DE102021108930B3 - Signalprüfung - Google Patents

Signalprüfung Download PDF

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Publication number
DE102021108930B3
DE102021108930B3 DE102021108930.1A DE102021108930A DE102021108930B3 DE 102021108930 B3 DE102021108930 B3 DE 102021108930B3 DE 102021108930 A DE102021108930 A DE 102021108930A DE 102021108930 B3 DE102021108930 B3 DE 102021108930B3
Authority
DE
Germany
Prior art keywords
signal
source
test
function
destination
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
DE102021108930.1A
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German (de)
English (en)
Inventor
Muhammad Hassan
Jens Rosenbusch
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Infineon Technologies AG
Original Assignee
Infineon Technologies AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Infineon Technologies AG filed Critical Infineon Technologies AG
Priority to DE102021108930.1A priority Critical patent/DE102021108930B3/de
Priority to US17/713,308 priority patent/US12196803B2/en
Priority to JP2022064352A priority patent/JP2022161888A/ja
Application granted granted Critical
Publication of DE102021108930B3 publication Critical patent/DE102021108930B3/de
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836—Fault-finding or characterising
    • G01R31/2839—Fault-finding or characterising using signal generators, power supplies or circuit analysers
    • G01R31/2841—Signal generators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31712—Input or output aspects
    • G01R31/31715—Testing of input or output circuits; test of circuitry between the I/C pins and the functional core, e.g. testing of input or output driver, receiver, buffer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31725—Timing aspects, e.g. clock distribution, skew, propagation delay
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3177—Testing of logic operation, e.g. by logic analysers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/52—Testing for short-circuits, leakage current or ground faults

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Tests Of Electronic Circuits (AREA)
DE102021108930.1A 2021-04-09 2021-04-09 Signalprüfung Active DE102021108930B3 (de)

Priority Applications (3)

Application Number Priority Date Filing Date Title
DE102021108930.1A DE102021108930B3 (de) 2021-04-09 2021-04-09 Signalprüfung
US17/713,308 US12196803B2 (en) 2021-04-09 2022-04-05 Signal test
JP2022064352A JP2022161888A (ja) 2021-04-09 2022-04-08 信号テスト

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE102021108930.1A DE102021108930B3 (de) 2021-04-09 2021-04-09 Signalprüfung

Publications (1)

Publication Number Publication Date
DE102021108930B3 true DE102021108930B3 (de) 2022-10-13

Family

ID=83361495

Family Applications (1)

Application Number Title Priority Date Filing Date
DE102021108930.1A Active DE102021108930B3 (de) 2021-04-09 2021-04-09 Signalprüfung

Country Status (3)

Country Link
US (1) US12196803B2 (https=)
JP (1) JP2022161888A (https=)
DE (1) DE102021108930B3 (https=)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20100188097A1 (en) 2009-01-23 2010-07-29 Chinsong Sul Fault testing for interconnections

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3449231B2 (ja) * 1998-08-14 2003-09-22 日本電気株式会社 シリアルデータ監視装置
US6917916B2 (en) * 2001-12-13 2005-07-12 Motorola, Inc. Method and apparatus for testing digital channels in a wireless communication system
EP2752768B1 (en) * 2003-05-28 2016-11-02 Polaris Innovations Limited Error detection in a circuit module
US7945831B2 (en) * 2008-10-31 2011-05-17 Texas Instruments Incorporated Gating TDO from plural JTAG circuits
JP2016025641A (ja) * 2014-07-24 2016-02-08 エヌ・ティ・ティ・コミュニケーションズ株式会社 通信システム、通信装置、データ通信方法、及びプログラム
US20160349320A1 (en) * 2015-05-26 2016-12-01 Qualcomm Incorporated Remote bus wrapper for testing remote cores using automatic test pattern generation and other techniques
JP7204698B2 (ja) * 2020-03-11 2023-01-16 株式会社東芝 故障検出回路及び半導体装置

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20100188097A1 (en) 2009-01-23 2010-07-29 Chinsong Sul Fault testing for interconnections

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
AKARE, U. [u.a.]: Performance of Simulink based SS-OFDM model for Broadband Wireless Access Network. In: Second International Conference on Emerging Trends in Engineering & Technology, 16-18 December 2009, pp. 1132 – 1137.

Also Published As

Publication number Publication date
US20220326298A1 (en) 2022-10-13
JP2022161888A (ja) 2022-10-21
US12196803B2 (en) 2025-01-14

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