CN224176688U - A substrate inspection device - Google Patents

Abstract

The utility model provides a substrate detection device, which belongs to the technical field of testing and comprises a placement part, a conductive part, a probe module and a probe module, wherein the conductive part is arranged on the placement part and is provided with a first position which is in abutting connection with a piece to be detected and a second position which is separated from the piece to be detected, the conductive part is electrically connected with a data acquisition module, the probe module is arranged on the placement part and is provided with a third position which is in abutting connection with a pin of a wire outlet of the piece to be detected and a fourth position which is separated from the pin of the wire outlet of the piece to be detected, the probe module is electrically connected with the data acquisition module, and the probe module can synchronously or asynchronously move along with the conductive part. The conductive part and the probe module cooperate to complete the detection of the electrical properties of the electrode area and the flat cable port of the workpiece to be detected in a single operation, thereby improving the detection efficiency and accuracy.

Description

Substrate detection device

Technical Field

The utility model belongs to the technical field of testing, and particularly relates to a substrate detection device.

Background

Electronic ink screens are widely used in the fields of electronic book readers, smart tags, industrial meters, wearable devices, and the like. As one of its core components, the electronic ink driving substrate bears key functions of signal transmission and pixel driving, and its electrical quality directly determines the final display effect. Therefore, after the completion of the production, it is necessary to perform strict inspection for each driving substrate.

Currently, the detection of the electrical performance of an electronic ink screen driving substrate in industry generally depends on manual operation, wherein an operator holds a universal meter probe or a simple clamp by hand, and aligns the common electrode area and the edge flat cable port on the back of the substrate one by one to respectively finish resistance measurement and short circuit judgment. However, the mode has the obvious defects of insufficient manual positioning precision, easy deviation of naked eyes alignment under the condition of micro-spacing line arrangement, easy false touch of adjacent pins by a probe, test data distortion, even false judgment rejection, low test efficiency, usually step-by-step resistance and short circuit detection, repositioning for each switching, and long single-piece test time consumption.

Disclosure of utility model

The utility model aims at solving the problems in the prior art and provides a detection device capable of completing detection of the electrical properties of an electrode area and a flat cable port of a piece to be detected in a single operation.

The object of the utility model can be achieved by the following technical scheme that the substrate detection device comprises:

A placement part including a placement plane for carrying a piece to be inspected;

The conductive part is arranged on the placing part and is provided with a first position which is in abutting connection with the to-be-detected piece and a second position which is separated from the to-be-detected piece, and the conductive part is electrically connected with the data acquisition module;

The probe module is arranged on the placing part, is provided with a third position which is in abutting connection with the pin of the flat cable port of the piece to be detected and a fourth position which is separated from the pin of the flat cable port of the piece to be detected, is electrically connected with the data acquisition module, and can synchronously or asynchronously move along with the conductive part.

In the above substrate detection device, along the length extending direction of the placement plane, two sides of the placement plane are oppositely provided with a limiting part for positioning the to-be-detected piece.

In the above-mentioned substrate detection device, offer the locating hole on waiting to detect the piece, spacing portion includes a plurality of spacing posts that place the plane on the interval set up, spacing post with the locating hole grafting cooperation, just spacing post can be followed place planar width direction and carry out position adjustment.

In the above substrate detection device, the conductive portion includes a conductive layer, and a conductive protection layer is disposed on the conductive layer, and the conductive protection layer can be in abutting connection with the to-be-detected member.

In the above substrate detection device, a flexible protection layer is disposed on the placement plane, and a surface of the flexible protection layer facing the conductive portion protrudes out of the placement plane.

In the above substrate detection device, the flexible protection layer is located between the limiting portions on two sides along the width direction of the placement plane.

In the above substrate detection device, the placement portion is provided with a conductive driving portion, and the conductive driving portion is in driving connection with the conductive portion to drive the conductive portion to move linearly, so that the conductive portion can be switched between a first position and a second position.

In the above substrate detection device, the probe module is connected with the conductive portion, and the probe module and the conductive portion can move synchronously and are in abutting connection or separation with the to-be-detected member.

In the above substrate detection device, the placement portion is fixedly provided with a guide rail, a first slider is slidably disposed on the guide rail, a second slider is relatively slidably disposed on the first slider, a sliding direction of the first slider is perpendicular to a sliding direction of the second slider, the probe module is disposed on the second slider and can be linearly adjusted relative to the second slider, and a linear adjustment direction of the probe module is perpendicular to the sliding direction of the first slider and the sliding direction of the second slider.

In the above substrate detection apparatus, a probe driving portion is disposed on the probe module, and the probe driving portion is in driving connection with the probe module to drive the probe module to move linearly, so that the probe module can be switched between a third position and a fourth position.

Compared with the prior art, the utility model has the beneficial effects that:

(1) In the detection process, after the to-be-detected piece is placed on the placement plane, the conductive part descends to a first position, the probe module moves to a third position and respectively establishes electrical connection with the to-be-detected piece, and through the cooperative action of the conductive part and the probe module, the synchronous electrical performance detection of the electrode area and the flat cable port of the to-be-detected piece can be completed in a single operation, so that the detection efficiency and accuracy are remarkably improved;

(2) Along the width direction of the placement plane, a plurality of first adjusting holes are oppositely arranged at intervals on two sides of the placement plane, the limiting columns are inserted and fixed in the first adjusting holes, and the transverse distance between the limiting columns can be flexibly adjusted according to the positioning hole distances of the to-be-detected pieces of different types (the limiting columns are inserted in the corresponding first adjusting holes);

(3) Along the width direction of the placing plane, the transverse dimension of the flexible protective layer is smaller than the width of the piece to be detected, and the whole flexible protective layer is positioned in the area between the limiting parts on two sides, and when the conductive part is pressed down, the flexible protective layer only acts on the electrode area above the flexible protective layer (the shape and the area of the flexible protective layer and the conductive layer are the same in the horizontal direction). The edge of the part to be detected directly falls on the rigid area of the placement plane, and the probe cannot be deformed to deviate, contact failure or scratch the flat cable.

Drawings

Fig. 1 is a schematic perspective view of a first embodiment;

FIG. 2 is an enlarged schematic view of the structure of FIG. 1 at A;

FIG. 3 is a schematic perspective view of the probe module of FIG. 1;

FIG. 4 is a schematic plan view of the structure of FIG. 1;

FIG. 5 is a schematic view of the placement section of FIG. 1 assembled with a flexible protective layer;

Fig. 6 is a schematic perspective view of the placement unit of fig. 1;

Fig. 7 is a schematic structural view of a structure equipped with a plurality of conductive driving parts;

fig. 8 is a schematic perspective view of the second embodiment.

In the figure, 100 parts of placement, 101 parts of placement plane, 102 parts of limit column, 103 parts of first regulation hole, 104 parts of flexible protective layer, 105 parts of placement concave, 200 parts of conductive part, 201 parts of conductive layer, 202 parts of conductive protective layer, 203 parts of conductive driving part, 204 parts of guide rail, 205 parts of first sliding block, 206 parts of second sliding block, 207 parts of second regulation hole, 300 parts of probe module, 301 parts of probe, 302 parts of probe seat, 303 parts of probe driving part, 400 parts of base, 401 parts of connecting plate, 402 parts of support column, 403 parts of connecting screw rod.

Detailed Description

The following are specific embodiments of the present utility model and the technical solutions of the present utility model will be further described with reference to the accompanying drawings, but the present utility model is not limited to these embodiments.

It should be noted that all directional indicators (such as up, down, left, right, front, and rear are used in the embodiments of the present utility model) are merely for explaining the relative positional relationship, movement conditions, and the like between the components in a certain specific posture (as shown in the drawings), and if the specific posture is changed, the directional indicators are changed accordingly.

First embodiment as shown in fig. 1 to 7, a substrate inspection apparatus is provided, which includes a placement part 100, a conductive part 200, and a probe module 300.

The placement part 100 is provided with a placement plane 101 for carrying the piece to be inspected, and the piece to be inspected is placed on the placement plane 101 smoothly.

The conductive portion 200 is disposed on the placement portion 100, specifically above the placement plane 101. The conductive part 200 can move to a first position in abutting connection with the member to be detected under the action of external driving, and can also retract to a second position separated from the member to be detected. The conductive portion 200 makes electrical contact with the electrode area of the part to be inspected when in the first position and is disengaged when in the second position. The conductive part 200 is electrically connected with the data acquisition module through a wire and is used for transmitting the acquired electric signals to the data acquisition module for analysis and processing.

The probe modules 300 are likewise arranged on the placement section 100, also above the placement plane 101. The probe module 300 includes a plurality of probes 301 having a third position abutting against the pin of the flat cable port of the workpiece to be inspected and a fourth position separated from the pin of the flat cable port of the workpiece to be inspected. In the third position, each probe 301 establishes an electrical connection with a corresponding pin, respectively, and in the fourth position, the probe 301 is out of contact with the pin. The probe module 300 is also electrically connected with the data acquisition module through a wire, so as to realize synchronous acquisition of signals.

In the detection process, after the to-be-detected piece is placed on the placement plane 101, the conductive part 200 descends to a first position, the probe module 300 moves to a third position and respectively establishes electrical connection with the to-be-detected piece, and through the cooperative action of the conductive part 200 and the probe module 300, the synchronous electrical performance detection of the electrode area and the flat cable port of the to-be-detected piece can be completed in a single operation, so that the detection efficiency and accuracy are remarkably improved.

Along the length extending direction of the placement plane 101, two sides of the placement plane 101 are oppositely provided with limiting parts for positioning the to-be-detected piece, and the to-be-detected piece is provided with positioning holes (generally positioned at the edge). Specifically, the limiting portion includes a plurality of limiting columns 102 that are disposed along the length direction of the placement plane 101 at intervals, as shown in fig. 5, as a specific embodiment, two limiting columns 102 are disposed on each side, and correspond to the positioning holes on the to-be-detected member one by one. During clamping, the positioning holes on the to-be-detected piece are aligned and sleeved into the limiting columns 102, so that the to-be-detected piece is effectively prevented from translating or rotating in the testing process.

In addition, along the width direction of placing plane 101, the both sides of placing plane 101 are relatively spaced apart and are equipped with a plurality of first regulation holes 103, and spacing post 102 grafting is fixed in first regulation hole 103, and the lateral distance between spacing post 102 can be according to the location pitch of the piece that waits to detect of different models and carry out nimble adjustment (with spacing post 102 grafting in corresponding first regulation hole 103 can).

Further, the conductive portion 200 includes a conductive layer 201, and a conductive protection layer 202 is disposed on the conductive layer 201, where the conductive protection layer 202 can be in abutting connection with the to-be-detected member. In this embodiment, the conductive protection layer 202 is made of aluminum foil, which has good conductivity, flexibility and surface flatness. When the conductive part 200 moves to the first position, the aluminum foil directly contacts with the electrode area of the to-be-detected piece, so that the coating on the surface of the to-be-detected piece is prevented from being scratched.

Further, a flexible protective layer 104 is provided on the placement plane 101, and a surface of the flexible protective layer 104 facing the conductive portion 200 protrudes from the placement plane 101. In this embodiment, the flexible protection layer 104 is a silica gel pad, which has good elasticity and surface adhesion.

Specifically, a placement recess 105 is provided in the central area of the placement plane 101, and a flexible protective layer 104 is provided in the placement recess 105 with its upper surface slightly higher than the rest of the placement plane 101, so that when the piece to be inspected is placed on the placement portion 100, it is held by the flexible protective layer 104. In the process that the conductive part 200 descends to the first position and contacts with the to-be-detected piece, the flexible protection layer 104 is pressed to generate elastic deformation, and the downward pressure is buffered, so that the to-be-detected piece is prevented from being warped or concentrated in stress due to the rigid support.

In particular, along the width direction of the placement plane 101, the lateral dimension of the flexible protection layer 104 is smaller than the width of the piece to be detected, and the whole flexible protection layer 104 is located in the area between the limiting parts on both sides, and when the conductive part 200 is pressed down, only acts on the electrode area above the flexible protection layer 104 (the shape and the area of the flexible protection layer 104 and the conductive layer 201 are the same in the horizontal direction). The edge of the to-be-detected piece directly falls on the rigid area of the placement plane 101, and the probe 301 cannot be deformed to deviate, be in poor contact or scratch the flat cable.

The placing part 100 is provided with a conductive driving part 203, and the conductive driving part 203 is in driving connection with the conductive part 200, and is used for driving the conductive part 200 to linearly move along a direction perpendicular to the placing plane 101, so that the conductive part is switched between a first position in abutting connection with the to-be-detected piece and a second position separated from the to-be-detected piece. In this embodiment, the device further includes a base 400, and the conductive driving portion 203 adopts an air cylinder, and the cylinder is fixed on the base 400, and the output end is fixedly connected with the conductive portion 200. When the cylinder is extended, the conductive part 200 is pushed to move down to a first position to contact with the electrode area of the member to be detected, and when the cylinder is retracted, the conductive part 200 is lifted to a second position to be separated from contact.

It should be noted that, when the number of the conductive driving portions 203 is one, the projection of the conductive driving portions 203 in the vertical direction is located in the central area of the placement plane 101, and when the number of the conductive driving portions 203 is multiple, the conductive driving portions 203 are distributed at intervals along the length direction of the placement plane 101 and symmetrically arranged in the central area of the placement plane 101, and the central collapse or the suspension of the edges is prevented by the multi-point synchronous pressing.

Specifically, a horizontal connection plate 401 is disposed on the base 400, the connection plate 401 is connected with the placement portion 100 through a plurality of support columns 402, and the placement portion 100 is elevated, so that the placement portion 100 is integrally located above the connection plate 401, and an operation space is formed between the connection plate 401 and the placement portion 100. In the operation space, at least one connection screw 403 (the end portion is provided with a handle) is provided, and the connection screw 403 passes through the connection plate 401 and is screwed with the base 400. The placement unit 100 can be firmly fixed to the base 400 or can be integrally detached from the base 400 by screwing or unscrewing the connection screw 403. It should be noted that, the placing portion 100 and the connection plate 401 are both made of insulating materials, and the output ends of the conductive portion 200 and the conductive driving portion 203 are fixedly connected through the insulating portions.

Further, the probe module 300 is connected to the conductive part 200, and both can move synchronously while being in interference connection with or separated from the object to be detected. Therefore, when the conductive driving part 203 operates, the conductive part 200 and the probe module 300 synchronously push down or retract as a whole, when the conductive part 200 contacts the electrode area of the member to be detected, the probes 301 of the probe module 300 synchronously contact the pin of the flat cable port, and when the conductive part and the probe module 300 retract, the conductive part and the probe module are simultaneously separated.

Specifically, the conductive portion 200 is fixedly provided with a guide rail 204, and the guide rail 204 extends along the length direction of the placement plane 101. A first slider 205 is slidably provided on the guide rail 204, and the first slider 205 can be fixed at any position by a locking screw. On the first slider 205, a second slider 206 is provided so as to slide relatively in a direction perpendicular to the sliding direction of the first slider 205, that is, in the thickness direction of the placement plane 101. The second slider 206 is also equipped with a position locking mechanism. The probe module 300 is mounted on the second slider 206, and the probe seat 302 of the probe module 300 is provided with a plurality of second adjusting holes 207 distributed along the width direction of the placement plane 101, and the set screw passes through the corresponding second adjusting hole 207 to be screwed with the second slider 206, so that the probe module 300 can be adjusted along the width direction of the placement plane 101.

Before batch detection, an operator first places the to-be-detected piece on the placement plane 101 (positioned by the limiting part), then manually adjusts the positions of the first slider 205 and the second slider 206, and uses a set screw to be screwed with the corresponding second adjusting hole 207, so that the probe module 300 is aligned to the flat cable port, and each probe 301 is ensured to accurately abut against the pin. After the first piece is debugged, all the sliding blocks and the adjusting mechanism are locked. The subsequent products in the same batch can automatically complete accurate contact by only being placed in place and controlling the probe module 300 to move down linearly without repeated adjustment.

In the second embodiment, as shown in fig. 8, the other structures are the same as those of the first embodiment, namely, the conductive driving part 203 is in driving connection with the conductive part 200, so as to drive the conductive part 200 to move linearly along the direction perpendicular to the placement plane 101, and the difference is that the probe modules 300 can move asynchronously relative to the conductive part 200, specifically, the structure is realized by that the guide rail 204 is fixed on the base 400 and does not move along with the conductive part 200 any more, and each probe module 300 is provided with a probe driving part 303, and the probe driving part 303 is in driving connection with the probe module 300, so as to drive the probe module 300 to move linearly along the direction perpendicular to the placement plane 101, thereby switching between a third position in abutting connection with the to-be-detected piece and a fourth position separated from the to-be-detected piece. Specifically, the probe driving portion 303 is an air cylinder, the cylinder body of the air cylinder is fixed on the second slider 206, and the fastening screw passes through the corresponding second adjusting hole 207 to be screwed with the output end of the probe driving portion 303, so that the probe module 300 can be adjusted along the width direction of the placement plane 101. When the probe driving part 303 acts, the whole probe module 300 is pushed to move downwards accurately along the vertical direction (namely, the direction perpendicular to the placement plane 101) so that the tips of the probes 301 are contacted with the flat cable pins, and after the test is finished, the probe driving part 303 retracts to drive the probe module 300 to retract to the fourth position and separate from the contact. For the to-be-detected piece with a plurality of flat cable ports, only the probe driving part 303 of the corresponding area can be started to drive the specific probe module 300 to act, and other modules are kept in a separated state, so that detection according to needs is realized, and unnecessary mechanical abrasion and signal interference are reduced.

It should be noted that the description of the present utility model as it relates to "first", "second", "a", etc. is for descriptive purposes only and is not to be construed as indicating or implying a relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defining "a first" or "a second" may explicitly or implicitly include at least one such feature. In the description of the present utility model, the meaning of "plurality" means at least two, for example, two, three, etc., unless specifically defined otherwise. The terms "connected," "secured," and the like are to be construed broadly, and may be, for example, fixedly connected, detachably connected, or integrally formed, mechanically connected, electrically connected, directly connected, indirectly connected via an intermediate medium, or in communication between two elements or in an interaction relationship between two elements, unless otherwise specifically defined. The specific meaning of the above terms in the present utility model can be understood by those of ordinary skill in the art according to the specific circumstances.

In addition, the technical solutions of the embodiments of the present utility model may be combined with each other, but it is necessary to be based on the fact that those skilled in the art can implement the technical solutions, and when the technical solutions are contradictory or cannot be implemented, the combination of the technical solutions should be considered as not existing, and not falling within the scope of protection claimed by the present utility model.

The specific embodiments described herein are offered by way of example only to illustrate the spirit of the utility model. Those skilled in the art may make various modifications or additions to the described embodiments or substitutions thereof without departing from the spirit of the utility model or exceeding the scope of the utility model as defined in the accompanying claims.

Claims (10)

1. A substrate inspection apparatus, comprising:

A placement part including a placement plane for carrying a piece to be inspected;

The conductive part is arranged on the placing part and is provided with a first position which is in abutting connection with the to-be-detected piece and a second position which is separated from the to-be-detected piece, and the conductive part is electrically connected with the data acquisition module;

The probe module is arranged on the placing part, is provided with a third position which is in abutting connection with the pin of the flat cable port of the piece to be detected and a fourth position which is separated from the pin of the flat cable port of the piece to be detected, is electrically connected with the data acquisition module, and can synchronously or asynchronously move along with the conductive part.

2. The substrate inspection apparatus according to claim 1, wherein the two sides of the placement plane are provided with a limiting portion for positioning the workpiece to be inspected, along a length extending direction of the placement plane.

3. The substrate detection apparatus according to claim 2, wherein the to-be-detected member is provided with a positioning hole, the limiting portion includes a plurality of limiting posts disposed on the placement plane at intervals, the limiting posts are in plug-in fit with the positioning hole, and the limiting posts can perform position adjustment along a width direction of the placement plane.

4. The substrate inspection apparatus according to claim 1, wherein the conductive portion comprises a conductive layer, and a conductive protection layer is disposed on the conductive layer, and the conductive protection layer is capable of being in abutting connection with the member to be inspected.

5. The substrate inspection apparatus according to claim 2, wherein a flexible protective layer is provided on the placement plane, and a surface of the flexible protective layer facing the conductive portion protrudes from the placement plane.

6. The substrate inspection apparatus according to claim 5, wherein the flexible protective layer is located between the limit portions on both sides in a width direction of the placement plane.

7. The substrate detection apparatus according to claim 1, wherein the placement portion is provided with a conductive driving portion, and the conductive driving portion is in driving connection with the conductive portion to drive the conductive portion to move linearly so as to be switchable between a first position and a second position.

8. The substrate inspection apparatus according to claim 7, wherein the probe module is connected to the conductive portion, and both are capable of moving synchronously while being in abutting connection with or separation from the object to be inspected.

9. The substrate detection apparatus according to claim 1, wherein a guide rail is fixedly provided on the placement portion, a first slider is slidably provided on the guide rail, a second slider is relatively slidably provided on the first slider, a sliding direction of the first slider is perpendicular to a sliding direction of the second slider, the probe module is provided on the second slider and is capable of performing linear adjustment with respect to the second slider, and a linear adjustment direction of the probe module is perpendicular to the sliding direction of the first slider and the sliding direction of the second slider.

10. The substrate inspection apparatus according to claim 1, wherein the probe module is provided with a probe driving part, and the probe driving part is in driving connection with the probe module to drive the probe module to move linearly so as to be capable of switching between a third position and a fourth position.