DE2816017C2 - - Google Patents

Info

Publication number
DE2816017C2
DE2816017C2 DE19782816017 DE2816017A DE2816017C2 DE 2816017 C2 DE2816017 C2 DE 2816017C2 DE 19782816017 DE19782816017 DE 19782816017 DE 2816017 A DE2816017 A DE 2816017A DE 2816017 C2 DE2816017 C2 DE 2816017C2
Authority
DE
Germany
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
DE19782816017
Other languages
German (de)
Other versions
DE2816017A1 (de
Inventor
Dieter Dipl.-Phys. Dr. Ernst
Dieter 3000 Hannover De Reinhardt
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
GESELLSCHAFT fur STRAHLEN- und UMWELTFORSCHUNG MBH 8000 MUENCHEN DE
Original Assignee
GESELLSCHAFT fur STRAHLEN- und UMWELTFORSCHUNG MBH 8000 MUENCHEN DE
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by GESELLSCHAFT fur STRAHLEN- und UMWELTFORSCHUNG MBH 8000 MUENCHEN DE filed Critical GESELLSCHAFT fur STRAHLEN- und UMWELTFORSCHUNG MBH 8000 MUENCHEN DE
Priority to DE19782816017 priority Critical patent/DE2816017A1/de
Priority to AT41879A priority patent/AT376041B/de
Priority to NL7900630A priority patent/NL178276C/xx
Priority to GB7912174A priority patent/GB2023812B/en
Priority to SE7903223A priority patent/SE440400B/sv
Publication of DE2816017A1 publication Critical patent/DE2816017A1/de
Application granted granted Critical
Publication of DE2816017C2 publication Critical patent/DE2816017C2/de
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/04—Optical or mechanical part supplementary adjustable parts
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/04—Optical or mechanical part supplementary adjustable parts
    • G01J1/0407—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/04—Optical or mechanical part supplementary adjustable parts
    • G01J1/0407—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings
    • G01J1/0474—Diffusers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/0271—Housings; Attachments or accessories for photometers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/04—Optical or mechanical part supplementary adjustable parts
    • G01J1/0488—Optical or mechanical part supplementary adjustable parts with spectral filtering

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
DE19782816017 1978-04-13 1978-04-13 Lichtmessgeraet Granted DE2816017A1 (de)

Priority Applications (5)

Application Number Priority Date Filing Date Title
DE19782816017 DE2816017A1 (de) 1978-04-13 1978-04-13 Lichtmessgeraet
AT41879A AT376041B (de) 1978-04-13 1979-01-19 Lichtmessgeraet
NL7900630A NL178276C (nl) 1978-04-13 1979-01-26 Lichtmeetinrichting.
GB7912174A GB2023812B (en) 1978-04-13 1979-04-06 Photometer
SE7903223A SE440400B (sv) 1978-04-13 1979-04-11 Ljusmetinstrument for kosinusriktig metning av alla infallsriktningar fran ett halvrum

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19782816017 DE2816017A1 (de) 1978-04-13 1978-04-13 Lichtmessgeraet

Publications (2)

Publication Number Publication Date
DE2816017A1 DE2816017A1 (de) 1979-10-25
DE2816017C2 true DE2816017C2 (US07608600-20091027-C00054.png) 1987-04-23

Family

ID=6036888

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19782816017 Granted DE2816017A1 (de) 1978-04-13 1978-04-13 Lichtmessgeraet

Country Status (5)

Country Link
AT (1) AT376041B (US07608600-20091027-C00054.png)
DE (1) DE2816017A1 (US07608600-20091027-C00054.png)
GB (1) GB2023812B (US07608600-20091027-C00054.png)
NL (1) NL178276C (US07608600-20091027-C00054.png)
SE (1) SE440400B (US07608600-20091027-C00054.png)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102005025606A1 (de) * 2005-06-03 2006-12-07 Vishay Semiconductor Gmbh Sonnensensor und Herstellungsverfahren hierfür

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3622075A1 (de) * 1986-07-01 1988-01-14 Patent Treuhand Ges Fuer Elektrische Gluehlampen Mbh Geraet zur messung inhomogener optischer strahlung und verfahren zur messung
FR2608742B1 (fr) * 1986-12-19 1990-02-23 Sevelinge Gerard Systeme de controle pour le suivi du soleil et le positionnement des heliostats d'un capteur solaire a concentration lineaire a lames mobiles
DE4329665C1 (de) * 1993-09-02 1994-05-11 Se Scient Electronics Muenchen Sensor zum Erfassen von elektromagnetischer Strahlung
GB9719614D0 (en) * 1997-09-10 1997-11-19 Wood John Solar radiation sensor
CN103411885A (zh) * 2013-07-18 2013-11-27 江苏大学 一种多光谱成像系统的漫反射照明装置

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE1028357B (de) * 1955-03-22 1958-04-17 Patra Patent Treuhand Beleuchtungsmesservorsatz fuer cos-richtige Beleuchtungsstaerkemessungen
DE1813306B2 (de) * 1968-12-07 1971-07-22 Korrekturlinse fuer lichtmessfuehler
US3880528A (en) * 1973-07-02 1975-04-29 Tektronix Inc Light probe

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102005025606A1 (de) * 2005-06-03 2006-12-07 Vishay Semiconductor Gmbh Sonnensensor und Herstellungsverfahren hierfür
DE102005025606B4 (de) * 2005-06-03 2015-10-01 Vishay Semiconductor Gmbh Sonnensensor und Herstellungsverfahren hierfür

Also Published As

Publication number Publication date
ATA41879A (de) 1984-02-15
NL7900630A (nl) 1979-10-16
DE2816017A1 (de) 1979-10-25
SE7903223L (sv) 1979-10-14
GB2023812B (en) 1982-11-24
NL178276C (nl) 1986-02-17
AT376041B (de) 1984-10-10
SE440400B (sv) 1985-07-29
GB2023812A (en) 1980-01-03
NL178276B (nl) 1985-09-16

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Legal Events

Date Code Title Description
8110 Request for examination paragraph 44
D2 Grant after examination
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee