DE102011101476A1 - Method for 3D measurement of objects - Google Patents
Method for 3D measurement of objects Download PDFInfo
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- DE102011101476A1 DE102011101476A1 DE102011101476A DE102011101476A DE102011101476A1 DE 102011101476 A1 DE102011101476 A1 DE 102011101476A1 DE 102011101476 A DE102011101476 A DE 102011101476A DE 102011101476 A DE102011101476 A DE 102011101476A DE 102011101476 A1 DE102011101476 A1 DE 102011101476A1
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- 238000000034 method Methods 0.000 title claims abstract description 32
- 238000005259 measurement Methods 0.000 title claims description 29
- 230000003287 optical effect Effects 0.000 claims abstract description 15
- 238000011156 evaluation Methods 0.000 claims abstract description 4
- 238000001514 detection method Methods 0.000 claims abstract description 3
- 230000033001 locomotion Effects 0.000 claims description 11
- 238000003908 quality control method Methods 0.000 abstract description 2
- 238000004441 surface measurement Methods 0.000 abstract 1
- 238000005286 illumination Methods 0.000 description 2
- 238000003909 pattern recognition Methods 0.000 description 2
- BUHVIAUBTBOHAG-FOYDDCNASA-N (2r,3r,4s,5r)-2-[6-[[2-(3,5-dimethoxyphenyl)-2-(2-methylphenyl)ethyl]amino]purin-9-yl]-5-(hydroxymethyl)oxolane-3,4-diol Chemical compound COC1=CC(OC)=CC(C(CNC=2C=3N=CN(C=3N=CN=2)[C@H]2[C@@H]([C@H](O)[C@@H](CO)O2)O)C=2C(=CC=CC=2)C)=C1 BUHVIAUBTBOHAG-FOYDDCNASA-N 0.000 description 1
- 238000013459 approach Methods 0.000 description 1
- 230000001427 coherent effect Effects 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 238000012937 correction Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 238000006073 displacement reaction Methods 0.000 description 1
- 238000003384 imaging method Methods 0.000 description 1
- 238000013208 measuring procedure Methods 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 238000001314 profilometry Methods 0.000 description 1
- 230000011664 signaling Effects 0.000 description 1
- 230000001360 synchronised effect Effects 0.000 description 1
Images
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
- G01B11/2518—Projection by scanning of the object
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
- G01B11/2513—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object with several lines being projected in more than one direction, e.g. grids, patterns
Abstract
Aufgabe war es, Objekte mit geringem Aufwand, schnellstmöglich und hochgenau dreidimensional zu vermessen. Erfindungsgemäß wird zumindest ein statistisches optisches Muster, vorzugsweise eines Lichtbilds (3) von einem Projektor (4), zur standortunterschiedlichen Detektion und dreidimensionalen Auswertung auf die zu vermessende Oberfläche (2) eines Objekt (1) abgebildet und dort in Lage und/oder Form, beispielsweise durch einen motorisch (6) bewegten Umlenkspiegel (5) beliebig verändert. Das Verfahren wird zur schnellen und hochauflösenden optische Oberflächenvermessung, wie der Qualitätskontrolle, eingesetzt.The task was to measure objects with little effort, as quickly as possible and with high accuracy in three dimensions. According to the invention, at least one statistical optical pattern, preferably a light image (3) from a projector (4), is imaged on the surface (2) of an object (1) to be measured for location-different detection and three-dimensional evaluation and there in position and / or shape, for example, changed as required by a motorized (6) moving deflection mirror (5). The method is used for fast and high-resolution optical surface measurement, such as quality control.
Description
Die Erfindung betrifft ein Verfahren zur schnellstmöglichen und hochgenauen 3D-Messung von Objekten, bei dem statistische Muster auf das zu vermessende Objekt projiziert werden, die von im Standort unterschiedlichen Bildansichten als korrespondierende Bildmuster des Objekts, beispielsweise durch Kameras, detektiert werden. Aus dem Vergleich dieser unterschiedlichen Bildmuster werden Rauminformationen für die dreidimensionale Rekonstruktion des Objektes gewonnen.The invention relates to a method for the fastest possible and highly accurate 3D measurement of objects, in which statistical patterns are projected onto the object to be measured, which are detected by different image views in the image as corresponding image pattern of the object, for example by cameras. From the comparison of these different image patterns, spatial information for the three-dimensional reconstruction of the object is obtained.
In vielen Bereichen sind schnell messende optische 3D-Messsysteme erforderlich. So werden zur Analyse von Airbag-Entfaltungen, Schadensanalyse von Unfallszenarien, und Fahrzeugcrashs bereits optische Verfahren eingesetzt, wobei jedoch nur wenige Zielmarken und damit 3D-Punkte der Szene verfolgt werden bzw. bei dicht messenden Verfahren nur sehr ungenaue 3D-Daten gewonnen werden können. Für die Qualitätskontrolle von Industriegütern im Fließbandbetrieb sind eine hohe Messrate, sowie die Toleranz gegenüber Objektbewegungen entscheidend. Hochgenaue Verfahren zur 3D-Vermessung konnten für diese Messaufgaben bisher nicht eingesetzt werden, da die geforderten, kurzen Messzeiten technisch nicht realisierbar waren. Für medizinische Zwecke ist die Vermessung von bewegten Körperteilen zur Diagnose von Fehlstellungen hilfreich. Im Bereich der Sportwissenschaft kann die Analyse der Bewegung von Körperteilen und/oder Personen zur Optimierung von Bewegungsabläufen eingesetzt werden, wobei bisher lediglich Zielmarken eingesetzt werden konnten, und damit nur vereinfachte Modelle mit Daten gespeist werden konnten. Das gleiche Problem besteht bei der Digitalisierung bewegter Szenen für die multimediale Nutzung, sei es die Bewegung von Schauspielern oder von bewegten Gegenständen. Insbesondere durch die immer stärkere Verbreitung von 3D-Fernsehen wird die 3D-Digitalisierung in der nahen Zukunft an Bedeutung gewinnen, und damit die Anforderungen an die Qualität von 3D-Aufnahmen zunehmen. Weiterhin werden in den nächsten Jahren hochauflösende Hochgeschwindigkeitskameras verfügbar sein, da die aktuelle Schnittstellengeneration (z. B. USB 3.0, LightPeak) höhere Aufnahmeraten zulässt (bis 1000 Hz bei VGA-Auflösung), und damit die bisher hohen Kamerasystemkosten deutlich sinken werden. In diesem Kontext ist daher die Entwicklung eines schnell und hochgenau messenden Systems für viele Anwendungsbereiche gewünscht.Many areas require fast 3D optical measurement systems. Thus, for the analysis of airbag deployments, damage analysis of accident scenarios, and vehicle crashes already optical methods are used, but only a few targets and thus 3D points of the scene are tracked or densely measuring methods only very inaccurate 3D data can be obtained. For the quality control of industrial goods in assembly line operation, a high measuring rate and the tolerance to object movements are decisive. High-precision methods for 3D measurement could not be used for these measuring tasks until now because the required, short measuring times were not technically feasible. For medical purposes, the measurement of moving parts of the body is helpful for diagnosing malpositions. In the field of sports science, the analysis of the movement of body parts and / or persons can be used to optimize movement sequences, whereby so far only targets could be used, and thus only simplified models could be fed with data. The same problem exists with the digitization of moving scenes for multimedia use, be it the movement of actors or moving objects. In particular, the increasing use of 3D television will increase the importance of 3D digitization in the near future and thus increase the quality requirements of 3D recordings. Furthermore, high-resolution, high-speed cameras will be available over the next few years, since the current interface generation (eg USB 3.0, LightPeak) allows higher recording rates (up to 1000 Hz with VGA resolution), and thus the previously high camera system costs will drop significantly. In this context, therefore, the development of a fast and highly accurate measuring system is desired for many applications.
Bekannt sind Verfahren zur hochgenauen (relative Messunsicherheit < 10–4) und dichten 3D-Vermessung von Objekten unter Verwendung strukturierter Beleuchtung. Dazu zählen beispielsweise Verfahren der Streifenprojektion (
Die Verfahren, welche höchsten Genauigkeitsanforderungen genügen, benötigen zur Realisierung der Messgenauigkeit für beliebige also auch unstetige und getrennte Objekte längere Bildsequenzen (zwischen zehn und 50 Bildern pro Kamera). Aus der Literatur sind keine hochgenau und dicht messenden Verfahren bekannt, welche mit mehr als 15 Hz Aufnahme- und Projektionsrate betrieben werden können, wobei der limitierende Faktor die Projektionstechnik darstellt (
Bekannt sind auch Verfahren zur genauen 3D-Vermessung (relative Messunsicherheit 10–3 bis 10–4), welche mit Sequenzlängen von fünf bis zwanzig Bildern dichte Rekonstruktionen erlauben. Durch speziell angepasste Hardware wurden hier Projektionsraten von bis zu 180 Hz (
Weiterhin sind neuere Arbeiten zur Hochgeschwindigkeitsvermessung bekannt (
Alle beschriebenen Verfahren benötigen für die Signalisierung der Objektoberfläche bei komplexen Objekten verschiedene Musterstrukturen, so dass der Einsatz von digitalen Projektoren wie DMD oder LCD-Projektoren zwingend ist, und folglich die maximale Projektionsrate für hohe Messgenauigkeiten technisch auf 255 Hz sowie für schlechtere Messgenauigkeiten durch Projektion von Binärbildern auf 10.000 Hz begrenzt ist. Mit diesem bekannten Stand der Technik sind deshalb hochgenaue, dichte 3D-Vermessungen mit kurzen Messzeiten bisher nicht realisierbar.All of the described methods require different pattern structures for the signaling of the object surface in complex objects, so that the use of digital projectors such as DMD or LCD projectors is mandatory, and consequently the maximum projection rate for high measurement accuracies technically to 255 Hz and for worse measurement accuracies by projection of Binary images is limited to 10,000 Hz. With this known state of the art, therefore, highly accurate, dense 3D measurements with short measuring times have not been possible up to now.
Der Erfindung liegt die Aufgabe zu Grunde, das Objekt mit geringem Aufwand, schnellstmöglich und hochgenau dreidimensional zu vermessen.The invention is based on the object to measure the object with little effort, as quickly as possible and highly accurate three-dimensional.
Dabei sollen bei hohen Messgenauigkeiten (relative Messgenauigkeit besser als 1.0·10–4) sehr schnelle 3D Aufnahmeraten (höher als 200 Hz, d. h. mehr als 200 3D Aufnahmen pro Sekunde) erzielbar sein.At high measurement accuracies (relative measurement accuracy better than 1.0 · 10 -4 ), very fast 3D acquisition rates (higher than 200 Hz, ie more than 200 3D images per second) should be achievable.
Diese Aufgabe wird gelöst durch ein Verfahren zur 3D-Vermessung von Objekten, bei dem mindestens ein statistisches optisches Muster zur standortunterschiedlichen Detektion und dreidimensionalen Auswertung auf das Objekt abgebildet und dort in Lage und/oder Form beliebig verändert wird.This object is achieved by a method for 3D measurement of objects, in which at least one statistical optical pattern for location-differentiated detection and three-dimensional evaluation is imaged onto the object, where it is arbitrarily changed in position and / or shape.
Bei einer Vorrichtung zur Durchführung dieses Verfahrens ist zumindest eine Lichtquelle (Konstantlichtquelle oder steuerbare Pulslichtquelle) zur Erzeugung des zumindest einen statistischen und standortunterschiedlich zu dektektierenden optischen Musters vorgesehen, wobei im Strahlengang der Lichtquelle zum Objekt wenigstens ein den Strahlengang veränderndes Element angeordnet ist.In an apparatus for carrying out this method, at least one light source (constant light source or controllable pulsed light source) is provided for generating the at least one random optical pattern to be locally differentiated, wherein at least one element changing the beam path is arranged in the beam path of the light source.
Im Gegensatz zu allen im Stand der Technik beschriebenen Verfahren wird die Messgenauigkeit unter Verwendung einer einzigen statistischen Musterstruktur, welche in Form und/oder Lage auf dem Objekt kontinuierlich verändert wird, realisiert. Durch den Verzicht auf die Verwendung einer definierten Mustersequenz verschiedenartiger Musterstrukturen wird keine flexible Projektionseinheit benötigt. Damit werden alle Limitierungen, welche durch den Bildaufbau sowie die Projektionsrate üblicher Projektionseinheiten bestehen, umgangen. Das heißt insbesondere, dass mit beliebiger Aufnahmerate gearbeitet werden kann, da sich zum Beispiel eine Bewegung des Musters über das Objekt mit hinreichender großer Geschwindigkeit realisieren lässt, und somit das größte momentane Problem schnell messender Systeme behoben wird. Weiterhin wird durch die Art der Projektion auch im Fall schnell messender Systeme stets eine grauwertige Musterstruktur erzeugt, und somit die Messgenauigkeit bisheriger schnell messender Verfahren unter Verwendung hochfrequenter Binärbilder deutlich verbessert (in etwa um den Faktor 10). Des Weiteren ist die übliche Synchronisierung zwischen den Kameras und der Projektionseinheit nicht notwendig, da keine exakte Bildreihenfolge und/oder Lage des Musters eingehalten werden muss. Lediglich die Synchronisierung der Kameras untereinander muss sichergestellt werden. Dies erhöht die Flexibilität möglicher Messanordnungen, da keine Verbindung und kein direkter Informationsaustausch zwischen der Projektionsquelle und den Aufnahmegeräten mehr bestehen muss. Da zur Projektion des festen Musters hochwertige Projektionsgeräte, beispielsweise Dia-Projektoren, verwendet werden können, die im Vergleich mit anderen Projektoren, insbesondere modernen DLP-Projektoren, noch immer den höchsten Kontrastumfang sowie die größte Auflösung realisieren, ließen sich mit dem beschriebenen Verfahren auch langsam messende Verfahren bzgl. ihrer Messgenauigkeit verbessern. Darüber hinaus ist keine Korrektur der Gammafunktion des Projektionsgerätes notwendig, wie es bei digitalen Projektionsgeräten erforderlich ist. Weiterhin werden kein Ansteuerungsrechner und keine Ansteuerelektronik für die Projektionseinheit benötigt, was den Verfahrensaufwand weiter reduziert.In contrast to all methods described in the prior art, the measurement accuracy is realized using a single statistical pattern structure which is continuously changed in shape and / or position on the object. By eliminating the use of a defined pattern sequence of various pattern structures, no flexible projection unit is needed. Thus, all limitations that exist through the image structure and the projection rate of conventional projection units, bypassed. This means, in particular, that it is possible to work with any desired acquisition rate, since, for example, a movement of the pattern over the object can be realized with sufficient high speed, and thus the largest current problem of fast measuring systems is eliminated. Furthermore, the type of projection, even in the case of fast measuring systems, always produces a gray-scale pattern structure, and thus significantly improves the measurement accuracy of previous fast-measuring methods using high-frequency binary images (approximately by a factor of 10). Furthermore, the usual synchronization between the cameras and the projection unit is not necessary, since no exact picture order and / or position of the pattern must be maintained. Only the synchronization of the cameras with each other must be ensured. This increases the flexibility of possible measurement arrangements, since no connection and no direct exchange of information between the projection source and the recorders must exist. Since the projection of the fixed pattern high-quality projection equipment, such as slide projectors can be used, which still in comparison with other projectors, especially modern DLP projectors, realize the highest contrast range and the largest resolution, could be slow with the described method improve measuring procedures with regard to their measuring accuracy. In addition, no correction of the gamma function of the projection device is necessary, as is required in digital projection devices. Furthermore, no control computer and no control electronics for the projection unit are needed, which further reduces the processing costs.
Die Erfindung soll nachstehend anhand einer in der Zeichnung dargestellten Vorrichtung zur schnellen und hochgenauen 3D-Messung von Objekten als Ausführungsbeispiel näher erläutert werden.The invention will be explained below with reference to a device shown in the drawing for fast and high-precision 3D measurement of objects as an example.
Von einem Objekt
Mit zwei zueinander synchronisierten Kameras
BezugszeichenlisteLIST OF REFERENCE NUMBERS
- 11
- Objektobject
- 22
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Oberfläche des Objekts
1 Surface of theobject 1 - 33
- Lichtbildphotograph
- 44
- Projektorprojector
- 55
- Umlenkspiegeldeflecting
- 66
- Motorengine
- 77
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Achse des Motors
6 Axis of themotor 6 - 8, 98, 9
- Kameracamera
ZITATE ENTHALTEN IN DER BESCHREIBUNG QUOTES INCLUDE IN THE DESCRIPTION
Diese Liste der vom Anmelder aufgeführten Dokumente wurde automatisiert erzeugt und ist ausschließlich zur besseren Information des Lesers aufgenommen. Die Liste ist nicht Bestandteil der deutschen Patent- bzw. Gebrauchsmusteranmeldung. Das DPMA übernimmt keinerlei Haftung für etwaige Fehler oder Auslassungen.This list of the documents listed by the applicant has been generated automatically and is included solely for the better information of the reader. The list is not part of the German patent or utility model application. The DPMA assumes no liability for any errors or omissions.
Zitierte PatentliteraturCited patent literature
- DE 19623172 C1 [0003] DE 19623172 C1 [0003]
Zitierte Nicht-PatentliteraturCited non-patent literature
- W. Schreiber and G. Notni: Theory and arrangements of self-calibrating whole-body three-dimensional measurement systems using fringe projection technique, Optical Engineering 39, 2000, 159–169 [0003] W. Schreiber and G. Notni: Theory and arrangements of self-calibrating whole-body three-dimensional measurement systems using the fringe projection technique, Optical Engineering 39, 2000, 159-169 [0003]
- J. Gühring, Dense 3-D surface acquisition by structured light using off-the-shelf components, videometrics and optical methods for 3D shape measurement 4309, 2001, 220–231 [0003] J. Guhring, Dense 3-D surface acquisition by structured light using off-the-shelf components, videometrics and optical methods for 3D shape measurement 4309, 2001, 220-231 [0003]
- A. Wiegmann, H. Wagner, R. Kowarschik: Human face measurement by projecting bandlimited random patterns, Optics Express 14, 2006, 7692–7698 [0003] A. Wiegmann, H. Wagner, R. Kowarschik: Human Face Measurement by Projecting Bandlimited Random Patterns, Optics Express 14, 2006, 7692-7698 [0003]
- M. Schaffer, M. Große, and R. Kowarschik: High-speed pattern projection for three-dimensional shape measurement using laser speckles, Applied Optics 49(18), 2010, 3622–3629 [0004] M. Schaffer, M. Grosse, and R. Kowarschik: High-speed pattern projection for three-dimensional shape measurement using laser speckles, Applied Optics 49 (18), 2010, 3622-3629 [0004]
- S. Zhang: Recent progresses an real-time 3d shape measurement using digital fringe projection techniques, Optics and Lasers in Engineering 48, 2010, 149–158 [0004] S. Zhang: Recent progress in real-time 3d shape measurement using digital fringe projection techniques, optics and lasers in Engineering 48, 2010, 149-158 [0004]
- S. König and S. Gumhold: Image-based motion compensation for structured light scanning of dynamic surfaces, EG Workshop an Dynamic 3D Imaging, 2007 [0005] S.King and S.Gumhold: Image-based motion compensation for Structured Light Scanning of Dynamic Surfaces, EC Workshop on Dynamic 3D Imaging, 2007 [0005]
- Z. Wang, H. Du, S. Park and H. Xie: Three-dimensional shape mea-surement with a fast and accurate approach, Appl. Opt. 48(6), 2009, 1052–1061 [0005] Z. Wang, H. Du, S. Park and H. Xie: Three-dimensional shape mea-surement with a fast and accurate approach, Appl. Opt. 48 (6), 2009, 1052-1061 [0005]
- Y. Gong and S. Zhang: Ultrafast 3-d shape measurement with an off-the-shelf dlp projector, Optics Express 18(19), 2010, 19743–19754 [0006] Y. Gong and S. Zhang: Ultrafast 3-d shape measurement with an off-the-shelf dlp projector, Optics Express 18 (19), 2010, 19743-19754 [0006]
- Y. Wang and S. Zhang: Superfast multifrequency phase-shifting technique with optimal pulse width modulation, Optics Express 19, 2011, 5149–5155 [0006] Y. Wang and S. Zhang: Superfast multifrequency phase-shifting technique with Optimal Pulse Width Modulation, Optics Express 19, 2011, 5149-5155 [0006]
- S. S. Gorthi and P. Rastogi: Fringe projection techniques: Whither we are?, Optics and Lasers in Engineering 48, 2010, 133–140 [0006] SS Gorthi and P. Rastogi: Fringe projection techniques: Whither we are ?, Optics and Lasers in Engineering 48, 2010, 133-140 [0006]
- J. Salvi, S. Fernandez, T. Pribanic, and X. Llado: A state of the art in structured light patterns for surface profilometry. Pattern Recognition 43(8), 2010, 2666–2680 [0006] J. Salvi, S. Fernandez, T. Pribanic, and X. Llado: A state-of-the-art in structured light patterns for surface profilometry. Pattern Recognition 43 (8), 2010, 2666-2680 [0006]
Claims (10)
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DE102011101476.8A DE102011101476B4 (en) | 2011-05-11 | 2011-05-11 | Process for 3D measurement of objects |
PCT/DE2012/000511 WO2012152261A1 (en) | 2011-05-11 | 2012-05-10 | Method for the 3d-measurement of objects |
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DE102011121696A1 (en) | 2011-12-16 | 2013-06-20 | Friedrich-Schiller-Universität Jena | Method for 3D measurement of depth-limited objects |
DE102015001365A1 (en) | 2015-02-03 | 2016-08-04 | EnShape GmbH | METHOD FOR 3D-MEASUREMENT OF LIQUIDS AND GELS |
DE102017113475A1 (en) | 2016-06-20 | 2017-12-21 | Cognex Corporation | Device for projecting a temporally variable optical pattern onto an object to be measured three-dimensionally |
WO2017220598A1 (en) * | 2016-06-20 | 2017-12-28 | Cognex Corporation | Method for the three dimensional measurement of moving objects during a known movement |
DE102017007191A1 (en) | 2017-07-27 | 2019-01-31 | Friedrich-Schiller-Universität Jena | Method and device for pattern generation for the 3D measurement of objects |
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