DE2822567A1 - Echometer zur lokalisierung von fehlern in lichtleitern - Google Patents
Echometer zur lokalisierung von fehlern in lichtleiternInfo
- Publication number
- DE2822567A1 DE2822567A1 DE19782822567 DE2822567A DE2822567A1 DE 2822567 A1 DE2822567 A1 DE 2822567A1 DE 19782822567 DE19782822567 DE 19782822567 DE 2822567 A DE2822567 A DE 2822567A DE 2822567 A1 DE2822567 A1 DE 2822567A1
- Authority
- DE
- Germany
- Prior art keywords
- echometer
- optical
- frequency
- signal
- oscillator
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000003287 optical effect Effects 0.000 claims description 16
- 239000000835 fiber Substances 0.000 claims description 11
- 238000006243 chemical reaction Methods 0.000 claims description 5
- 238000002592 echocardiography Methods 0.000 claims description 5
- 230000010355 oscillation Effects 0.000 claims description 5
- 239000004020 conductor Substances 0.000 claims description 3
- 230000007547 defect Effects 0.000 claims description 3
- 238000010168 coupling process Methods 0.000 description 4
- 238000005859 coupling reaction Methods 0.000 description 4
- 239000013307 optical fiber Substances 0.000 description 3
- JBRZTFJDHDCESZ-UHFFFAOYSA-N AsGa Chemical compound [As]#[Ga] JBRZTFJDHDCESZ-UHFFFAOYSA-N 0.000 description 2
- 229910001218 Gallium arsenide Inorganic materials 0.000 description 2
- 230000005540 biological transmission Effects 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 239000000758 substrate Substances 0.000 description 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- 238000010521 absorption reaction Methods 0.000 description 1
- JNDMLEXHDPKVFC-UHFFFAOYSA-N aluminum;oxygen(2-);yttrium(3+) Chemical compound [O-2].[O-2].[O-2].[Al+3].[Y+3] JNDMLEXHDPKVFC-UHFFFAOYSA-N 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 238000000151 deposition Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000005669 field effect Effects 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- CPBQJMYROZQQJC-UHFFFAOYSA-N helium neon Chemical compound [He].[Ne] CPBQJMYROZQQJC-UHFFFAOYSA-N 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 239000000344 soap Substances 0.000 description 1
- 229910019655 synthetic inorganic crystalline material Inorganic materials 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
- 229910019901 yttrium aluminum garnet Inorganic materials 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
- G01S17/00—Systems using the reflection or reradiation of electromagnetic waves other than radio waves, e.g. lidar systems
- G01S17/88—Lidar systems specially adapted for specific applications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/30—Testing of optical devices, constituted by fibre optics or optical waveguides
- G01M11/31—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter and a light receiver being disposed at the same side of a fibre or waveguide end-face, e.g. reflectometers
- G01M11/3172—Reflectometers detecting the back-scattered light in the frequency-domain, e.g. OFDR, FMCW, heterodyne detection
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Radar, Positioning & Navigation (AREA)
- Chemical & Material Sciences (AREA)
- Computer Networks & Wireless Communication (AREA)
- Electromagnetism (AREA)
- Optics & Photonics (AREA)
- Remote Sensing (AREA)
- Analytical Chemistry (AREA)
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Testing Of Optical Devices Or Fibers (AREA)
- Light Guides In General And Applications Therefor (AREA)
- Optical Communication System (AREA)
- Measuring Instrument Details And Bridges, And Automatic Balancing Devices (AREA)
- Optical Radar Systems And Details Thereof (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| FR7716568A FR2393287A1 (fr) | 1977-05-31 | 1977-05-31 | Echometre pour la localisation de defauts affectant les conducteurs de lumiere |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| DE2822567A1 true DE2822567A1 (de) | 1979-01-04 |
| DE2822567C2 DE2822567C2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1989-02-09 |
Family
ID=9191459
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE19782822567 Granted DE2822567A1 (de) | 1977-05-31 | 1978-05-24 | Echometer zur lokalisierung von fehlern in lichtleitern |
Country Status (9)
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE3126356A1 (de) * | 1981-07-03 | 1983-01-20 | Siemens AG, 1000 Berlin und 8000 München | Verfahren zum pruefen von objekten |
| DE3243464A1 (de) * | 1981-11-26 | 1983-06-01 | Alain 22300 Lannion Leclert | Verfahren zur kohaerenten erfassung und demodulation einer sich in irgendeinem polarisationszustand befindenden, phasenmodulierten traegerwelle und vorrichtung zur durchfuehrung des verfahrens |
| DE3230570A1 (de) * | 1982-08-17 | 1984-04-26 | Siemens AG, 1000 Berlin und 8000 München | Sende- und empfangseinrichtung fuer ein faseroptisches sensorsystem |
| DE3340428A1 (de) * | 1983-11-09 | 1985-05-23 | Wandel & Goltermann Gmbh & Co, 7412 Eningen | Verfahren und einrichtung zur ueberwachung eines optischen nachrichtenuebertragungssystems |
| EP0125758A3 (en) * | 1983-04-14 | 1987-02-25 | Stc Plc | Coherent reflectometers |
| EP0168114A3 (en) * | 1984-07-12 | 1987-08-19 | Philips Patentverwaltung Gmbh | Method of and device for measuring the attenuation in beam waveguides |
Families Citing this family (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR2520114A1 (fr) * | 1982-01-18 | 1983-07-22 | Lignes Telegraph Telephon | Dispositif de localisation d'une cassure d'une fibre optique et utilisation d'un tel dispositif |
| DE3372540D1 (en) * | 1982-12-24 | 1987-08-20 | Sumitomo Electric Industries | Device for detecting fractures in power transmission fibers |
| DE3506884A1 (de) * | 1985-02-27 | 1986-08-28 | Philips Patentverwaltung Gmbh, 2000 Hamburg | Optisches zeitbereichsreflektometer mit heterodyn-empfang |
| GB2182223A (en) * | 1985-10-23 | 1987-05-07 | Stc Plc | Optical fibre reflectometer |
| JPS62200782A (ja) * | 1986-02-28 | 1987-09-04 | Anritsu Corp | 光ファイバ測定装置 |
| JPH0623678B2 (ja) * | 1986-03-19 | 1994-03-30 | アンリツ株式会社 | コヒ−レントｏｔｄｒ装置 |
| FR2640379B1 (fr) * | 1988-12-14 | 1994-07-01 | Centre Nat Rech Scient | Procede d'analyse de composants d'optique guidee, fibres optiques ou reseaux de guides optiques par reflectometrie temporelle et reflectometre dans le domaine temporel |
| CH679184A5 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) * | 1989-10-17 | 1991-12-31 | Leica Aarau Ag | |
| EP0515443B1 (en) * | 1990-02-15 | 1995-06-07 | BRITISH TELECOMMUNICATIONS public limited company | Optical test apparatus comprising an OTDR |
| US5013907A (en) * | 1990-03-27 | 1991-05-07 | Tektronix, Inc. | Optical time domain testing instrument |
| US5149961A (en) * | 1990-05-15 | 1992-09-22 | Eg&G, Ltd. | Method and apparatus for optical fiber length determination |
| JPH04134238A (ja) * | 1990-09-27 | 1992-05-08 | Ando Electric Co Ltd | ヘテロダイン受光を用いた光パルス試験器 |
| US5757241A (en) * | 1996-12-31 | 1998-05-26 | Millitech Corporation | Pulse amplification apparatus and method |
| US9500562B2 (en) * | 2015-02-05 | 2016-11-22 | University Of Ottawa | Kerr phase-interrogator for sensing and signal processing applications |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR2280072A1 (fr) * | 1974-07-26 | 1976-02-20 | Douillie Remy | Procede et equipement de mesure permettant de localiser une cassure sur un cable optique |
-
1977
- 1977-05-31 FR FR7716568A patent/FR2393287A1/fr active Granted
-
1978
- 1978-05-02 CH CH473478A patent/CH623417A5/fr not_active IP Right Cessation
- 1978-05-11 IT IT23309/78A patent/IT1094629B/it active
- 1978-05-15 GB GB19572/78A patent/GB1563993A/en not_active Expired
- 1978-05-24 DE DE19782822567 patent/DE2822567A1/de active Granted
- 1978-05-30 NL NL7805870A patent/NL7805870A/xx not_active Application Discontinuation
- 1978-05-30 CA CA304,385A patent/CA1108431A/fr not_active Expired
- 1978-05-31 JP JP6445378A patent/JPS53149351A/ja active Granted
-
1982
- 1982-06-28 US US06/392,912 patent/US4826314A/en not_active Expired - Fee Related
Non-Patent Citations (2)
| Title |
|---|
| Applied Optics, Vol. 15, No. 9, Sept. 1976, S. 2112-2115 * |
| National Convention Record 1976 des Institute of Electronics and Communication in Japan: Bericht 946 * |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE3126356A1 (de) * | 1981-07-03 | 1983-01-20 | Siemens AG, 1000 Berlin und 8000 München | Verfahren zum pruefen von objekten |
| DE3243464A1 (de) * | 1981-11-26 | 1983-06-01 | Alain 22300 Lannion Leclert | Verfahren zur kohaerenten erfassung und demodulation einer sich in irgendeinem polarisationszustand befindenden, phasenmodulierten traegerwelle und vorrichtung zur durchfuehrung des verfahrens |
| DE3230570A1 (de) * | 1982-08-17 | 1984-04-26 | Siemens AG, 1000 Berlin und 8000 München | Sende- und empfangseinrichtung fuer ein faseroptisches sensorsystem |
| EP0125758A3 (en) * | 1983-04-14 | 1987-02-25 | Stc Plc | Coherent reflectometers |
| DE3340428A1 (de) * | 1983-11-09 | 1985-05-23 | Wandel & Goltermann Gmbh & Co, 7412 Eningen | Verfahren und einrichtung zur ueberwachung eines optischen nachrichtenuebertragungssystems |
| EP0168114A3 (en) * | 1984-07-12 | 1987-08-19 | Philips Patentverwaltung Gmbh | Method of and device for measuring the attenuation in beam waveguides |
Also Published As
| Publication number | Publication date |
|---|---|
| CA1108431A (fr) | 1981-09-08 |
| FR2393287B1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1980-07-11 |
| JPS6235051B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1987-07-30 |
| CH623417A5 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1981-05-29 |
| US4826314A (en) | 1989-05-02 |
| FR2393287A1 (fr) | 1978-12-29 |
| GB1563993A (en) | 1980-04-02 |
| NL7805870A (nl) | 1978-12-04 |
| IT1094629B (it) | 1985-08-02 |
| IT7823309A0 (it) | 1978-05-11 |
| JPS53149351A (en) | 1978-12-26 |
| DE2822567C2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1989-02-09 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| DE2822567A1 (de) | Echometer zur lokalisierung von fehlern in lichtleitern | |
| DE2003492A1 (de) | Messverfahren fuer Schrittgeber zum Messen von Laengen oder Winkeln sowie Anordnungen zur Durchfuehrung dieses Messverfahrens | |
| DE2112325A1 (de) | Optisches Geraet zur gleichzeitigen Messung der Entfernung und der Geschwindigkeit eines beweglichen Objektes in bezug auf eine feste Markierung | |
| DE69229055T2 (de) | Digitales sampeln einzelner pulse | |
| DE3638583A1 (de) | Verfahren und vorrichtung zur bestimmung der dispersion optischer fasern | |
| DE3018212A1 (de) | Hf-spektralanalysator | |
| DE1918730A1 (de) | Verfahren und Einrichtung zur Messung der zeitlichen AEnderung der Feldstaerke eines Magnetfeldes | |
| DE1623410A1 (de) | Vibrationsempfindliche Vorrichtung | |
| EP2816323A1 (de) | Verfahren und Vorrichtung zur Messung der akustischen Umgebung einer Glasfaser | |
| DE112012004046B4 (de) | Vorrichtung zur Detektion einer elektromagnetischen Welle | |
| US4411520A (en) | Light dispersion measuring apparatus | |
| DE102020133347A1 (de) | Laservorrichtung, messvorrichtung und messverfahren | |
| DE112010002587B4 (de) | Elektrooptischer Abstandsmesser | |
| DE69115877T2 (de) | Gerät zum messen der winkelgeschwindigkeit durch optische interferenz | |
| DE3008187C2 (de) | System zur Ermittlung der Entfernung von Bruchstellen in einem Lichtwellenleiter | |
| DE69306706T2 (de) | Optischer Wandler | |
| DE2014781B2 (de) | Anordnung zum bestimmen von brechungsindizes in der atom sphaere | |
| DE2709571A1 (de) | Auf die intensitaet von ultraschallstrahlung ansprechende einrichtung | |
| DE60131322T2 (de) | Optoelektronisches Übertragungssystem in einem turbulenten Medium mit Fotodetektormatrix und Zeitkompensation | |
| DE68905384T2 (de) | Vorrichtung zur korrelation von lichtintensitaet. | |
| DE69433483T2 (de) | Optischer Empfänger mit hoher Empfindlichkeit zum Empfang eines einzelnen hohen frequenzmodulierten optischen Signals | |
| EP0302275A2 (de) | Vorrichtung zum Detektieren intensitätsmodulierter Lichtsignale | |
| DE2456293A1 (de) | Verfahren und vorrichtung zur fehlerortsbestimmung in lichtleitfasern | |
| DE10346379B4 (de) | Verfahren zum Bestimmen des Frequenzgangs eines elektrooptischen Bauelements | |
| DE1589970B2 (de) | Optisches Verfahren zur Erzeugung der zweiten Harmonischen als Summenfrequenz |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| 8110 | Request for examination paragraph 44 | ||
| 8128 | New person/name/address of the agent |
Representative=s name: WEINMILLER, J., DIPL.-ING., PAT.-ANW., 8133 FELDAF |
|
| D2 | Grant after examination | ||
| 8364 | No opposition during term of opposition | ||
| 8339 | Ceased/non-payment of the annual fee |