Grinding type machining center for high-precision probe
Technical Field
The utility model relates to the technical field of probe manufacturing, in particular to a grinding type machining center for a high-precision probe.
Background
With the increasing improvement of chip performance, the complexity of the chip is higher, and in order to ensure the quality of the chip from the factory, the chip testing environment is more and more valued by various manufacturers. In the test system, an important accessory, namely a test fixture, is needed, the existing test fixture comprises a device connection fixture, a probe station interface board, a probe card, a KIT, a test seat and the like, the core component is a test probe, the total cost of the test fixture is 70%, the probe needs to undergo a plurality of working procedures in the production and processing process, and one working procedure is chamfering and polishing of the end part of the probe.
According to the utility model, through arranging the feeding mechanism, the clamping mechanism, the grinding mechanism and the discharging mechanism, the automatic feeding, taking, grinding and discharging of probe grinding can be realized, the manual operation is greatly reduced, the working efficiency is improved, an operator is prevented from directly contacting with the grinding mechanism, the production risk is reduced, and the grinding disc can move along the direction parallel and perpendicular to the clamping hand by the aid of the first driving mechanism and the second driving mechanism, so that the omnibearing grinding of the probe is realized, and the grinding effect is improved.
In the actual polishing production process of the probe, according to the different types and lengths of the probe, the parts needing to polish the probe are also different, and a common polishing center is difficult to adjust the polishing position according to different polishing requirements of the probe.
Disclosure of utility model
Aiming at the defects of the prior art, the utility model provides a grinding type machining center for a high-precision probe, so as to meet the requirements of different sizes of probes, adjusting the height of a grinding mechanism and adapting to the grinding position of the probes.
The grinding type machining center for the high-precision probe comprises a device main body and a lifting assembly, wherein the lifting assembly is arranged in the device main body and comprises a lifting rod which is in sliding connection with the inner wall of the device main body, a grinding block is fixedly connected to the bottom of the outer wall of the lifting rod, a grinding hole is formed in the bottom of the outer wall of the grinding block, a fixed block is fixedly connected to the rear side of the outer wall of the lifting rod, a rotating disc is arranged at the rear side of the outer wall of the fixed block, a rotating groove is formed in the position, corresponding to the fixed block, of the outer wall of the rotating disc, a sliding block is fixedly connected to the rear side of the outer wall of the rotating disc, a track block is sleeved on the outer wall of the sliding block, a screw rod is arranged in the sliding block, a rotating shaft is fixedly connected to the rear side of the outer wall of the track block, and a motor is fixedly connected to the rear side of the rotating shaft.
Preferably, the outer wall of the rotating shaft is sleeved with a supporting shaft, and the supporting shaft is fixedly connected with the outer wall of the device main body.
Preferably, the middle part of the inner wall of the device main body is fixedly connected with a fixing plate, and the bottom of the outer wall of the device main body is fixedly connected with a cylinder.
Preferably, the top of the air cylinder is provided with an output shaft, and the top of the outer wall of the output shaft is fixedly connected with a jacking block.
Preferably, the outer wall of the output shaft is sleeved with a mounting plate, and the outer wall of the top block is provided with a pulley.
Preferably, the pulley outer wall rotates and is connected with L type splint, L type splint and mounting panel junction are equipped with the supporting shoe.
Preferably, a rotating block is arranged at the joint of the L-shaped clamping plate and the supporting block, and the supporting block is fixedly connected with the mounting plate.
Compared with the prior art, the utility model has the beneficial effects that:
1. Through setting up lifting unit, thereby the staff can be through the height of adjusting the polishing piece of rotating the lead screw, when machining center polishes the probe of different models, can make the polishing piece can adapt to the height of different models probes, carries out subsequent processing operation of polishing, has strengthened the suitability of device.
2. Through setting up cylinder and L type splint, when the staff carries out processing to the probe and polishes, can drive the cylinder to realize the centre gripping to different model size probes fixed, satisfy the fixed demand of centre gripping of device to different model size probes.
Drawings
FIG. 1 is a schematic perspective view of the present utility model;
FIG. 2 is a schematic view of the device body of the present utility model in cross-section;
FIG. 3 is a schematic view of an L-shaped splint according to the present utility model;
FIG. 4 is a schematic perspective view of a rotary disk according to the present utility model;
FIG. 5 is a schematic diagram showing the exploded structure of the slider and the track block according to the present utility model.
1, A device main body; 201, lifting rods, 202, polishing blocks, 203, polishing holes, 204, fixed blocks, 205, rotating discs, 206, rotating grooves, 207, sliding blocks, 208, track blocks, 209, screw rods, 210, rotating shafts, 211, motors, 3, supporting shafts, 4, fixed plates, 5, air cylinders, 6, output shafts, 7, top blocks, 8, mounting plates, 9, pulleys, 10, L-shaped clamping plates, 11, supporting blocks, 12 and rotating blocks.
Detailed Description
The following description of the embodiments of the present utility model will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present utility model, but not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the utility model without making any inventive effort, are intended to be within the scope of the utility model.
Referring to fig. 1, 2, 4 and 5, the utility model provides a technical scheme, in order to adjust the polishing position height of probes of different types, the polishing center for the high-precision probes comprises a device main body 1 and a lifting assembly, the lifting assembly is arranged in the device main body 1 and comprises a lifting rod 201 which is in sliding connection with the inner wall of the device main body 1, a polishing block 202 is fixedly connected to the bottom of the outer wall of the lifting rod 201, a polishing hole 203 is formed in the bottom of the outer wall of the polishing block 202, a fixed block 204 is fixedly connected to the rear side of the outer wall of the lifting rod 201, a rotating disc 205 is arranged at the rear side of the outer wall of the fixed block 204, a rotating groove 206 is formed in the position, corresponding to the fixed block 204, of the outer wall of the rotating disc 205, a sliding block 207 is fixedly connected with a track block 208, a screw rod 209 is arranged in the sliding block 207, a rotating shaft 210 is fixedly connected to the rear side of the outer wall of the track block 208, a supporting shaft 3 is sleeved on the outer wall of the rotating shaft 210, the supporting shaft 3 is fixedly connected with the outer wall of the device main body 1, a polishing assembly is arranged, a worker can adjust the polishing hole 203 through the rotating shaft 209, and the polishing center can polish probes of different types of the probes in different types when polishing center can be polished, and the polishing device is suitable for the probes are suitable for being processed.
Referring to fig. 1 and 3, in order to clamp and fix probes of different types, a fixing plate 4 is fixedly connected to the middle part of the inner wall of a device main body 1, an air cylinder 5 is fixedly connected to the bottom of the outer wall of the device main body 1, an output shaft 6 is arranged at the top of the air cylinder 5, a jacking block 7 is fixedly connected to the top of the outer wall of the output shaft 6, a mounting plate 8 is sleeved on the outer wall of the output shaft 6, a pulley 9 is arranged on the outer wall of the jacking block 7, an L-shaped clamping plate 10 is rotatably connected to the outer wall of the pulley 9, a supporting block 11 is arranged at the joint of the L-shaped clamping plate 10 and the mounting plate 8, a rotating block 12 is arranged at the joint of the L-shaped clamping plate 10 and the supporting block 11, the supporting block 11 is fixedly connected with the mounting plate 8, and by arranging the air cylinder 5 and the L-shaped clamping plate 10, when a worker processes and polishes the probes, the air cylinder 5 can be driven, so that the clamping and fixing of probes of different types and sizes can be realized, and the clamping and fixing requirements of probes of different types are met.
The working principle is that when a worker places a probe at a corresponding position of the device and needs to adjust the polishing height, the screw rod 209 is manually rotated, the sliding block 207 moves on the outer wall of the screw rod 209, the sliding block 207 moves downwards in the track block 208, the rotating disc 205 is driven to move downwards, the fixed block 204 also moves downwards, the lifting rod 201 is driven to move downwards, the driving motor 211 is operated, the rotating shaft 210 drives the track block 208 to rotate, the rotating disc 205 is driven to rotate, the fixed block 204 drives the lifting rod 201 to reciprocate under the action of the rotating groove 206, the polishing block 202 is driven to polish the probe, and the rotating eccentric distance of the rotating disc 205 is increased in the polishing process due to the fact that the rotating screw rod 209 drives the rotating disc 205 to move downwards, so that the polishing height of the probe is increased, and the reverse operation is the same;
when the probe needs to be fixed, a worker manually inserts the probe into the fixed plate 4, the driving cylinder 5 is driven to run at the moment, the output shaft 6 drives the top block 7 to move upwards, the L-shaped clamping plate 10 is subjected to the acting force of the outer wall of the top block 7 through the pulley 9 so as to deflect, the L-shaped clamping plate 10 clamps the probe at the moment, the clamping and fixing of the probe is realized, the working process of the whole device is realized, and the content which is not described in detail in the specification belongs to the prior art known to the person skilled in the art.
Although embodiments of the present utility model have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and alterations can be made therein without departing from the principles and spirit of the utility model, the scope of which is defined in the appended claims and their equivalents.