Abgleichaufwand entsprechend hoch.It is a method of correcting the optical Image errors of the "Research Institute of Electrical Engineering "in Prague, where instead of A defined number of test standards in the Measuring field are introduced. Assuming that in Region of the optical axis no aberrations occur, and on the condition that the middle of the Test standards run exactly through the optical axis, can determine an appropriate number of correction values will. But it can be assumed that the Changing the test standards is quite complex because the mechanical attachment must be very precise. In addition, with a larger number of Test standards the adjustment effort correspondingly high.

Eine weitere Möglichkeit, die Korrekturwerte zu ermitteln, basiert auf dem Gedanken, eine Objektkante um definierte Wegstrecken parallel durch das Meßfeld zu verschieben. Dazu ist aber eine inkrementelle Längenmeßeinrichtung notwendig, um die Verschiebewege exakt zu ermitteln. Der meßtechnische Aufwand steigt erheblich.Another way to determine the correction values is based on the idea of defining an object edge around To move distances parallel through the measuring field. But this is an incremental length measuring device necessary to determine the displacement paths exactly. The metrological effort increases significantly.

Die DE-OS 33 05 129 beschreibt ein Verfahren und eine Vorrichtung zur Kalibrierung einer zum Messen einer Dimension eines Körpers dienenden Meßvorrichtung. Dabei unterscheiden sich die Abbildungsverfahren derart, daß im beschriebenen Verfahren eine Meßskala als Hintergrund im eigentlichen Meßfeld dient, wobei diese abwechselnd von zwei Lampen beleuchtet wird, die entsprechend vom Mikrorechner gesteuert zu- bzw. abgeschaltet werden müssen. Dieses Verfahren ist für den vorliegenden Sachverhalt nicht anwendbar, da bei dem vorliegenden Abbildungssystem nach DD-WP 1 52 988 das Meßgut von hinten beleuchtet wird und somit der Hintergrund nicht für die Aufnahme einer Meßskala - wie in obengenannter Patentschrift beschrieben - dienen kann.DE-OS 33 05 129 describes a method and a Device for calibrating one for measuring one Dimension of a body-serving measuring device. Here the imaging methods differ in such a way that in described a measurement scale as a background in the actual measuring field, which alternates from two lamps is lit, which is accordingly from Microcomputer controlled on or off  have to. This procedure is for the present The facts are not applicable, as in the present case Imaging system according to DD-WP 1 52 988 the measured material from behind is illuminated and therefore the background is not for the Recording a measuring scale - as in the above Patent specification described - can serve.

Das von uns beschriebene Verfahren erfaßt die Korrekturwerte in der Meßebene des Systems einmalig.The procedure described by us covers the Correction values in the measuring level of the system are unique.

Der Erfindung liegt das Problem zugrunde, ein Verfahren zu schaffen, das es ermöglicht, die Korrekturwerte für die Korrektur optischer Abbildungsfehler in Durchmessermeßgeräten auf der Basis von CCD-Zeilen in einem Arbeitsgang zu ermitteln.The invention is based on the problem of a method create that enables the correction values for the Correction of optical aberrations in diameter measuring devices based on CCD lines in one operation to determine.

Erfindungsgemäß wird das Problem so gelöst, daß auf dem als Normal eingesetzten Strichraster mit definierten Abständen y₁ . . . yn der Striche die Abstände xi der Striche gemessen und die Korrekturwerte ki durch Subtraktion von den realen Abständen y ermittelt werden.According to the invention the problem is solved in such a way that on the line grid used as normal with defined intervals y 1. . . y n of the lines, the distances x i of the lines are measured and the correction values k i are determined by subtracting from the real distances y.

Die weitere Ausgestaltung des erfindungsgemäßen Verfahrens sieht vor, zwischen den ermittelten Korrekturwerten ki eine Interpolation durchzuführen.The further embodiment of the method according to the invention provides for an interpolation between the determined correction values k i .

Die Anwendung der Erfindung führt zu einer Minimierung des Aufwandes zur Ermittlung der Korrekturwerte.The application of the invention leads to a minimization the effort to determine the correction values.

Anhand eines Beispieles soll das erfindungsgemäße Verfahren näher erläutert werden.Using an example, the inventive Procedures are explained in more detail.

Bei Durchmessermeßgeräten mit CCD-Zeile wird anstelle des Meßgutes ein Strichraster 2 mit definierten Abständen y₁ . . . yn der Striche eingebracht. Das Strichraster 2 wird derart angeordnet, daß die Striche mit Hilfe der Strahlungsquelle 1 und der Optik 4 auf der CCD-Zeile 3 abgebildet werden und so der Abstand x₁ . . . xn der Striche gemessen werden kann. In diameter measuring devices with a CCD line, a line grid 2 with defined distances y 1 is used instead of the material to be measured. . . y n introduced the strokes. The line grid 2 is arranged such that the lines are imaged on the CCD line 3 with the aid of the radiation source 1 and the optics 4 and so the distance x 1 . . . x n of the lines can be measured.

Die Korrekturwerte k₁ . . . kn werden dann durch Subtraktion der bekannten Abstände y₁ . . . yn und der gemessenen Abstände x₁ . . . xn ermittelt. Die ermittelten Korrekturwerte werden in einem Festwertspeicher abgespeichert und durch das Meßgerät bei der Ermittlung der Meßwerte während des Betriebes mit ausgewertet.The correction values k₁. . . k n are then y₁ by subtracting the known distances. . . y n and the measured distances x₁. . . x n determined. The correction values determined are stored in a read-only memory and are also evaluated by the measuring device when determining the measured values during operation.

Claims (2)

1. Verfahren zur Erfassung von Korrekturwerten zur Korrektur optischer Abbildungsfehler in Durchmessermeßgeräten auf der Basis von CCD-Zeilen, dadurch gekennzeichnet, daß auf dem als Normal eingesetzten Strichraster (3) mit definierten Abständen y₁ . . . yn der Striche die Abstände xi der Striche gemessen und die Korrekturwerte ki durch Subtraktion von den realen Abständen yi ermittelt werden.1. A method for detecting correction values for correcting optical imaging errors in diameter measuring devices on the basis of CCD lines, characterized in that on the line grid ( 3 ) used as a normal with defined distances y 1. . . y n of the lines, the distances x i of the lines are measured and the correction values k i are determined by subtraction from the real distances y i . 2. Verfahren zur Erfassung von Korrekturwerten nach Anspruch 1, dadurch gekennzeichnet, daß zwischen den ermittelten Korrekturwerten ki eine Interpolation durchgeführt wird.2. A method for detecting correction values according to claim 1, characterized in that an interpolation is carried out between the determined correction values k i .
DE19904039743 1990-12-08 1990-12-08 Optical imaging error correction in cable dia. measurement - subtracting measured values for standard pattern from defined values Ceased DE4039743A1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
DE19904039743 DE4039743A1 (en) 1990-12-08 1990-12-08 Optical imaging error correction in cable dia. measurement - subtracting measured values for standard pattern from defined values

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19904039743 DE4039743A1 (en) 1990-12-08 1990-12-08 Optical imaging error correction in cable dia. measurement - subtracting measured values for standard pattern from defined values

Publications (1)

Publication Number Publication Date
DE4039743A1 true DE4039743A1 (en) 1992-06-11

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Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1219922A2 (en) * 2000-12-28 2002-07-03 INB Vision AG Procedure to improve the exactness of optical 3D-measuring
DE10065120A1 (en) * 2000-12-28 2002-07-11 Inb Vision Ag Method for determining the deviation of the pixel location of the pixels of at least one image recording matrix from the target position
CN104949620A (en) * 2014-03-28 2015-09-30 株式会社三丰 Correction device and correction method for optical measuring apparatus
US11257205B2 (en) * 2015-12-21 2022-02-22 Mitutoyo Corporation Image measuring method and apparatus

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4129384A (en) * 1977-06-08 1978-12-12 Batelle Memorial Institute Optical extensometer
DE3305129A1 (en) * 1982-02-16 1983-09-01 Osakeyhtiö Decon AB, 02201 Espoo Method and device for calibrating a measuring device which serves to measure a dimension of a body

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4129384A (en) * 1977-06-08 1978-12-12 Batelle Memorial Institute Optical extensometer
DE3305129A1 (en) * 1982-02-16 1983-09-01 Osakeyhtiö Decon AB, 02201 Espoo Method and device for calibrating a measuring device which serves to measure a dimension of a body

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
DE-Buch: Internationales Wörterbuch der Metrologie, 1. Aufl., Benth Verlag, Berlin, Köln, 1984, Stichpunkte 3.10 u. 3.14 *

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1219922A2 (en) * 2000-12-28 2002-07-03 INB Vision AG Procedure to improve the exactness of optical 3D-measuring
DE10065120A1 (en) * 2000-12-28 2002-07-11 Inb Vision Ag Method for determining the deviation of the pixel location of the pixels of at least one image recording matrix from the target position
DE10065120C2 (en) * 2000-12-28 2003-03-20 Inb Vision Ag Method for determining the deviation of the pixel location of the pixels of at least one image recording matrix from the target position
EP1219922A3 (en) * 2000-12-28 2004-01-21 INB Vision AG Procedure to improve the exactness of optical 3D-measuring
CN104949620A (en) * 2014-03-28 2015-09-30 株式会社三丰 Correction device and correction method for optical measuring apparatus
CN104949620B (en) * 2014-03-28 2019-07-23 株式会社三丰 Calibration equipment and bearing calibration for optical measuring device
US11257205B2 (en) * 2015-12-21 2022-02-22 Mitutoyo Corporation Image measuring method and apparatus

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