CN223955724U

CN223955724U - Multi-module insulation voltage withstand testing device

Info

Publication number: CN223955724U
Application number: CN202423252937.6U
Authority: CN
Inventors: 何陈鑫
Original assignee: Zhejiang Gulan Electronic Technology Co ltd
Current assignee: Zhejiang Gulan Electronic Technology Co ltd
Priority date: 2024-12-27
Filing date: 2024-12-27
Publication date: 2026-02-27
Anticipated expiration: 2034-12-27

Abstract

The utility model relates to a multi-module insulation voltage-withstanding testing device, which comprises a stress plate, an adjusting plate and a bottom plate, wherein the lower surface of the stress plate is fixedly arranged right above the adjusting plate through supporting legs on two sides, the adjusting plate is fixed on the upper surface of the bottom plate through adjusting posts on two sides of the bottom, a testing probe is arranged at the middle position of the adjusting plate through adjusting the height of the adjusting plate, a substrate is arranged right below the testing probe in a limiting manner through a limiting mounting seat, a plurality of placing grooves are formed in the substrate for placing modules to be tested, a testing circuit with testing lamps is welded on the bottom plate, two metal sheets are respectively arranged on the inner wall of each through hole, a certain distance is reserved between the upper end of each metal sheet and a pin of the module to be tested, and the lower ends of the metal sheets are connected with the testing circuit. The utility model has the advantages of simple and reasonable structure, practical, convenient and efficient test and the like.

Description

Multi-module insulation voltage withstand testing device

Technical Field

The utility model belongs to the technical field of module testing, and particularly relates to a multi-module insulation voltage withstand testing device.

Background

At present, the IGBT module is widely applied to the fields of air conditioner frequency converters, electric welding machines, photovoltaic inversion, wind power generation inversion and electric automobiles, and has more and more severe test requirements on discrete devices.

At present, when the discrete device of the IGBT on the market is used, part of the requirements have insulation characteristics, and the insulation voltage resistance test is of great significance before delivery. And the efficiency of the factory test of the discrete device of the IGBT with the insulating property is lower. The insulation test requirement is higher, up to several kilovolts of voltage, and the equipment of test is great, and is different from other test systems, and integrated integral type test is difficult. The discrete device is small and exquisite, and single test tool, test efficiency is low, and the test also can't detect the condition of test contact scheduling problem.

For this reason, a multi-module insulation and voltage withstand test device is designed to overcome the above problems.

Disclosure of utility model

The utility model aims to overcome the defects in the prior art and provide the multi-module insulation voltage withstand test device which has the advantages of simple and reasonable structure, practicality, convenience, high efficiency and safety in test.

The utility model is realized by the following technical scheme: the multi-module insulation voltage withstand test device comprises a test device body for performing insulation voltage withstand test on a module to be tested, wherein the test device body consists of a stress plate, an adjusting plate and a bottom plate, the lower surface of the stress plate is fixedly arranged right above the adjusting plate through supporting legs on two sides, the adjusting plate is fixed on the upper surface of the bottom plate through adjusting posts on two sides of the bottom, the height of the adjusting plate is adjusted through the adjusting posts, a plurality of through holes for installing test probes are formed in the middle position of the adjusting plate, part of the installed test probes are exposed out of the lower surface of the adjusting plate, part of the test probes are used as pin test probes through the positive electrode of a cable external power supply, part of the test probes are used as insulation test probes of the module to be tested through the negative electrode of the cable external power supply with an indicator lamp, a substrate is arranged on the upper surface of the bottom plate right below the test probes in a limiting manner through a limiting mounting seat, a plurality of placing grooves and a row of through holes which are uniformly arranged are formed in the substrate, a module to be tested is placed in each placing groove, each pin of the placed module to be tested corresponds to each through hole and each pin test probe in a one-to-one manner, an insulation part of the module to be tested corresponds to the insulation test probes of the module to be tested in an up-down manner, a test circuit with test lamps is welded on the lower surface of the bottom plate, two mutually independent metal sheets are respectively arranged on the inner wall of each through hole, a certain interval is reserved between the upper end of each metal sheet and each pin of the module to be tested, the lower end of each metal sheet is connected with the test circuit, the stress plate is pressed, the adjusting plate descends through the adjusting column, and each test probe descends along with the time, after the pin test probes prop against each pin of the module to be tested, the module to be tested is enabled to prop against the insulation part of the module to be tested while each pin is respectively contacted with the corresponding two metal sheets, at the moment, the test lamp of the test circuit is on, the indicator lamp is not on, the pin and the insulation part of the module to be tested are normal in performance, and otherwise, the module to be tested is abnormal.

Preferably, the adjusting column is hollow and is used for inserting and installing a vertically arranged spring, one end of the spring extends out of the adjusting column to be fixedly connected with the upper surface of the bottom plate, the other end of the spring extends out of the adjusting column to be fixedly connected with the lower surface of the adjusting plate, the height of the spring under the condition of no stress is higher than the height of the top surface of the adjusting column, the spring is pressed and contracted when the adjusting plate descends after being stressed, the adjusting plate descends along with the spring, when the adjusting plate supports against the adjusting column, the pin testing probe and the insulation testing probe of the module to be tested just support against each pin of the module to be tested and the insulation part of the module to be tested respectively.

The limiting mounting seat is two baffles which are arranged in the middle of the upper surface of the bottom plate and are of an inverted L-shaped structure, the two baffles are symmetrically arranged left and right, and a certain distance is arranged between the two baffles and used for horizontally inserting the substrate.

The test circuit is preferably composed of a manual switch, a test power supply, a resistor and a plurality of test lamps, wherein the manual switch, the test power supply and the resistor are sequentially arranged on a main circuit of the test circuit, one side of the main circuit is connected with a branch circuit composed of a plurality of parallel circuits, each parallel circuit is respectively provided with one test lamp and three disconnected contact pins, the position of each contact pin corresponds to the position of a through hole formed in a substrate one by one, two metal sheets are respectively connected with two ends of each contact pin, after a pin test probe abuts against a corresponding pin of a module to be tested, the corresponding contact pin on the parallel circuit is conducted, and the test lamp on the corresponding parallel circuit is lightened under the normal condition of the pin.

Preferably, one side of the substrate is provided with a strip-shaped through hole which is used as a handheld part, so that the substrate can be conveniently pulled.

Preferably, the module to be tested is a discrete device.

Preferably, the test lamps are all arranged on the side body of the bottom plate, so that the observation is convenient.

The beneficial effects of the utility model are as follows:

According to the testing device designed by the utility model, a plurality of modules (discrete devices) to be tested can be installed on the substrate at one time, the test probes are lowered by pressing the stress plate and respectively contact with the pins and the insulation parts of the modules to be tested, and the single or a plurality of modules (discrete devices) to be tested can be simultaneously electrified (whether the pins are installed correctly) and the insulation test of the insulation parts, so that the overall working efficiency is improved, and the testing result is accurate.

Drawings

Fig. 1 is a schematic diagram of the overall structure of the present utility model.

Fig. 2 is a top view of the base plate of the present utility model.

Fig. 3 is a side view of the present utility model.

FIG. 4 is a schematic diagram of a test circuit according to the present utility model.

Fig. 5 is a schematic structural diagram of a module to be tested according to the present utility model.

Detailed Description

The present utility model will be further described with reference to the drawings and examples below in order to more clearly understand the objects, technical solutions and advantages of the present utility model to those skilled in the art.

In the description of the present utility model, it should be understood that the terms "upper," "lower," "left," "right," "inner," "outer," "transverse," "vertical," and the like indicate or are based on the orientation or positional relationship shown in the drawings, and are merely for convenience in describing the present utility model, and do not indicate or imply that the apparatus or element to be referred to must have a specific orientation, and thus should not be construed as limiting the utility model.

The utility model will be described in detail below with reference to the attached drawings: as shown in fig. 1-3, a multi-module insulation and voltage withstand test device comprises a test device body for performing insulation and voltage withstand test on a module to be tested, wherein the test device body is composed of a stress plate 1, an adjusting plate 2 and a bottom plate 3, the lower surface of the stress plate 1 is fixedly arranged right above the adjusting plate 2 through supporting legs 4 on two sides, the adjusting plate 2 is fixed on the upper surface of the bottom plate 3 through adjusting posts 5 on two sides of the bottom, the height of the adjusting plate 2 is adjusted through the adjusting posts 5, a plurality of through holes for installing test probes 6 are formed in the middle position of the adjusting plate 2, as shown in fig. 3, part of the installed test probes 6 are exposed on the lower surface of the adjusting plate 2, wherein part of the test probes are used as pin test probes 7 through anodes of external power supplies of cables, part of the test probes are used as insulation test probes 8 of the module to be tested through cathodes of external power supplies of the cables with indication lamps, a substrate 10 is arranged on the upper surface of the bottom plate 3 under the test probes in a limiting manner through a limiting mounting seat 9, a plurality of placing grooves 11 and a row of through holes 12 which are uniformly arranged are arranged on the substrate 10, a module 13 to be tested is placed in each placing groove 11, each pin 14 of the placed module 13 to be tested corresponds to each through hole 12 and each pin test probe 7 one by one up and down, an insulating part 15 of the module 13 to be tested corresponds to the insulating test probes 8 of the module to be tested in the up-down manner, a test circuit 19 with a test lamp 16 is welded on the lower surface of the bottom plate 3, two mutually independent metal sheets 17 are respectively arranged on the inner wall of each through hole 12, a certain interval 18 is reserved between the upper end of each metal sheet 17 and the pin 14 of the module to be tested, the lower end of the metal sheet 17 is connected with the test circuit 19, the stressed plate 1 is pressed, the adjusting plate 2 is lowered through the adjusting column 5, each test probe is lowered along with the lowering, after the pin test probe 7 is propped against each pin 14 of the module to be tested, each pin 14 is contacted with two corresponding metal sheets 17 respectively (at the moment, the pin test probe is not in direct contact with the metal sheets), the insulation test probe 8 of the module to be tested is propped against the insulation part 15 of the module to be tested 13, at the moment, the test lamp 16 of the test circuit 19 is on, the indicating lamp is not on, the performances of the pin 14 and the insulation part 15 of the module to be tested are normal, and otherwise, the module to be tested is abnormal.

In order to ensure that the multi-module test is not interfered by the number, each module is independently detected, and the condition that the test cannot be detected due to the fact that the test number is not full is avoided.

According to the utility model, the pin test probes and the insulation test probes of the module to be tested are mutually independent, each pin test probe can be all shorted according to requirements, and the insulation test probes of the module to be tested are not in shorted connection with the pin test probes.

According to the utility model, two independent metal sheets are arranged on the inner wall of each through hole left and right, and the design can ensure that a test circuit at the bottom of the bottom plate is in an open circuit state when the test probe does not work.

The simple circuit formed by the pin test probe and the insulation test probe of the module to be tested and externally connected with the power supply comprises a cable, a resistor, a power supply and a switch (conventional design), so the detailed description is omitted.

The adjusting column 5 is hollow and is used for inserting and installing a vertically arranged spring 20, one end of the spring 20 extends out of the adjusting column 5 and is fixedly connected with the upper surface of the bottom plate 3, the other end of the spring 20 extends out of the adjusting column 5 and is fixedly connected with the lower surface of the adjusting plate 2, the height of the spring 20 under the condition of no stress is higher than the height of the top surface of the adjusting column 5, the spring 20 is pressed and contracted after the stress plate 1 is stressed, the adjusting plate 2 is lowered along with the pressing and contracting, when the adjusting plate 2 supports against the adjusting column 5, the pin test probe 7 and the module insulation test probe 8 to be tested just support against each pin 14 of the module 13 to be tested and the insulation part 15 of the module to be tested respectively.

The height of the spring arranged inside the adjusting column is slightly higher than that of the spring arranged inside the adjusting column, so that the functions of pressing and rebounding can be met, the adjusting column plays a role in limiting the lowest position, the placing force is too large, the device to be tested is damaged due to the fact that the position of the adjusting plate is too low, and the safety and the high efficiency of the whole test are guaranteed.

The limiting mounting seat 9 is two baffles 21 which are arranged in the middle of the upper surface of the bottom plate and are of an inverted L-shaped structure, the two baffles 21 are symmetrically arranged left and right, and a certain distance is arranged between the two baffles 21 and used for horizontally inserting the substrate 10.

The limiting mounting seat can well limit the substrate and the module to be tested on the substrate, prevent the module from shifting in the test process, greatly improve the accuracy and prevent unnecessary damage.

As shown in fig. 4, the test circuit 19 is composed of a manual switch 22, a test power supply 23, a resistor 24 and a plurality of test lamps 16, wherein the manual switch 22, the test power supply 23 and the resistor 24 are sequentially disposed on a trunk 25 of the test circuit 19, one side of the trunk 25 is connected with a branch 27 composed of a plurality of parallel circuits 26, each parallel circuit 26 is respectively provided with one test lamp 16 and three disconnected contact pins 28, the position of each contact pin 28 corresponds to the position of a through hole 12 formed in the substrate 10 one by one, two metal sheets 17 are respectively connected with two ends of each contact pin 28, when the pin test probe 7 abuts against a corresponding pin 14 of the module 13 to be tested, the corresponding contact pin 28 on the parallel circuit 26 is conducted, and the test lamp on the corresponding parallel circuit 26 is turned on under the normal condition of the pin 14.

One side of the base plate 10 is provided with a strip-shaped through hole 29, and the strip-shaped through hole 29 is used as a handheld part, so that the base plate 10 can be conveniently pulled. As shown in fig. 5, the module under test 13 is a discrete device. The test lamps 16 are all arranged on the side bodies of the bottom plate 3, so that observation is convenient.

When the substrate placing groove (test position) is not placed in the module or the module position is placed askew, the probe is pressed down and cannot be contacted with the two metal sheets at the bottom, so that the test circuit cannot be conducted (the test lamp is not lightened), and the normal use of the whole device is ensured.

The specific embodiments described herein are merely illustrative of the principles and functions of the present utility model, and are not meant to limit the utility model. Modifications and variations may be made to the above-described embodiments by those skilled in the art without departing from the spirit and scope of the utility model. It is therefore intended that all equivalent modifications and changes made by those skilled in the art without departing from the spirit and technical spirit of the present utility model shall be covered by the appended claims.

Claims

1. A multi-module insulation withstand voltage test device, comprising a test device body for performing insulation withstand voltage tests on the module under test, characterized in that: the test device body is composed of a force plate (1), an adjustment plate (2) and a base plate (3), the lower surface of the force plate (1) is fixedly mounted on the upper surface of the adjustment plate (2) by support feet (4) on both sides, the adjustment plate (2) is fixed to the upper surface of the base plate (3) by adjustment columns (5) on both sides of the bottom, the height of the adjustment plate (2) is adjusted by the adjustment columns (5), and a plurality of through holes for installing test probes (6) are provided in the middle of the adjustment plate (2). After installation, the test probes (6) are partially exposed on the lower surface of the adjustment plate (2). Some of the test probes are connected to the positive terminal of the external power supply via a cable as pin test probes (7), and some of the test probes are connected to the negative terminal of the external power supply via a cable with an indicator light as insulation test probes (8) for the module under test. A base plate (10) is mounted on the upper surface of the base plate (3) directly below the test probes via a limiting mounting seat (9). The base plate (10) has multiple placement slots (11) and a row of evenly arranged through holes (12). Each placement slot (11) contains a module under test (13). Each pin (14) of the module under test (13) corresponds vertically to each through hole (12) and each pin test probe (7). The insulation part (15) of the module under test (13) corresponds vertically to the insulation test probe (8) of the module under test. A test circuit (19) with a test lamp (16) is soldered on the lower surface of the base plate (3). Two independent metal plates (17) are installed on the inner wall of each through hole (12). A certain distance (18) is left between the upper end of each metal plate (17) and the pin (14) of the module under test, and the lower end of the metal plate (17) is connected to the test probe (7). The circuit (19) is connected. Press the force plate (1) and adjust the plate (2) by adjusting the column (5). Each test probe will then descend. The pin test probe (7) will touch each pin (14) of the module under test, and each pin (14) will contact the corresponding two metal plates (17). At the same time, the insulation test probe (8) of the module under test will touch the insulation part (15) of the module under test (13). At this time, the test lamp (16) of the test circuit (19) will light up. If the indicator light does not light up, the pin (14) and insulation part (15) of the module under test are normal. Otherwise, there is an abnormality.

2. The multi-module insulation withstand voltage test device according to claim 1, characterized in that: the adjusting column (5) is hollow inside and is used to insert and install vertically arranged springs (20). One end of the spring (20) extends out of the adjusting column (5) and is fixedly connected to the upper surface of the base plate (3), and the other end extends out of the adjusting column (5) and is fixedly connected to the lower surface of the adjusting plate (2). The height of the spring (20) when it is not under force is higher than the height of the top surface of the adjusting column (5). After the force plate (1) is under force, it descends, causing the spring (20) to be compressed and contracted. The adjusting plate (2) descends accordingly. When the adjusting plate (2) touches the adjusting column (5), it is the lowest position of the adjusting column (5) descending. At this time, the pin test probe (7) and the insulation test probe (8) of the module under test just touch each pin (14) of the module under test (13) and the insulation part (15) of the module under test, respectively.

3. The multi-module insulation withstand voltage test device according to claim 1, characterized in that: the limiting mounting base (9) is two baffles (21) in an inverted L-shaped structure set at the middle position of the upper surface of the base plate, the two baffles (21) are symmetrically arranged on the left and right, and a certain distance is set between the two baffles (21) for horizontal insertion of the substrate (10).

4. The multi-module insulation withstand voltage testing device according to claim 1, characterized in that: the test circuit (19) is composed of a manual switch (22), a test power supply (23), a resistor (24) and multiple test lamps (16), wherein the manual switch (22), the test power supply (23), and the resistor (24) are sequentially arranged on the main circuit (25) of the test circuit (19), and a branch circuit (27) composed of multiple parallel circuits (26) is connected to one side of the main circuit (25), and each parallel circuit (26) is respectively equipped with There is a test lamp (16) and three disconnected contact pins (28). The position of each contact pin (28) corresponds one-to-one with the position of the through hole (12) opened on the substrate (10). Two metal plates (17) are connected to the two ends of each contact pin (28). When the pin test probe (7) touches the corresponding pin (14) of the module under test (13), the corresponding contact pin (28) on the parallel circuit (26) is turned on. When the pin (14) is normal, the test lamp on the corresponding parallel circuit (26) lights up.

5. The multi-module insulation withstand voltage test device according to claim 3, characterized in that: a long strip-shaped through hole (29) is provided on one side of the substrate (10), and the long strip-shaped through hole (29) serves as a hand grip to facilitate pulling the substrate (10).

6. The multi-module insulation withstand voltage test device according to claim 4, wherein the module to be tested (13) is a discrete device.

7. The multi-module insulation withstand voltage test device according to claim 5, characterized in that: the test lamps (16) are all installed on the side of the base plate (3) for easy observation.