DE112022005727T5 - Schottky-Barriere-Diode - Google Patents
Schottky-Barriere-Diode Download PDFInfo
- Publication number
- DE112022005727T5 DE112022005727T5 DE112022005727.0T DE112022005727T DE112022005727T5 DE 112022005727 T5 DE112022005727 T5 DE 112022005727T5 DE 112022005727 T DE112022005727 T DE 112022005727T DE 112022005727 T5 DE112022005727 T5 DE 112022005727T5
- Authority
- DE
- Germany
- Prior art keywords
- barrier diode
- schottky barrier
- anode electrode
- outer peripheral
- trench
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Images
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D62/00—Semiconductor bodies, or regions thereof, of devices having potential barriers
- H10D62/10—Shapes, relative sizes or dispositions of the regions of the semiconductor bodies; Shapes of the semiconductor bodies
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D62/00—Semiconductor bodies, or regions thereof, of devices having potential barriers
- H10D62/10—Shapes, relative sizes or dispositions of the regions of the semiconductor bodies; Shapes of the semiconductor bodies
- H10D62/102—Constructional design considerations for preventing surface leakage or controlling electric field concentration
- H10D62/103—Constructional design considerations for preventing surface leakage or controlling electric field concentration for increasing or controlling the breakdown voltage of reverse-biased devices
- H10D62/105—Constructional design considerations for preventing surface leakage or controlling electric field concentration for increasing or controlling the breakdown voltage of reverse-biased devices by having particular doping profiles, shapes or arrangements of PN junctions; by having supplementary regions, e.g. junction termination extension [JTE]
- H10D62/106—Constructional design considerations for preventing surface leakage or controlling electric field concentration for increasing or controlling the breakdown voltage of reverse-biased devices by having particular doping profiles, shapes or arrangements of PN junctions; by having supplementary regions, e.g. junction termination extension [JTE] having supplementary regions doped oppositely to or in rectifying contact with regions of the semiconductor bodies, e.g. guard rings with PN or Schottky junctions
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D62/00—Semiconductor bodies, or regions thereof, of devices having potential barriers
- H10D62/80—Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D64/00—Electrodes of devices having potential barriers
- H10D64/20—Electrodes characterised by their shapes, relative sizes or dispositions
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D64/00—Electrodes of devices having potential barriers
- H10D64/60—Electrodes characterised by their materials
- H10D64/64—Electrodes comprising a Schottky barrier to a semiconductor
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D8/00—Diodes
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D8/00—Diodes
- H10D8/50—PIN diodes
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D8/00—Diodes
- H10D8/60—Schottky-barrier diodes
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D8/00—Diodes
- H10D8/60—Schottky-barrier diodes
- H10D8/605—Schottky-barrier diodes of the trench conductor-insulator-semiconductor barrier type, e.g. trench MOS barrier Schottky rectifiers [TMBS]
Landscapes
- Electrodes Of Semiconductors (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2021-193059 | 2021-11-29 | ||
| JP2021193059A JP7843603B2 (ja) | 2021-11-29 | 2021-11-29 | ショットキーバリアダイオード |
| PCT/JP2022/030765 WO2023095395A1 (ja) | 2021-11-29 | 2022-08-12 | ショットキーバリアダイオード |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| DE112022005727T5 true DE112022005727T5 (de) | 2024-09-19 |
Family
ID=86539135
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE112022005727.0T Pending DE112022005727T5 (de) | 2021-11-29 | 2022-08-12 | Schottky-Barriere-Diode |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US20240313129A1 (https=) |
| JP (1) | JP7843603B2 (https=) |
| CN (1) | CN118339662A (https=) |
| DE (1) | DE112022005727T5 (https=) |
| TW (1) | TWI827222B (https=) |
| WO (1) | WO2023095395A1 (https=) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN118841453A (zh) * | 2024-08-09 | 2024-10-25 | 乐山希尔电子股份有限公司 | 一种垂直型宽禁带肖特基功率二极管及其制备方法 |
| CN119451139A (zh) * | 2024-10-31 | 2025-02-14 | 中国电子科技集团公司第五十八研究所 | 一种沟槽型氧化镓异质结势垒肖特基二极管 |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2017199869A (ja) | 2016-04-28 | 2017-11-02 | 株式会社タムラ製作所 | トレンチmos型ショットキーダイオード |
Family Cites Families (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6707127B1 (en) * | 2000-08-31 | 2004-03-16 | General Semiconductor, Inc. | Trench schottky rectifier |
| US7323402B2 (en) * | 2002-07-11 | 2008-01-29 | International Rectifier Corporation | Trench Schottky barrier diode with differential oxide thickness |
| JP2009177028A (ja) * | 2008-01-25 | 2009-08-06 | Toshiba Corp | 半導体装置 |
| TWI521719B (zh) * | 2012-06-27 | 2016-02-11 | 財團法人工業技術研究院 | 雙凹溝槽式蕭基能障元件 |
| CN103456627B (zh) * | 2013-08-28 | 2016-04-06 | 中航(重庆)微电子有限公司 | 一种复合型沟槽栅肖特基器件结构及其制造方法 |
| TWI726964B (zh) * | 2015-12-25 | 2021-05-11 | 日商出光興產股份有限公司 | 積層體 |
| TWI715711B (zh) * | 2017-01-25 | 2021-01-11 | 聯華電子股份有限公司 | 半導體元件及其製造方法 |
| JP7045008B2 (ja) * | 2017-10-26 | 2022-03-31 | Tdk株式会社 | ショットキーバリアダイオード |
| JP7165322B2 (ja) * | 2018-03-30 | 2022-11-04 | Tdk株式会社 | ショットキーバリアダイオード |
| JP6980116B2 (ja) * | 2018-08-22 | 2021-12-15 | 三菱電機株式会社 | 酸化物半導体装置及びその製造方法 |
| JP7371484B2 (ja) * | 2019-12-18 | 2023-10-31 | Tdk株式会社 | ショットキーバリアダイオード |
| JP7415537B2 (ja) * | 2019-12-18 | 2024-01-17 | Tdk株式会社 | ショットキーバリアダイオード |
-
2021
- 2021-11-29 JP JP2021193059A patent/JP7843603B2/ja active Active
-
2022
- 2022-08-12 WO PCT/JP2022/030765 patent/WO2023095395A1/ja not_active Ceased
- 2022-08-12 CN CN202280079145.8A patent/CN118339662A/zh active Pending
- 2022-08-12 DE DE112022005727.0T patent/DE112022005727T5/de active Pending
- 2022-08-30 TW TW111132597A patent/TWI827222B/zh active
-
2024
- 2024-05-28 US US18/676,077 patent/US20240313129A1/en active Pending
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2017199869A (ja) | 2016-04-28 | 2017-11-02 | 株式会社タムラ製作所 | トレンチmos型ショットキーダイオード |
Also Published As
| Publication number | Publication date |
|---|---|
| JP2023079551A (ja) | 2023-06-08 |
| TWI827222B (zh) | 2023-12-21 |
| JP7843603B2 (ja) | 2026-04-10 |
| TW202322404A (zh) | 2023-06-01 |
| WO2023095395A1 (ja) | 2023-06-01 |
| US20240313129A1 (en) | 2024-09-19 |
| CN118339662A (zh) | 2024-07-12 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| R012 | Request for examination validly filed | ||
| R079 | Amendment of ipc main class |
Free format text: PREVIOUS MAIN CLASS: H01L0029872000 Ipc: H10D0008600000 |
|
| R016 | Response to examination communication |