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Info

Publication number
DE2521934C3
DE2521934C3 DE19752521934 DE2521934A DE2521934C3 DE 2521934 C3 DE2521934 C3 DE 2521934C3 DE 19752521934 DE19752521934 DE 19752521934 DE 2521934 A DE2521934 A DE 2521934A DE 2521934 C3 DE2521934 C3 DE 2521934C3
Authority
DE
Grant status
Grant
Patent type
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
DE19752521934
Other versions
DE2521934A1 (de )
DE2521934B2 (de )
Inventor
Klaus Dipl.-Phys. Dr. 8000 Muenchen Hartmann
Meinhard Von 8022 Gruenwald Braitenberg
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
ERWIN SICK GmbH OPTIK-ELEKTRONIK 7808 WALDKIRCH
Original Assignee
ERWIN SICK GMBH OPTIK-ELEKTRONIK, 7808 WALDKIRCH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Grant date

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47Scattering, i.e. diffuse reflection
    • G01N21/49Scattering, i.e. diffuse reflection within a body or fluid
    • G01N21/53Scattering, i.e. diffuse reflection within a body or fluid within a flowing fluid, e.g. smoke
    • G01N21/534Scattering, i.e. diffuse reflection within a body or fluid within a flowing fluid, e.g. smoke by measuring transmission alone, i.e. determining opacity
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/85Investigating moving fluids or granular solids
DE19752521934 1975-05-16 1975-05-16 Expired DE2521934C3 (de)

Priority Applications (1)

Application Number Priority Date Filing Date Title
DE19752521934 DE2521934C3 (de) 1975-05-16 1975-05-16

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
DE19752521934 DE2521934C3 (de) 1975-05-16 1975-05-16
US05685425 US4126396A (en) 1975-05-16 1976-05-11 Device for the non-dispersive optical determination of the concentration of gas and smoke components
GB2000476A GB1531844A (en) 1975-05-16 1976-05-14 Method and device for the non-dispersive optical determination of the concentration of gas and smoke components
FR7614704A FR2311296B1 (de) 1975-05-16 1976-05-14
JP5547476A JPS6214769B2 (de) 1975-05-16 1976-05-17

Publications (3)

Publication Number Publication Date
DE2521934A1 true DE2521934A1 (de) 1976-11-18
DE2521934B2 true DE2521934B2 (de) 1978-03-02
DE2521934C3 true DE2521934C3 (de) 1978-11-02

Family

ID=5946767

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19752521934 Expired DE2521934C3 (de) 1975-05-16 1975-05-16

Country Status (5)

Country Link
US (1) US4126396A (de)
JP (1) JPS6214769B2 (de)
DE (1) DE2521934C3 (de)
FR (1) FR2311296B1 (de)
GB (1) GB1531844A (de)

Families Citing this family (64)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2601985C2 (de) * 1976-01-16 1978-02-16
US4078896A (en) * 1977-01-21 1978-03-14 International Telephone And Telegraph Corporation Photometric analyzer
US4097743A (en) * 1977-04-19 1978-06-27 Moisture Systems Corp. Moisture analyzing method and apparatus
NL94317C (de) * 1978-11-29
DE2918084C3 (de) * 1979-05-04 1982-04-08 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch, De
FR2464470A1 (fr) * 1979-08-29 1981-03-06 Econics Corp Appareil electro-optique d'analyse d'un gaz de carneau
DE2945608A1 (de) * 1979-11-12 1981-05-21 Sick Optik Elektronik Erwin Vorichtung zur bestimmung der konzentrationen von aus verschiedenen gasen und gegebenenfalls rauchteilchen bestehenden komponenten eines abgasgemisches
US4413911A (en) * 1981-04-24 1983-11-08 Measurex Corporation Gas analyzer with fluid curtain
GB2110818B (en) * 1981-11-14 1985-05-15 Ferranti Ltd Non-dispersive gas analyser
DE3206427A1 (de) * 1982-02-23 1983-09-01 Siemens Ag Messeinrichtung fuer die optische gasanalyse
US4746218A (en) * 1984-06-12 1988-05-24 Syconex Corporation Gas detectors and gas analyzers utilizing spectral absorption
US4632563A (en) * 1983-02-28 1986-12-30 The Syconex Corporation In-situ gas analyzer
US4640621A (en) * 1983-06-17 1987-02-03 Eastern Technical Associates, Inc. Transmissometer and optical elements therefor
EP0145877B1 (de) * 1983-11-04 1989-08-02 Hartmann & Braun Aktiengesellschaft Fotometer zur kontinuierlichen Analyse eines Mediums (Gas oder Flüssigkeit)
US4572663A (en) * 1983-12-22 1986-02-25 Elliott Turbomachinery Co., Inc. Method and apparatus for selectively illuminating a particular blade in a turbomachine
EP0190280A1 (de) * 1984-08-10 1986-08-13 Boliden Aktiebolag Lidar-einrichtung zum korrelationsnachweis von gasen
US4647777A (en) * 1985-05-31 1987-03-03 Ametrek, Inc. Selective gas detector
JPH0711695B2 (ja) 1985-09-25 1995-02-08 富士写真フイルム株式会社 撮影用ハロゲン化銀カラー感光材料の処理方法
US4851327A (en) 1986-07-17 1989-07-25 Fuji Photo Film Co., Ltd. Photographic color photosensitive material with two layer reflective support
DE3624567C2 (de) * 1986-07-21 1989-05-11 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch, De
JPH06105346B2 (ja) 1986-11-07 1994-12-21 富士写真フイルム株式会社 ハロゲン化銀カラ−写真感光材料の処理方法
US4893315A (en) * 1987-04-08 1990-01-09 General Signal Corporation Calorimetry system
US4809190A (en) * 1987-04-08 1989-02-28 General Signal Corporation Calorimetry system
US4895081A (en) * 1987-04-08 1990-01-23 General Signal Corporation Gravimetric feeder, especially adapted for use in a calorimetry system
US4846081A (en) * 1987-04-08 1989-07-11 General Signal Corporation Calorimetry system
US4795262A (en) * 1987-07-29 1989-01-03 The Regents Of The Univerity Of Michigan Liquid chromatography absorbance detector
DE3928081C2 (de) * 1989-08-25 1998-05-07 Bosch Gmbh Robert Vorrichtung zur Erfassung der Trübung von Gasen
US5060505A (en) * 1989-09-12 1991-10-29 Sensors, Inc. Non-dispersive infrared gas analyzer system
US5220179A (en) * 1990-02-06 1993-06-15 Helmut Katschnig Method of and apparatus for detecting the presence of vapor and/or smoke in the outgoing air of a device for heating materials
DE69127750D1 (de) * 1990-04-09 1997-10-30 Commw Scient Ind Res Org Detektionssystem zum gebrauch im flugzeug
US5281256A (en) * 1990-09-28 1994-01-25 Regents Of The University Of Michigan Gas chromatography system with column bifurcation and tunable selectivity
US5210702A (en) * 1990-12-26 1993-05-11 Colorado Seminary Apparatus for remote analysis of vehicle emissions
US5401967A (en) * 1990-12-26 1995-03-28 Colorado Seminary Dba University Of Denver Apparatus for remote analysis of vehicle emissions
GB9210674D0 (en) * 1992-05-19 1992-07-01 Gersan Ets Method and apparatus for examining an object
US5288310A (en) * 1992-09-30 1994-02-22 The Regents Of The University Of Michigan Adsorbent trap for gas chromatography
US5510269A (en) * 1992-11-20 1996-04-23 Sensors, Inc. Infrared method and apparatus for measuring gas concentration including electronic calibration
US5371367A (en) * 1993-04-13 1994-12-06 Envirotest Systems Corp. Remote sensor device for monitoring motor vehicle exhaust systems
US5352901A (en) * 1993-04-26 1994-10-04 Cummins Electronics Company, Inc. Forward and back scattering loss compensated smoke detector
US5424842A (en) * 1993-04-27 1995-06-13 Cummins Electronics Company, Inc. Self-cleaning system for monitoring the opacity of combustion engine exhaust using venturi effect
DE4400963C2 (de) * 1994-01-14 1997-07-17 Sick Ag Verfahren und Vorrichtung zur Überwachung des Zustandes von in einem fluiddurchströmten Kanal eingeschalteten Filteranordnungen
US5751216A (en) * 1994-09-27 1998-05-12 Hochiki Kabushiki Kaisha Projected beam-type smoke detector and receiving unit
DE4443016A1 (de) * 1994-12-02 1996-06-05 Sick Optik Elektronik Erwin Gasanalytisches Meßgerät
US5621213A (en) * 1995-07-07 1997-04-15 Novitron International Inc. System and method for monitoring a stack gas
JPH09152696A (ja) 1995-11-30 1997-06-10 Fuji Photo Film Co Ltd ハロゲン化銀カラー写真感光材料
JP3383499B2 (ja) 1995-11-30 2003-03-04 富士写真フイルム株式会社 ハロゲン化銀カラー写真感光材料
DE19611290C2 (de) * 1996-03-22 1998-04-16 Draegerwerk Ag Gassensor
US5770156A (en) * 1996-06-04 1998-06-23 In Usa, Inc. Gas detection and measurement system
US6010665A (en) * 1996-10-18 2000-01-04 In Usa, Inc. Multi-wavelength based ozone measurement method and apparatus
US5831267A (en) * 1997-02-24 1998-11-03 Envirotest Systems Corp. Method and apparatus for remote measurement of exhaust gas
EP1230535A1 (de) * 1999-11-04 2002-08-14 L'air Liquide, S.A. à Directoire et Conseil de Surveillance pour l'Etude et l'Exploitation des Procédés Georges Claude Verfahren zur kontinuierlichen überwachung von temperatur und chemischen spezies in heissen prozessgasen
US6536649B1 (en) 2000-07-28 2003-03-25 Advanced Micro Devices, Inc. Method of preventing residue contamination of semiconductor devices during furnace processing
US6822216B2 (en) * 2002-01-08 2004-11-23 Honeywell International, Inc. Obscuration detector
US20050030628A1 (en) * 2003-06-20 2005-02-10 Aegis Semiconductor Very low cost narrow band infrared sensor
CA2536371A1 (en) * 2003-08-26 2005-03-10 Redshift Systems Corporation Infrared camera system
US7221827B2 (en) * 2003-09-08 2007-05-22 Aegis Semiconductor, Inc. Tunable dispersion compensator
US7304799B2 (en) * 2003-10-07 2007-12-04 Aegis Lightwave, Inc. Tunable optical filter with heater on a CTE-matched transparent substrate
US20060002656A1 (en) * 2004-05-25 2006-01-05 Cowan James J Surface relief structure
GB0502150D0 (en) * 2005-02-02 2005-03-09 Pcme Ltd A monitor for monitoring particles flowing in a stack
JP2007232402A (ja) * 2006-02-27 2007-09-13 Denso Corp 光学式ガス検知装置
GB0700677D0 (en) * 2007-01-12 2007-02-21 Servomex Group Ltd Probe
EP1975601B1 (de) 2007-03-24 2011-01-12 SICK Engineering GmbH Verschmutzungsmessung
US8467066B2 (en) 2008-09-29 2013-06-18 Johanson Holdings Llc Mixture segregation testing devices and methods
JP5349996B2 (ja) * 2009-02-10 2013-11-20 一般財団法人電力中央研究所 ガス濃度測定装置
US20110035158A1 (en) * 2009-08-06 2011-02-10 Peter Theophilos Banos Methods of and devices for monitoring the effects of cellular stress and damage resulting from radiation exposure

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE1279371B (de) * 1962-03-27 1968-10-03 Sick Erwin Vorrichtung zur Messung der Rauchdichte in Schornsteinen
US3472594A (en) * 1966-06-06 1969-10-14 Philips Corp Multi-channel atomic absorption spectrometer
DE1623071B2 (de) * 1967-02-03 1971-09-09 Photoelektronisches rauchdichtemessgeraet
DE2130331C3 (de) * 1971-06-18 1978-06-29 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch
US3790797A (en) * 1971-09-07 1974-02-05 S Sternberg Method and system for the infrared analysis of gases
DE2218536A1 (de) * 1972-04-17 1973-10-25 Durag Apparatebau Gmbh Truebungsmessgeraet fuer gase und fluessigkeiten
US3860818A (en) * 1972-04-27 1975-01-14 Texas Instruments Inc Atmospheric pollution monitor
US3796887A (en) * 1972-05-17 1974-03-12 Itt Photometric analyzer
DE2303040C3 (de) * 1973-01-23 1978-03-30 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch
US3885162A (en) * 1973-10-31 1975-05-20 Contraves Goerz Corp Optical measuring apparatus

Also Published As

Publication number Publication date Type
JP1416468C (de) grant
GB1531844A (en) 1978-11-08 application
US4126396A (en) 1978-11-21 grant
JPS51141681A (en) 1976-12-06 application
JPS6214769B2 (de) 1987-04-03 grant
FR2311296B1 (de) 1981-09-25 grant
FR2311296A1 (fr) 1976-12-10 application
DE2521934A1 (de) 1976-11-18 application
DE2521934B2 (de) 1978-03-02 application

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Date Code Title Description
OI Miscellaneous see part 1
C3 Grant after two publication steps (3rd publication)
AH Division in

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