DE3211281C2 - - Google Patents

Info

Publication number
DE3211281C2
DE3211281C2 DE19823211281 DE3211281A DE3211281C2 DE 3211281 C2 DE3211281 C2 DE 3211281C2 DE 19823211281 DE19823211281 DE 19823211281 DE 3211281 A DE3211281 A DE 3211281A DE 3211281 C2 DE3211281 C2 DE 3211281C2
Authority
DE
Germany
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
DE19823211281
Other versions
DE3211281A1 (de
Inventor
Asao Hachioji Tokio/Tokyo Jp Hayashi
Masahiro Fussa Tokio/Tokyo Jp Aoki
Kenichi Tokio/Tokyo Jp Oinoue
Masatoshi Hachioji Tokio/Tokyo Jp Ida
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Olympus Corp
Original Assignee
Olympus Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority to JP56044183A priority Critical patent/JPH0375844B2/ja
Application filed by Olympus Corp filed Critical Olympus Corp
Publication of DE3211281A1 publication Critical patent/DE3211281A1/de
Application granted granted Critical
Publication of DE3211281C2 publication Critical patent/DE3211281C2/de
Expired legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
    • G02B7/00Mountings, adjusting means, or light-tight connections, for optical elements
    • G02B7/28Systems for automatic generation of focusing signals
    • G02B7/36Systems for automatic generation of focusing signals using image sharpness techniques, e.g. image processing techniques for generating autofocus signals
    • G02B7/38Systems for automatic generation of focusing signals using image sharpness techniques, e.g. image processing techniques for generating autofocus signals measured at different points on the optical axis, e.g. focussing on two or more planes and comparing image data
DE19823211281 1981-03-27 1982-03-26 Expired DE3211281C2 (de)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56044183A JPH0375844B2 (de) 1981-03-27 1981-03-27

Publications (2)

Publication Number Publication Date
DE3211281A1 DE3211281A1 (de) 1982-10-14
DE3211281C2 true DE3211281C2 (de) 1985-05-30

Family

ID=12684452

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19823211281 Expired DE3211281C2 (de) 1981-03-27 1982-03-26

Country Status (3)

Country Link
US (1) US4540881A (de)
JP (1) JPH0375844B2 (de)
DE (1) DE3211281C2 (de)

Families Citing this family (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0727107B2 (ja) * 1985-07-26 1995-03-29 ミノルタ株式会社 相関像比較装置及びそれを用いた焦点検出装置及び測距装置
JPS62133408A (en) * 1985-12-05 1987-06-16 Canon Inc Focus detecting system
US5166506A (en) * 1991-01-30 1992-11-24 Eastman Kodak Company Method for determining an imaging system focus error
US5245173A (en) * 1991-03-29 1993-09-14 Olympus Optical Co., Ltd. Automatic focal-point sensing apparatus sensing high and low magnification
US5396058A (en) * 1993-06-10 1995-03-07 Eastman Kodak Company Robust method for determining an imaging system focus error
US5432331A (en) * 1994-06-07 1995-07-11 Eastman Kodak Company Method and apparatus for detecting focus of moving images with tilted plane detector and time delay means
US6023056A (en) * 1998-05-04 2000-02-08 Eastman Kodak Company Scene-based autofocus method
JP2002072066A (ja) * 2000-08-25 2002-03-12 Olympus Optical Co Ltd ピント合せ装置
US7345706B2 (en) * 2002-08-23 2008-03-18 Fuji Photo Optical Co., Ltd. Auto focus system
JP2004085675A (ja) * 2002-08-23 2004-03-18 Fuji Photo Optical Co Ltd オートフォーカスシステム
US20120077206A1 (en) 2003-07-12 2012-03-29 Accelr8 Technology Corporation Rapid Microbial Detection and Antimicrobial Susceptibility Testing
US7687239B2 (en) 2003-07-12 2010-03-30 Accelrs Technology Corporation Sensitive and rapid determination of antimicrobial susceptibility
DE602004001960T2 (de) * 2003-11-21 2006-12-14 Fujinon Corp. Autofokussystem
US10254204B2 (en) 2011-03-07 2019-04-09 Accelerate Diagnostics, Inc. Membrane-assisted purification
ES2551922T3 (es) 2011-03-07 2015-11-24 Accelerate Diagnostics, Inc. Sistemas rápidos de purificación celular
US10001622B2 (en) * 2011-10-25 2018-06-19 Sanford Burnham Medical Research Institute Multifunction autofocus system and method for automated microscopy
US9677109B2 (en) 2013-03-15 2017-06-13 Accelerate Diagnostics, Inc. Rapid determination of microbial growth and antimicrobial susceptibility
US10253355B2 (en) 2015-03-30 2019-04-09 Accelerate Diagnostics, Inc. Instrument and system for rapid microorganism identification and antimicrobial agent susceptibility testing
WO2016161022A2 (en) 2015-03-30 2016-10-06 Accerlate Diagnostics, Inc. Instrument and system for rapid microorganism identification and antimicrobial agent susceptibility testing

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5156627A (ja) * 1974-11-13 1976-05-18 Canon Kk Butsutaizosenmeidokenshutsuhoshiki
JPS53116852A (en) * 1977-03-23 1978-10-12 Olympus Optical Co Ltd Automatic focus adjusting system
DE2838647C2 (de) * 1978-09-05 1988-03-24 Siemens Ag, 1000 Berlin Und 8000 Muenchen, De
JPS6355043B2 (de) * 1978-10-24 1988-11-01 Olympus Optical Co
JPS641765B2 (de) * 1978-12-25 1989-01-12 Kogyo Gijutsuin
US4352545A (en) * 1979-02-13 1982-10-05 Asahi Kogaku Kogyo Kabushiki Kaisha Camera focus detecting device
JPS55144212A (en) * 1979-04-28 1980-11-11 Seiko Koki Kk Automatic focus adjusting device

Also Published As

Publication number Publication date
JPS57158820A (en) 1982-09-30
JPH0375844B2 (de) 1991-12-03
DE3211281A1 (de) 1982-10-14
US4540881A (en) 1985-09-10

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Legal Events

Date Code Title Description
OP8 Request for examination as to paragraph 44 patent law
D2 Grant after examination
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee