DE2912826A1 - Compact pair of electrical probes packaged for portability - are used for voltage or short circuit testing and clamped together, when not in use, by magnets - Google Patents

Compact pair of electrical probes packaged for portability - are used for voltage or short circuit testing and clamped together, when not in use, by magnets

Info

Publication number
DE2912826A1
DE2912826A1 DE19792912826 DE2912826A DE2912826A1 DE 2912826 A1 DE2912826 A1 DE 2912826A1 DE 19792912826 DE19792912826 DE 19792912826 DE 2912826 A DE2912826 A DE 2912826A DE 2912826 A1 DE2912826 A1 DE 2912826A1
Authority
DE
Germany
Prior art keywords
probes
magnets
use
used
packaged
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
DE19792912826
Other languages
German (de)
Inventor
Heinz Laass
Original Assignee
Heinz Laass
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Heinz Laass filed Critical Heinz Laass
Priority to DE19792912826 priority Critical patent/DE2912826A1/en
Publication of DE2912826A1 publication Critical patent/DE2912826A1/en
Application status is Withdrawn legal-status Critical

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/18Indicating phase sequence; Indicating synchronism
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/145Indicating the presence of current or voltage
    • G01R19/155Indicating the presence of voltage
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/02Testing of electric apparatus, lines or components, for short-circuits, discontinuities, leakage of current, or incorrect line connection
    • G01R31/024Arrangements for indicating continuity or short-circuits in electric apparatus or lines, leakage or ground faults

Abstract

The two probes are each housed in a handgrip and are held together when not in use by a pair of magnets or by a magnet and an iron pole. The electrical lead connecting the two probes can be stored by wrapping it around two posts on the side of one of the probes. A mechanical hinged link may be used to connect the two probes instead of the magnets, and various alternative methods of storing the lead are given. The probes may or may not be identical and one may have a touch switch on the side to initiate the test. The probes are neatly packaged but quickly prepared for use.
DE19792912826 1979-03-30 1979-03-30 Compact pair of electrical probes packaged for portability - are used for voltage or short circuit testing and clamped together, when not in use, by magnets Withdrawn DE2912826A1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
DE19792912826 DE2912826A1 (en) 1979-03-30 1979-03-30 Compact pair of electrical probes packaged for portability - are used for voltage or short circuit testing and clamped together, when not in use, by magnets

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19792912826 DE2912826A1 (en) 1979-03-30 1979-03-30 Compact pair of electrical probes packaged for portability - are used for voltage or short circuit testing and clamped together, when not in use, by magnets

Publications (1)

Publication Number Publication Date
DE2912826A1 true DE2912826A1 (en) 1980-10-16

Family

ID=6066999

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19792912826 Withdrawn DE2912826A1 (en) 1979-03-30 1979-03-30 Compact pair of electrical probes packaged for portability - are used for voltage or short circuit testing and clamped together, when not in use, by magnets

Country Status (1)

Country Link
DE (1) DE2912826A1 (en)

Cited By (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0129993A1 (en) * 1983-06-01 1985-01-02 Joseph F. Festa Circuit board tester
FR2575837A1 (en) * 1985-01-10 1986-07-11 Gedic International Apparatus for checking the continuity of an electrical circuit
US7492172B2 (en) 2003-05-23 2009-02-17 Cascade Microtech, Inc. Chuck for holding a device under test
US7656172B2 (en) 2005-01-31 2010-02-02 Cascade Microtech, Inc. System for testing semiconductors
US7688062B2 (en) 2000-09-05 2010-03-30 Cascade Microtech, Inc. Probe station
US7688091B2 (en) 2003-12-24 2010-03-30 Cascade Microtech, Inc. Chuck with integrated wafer support
US7898281B2 (en) 2005-01-31 2011-03-01 Cascade Mircotech, Inc. Interface for testing semiconductors
US7969173B2 (en) 2000-09-05 2011-06-28 Cascade Microtech, Inc. Chuck for holding a device under test
US8069491B2 (en) 2003-10-22 2011-11-29 Cascade Microtech, Inc. Probe testing structure
US8319503B2 (en) 2008-11-24 2012-11-27 Cascade Microtech, Inc. Test apparatus for measuring a characteristic of a device under test
DE102011077007A1 (en) * 2011-06-06 2012-12-06 Hoover Dam Technology Gmbh Two-pole voltage tester with Prüfelektrodenschutz
EP2672278A1 (en) * 2012-06-04 2013-12-11 Weidmüller Interface GmbH & Co. KG Measuring instrument, in particular a voltage tester

Cited By (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0129993A1 (en) * 1983-06-01 1985-01-02 Joseph F. Festa Circuit board tester
FR2575837A1 (en) * 1985-01-10 1986-07-11 Gedic International Apparatus for checking the continuity of an electrical circuit
US7688062B2 (en) 2000-09-05 2010-03-30 Cascade Microtech, Inc. Probe station
US7969173B2 (en) 2000-09-05 2011-06-28 Cascade Microtech, Inc. Chuck for holding a device under test
US7876115B2 (en) 2003-05-23 2011-01-25 Cascade Microtech, Inc. Chuck for holding a device under test
US7492172B2 (en) 2003-05-23 2009-02-17 Cascade Microtech, Inc. Chuck for holding a device under test
US8069491B2 (en) 2003-10-22 2011-11-29 Cascade Microtech, Inc. Probe testing structure
US7688091B2 (en) 2003-12-24 2010-03-30 Cascade Microtech, Inc. Chuck with integrated wafer support
US7898281B2 (en) 2005-01-31 2011-03-01 Cascade Mircotech, Inc. Interface for testing semiconductors
US7940069B2 (en) 2005-01-31 2011-05-10 Cascade Microtech, Inc. System for testing semiconductors
US7656172B2 (en) 2005-01-31 2010-02-02 Cascade Microtech, Inc. System for testing semiconductors
US8319503B2 (en) 2008-11-24 2012-11-27 Cascade Microtech, Inc. Test apparatus for measuring a characteristic of a device under test
DE102011077007A1 (en) * 2011-06-06 2012-12-06 Hoover Dam Technology Gmbh Two-pole voltage tester with Prüfelektrodenschutz
EP2533054A3 (en) * 2011-06-06 2013-07-31 Hoover Dam Technology GmbH Bipolar voltage test with test electrode protection
DE102011077007B4 (en) * 2011-06-06 2014-06-05 Hoover Dam Technology Gmbh Two-pole voltage tester with Prüfelektrodenschutz
EP2672278A1 (en) * 2012-06-04 2013-12-11 Weidmüller Interface GmbH & Co. KG Measuring instrument, in particular a voltage tester
US9188604B2 (en) 2012-06-04 2015-11-17 Weidmueller Interface Gmbh & Co. Kg Measuring instrument for testing voltage
RU2621489C2 (en) * 2012-06-04 2017-06-06 Вайдмюллер Интерфейс Гмбх Унд Ко. Кг Measuring device, in particular, voltage indicator

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Legal Events

Date Code Title Description
8139 Disposal/non-payment of the annual fee