DE3580740D1 - Vorrichtung und verfahren zum gewinnen einer oberflaechenprofilometrie und von dreidimensionalen oberflaechenkonturen. - Google Patents

Vorrichtung und verfahren zum gewinnen einer oberflaechenprofilometrie und von dreidimensionalen oberflaechenkonturen.

Info

Publication number
DE3580740D1
DE3580740D1 DE8585306523T DE3580740T DE3580740D1 DE 3580740 D1 DE3580740 D1 DE 3580740D1 DE 8585306523 T DE8585306523 T DE 8585306523T DE 3580740 T DE3580740 T DE 3580740T DE 3580740 D1 DE3580740 D1 DE 3580740D1
Authority
DE
Germany
Prior art keywords
obtaining
profilometry
contours
dimensional surface
dimensional
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE8585306523T
Other languages
English (en)
Inventor
Maurice Halioua
Venugopal Srinivasan
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
New York Institute Of Technology Old Westbury Ny Us
New York Institute of Technology
Original Assignee
New York Institute Of Technology Old Westbury Ny Us
New York Institute of Technology
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=27095944&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=DE3580740(D1) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Priority claimed from US06/650,824 external-priority patent/US4641972A/en
Application filed by New York Institute Of Technology Old Westbury Ny Us, New York Institute of Technology filed Critical New York Institute Of Technology Old Westbury Ny Us
Application granted granted Critical
Publication of DE3580740D1 publication Critical patent/DE3580740D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/24Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2518Projection by scanning of the object
    • G01B11/2527Projection by scanning of the object with phase change by in-plane movement of the patern
DE8585306523T 1984-09-14 1985-09-13 Vorrichtung und verfahren zum gewinnen einer oberflaechenprofilometrie und von dreidimensionalen oberflaechenkonturen. Expired - Lifetime DE3580740D1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US06/650,824 US4641972A (en) 1984-09-14 1984-09-14 Method and apparatus for surface profilometry
US06/753,722 US4657394A (en) 1984-09-14 1985-07-10 Apparatus and method for obtaining three dimensional surface contours

Publications (1)

Publication Number Publication Date
DE3580740D1 true DE3580740D1 (de) 1991-01-10

Family

ID=27095944

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8585306523T Expired - Lifetime DE3580740D1 (de) 1984-09-14 1985-09-13 Vorrichtung und verfahren zum gewinnen einer oberflaechenprofilometrie und von dreidimensionalen oberflaechenkonturen.

Country Status (4)

Country Link
US (1) US4657394A (de)
EP (1) EP0182469B1 (de)
CA (1) CA1261656A (de)
DE (1) DE3580740D1 (de)

Families Citing this family (90)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4709156A (en) * 1985-11-27 1987-11-24 Ex-Cell-O Corporation Method and apparatus for inspecting a surface
US4842411A (en) * 1986-02-06 1989-06-27 Vectron, Inc. Method of automatically measuring the shape of a continuous surface
EP0262089A3 (de) * 1986-09-23 1989-08-09 KERN & CO. AG Werke für Präzisionsmechanik Optik und Elektronik Vorrichtung zur Vermessung der Oberfläche eines Objektes
US4794550A (en) * 1986-10-15 1988-12-27 Eastman Kodak Company Extended-range moire contouring
FR2610821B1 (fr) * 1987-02-13 1989-06-09 Hennson Int Procede de prise d'empreinte medicale et dispositif pour sa mise en oeuvre
US5085502A (en) * 1987-04-30 1992-02-04 Eastman Kodak Company Method and apparatus for digital morie profilometry calibrated for accurate conversion of phase information into distance measurements in a plurality of directions
US4846577A (en) * 1987-04-30 1989-07-11 Lbp Partnership Optical means for making measurements of surface contours
US4825263A (en) * 1987-06-02 1989-04-25 University Of Medicine & Dentistry Of New Jersey Optical method and apparatus for determining three-dimensional changes in facial contours
CA1313040C (en) * 1988-03-31 1993-01-26 Mitsuaki Uesugi Method and apparatus for measuring a three-dimensional curved surface shape
US5206699A (en) * 1988-05-06 1993-04-27 Gersan Establishment Sensing a narrow frequency band of radiation and gemstones
GB8826224D0 (en) * 1988-11-09 1988-12-14 Gersan Anstalt Sensing shape of object
DE3907430C1 (de) * 1988-12-23 1991-03-21 Klaus 8206 Bruckmuehl De Pfister
CH677972A5 (de) * 1989-01-17 1991-07-15 Kern & Co Ag
US4979815A (en) * 1989-02-17 1990-12-25 Tsikos Constantine J Laser range imaging system based on projective geometry
US5121334A (en) * 1989-06-08 1992-06-09 Regents Of The University Of Minnesota Method and apparatus for automated machining of objects of complex and unique geometry
US5128870A (en) * 1989-06-09 1992-07-07 Regents Of The University Of Minnesota Automated high-precision fabrication of objects of complex and unique geometry
US5027281A (en) * 1989-06-09 1991-06-25 Regents Of The University Of Minnesota Method and apparatus for scanning and recording of coordinates describing three dimensional objects of complex and unique geometry
US5257203A (en) * 1989-06-09 1993-10-26 Regents Of The University Of Minnesota Method and apparatus for manipulating computer-based representations of objects of complex and unique geometry
US5184306A (en) * 1989-06-09 1993-02-02 Regents Of The University Of Minnesota Automated high-precision fabrication of objects of complex and unique geometry
US4984893A (en) * 1989-12-01 1991-01-15 Wyko Corporation Phase shifting device and method
US5347454A (en) * 1990-04-10 1994-09-13 Mushabac David R Method, system and mold assembly for use in preparing a dental restoration
US5545039A (en) * 1990-04-10 1996-08-13 Mushabac; David R. Method and apparatus for preparing tooth or modifying dental restoration
US5343391A (en) * 1990-04-10 1994-08-30 Mushabac David R Device for obtaining three dimensional contour data and for operating on a patient and related method
US5569578A (en) * 1990-04-10 1996-10-29 Mushabac; David R. Method and apparatus for effecting change in shape of pre-existing object
US5562448A (en) * 1990-04-10 1996-10-08 Mushabac; David R. Method for facilitating dental diagnosis and treatment
US5257184A (en) * 1990-04-10 1993-10-26 Mushabac David R Method and apparatus with multiple data input stylii for collecting curvilinear contour data
US5224049A (en) * 1990-04-10 1993-06-29 Mushabac David R Method, system and mold assembly for use in preparing a dental prosthesis
FR2664378B1 (fr) * 1990-07-03 1992-10-16 Bertin & Cie Appareil de projection et de prise d'images pour la determination de la forme tridimensionnelle d'un objet.
US5069548A (en) * 1990-08-08 1991-12-03 Industrial Technology Institute Field shift moire system
US5133601A (en) * 1991-06-12 1992-07-28 Wyko Corporation Rough surface profiler and method
DE4134546A1 (de) * 1991-09-26 1993-04-08 Steinbichler Hans Verfahren und vorrichtung zur bestimmung der absolut-koordinaten eines objektes
US5313265A (en) * 1992-03-02 1994-05-17 Hughes Aircraft Company Non-contact non-destructive latent image scanner
JP2711042B2 (ja) * 1992-03-30 1998-02-10 シャープ株式会社 クリーム半田の印刷状態検査装置
US5444536A (en) * 1992-04-28 1995-08-22 Mtu Motoren- Und Turbinen-Union Muenchen Gmbh Apparatus for measuring the curvature of a profile, such as an edge of a turbine blade
US5570186A (en) * 1992-04-28 1996-10-29 Mtu Motoren- Und Turbinen-Union Munich Gmbh Method for inspecting the curvature of a profile, such an edge of a turbine blade
DE4213908A1 (de) * 1992-04-28 1993-11-04 Mtu Muenchen Gmbh Verfahren zur vermessung von kruemmungsprofilen von kanten
DE4213909A1 (de) * 1992-04-28 1993-11-04 Mtu Muenchen Gmbh Vorrichtung zur vermessung von kruemmungsprofilen von kanten
US5280342A (en) * 1992-08-17 1994-01-18 Mcconnell Timothy P Optical grid projection system for surgical applications
US5436462A (en) * 1993-12-21 1995-07-25 United Technologies Optical Systems Video contour measurement system employing moire interferometry having a beat frequency pattern
DE4416108C2 (de) * 1994-05-06 2000-05-11 Fraunhofer Ges Forschung Vorrichtung zum berührungsfreien Vermessen einer Objektoberfläche
AU683803B2 (en) * 1995-10-17 1997-11-20 Aluminum Company Of America Electronic fringe analysis for determining surface contours
US6049384A (en) * 1996-02-27 2000-04-11 Cyberoptics Corporation Method and apparatus for three dimensional imaging using multi-phased structured light
JP3914638B2 (ja) * 1997-09-09 2007-05-16 シーケーディ株式会社 形状計測装置
US6101269A (en) * 1997-12-19 2000-08-08 Lifef/X Networks, Inc. Apparatus and method for rapid 3D image parametrization
US6438272B1 (en) * 1997-12-31 2002-08-20 The Research Foundation Of State University Of Ny Method and apparatus for three dimensional surface contouring using a digital video projection system
US6040910A (en) * 1998-05-20 2000-03-21 The Penn State Research Foundation Optical phase-shift triangulation technique (PST) for non-contact surface profiling
JP2000292135A (ja) * 1999-04-07 2000-10-20 Minolta Co Ltd 3次元情報入力カメラ
CA2277855A1 (fr) 1999-07-14 2001-01-14 Solvision Methode et systeme de mesure de la hauteur des billes de soudure d'un circuit imprime
US6788210B1 (en) 1999-09-16 2004-09-07 The Research Foundation Of State University Of New York Method and apparatus for three dimensional surface contouring and ranging using a digital video projection system
US6888640B2 (en) 2000-02-04 2005-05-03 Mario J. Spina Body spatial dimension mapper
US6639685B1 (en) 2000-02-25 2003-10-28 General Motors Corporation Image processing method using phase-shifted fringe patterns and curve fitting
CA2301822A1 (fr) * 2000-03-24 2001-09-24 9071 9410 Quebec Inc. Projection simultanee de plusieurs patrons avec acquisition simultanee pour l'inspection d'objets en trois dimensions
FI20001568A (fi) * 2000-06-30 2001-12-31 Thermo Radiometrie Oy Pinnan muotojen määrittäminen
US6483595B1 (en) * 2000-07-22 2002-11-19 Basis Software, Inc. Three dimensional optical scanner
JP4010753B2 (ja) * 2000-08-08 2007-11-21 株式会社リコー 形状計測システムと撮像装置と形状計測方法及び記録媒体
US6856407B2 (en) 2000-09-13 2005-02-15 Nextengine, Inc. Method for depth detection in 3D imaging providing a depth measurement for each unitary group of pixels
CA2422242A1 (en) * 2000-09-13 2002-03-21 Nextengine, Inc. Imaging system monitored or controlled to ensure fidelity of file captured
US6639684B1 (en) * 2000-09-13 2003-10-28 Nextengine, Inc. Digitizer using intensity gradient to image features of three-dimensional objects
US7358986B1 (en) 2000-09-13 2008-04-15 Nextengine, Inc. Digital imaging system having distribution controlled over a distributed network
US6369879B1 (en) 2000-10-24 2002-04-09 The Regents Of The University Of California Method and apparatus for determining the coordinates of an object
US6504605B1 (en) * 2000-10-24 2003-01-07 The Regents Of The University Of California Method and apparatus for determining the coordinates of an object
US7233351B1 (en) 2001-02-23 2007-06-19 Nextengine, Inc. Method for high resolution incremental imaging
US7061628B2 (en) * 2001-06-27 2006-06-13 Southwest Research Institute Non-contact apparatus and method for measuring surface profile
WO2003014665A1 (en) * 2001-08-01 2003-02-20 Unilever N.V. Device and method for 3d imaging
JP3878033B2 (ja) * 2002-02-28 2007-02-07 シーケーディ株式会社 三次元計測装置
US7012631B2 (en) * 2002-09-17 2006-03-14 Bojko Vodanovic Absolute position determination for a CCD-based acquisition unit
GB0301775D0 (en) * 2003-01-25 2003-02-26 Wilson John E Device and method for 3Dimaging
US7286246B2 (en) * 2003-03-31 2007-10-23 Mitutoyo Corporation Method and apparatus for non-contact three-dimensional surface measurement
US6987560B2 (en) * 2003-05-30 2006-01-17 The Boeing Company Inverse synthetic aperture radar-based covert system for human identification
US20050219553A1 (en) * 2003-07-31 2005-10-06 Kelly Patrick V Monitoring apparatus
WO2005031252A1 (ja) * 2003-09-25 2005-04-07 Brother Kogyo Kabushiki Kaisha 3次元形状検出装置、3次元形状検出システム、及び、3次元形状検出プログラム
US7711179B2 (en) 2004-04-21 2010-05-04 Nextengine, Inc. Hand held portable three dimensional scanner
US20060045174A1 (en) * 2004-08-31 2006-03-02 Ittiam Systems (P) Ltd. Method and apparatus for synchronizing a transmitter clock of an analog modem to a remote clock
WO2006110215A2 (en) * 2005-02-18 2006-10-19 Blue Marlin Llc Method and imager for determining the point of impact on a putter face
EP1875162B1 (de) * 2005-04-06 2014-06-11 Dimensional Photonics International, Inc. Definition eines positionsfehlers einer optischen komponente mittels strukturierter lichtmuster
WO2006134793A1 (ja) * 2005-06-14 2006-12-21 Brother Kogyo Kabushiki Kaisha 投影装置
US7995834B1 (en) 2006-01-20 2011-08-09 Nextengine, Inc. Multiple laser scanner
JP4895655B2 (ja) * 2006-03-29 2012-03-14 住友大阪セメント株式会社 嚥下機能評価装置
CN101127923B (zh) * 2007-09-18 2010-05-19 深圳大学 嵌入式三维数字成像装置及其方法
US8045181B2 (en) * 2009-05-21 2011-10-25 General Electric Company Inspection system and method with multi-image phase shift analysis
WO2011054083A1 (en) 2009-11-04 2011-05-12 Technologies Numetrix Inc. Device and method for obtaining three-dimensional object surface data
US8605150B1 (en) * 2010-10-29 2013-12-10 Lockheed Martin Corporation Single image DC-removal method for increasing the precision of two-dimensional fourier transform profilometry
JP5683002B2 (ja) * 2011-02-01 2015-03-11 Jukiオートメーションシステムズ株式会社 3次元測定装置、3次元測定方法及びプログラム
DE102012108567B4 (de) * 2011-10-05 2017-04-27 Electronics And Telecommunications Research Institute Verfahren zum Erlangen von Tiefeninformationen unter Verwendung eines Lichtmusters
TWI503579B (zh) 2013-06-07 2015-10-11 Young Optics Inc 立體影像裝置、其立體影像掃描底座及其運作方法
DE102013020498A1 (de) * 2013-12-11 2015-06-11 Api International Ag Vorrichtung zur 3-D-Vermessung einer Oberfläche und Projektionseineit, sowie Verfahren zur 3-D-Vermessung
KR102159996B1 (ko) * 2013-12-16 2020-09-25 삼성전자주식회사 이벤트 필터링 장치 및 이를 이용한 동작 인식 장치
US9470508B2 (en) * 2014-04-23 2016-10-18 General Electric Company Non-contact coordinate measuring system
DE102014226729A1 (de) * 2014-12-19 2016-06-23 Sac Sirius Advanced Cybernetics Gmbh Verfahren zur optischen Formerfassung und/oder Formprüfung eines Gegenstands und Beleuchtungseinrichtung
US11119193B2 (en) * 2018-03-28 2021-09-14 Northwestern University Micro resolution imaging range sensor system

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3627427A (en) * 1970-02-11 1971-12-14 Lockheed Aircraft Corp Method and apparatus for contour measurement
FR2212034A5 (de) * 1972-12-21 1974-07-19 Cem Comp Electro Mec
DE2636211C2 (de) * 1976-08-12 1978-01-26 Ibm Deutschland Gmbh, 7000 Stuttgart Interferometrisches Verfahren zur Abstands- oder Ebenheitsmessung
GB1593284A (en) * 1977-03-15 1981-07-15 Nat Res Dev Optical inspection
US4212073A (en) * 1978-12-13 1980-07-08 Balasubramanian N Method and system for surface contouring
US4373804A (en) * 1979-04-30 1983-02-15 Diffracto Ltd. Method and apparatus for electro-optically determining the dimension, location and attitude of objects
US4349277A (en) * 1980-06-11 1982-09-14 General Electric Company Non-contact measurement of surface profile
FR2512945B1 (fr) * 1981-09-14 1986-04-04 Utilisation Ration Gaz Procede de

Also Published As

Publication number Publication date
EP0182469B1 (de) 1990-11-28
US4657394A (en) 1987-04-14
EP0182469A1 (de) 1986-05-28
CA1261656A (en) 1989-09-26

Similar Documents

Publication Publication Date Title
DE3580740D1 (de) Vorrichtung und verfahren zum gewinnen einer oberflaechenprofilometrie und von dreidimensionalen oberflaechenkonturen.
DE3854348D1 (de) Verfahren und Vorrichtung zum Messen der Form einer dreidimensional gekrümmten Oberfläche.
DE3682381D1 (de) Verfahren und vorrichtung zur kontrolle einer oberflaeche.
DE68922990T2 (de) Vorrichtung und verfahren zum abtasten der oberfläche eines werkstückes.
DE58906609D1 (de) Verfahren und Vorrichtung zum Reinigen einer Sprühvorrichtung.
DE3866342D1 (de) Verfahren und vorrichtung zum weben eines dreidimensionalen artikels.
DE3584994D1 (de) Vorrichtung und verfahren zum herstellen von mustern mit schmaler linienbreite.
DE3485697D1 (de) Verfahren und vorrichtung zum steuern einer anzeige.
DE3851514D1 (de) Verfahren und Vorrichtung zur überprüfung der Zustände einer Maschine.
DE3581426D1 (de) Verfahren zum zustellen eines honwerkzeuges und vorrichtung zum ausfuehren des verfahrens.
DE3877191T2 (de) Verfahren und vorrichtung zum messen einer dreidimensionalen gekruemmten oberflaeche.
ATA236886A (de) Verfahren und vorrichtung zum bilden einer feuerfestmasse auf einer oberflaeche
DE3578391D1 (de) Verfahren und vorrichtung zur herstellung eines warmarbeitswerkzeuges.
DE3880613D1 (de) Verfahren und geraet zum elektronischen identifizieren von sich auf einer oberflaeche bewegenden gegenstaenden.
PT87576A (pt) Verfahren und vorrichtung zum kontrollierten abbau einer aerosolwolke
DE58901200D1 (de) Verfahren und vorrichtung zum oszillieren einer stahlstranggiesskokille.
DE3578113D1 (de) Verfahren und vorrichtung zum abschneiden einer reissverschlusskette.
DE310765T1 (de) Verfahren und vorrichtung zum umbrechen der seiten in einer druckmaschine.
DE3582796D1 (de) Verfahren und vorrichtung zur behandlung von werkstuecken mit verwendung einer sandstrahleinheit.
DE3871946T2 (de) Vorrichtung und verfahren zum behandeln einer materialbahn.
DE3878681T2 (de) Verfahren und vorrichtung zur behandlung einer oberflaeche.
DE3767041D1 (de) Verfahren und vorrichtung zum messen der freien oberflaeche einer fluessigkeit.
DE3481698D1 (de) Vorrichtung und verfahren zum dekorieren von gegenstaenden.
DE3483193D1 (de) Verfahren und vorrichtung zur festlegung einer koordinate auf einer oberflaeche eines festkoerpers.
DE68910791T2 (de) Verfahren und Vorrichtung zum Detektieren und Klassifizieren der Kräuselung einer behandelten Oberfläche.

Legal Events

Date Code Title Description
8363 Opposition against the patent
8339 Ceased/non-payment of the annual fee