DE10329976A1 - Mechanical fixing device securing substrate to substrate electrode e.g. for plasma treatment of semiconductor wafer, using pneumatic adjustment of clamp relative to substrate support surface - Google Patents
Mechanical fixing device securing substrate to substrate electrode e.g. for plasma treatment of semiconductor wafer, using pneumatic adjustment of clamp relative to substrate support surface Download PDFInfo
- Publication number
- DE10329976A1 DE10329976A1 DE2003129976 DE10329976A DE10329976A1 DE 10329976 A1 DE10329976 A1 DE 10329976A1 DE 2003129976 DE2003129976 DE 2003129976 DE 10329976 A DE10329976 A DE 10329976A DE 10329976 A1 DE10329976 A1 DE 10329976A1
- Authority
- DE
- Germany
- Prior art keywords
- substrate
- clamping means
- support surface
- substrate electrode
- clamping
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
- H01L21/68714—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
- H01L21/68721—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by edge clamping, e.g. clamping ring
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
- H01L21/68714—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
- H01L21/68742—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by a lifting arrangement, e.g. lift pins
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- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
Abstract
Description
Die Erfindung betrifft eine Vorrichtung und ein Verfahren zur Fixierung eines Substrates im Vakuum mit den im Oberbegriff des Anspruchs 1 und des Anspruchs 17 genannten Merkmalen.The The invention relates to a device and a method for fixation a substrate in vacuum with in the preamble of the claim 1 and of claim 17 mentioned features.
Zur Herstellung elektronischer Bauelemente werden Halbleiter-Wafer in Plasmaanlagen behandelt. Dabei ist es zur Sicherung der Uniformität des Plasmaprozesses erforderlich, den Halbleiter-Wafer innerhalb eines Rezipienten fixieren zu können, so dass auf den fixierten Halbleiter-Wafer ein bestimmter Druck ausgeübt werden kann, um über den gesamten oder einen definierten Bereich des Halbleiter-Wafers, in dem elektronische Bauelemente ausgebildet werden, einen konstanten Wärmezustand zu gewährleisten.to Production of electronic components are semiconductor wafers in Plasma systems treated. It is to ensure the uniformity of the plasma process required to fix the semiconductor wafer within a recipient to be able to so that a certain pressure is exerted on the fixed semiconductor wafer can to over the entire or a defined area of the semiconductor wafer, in which electronic components are formed, a constant thermal state to ensure.
Dabei es ist es vorteilhaft, den Wafer mechanisch auf der Substratelektrode zu fixieren. Elektrostatische Fixiermechanismen sind insbesondere bei isolierenden Substraten nicht realisierbar.there it is advantageous to place the wafer mechanically on the substrate electrode to fix. Electrostatic fixing mechanisms are in particular not possible with insulating substrates.
Für eine mechanische
Fixierung eines Substrates auf einer Substratelektrode ist es bekannt, den äußeren Bereich
der Oberseite der Substratelektrode gegen ein Klemmmittel zu verspannen.
Als Klemmmittel kommen nach innen vorstehende Klemmfinger oder ein
geschlossener Klemmring in Betracht. Dabei ist in der Regel das
Klemmmittel und/oder das Substrat federnd gelagert. Die auf das Substrat
wirkende Klemmkraft resultiert dann aus der Federkraft des Klemmmittels
oder des Substrates. Eine gattungsgemäße Vorrichtung ist aus
Nachteilig
an den bekannten Vorrichtungen ist die schlechte Dosierbarkeit der
auf das Substrat wirkenden Klemmkraft. Insbesondere ist es bei der aus
Es ist daher Aufgabe der vorliegenden Erfindung, eine Vorrichtung und ein Verfahren zum Fixieren eines Substrates anzugeben, durch welche eine genaue und stufenlose Dosierung der Klemmkraft ermöglicht wird. Weiterhin soll die Anzahl der im Plasma befindlichen Komponenten minimal sein, um Verschleißerscheinungen zu minimieren.It is therefore an object of the present invention, an apparatus and to provide a method for fixing a substrate, by which an accurate and continuous dosing of the clamping force is made possible. Furthermore, the number of components located in the plasma be minimal to wear and tear to minimize.
Diese Aufgabe wird erfindungsgemäß gelöst durch die Merkmale im kennzeichnenden Teil des Anspruchs 1 (Vorrichtungsanspruch) und im kennzeichnenden Teil des Anspruchs 17 (Verfahrensanspruch) im Zusammenwirken mit den Merkmalen im Oberbegriff. Zweckmäßige Ausgestaltungen der Erfindung sind in den Unteransprüchen enthalten.These The object is achieved by the features in the characterizing part of claim 1 (device claim) and in the characterizing part of claim 17 (method claim) in Interaction with the features in the preamble. Advantageous embodiments The invention are contained in the subclaims.
Ein besonderer Vorteil der Erfindung besteht in der besonders guten Dosierbarkeit der auf ein Substrat wirkenden Klemmkraft. Hierdurch wird insbesondere eine bestmögliche Fixierung sowohl robuster als auch fragiler Substrate ermöglicht. Dabei kann die eingestellte Klemmkraft auch bei Temperaturänderungen während eines Plasmaprozesses konstant gehalten werden. Weiterhin ist es während des Plasmaprozesses möglich, die auf das Substrat wirkende Klemmkraft zu variieren.One particular advantage of the invention is the particularly good Dosability of acting on a substrate clamping force. hereby in particular, will be the best possible Fixation of both robust and fragile substrates allows. The set clamping force can also change with temperature while a plasma process are kept constant. It continues while the plasma process possible, to vary the clamping force acting on the substrate.
Dazu ist das Verstellmittel einer erfindungsgemäßen Vorrichtung zur Variation des Abstandes zwischen Klemmmittel und Auflagefläche zumindest teilweise ein pneumatisches Mittel. In einer bevorzugten Ausführungsvariante weist das Verstellmittel mindestens einen Hubzylinder auf, welcher über mindestens einen Hubstift mit dem Klemmmittel verbunden ist. Der zumindest teilweise innerhalb der Substratelektrode höhenbeweglich angeordnete Hubstift schließt mit der Substratelektrode vakuumdicht ab. Weiterhin ist der Hubzylinder innerhalb der Substratelektrode angeordnet und der Hubstift mittels mindestens eines Federbalges, welcher vorzugsweise ein Membranfederbalg ist, gedichtet. Durch die pneumatische Ausbildung des Verstellmittels lässt sich die auf das Verstellmittel und damit die auf das Substrat wirkende Kraft besonders gut dosieren. Zur Fixierung des Substrates auf der Auflagefläche wird das mit dem pneumatischen Verstellmittel verbundene Klemmmittel, welches vorzugsweise aus einem Dielektrikum besteht, relativ zur Auflagefläche bewegt, bis das zwischen Auflagefläche und Klemmmittel angeordnete Substrat vollständig arretiert ist. Dabei ist es insbesondere vorteilhaft, dass sich lediglich das Klemmmittel und ein Teil des mindestens einen Hubstiftes im Plasma befindet. Durch die Abdichtung des Hubstiftes mittels eines Membranfederbalges wird das In-Kontakt-treten des Plasmas mit den Hubzylindern vermieden.To is the adjusting means of a device according to the invention for variation the distance between the clamping means and support surface at least partially pneumatic agent. In a preferred embodiment, the adjusting means at least a lifting cylinder on which over at least one lifting pin is connected to the clamping means. Of the at least partially vertically movable within the substrate electrode arranged lifting pin closes with the substrate electrode vacuum-tight. Furthermore, the lifting cylinder disposed within the substrate electrode and the lifting pin by means of at least one bellows, which is preferably a diaphragm bellows is, poems. Due to the pneumatic design of the adjusting let yourself the force acting on the adjusting means and thus on the substrate especially good. To fix the substrate on the support surface is the clamping means connected to the pneumatic adjusting means, which preferably consists of a dielectric, relative to bearing surface moved until the arranged between the bearing surface and clamping means Substrate completely is locked. It is particularly advantageous that only the clamping means and a part of the at least one lifting pin is located in the plasma. By sealing the lifting pin means a diaphragm bellows will contact the plasma avoided with the lifting cylinders.
In einer besonders bevorzugten Ausführungsvariante sind die Hubzylinder beheizbar ausgeführt und/oder als Druckluft-Hubzylinder ausgebildet. Die vorzugsweise zwei Druckluft-Hubzylinder sind mit einem Druckluftregler, welcher vorzugsweise außerhalb des Rezipienten angeordnet ist, verbunden. Weiterhin ist es in einer bevorzugten Ausführungsvariante vorgesehen, dass die Substratelektrode eine Heizung, eine Kühlung, einen Hochfrequenzanschluss, ein Mittel zur Temperaturmessung und/oder ein Mittel zur thermischen Kontaktierung des Substrates aufweist. Dabei weist das Mittel zur Temperaturmessung vorzugsweise einen Sensor auf, welcher zumindest teilweise in die Substratelektrode integriert ist. Dabei weist der Sensor einen besseren thermischen Kontakt zum Substrat als zur Substratelektrode auf. Ferner ist es vorgesehen, dass die Vorrichtung ein Mittel zur Spülung des Innenraumes der Substratelektrode mit Stickstoff aufweist.In a particularly preferred embodiment the lifting cylinders are designed heatable and / or compressed air lifting cylinder educated. The preferably two compressed air lifting cylinders are with a compressed air regulator, which is preferably arranged outside of the recipient is connected. Furthermore, it is in a preferred embodiment provided that the substrate electrode, a heating, a cooling, a High-frequency connection, a means for temperature measurement and / or a Having means for thermal contacting of the substrate. there the means for measuring temperature preferably has a sensor which is at least partially integrated into the substrate electrode is. In this case, the sensor has a better thermal contact to Substrate as the substrate electrode. It is also intended in that the device comprises a means for flushing the interior of the substrate electrode having nitrogen.
Beim erfindungsgemäßen Verfahren zum Fixieren eines Substrates wird die Relativbewegung von Auflagefläche und Klemmmittel zumindest teilweise durch eine pneumatische Kraft bewirkt.At the inventive method for fixing a substrate, the relative movement of support surface and Clamping means effected at least partially by a pneumatic force.
Die Erfindung soll nachstehend anhand eines zumindest teilweise in der Figur dargestellten Ausführungsbeispieles näher erläutert werden.The Invention is based on an at least partially in the Figure illustrated embodiment be explained in more detail.
Es zeigt:It shows:
Zur
Plasmabehandlung eines Substrates
Zunächst wird
das Substrat
Insbesondere
vorteilhaft ist, dass mit der erfindungsgemäßen Vorrichtung die auf das
Substrat
Die Erfindung ist nicht beschränkt auf das hier dargestellte Ausführungsbeispiel. Vielmehr ist es möglich, durch Kombination und Modifikation der genannten Mittel und Merkmale weitere Ausführungsvarianten zu realisieren, ohne den Rahmen der Erfindung zu verlassen.The Invention is not limited to the embodiment shown here. Rather, it is possible by combination and modification of said means and features further variants to realize without departing from the scope of the invention.
- 1010
- Rezipientrecipient
- 2020
- SubstratelektodeSubstratelektode
- 3030
- Substratsubstratum
- 3535
- Auflageflächebearing surface
- 4040
- Klemmmittelclamping means
- 5050
- Hubzylinderlifting cylinder
- 5555
- HubstiftLifting pin
- 6060
- Federbalgbellows
- 7070
- DruckluftreglerAir Regulator
Claims (18)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE2003129976 DE10329976A1 (en) | 2003-06-26 | 2003-06-26 | Mechanical fixing device securing substrate to substrate electrode e.g. for plasma treatment of semiconductor wafer, using pneumatic adjustment of clamp relative to substrate support surface |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE2003129976 DE10329976A1 (en) | 2003-06-26 | 2003-06-26 | Mechanical fixing device securing substrate to substrate electrode e.g. for plasma treatment of semiconductor wafer, using pneumatic adjustment of clamp relative to substrate support surface |
Publications (1)
Publication Number | Publication Date |
---|---|
DE10329976A1 true DE10329976A1 (en) | 2005-02-03 |
Family
ID=33559841
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE2003129976 Ceased DE10329976A1 (en) | 2003-06-26 | 2003-06-26 | Mechanical fixing device securing substrate to substrate electrode e.g. for plasma treatment of semiconductor wafer, using pneumatic adjustment of clamp relative to substrate support surface |
Country Status (1)
Country | Link |
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DE (1) | DE10329976A1 (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN108345178A (en) * | 2017-01-25 | 2018-07-31 | 上海微电子装备(集团)股份有限公司 | A kind of silicon chip edge protection device |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4385434A (en) * | 1981-06-08 | 1983-05-31 | Visidyne, Inc. | Alignment system |
US5316278A (en) * | 1992-09-18 | 1994-05-31 | Applied Materials, Inc. | Clamping ring apparatus for processing semiconductor wafers |
DE69008228T2 (en) * | 1989-04-11 | 1994-09-08 | Tokyo Electron Ltd., Tokio/Tokyo | Plasma processing device. |
DE19713034A1 (en) * | 1996-03-27 | 1997-10-30 | Surface Technology Systems Ltd | Clamping device |
DE10134513A1 (en) * | 2001-07-16 | 2003-01-30 | Unaxis Balzers Ag | Lifting and support device |
-
2003
- 2003-06-26 DE DE2003129976 patent/DE10329976A1/en not_active Ceased
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4385434A (en) * | 1981-06-08 | 1983-05-31 | Visidyne, Inc. | Alignment system |
DE69008228T2 (en) * | 1989-04-11 | 1994-09-08 | Tokyo Electron Ltd., Tokio/Tokyo | Plasma processing device. |
US5316278A (en) * | 1992-09-18 | 1994-05-31 | Applied Materials, Inc. | Clamping ring apparatus for processing semiconductor wafers |
DE19713034A1 (en) * | 1996-03-27 | 1997-10-30 | Surface Technology Systems Ltd | Clamping device |
DE10134513A1 (en) * | 2001-07-16 | 2003-01-30 | Unaxis Balzers Ag | Lifting and support device |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN108345178A (en) * | 2017-01-25 | 2018-07-31 | 上海微电子装备(集团)股份有限公司 | A kind of silicon chip edge protection device |
CN108345178B (en) * | 2017-01-25 | 2020-11-13 | 上海微电子装备(集团)股份有限公司 | Silicon chip edge protection device |
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OP8 | Request for examination as to paragraph 44 patent law | ||
8131 | Rejection |