DE20021685U1 - High frequency probe tip - Google Patents

High frequency probe tip

Info

Publication number
DE20021685U1
DE20021685U1 DE20021685U DE20021685U DE20021685U1 DE 20021685 U1 DE20021685 U1 DE 20021685U1 DE 20021685 U DE20021685 U DE 20021685U DE 20021685 U DE20021685 U DE 20021685U DE 20021685 U1 DE20021685 U1 DE 20021685U1
Authority
DE
Germany
Prior art keywords
probe tip
frequency probe
high
characterized
tip according
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE20021685U
Other languages
German (de)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Rosenberger Hochfrequenztechnik GmbH and Co KG
Original Assignee
Rosenberger Hochfrequenztechnik GmbH and Co KG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Rosenberger Hochfrequenztechnik GmbH and Co KG filed Critical Rosenberger Hochfrequenztechnik GmbH and Co KG
Priority to DE20021685U priority Critical patent/DE20021685U1/en
Publication of DE20021685U1 publication Critical patent/DE20021685U1/en
Anticipated expiration legal-status Critical
Application status is Expired - Lifetime legal-status Critical

Links

Classifications

    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01RELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R11/00Individual connecting elements providing two or more spaced connecting locations for conductive members which are, or may be, thereby interconnected, e.g. end pieces for wires or cables supported by the wire or cable and having means for facilitating electrical connection to some other wire, terminal, or conductive member, blocks of binding posts
    • H01R11/11End pieces or tapping pieces for wires, supported by the wire and for facilitating electrical connection to some other wire, terminal or conductive member
    • H01R11/18End pieces terminating in a probe
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/06772High frequency probes

Description

Der Beschreibungstext wurde nicht elektronisch erfaßt The description text has not been detected electronically

Der Beschreibungstext wurde nicht elektronisch erfaßt The description text has not been detected electronically

Der Beschreibungstext wurde nicht elektronisch erfaßt The description text has not been detected electronically

Der Beschreibungstext wurde nicht elektronisch erfaßt The description text has not been detected electronically

Der Beschreibungstext wurde nicht elektronisch erfaßt The description text has not been detected electronically

Claims (8)

1. Hochfrequenz-Tastspitze, insbesondere für Leiterplatten und/oder HF-Kabel, mit einem Anschlußende ( 10 ), an dem ein Meßkabel zum Ver binden mit einem Meßgerät anschließbar ist, mit einem Massekontakt ( 16 ) und einer Meßspitze ( 12 ), an der wenigstens ein Signalkontakt ( 14 ) ausge bildet ist, wobei ein Koaxialleiter ( 18 ) mit Masseleiteranordnung ( 20 ) und wenigstes einer von einem Dielektrikum ( 24 ) umgebenen Signalleiter ( 22 ) das Anschlußende ( 10 ) mit der Meßspitze ( 12 ) verbindet, dadurch gekennzeichnet , daß ausgehend von der Meßspitze ( 12 ) über einen vorbestimmten Bereich ( 30 ) der Hochfrequenz-Tastspitze die Masseleiteranordnung ( 20 ) derart ausge bildet ist, daß wenigstens einer der Signalleiter ( 22 ) zusammen mit dem ihn umgebenden Dielektrikum ( 24 ) innerhalb der Masseleiteranordnung ( 20 ) verschiebbar ist. 1. A high-frequency probe tip, in particular for printed circuit boards and / or RF cable, to a terminal end (10) to which a measuring cable for locking tie with a measuring device can be connected, with a ground contact (16) and a measuring tip (12) to is the at least one signal contact (14) being, with a coaxial conductor (18) to the ground conductor arrangement (20) and wenigstes one of a dielectric (24) surrounding the signal conductor (22) connecting the connection end (10) with the measuring tip (12), characterized in that, starting from the measuring tip (12) over a predetermined range (30) of the high-frequency probe tip, the ground conductor arrangement (20) in such a way out, that at least one of the signal conductors (22) together with the surrounding dielectric (24) within the ground conductor assembly (20) is displaceable.
2. Hochfrequenz-Tastspitze nach Anspruch 1, dadurch gekennzeichnet, daß die Masseleiteranordnung ( 20 ) in dem vorbestimmten Bereich ( 30 ) kasten förmig ausgebildet ist. 2. high-frequency probe tip according to claim 1, characterized in that the ground conductor assembly (20) in the predetermined area (30) of box-shaped design.
3. Hochfrequenz-Tastspitze nach Anspruch 1 oder 2, dadurch gekennzeich net, daß die kastenförmige Masseleiteranordnung ( 20 ) im Querschnitt einen kleinen und einen großen Durchmesser ( 34 , 32 ) aufweist, wobei der kleine Durchmesser ( 34 ) kleiner ist als der Durchmesser des Dielektrikums ( 24 ) des Signalleiters. 3. The high-frequency probe tip according to claim 1 or 2, characterized in that the box-shaped ground conductor assembly (20) having a small and a large diameter (34, 32) in cross-section, the small diameter (34) is smaller than the diameter of the dielectric (24) of the signal conductor.
4. Hochfrequenz-Tastspitze nach Anspruch 3, dadurch gekennzeichnet, daß am meßspitzenseitigen Ende ein Schieber ( 38 ) vorgesehen ist, welcher in Richtung des großen Durchmessers ( 32 ) verschiebbar ist und den Signal leiter ( 22 ) mit dem Dielektrikum ( 24 ) mit sich führt. 4. The high-frequency probe tip according to claim 3, characterized in that a slide (38) is provided at meßspitzenseitigen end which in the direction of the large diameter (32) is displaceable and the signal conductor (22) with the dielectric (24) with it leads.
5. Hochfrequenz-Tastspitze nach wenigstens einem der vorhergehende An sprüche, dadurch gekennzeichnet, daß die Masseleiteranordnung ( 20 ) in dem vorbestimmten Bereich ( 30 ) als abgeflachtes Rohr ausgebildet ist. 5. The high-frequency probe tip according to at least one of the previous claims, characterized in that the ground conductor assembly (20) is in the predetermined area (30) as a flattened tube formed.
6. Hochfrequenz-Tastspitze nach wenigstens einem der vorhergehenden An sprüche, dadurch gekennzeichnet, daß am Anschlußende ( 10 ) eine Stan dard-Koaxialverbindung ( 28 ) für das Meßkabel vorgesehen ist. 6. The high-frequency probe tip according to at least one of the preceding claims, characterized in that a stan dard coaxial connection (28) is provided for the measuring cable at the terminal end (10).
7. Hochfrequenz-Tastspitze nach wenigstens einem der vorhergehenden An sprüche, dadurch gekennzeichnet, daß zwei Signalleiter ( 22 ) mit jeweils einem Signalkontakt ( 14 ) vorgesehen sind. 7. The high-frequency probe tip according to at least one of the preceding claims, characterized in that two signal conductors (22) are provided, each having a signal contact (14).
8. Hochfrequenz-Tastspitze nach wenigstens einem der vorhergehenden An sprüche, dadurch gekennzeichnet, daß der Massekontakt ( 16 ) an der Meßspitze ( 12 ) ausgebildet ist. 8. The high-frequency probe tip according to at least one of the preceding claims, characterized in that the earth contact (16) to the measuring tip (12) is formed.
DE20021685U 2000-12-21 2000-12-21 High frequency probe tip Expired - Lifetime DE20021685U1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
DE20021685U DE20021685U1 (en) 2000-12-21 2000-12-21 High frequency probe tip

Applications Claiming Priority (7)

Application Number Priority Date Filing Date Title
DE20021685U DE20021685U1 (en) 2000-12-21 2000-12-21 High frequency probe tip
CA 2420581 CA2420581A1 (en) 2000-12-21 2001-12-06 High-frequency probe-tip
JP2002551603A JP2004537031A (en) 2000-12-21 2001-12-06 High frequency probe tip
EP20010989385 EP1352253A2 (en) 2000-12-21 2001-12-06 High-frequency probe-tip
CNA018161979A CN1466686A (en) 2000-12-21 2001-12-06 High-frequency probe-tip
PCT/DE2001/004619 WO2002050556A2 (en) 2000-12-21 2001-12-06 High-frequency probe-tip
US10/450,394 US20040066181A1 (en) 2000-12-21 2001-12-12 High-frequency probe tip

Publications (1)

Publication Number Publication Date
DE20021685U1 true DE20021685U1 (en) 2001-03-15

Family

ID=7950409

Family Applications (1)

Application Number Title Priority Date Filing Date
DE20021685U Expired - Lifetime DE20021685U1 (en) 2000-12-21 2000-12-21 High frequency probe tip

Country Status (7)

Country Link
US (1) US20040066181A1 (en)
EP (1) EP1352253A2 (en)
JP (1) JP2004537031A (en)
CN (1) CN1466686A (en)
CA (1) CA2420581A1 (en)
DE (1) DE20021685U1 (en)
WO (1) WO2002050556A2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2009105181A1 (en) * 2008-02-19 2009-08-27 Siemens Energy & Automation, Inc. Adjustable electrical probes for circuit breaker tester

Families Citing this family (26)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5914613A (en) 1996-08-08 1999-06-22 Cascade Microtech, Inc. Membrane probing system with local contact scrub
US6256882B1 (en) 1998-07-14 2001-07-10 Cascade Microtech, Inc. Membrane probing system
US6914423B2 (en) 2000-09-05 2005-07-05 Cascade Microtech, Inc. Probe station
US6965226B2 (en) 2000-09-05 2005-11-15 Cascade Microtech, Inc. Chuck for holding a device under test
DE10143173A1 (en) 2000-12-04 2002-06-06 Cascade Microtech Inc Wafer probe has contact finger array with impedance matching network suitable for wide band
US7355420B2 (en) 2001-08-21 2008-04-08 Cascade Microtech, Inc. Membrane probing system
US7492172B2 (en) 2003-05-23 2009-02-17 Cascade Microtech, Inc. Chuck for holding a device under test
US7057404B2 (en) 2003-05-23 2006-06-06 Sharp Laboratories Of America, Inc. Shielded probe for testing a device under test
US7250626B2 (en) 2003-10-22 2007-07-31 Cascade Microtech, Inc. Probe testing structure
US7321234B2 (en) 2003-12-18 2008-01-22 Lecroy Corporation Resistive test probe tips and applications therefor
US7427868B2 (en) 2003-12-24 2008-09-23 Cascade Microtech, Inc. Active wafer probe
US7187188B2 (en) 2003-12-24 2007-03-06 Cascade Microtech, Inc. Chuck with integrated wafer support
JP2008512680A (en) 2004-09-13 2008-04-24 カスケード マイクロテック インコーポレイテッドCascade Microtech,Incorporated Double-sided probing structure
US7183779B2 (en) * 2004-12-28 2007-02-27 Spectrum Technologies, Inc. Soil probe device and method of making same
US7535247B2 (en) 2005-01-31 2009-05-19 Cascade Microtech, Inc. Interface for testing semiconductors
US7656172B2 (en) 2005-01-31 2010-02-02 Cascade Microtech, Inc. System for testing semiconductors
US7262614B1 (en) * 2005-02-10 2007-08-28 Lecroy Corporation Planar on edge probing tip with flex
US9404940B1 (en) 2006-01-06 2016-08-02 Teledyne Lecroy, Inc. Compensating probing tip optimized adapters for use with specific electrical test probes
US7403028B2 (en) 2006-06-12 2008-07-22 Cascade Microtech, Inc. Test structure and probe for differential signals
US7764072B2 (en) 2006-06-12 2010-07-27 Cascade Microtech, Inc. Differential signal probing system
US7723999B2 (en) 2006-06-12 2010-05-25 Cascade Microtech, Inc. Calibration structures for differential signal probing
US7876114B2 (en) 2007-08-08 2011-01-25 Cascade Microtech, Inc. Differential waveguide probe
US7888957B2 (en) 2008-10-06 2011-02-15 Cascade Microtech, Inc. Probing apparatus with impedance optimized interface
US8410806B2 (en) 2008-11-21 2013-04-02 Cascade Microtech, Inc. Replaceable coupon for a probing apparatus
US8319503B2 (en) 2008-11-24 2012-11-27 Cascade Microtech, Inc. Test apparatus for measuring a characteristic of a device under test
DE202009003966U1 (en) * 2009-03-20 2009-06-04 Rosenberger Hochfrequenztechnik Gmbh & Co. Kg measuring tips

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0293497B1 (en) * 1987-05-26 1993-03-10 Ibm Deutschland Gmbh Arrangement of probes with a device for accurate positioning
US4829242A (en) * 1987-12-07 1989-05-09 Microelectronics And Computer Technology Corporation Multigigahertz probe
US4923407A (en) * 1989-10-02 1990-05-08 Tektronix, Inc. Adjustable low inductance probe
US5565788A (en) * 1994-07-20 1996-10-15 Cascade Microtech, Inc. Coaxial wafer probe with tip shielding
US5506515A (en) * 1994-07-20 1996-04-09 Cascade Microtech, Inc. High-frequency probe tip assembly
JP3112873B2 (en) * 1997-10-31 2000-11-27 アンリツ株式会社 High-frequency probe
US6366104B2 (en) * 2000-02-15 2002-04-02 Hughes Electronics Corp. Microwave probe for surface mount and hybrid assemblies

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2009105181A1 (en) * 2008-02-19 2009-08-27 Siemens Energy & Automation, Inc. Adjustable electrical probes for circuit breaker tester
US7804314B2 (en) 2008-02-19 2010-09-28 Siemens Industry, Inc. Adjustable electrical probes for circuit breaker tester
CN101971042A (en) * 2008-02-19 2011-02-09 西门子工业公司 Adjustable electrical probes for circuit breaker tester
CN101971042B (en) 2008-02-19 2013-12-18 西门子工业公司 Adjustable electrical probes for circuit breaker tester

Also Published As

Publication number Publication date
CN1466686A (en) 2004-01-07
CA2420581A1 (en) 2003-02-25
US20040066181A1 (en) 2004-04-08
WO2002050556A2 (en) 2002-06-27
JP2004537031A (en) 2004-12-09
WO2002050556A3 (en) 2002-12-05
EP1352253A2 (en) 2003-10-15

Similar Documents

Publication Publication Date Title
DE29907173U1 (en) coaxial
DE20008498U1 (en) holder
DE20019483U1 (en) Wipproller
DE20018635U1 (en) Insulated
DE20114544U1 (en) wafer probe
DE20001800U1 (en) Werkzeugrack
DE20021685U1 (en) High frequency probe tip
DE20007904U1 (en) screwsystem
DE20112302U1 (en) Wasserklosett
DE20111230U1 (en) holder
DE20018317U1 (en) Visitenwagen
DE20005471U1 (en) instrument panel
DE20005065U1 (en) Doppelschneckenstirnradantrieb
DE20018390U1 (en) Schneidzange
DE20002202U1 (en) bat
DE20116125U1 (en) Amlodipinfumarat
DE20011371U1 (en) Construction apparatus
DE20017722U1 (en) Armtrainingsgerät
DE20009671U1 (en) can end
DE20002313U1 (en) Eckschranktürbeschlag
DE20102096U1 (en) Schalldämmtafel
DE20121226U1 (en) Streichrackel
DE20021105U1 (en) probe base
DE20009028U1 (en) Carrying-rod arrangement
DE20017038U1 (en) Seitenblinkleuchte

Legal Events

Date Code Title Description
R207 Utility model specification

Effective date: 20010419

R163 Identified publications notified

Effective date: 20010911

R150 Term of protection extended to 6 years

Effective date: 20040312

R151 Term of protection extended to 8 years

Effective date: 20070129

R152 Term of protection extended to 10 years

Effective date: 20090312

R071 Expiry of right