DE2003753A1 - Aperture arrangement for limiting a Roentgenstrahlenbuendels - Google Patents

Aperture arrangement for limiting a Roentgenstrahlenbuendels

Info

Publication number
DE2003753A1
DE2003753A1 DE19702003753 DE2003753A DE2003753A1 DE 2003753 A1 DE2003753 A1 DE 2003753A1 DE 19702003753 DE19702003753 DE 19702003753 DE 2003753 A DE2003753 A DE 2003753A DE 2003753 A1 DE2003753 A1 DE 2003753A1
Authority
DE
Grant status
Application
Patent type
Prior art keywords
roentgenstrahlenbuendels
limiting
aperture arrangement
aperture
arrangement
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
DE19702003753
Other languages
German (de)
Other versions
DE2003753B2 (en )
Inventor
Kratky Dipl-Ing Dr Rechn Otto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
KRATKY DIPL ING DR RECHN DR H
Kratky dipl-Ingdrrechndrhc Otto
Original Assignee
KRATKY DIPL ING DR RECHN DR H
Kratky dipl-Ingdrrechndrhc Otto
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20Investigating or analysing materials by the use of wave or particle radiation not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/201Investigating or analysing materials by the use of wave or particle radiation not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials by measuring small-angle scattering
DE19702003753 1969-02-20 1970-01-22 Stop arrangement for limiting a bundle X-rays Pending DE2003753B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
AT173469A AT285756B (en) 1969-02-20 1969-02-20 Aperture arrangement for limiting an X-ray beam

Publications (2)

Publication Number Publication Date
DE2003753A1 true true DE2003753A1 (en) 1970-09-03
DE2003753B2 true DE2003753B2 (en) 1971-08-05

Family

ID=3519845

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19702003753 Pending DE2003753B2 (en) 1969-02-20 1970-01-22 Stop arrangement for limiting a bundle X-rays

Country Status (1)

Country Link
DE (1) DE2003753B2 (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0360347A2 (en) * 1988-09-22 1990-03-28 Philips Patentverwaltung GmbH Arrangement for the measurement of the pulse transfer spectrum
EP0462658A2 (en) * 1990-06-20 1991-12-27 Philips Patentverwaltung GmbH Arrangement for the measurement of the pulse transfer spectrum of X-ray quanta
WO2000042420A1 (en) * 1998-12-24 2000-07-20 Quanta Vision, Inc. X-ray inspection device using small-angle diffused radiation and variants
WO2006079471A1 (en) * 2005-01-26 2006-08-03 Smiths Heimann Gmbh Collimator with adjustable focal length
WO2006097254A2 (en) * 2005-03-12 2006-09-21 Smiths Heimann Gmbh Collimator with an adjustable focal length

Cited By (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0360347A2 (en) * 1988-09-22 1990-03-28 Philips Patentverwaltung GmbH Arrangement for the measurement of the pulse transfer spectrum
US5008911A (en) * 1988-09-22 1991-04-16 U.S. Philips Corporation X-ray quanta measuring device including diaphragm for producing conical radiation beam on object being measured
EP0360347A3 (en) * 1988-09-22 1991-07-17 Philips Electronics N.V. Arrangement for the measurement of the pulse transfer spectrum
EP0462658A2 (en) * 1990-06-20 1991-12-27 Philips Patentverwaltung GmbH Arrangement for the measurement of the pulse transfer spectrum of X-ray quanta
EP0462658A3 (en) * 1990-06-20 1992-09-09 Philips Patentverwaltung Gmbh Arrangement for the measurement of the pulse transfer spectrum of x-ray quanta
US5231652A (en) * 1990-06-20 1993-07-27 U.S. Philips Corp. Arrangement for measuring the pulse transmission spectrum of x-ray quanta
WO2000042420A1 (en) * 1998-12-24 2000-07-20 Quanta Vision, Inc. X-ray inspection device using small-angle diffused radiation and variants
WO2006079471A1 (en) * 2005-01-26 2006-08-03 Smiths Heimann Gmbh Collimator with adjustable focal length
US8472587B2 (en) 2005-01-26 2013-06-25 Smiths Heimann Gmbh Collimator with an adjustable focal length
WO2006097254A2 (en) * 2005-03-12 2006-09-21 Smiths Heimann Gmbh Collimator with an adjustable focal length
WO2006097254A3 (en) * 2005-03-12 2006-12-28 Smiths Heimann Gmbh Collimator with an adjustable focal length
US7436934B2 (en) 2005-03-12 2008-10-14 Smiths Heimann Gmbh Collimator with adjustable focal length

Also Published As

Publication number Publication date Type
DE2003753B2 (en) 1971-08-05 application

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Legal Events

Date Code Title Description
SH Request for examination between 03.10.1968 and 22.04.1971
E77 Valid patent as to the heymanns-index 1977