DE2901076B2 - - Google Patents

Info

Publication number
DE2901076B2
DE2901076B2 DE2901076A DE2901076A DE2901076B2 DE 2901076 B2 DE2901076 B2 DE 2901076B2 DE 2901076 A DE2901076 A DE 2901076A DE 2901076 A DE2901076 A DE 2901076A DE 2901076 B2 DE2901076 B2 DE 2901076B2
Authority
DE
Germany
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
DE2901076A
Other versions
DE2901076C3 (en
DE2901076A1 (en
Inventor
Gerhard 8200 Rosenheim Krause
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Siemens AG
Original Assignee
Siemens AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siemens AG filed Critical Siemens AG
Priority to DE2901076A priority Critical patent/DE2901076C3/de
Publication of DE2901076A1 publication Critical patent/DE2901076A1/en
Publication of DE2901076B2 publication Critical patent/DE2901076B2/de
Application granted granted Critical
Publication of DE2901076C3 publication Critical patent/DE2901076C3/de
Expired legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26Testing of individual semiconductor devices
    • G01R31/2607Circuits therefor
    • G01R31/2632Circuits therefor for testing diodes
    • G01R31/2635Testing light-emitting diodes, laser diodes or photodiodes
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/42Photometry, e.g. photographic exposure meter using electric radiation detectors
DE2901076A 1979-01-12 1979-01-12 Expired DE2901076C3 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
DE2901076A DE2901076C3 (en) 1979-01-12 1979-01-12

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE2901076A DE2901076C3 (en) 1979-01-12 1979-01-12

Publications (3)

Publication Number Publication Date
DE2901076A1 DE2901076A1 (en) 1980-07-17
DE2901076B2 true DE2901076B2 (en) 1980-10-30
DE2901076C3 DE2901076C3 (en) 1981-07-09

Family

ID=6060445

Family Applications (1)

Application Number Title Priority Date Filing Date
DE2901076A Expired DE2901076C3 (en) 1979-01-12 1979-01-12

Country Status (1)

Country Link
DE (1) DE2901076C3 (en)

Also Published As

Publication number Publication date
DE2901076A1 (en) 1980-07-17
DE2901076C3 (en) 1981-07-09

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Legal Events

Date Code Title Description
OAP Request for examination filed
OD Request for examination
C3 Grant after two publication steps (3rd publication)
8339 Ceased/non-payment of the annual fee