CN223273025U - Flash memory chip test board - Google Patents
Flash memory chip test boardInfo
- Publication number
- CN223273025U CN223273025U CN202422006435.9U CN202422006435U CN223273025U CN 223273025 U CN223273025 U CN 223273025U CN 202422006435 U CN202422006435 U CN 202422006435U CN 223273025 U CN223273025 U CN 223273025U
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- China
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- frame
- test
- adjusting plate
- flash memory
- memory chip
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Abstract
The utility model provides a flash memory chip test board, and relates to the technical field of chip test. The flash memory chip test board comprises a test substrate, wherein a socket is arranged on the front side of the test substrate, a test seat is arranged in the middle of the test substrate, a groove is formed in the middle of the test seat, a plurality of mounting groove contacts are arranged on two sides of the test seat, a fixing frame is fixed on the rear side of the test substrate, a connecting structure is arranged on the fixing frame, an adjusting plate and a pressing frame are arranged on the connecting structure, and the connecting structure can slide along the depth direction of the groove with the adjusting plate and the pressing frame so as to adjust different pressures to clamp. This flash memory chip test board rotates the operation through the manpower rotation lead screw, realizes the effect of adjustable centre gripping, reaches the effect that improves chip test board practicality, moves the operation through the manpower pulling movable frame, realizes convenient effect of getting the material, reaches the effect that improves chip test board and use convenience.
Description
Technical Field
The utility model relates to a flash memory chip test board, and belongs to the technical field of chip test.
Background
The flash memory chip is a long-life nonvolatile memory chip, and because the flash memory chip can still store data when the flash memory chip is powered off, the flash memory is usually used for storing setting information, such as storing data in a BIOS (basic input output system), a PDA (personal digital assistant), a digital camera and the like of a computer, and has wide application.
The high-efficiency test board for the flash memory chip comprises a circuit board, wherein a test seat is arranged at the top of the circuit board, two groups of movable conductive contacts are arranged in the test seat, the number of the movable conductive contacts is equal to that of pins of the flash memory chip, two groups of elastic conductive pieces are arranged in the test seat, the number of the elastic conductive pieces is equal to that of the movable conductive contacts, the elastic conductive pieces are connected with the movable conductive contacts, one end of each elastic conductive piece extends to the outside of the test seat and is connected with the circuit board, and a supporting frame is arranged at the top of the circuit board.
Under the condition of actual use, the problem still exists that although the chip test board can carry out daily chip test operation, in the actual use process, the heights of the supporting frames are relatively fixed, so that the pressing strengths of the springs connected with the supporting frames are inconsistent for chips with different thicknesses, when thicker chips are encountered, the springs drive the clamping frames to have larger pressing strengths for the chips, the chips are easy to damage, the corresponding adjustment operation of the pressing strengths of the springs is inconvenient, the use of the chip test board is limited, and after the test is finished, the pins are inserted into the conductive contacts, so that certain resistance exists when the pins are taken down, inconvenience is brought to the use of staff, and the use convenience of the chip test board is insufficient.
Disclosure of utility model
(One) solving the technical problems
The utility model provides a flash memory chip test board to solve the problems of limitation in use of the chip test board and insufficient use convenience of the chip test board in the prior art.
(II) technical scheme
The flash memory chip test board comprises a test substrate, wherein a socket is arranged on the front side of the test substrate, and a test seat is arranged in the middle of the test substrate;
The middle part of the test seat is provided with a groove, two sides of the test seat are provided with a plurality of mounting groove contacts, the rear side of the test substrate is fixedly provided with a fixing frame, the fixing frame is provided with a connecting structure, the connecting structure is provided with an adjusting plate and a pressing frame, and the connecting structure can slide along the depth direction of the groove with the adjusting plate and the pressing frame so as to adjust different pressures for clamping.
Preferably, the connecting structure comprises a screw rod, an adjusting plate is connected to the outer surface of the screw rod in a threaded mode, a limiting rod is connected to the other end of the adjusting plate in a sliding mode, a movable frame is connected to the middle of the adjusting plate in a sliding mode, a pressing frame is fixed to the lower end of the movable frame, and a spring is fixed to the upper end of the pressing frame.
Preferably, the outer surface of the screw rod is rotationally connected to one side of the upper end of the fixing frame, the upper end of the limiting rod is fixed to the other side of the upper end of the fixing frame, the vertical section of the limiting rod is in a T-shaped structure, the outer surface of the screw rod is in threaded connection to one side of the adjusting plate, and the outer surface of the limiting rod is in sliding connection to the other side of the adjusting plate.
Preferably, the outer surface sliding connection of the movable frame is in the middle of the adjusting plate, the outer surface sliding connection of the movable frame is in the middle of the upper end of the fixed frame, the middle of the upper end of the pressing frame is fixed at the lower end of the movable frame, the outer surface of the pressing frame is in contact with the inner wall of the groove, one end of the spring is fixed at the upper end of the pressing frame, and the other end of the spring is fixed at the lower end of the adjusting plate.
Preferably, a sliding groove is formed in the middle of the test seat, and a sliding frame is connected to the inner wall of the sliding groove in a sliding manner.
Preferably, the sliding groove penetrates through the middle of the test seat, the outer surface of the sliding frame is slidably connected to the inner wall of the sliding groove, the inner wall of the sliding frame is slidably connected to the outer surface of the test seat, and the outer surface of the sliding frame is in contact with the outer surface of the pressing frame.
Preferably, the four corners of the test substrate are provided with reserved holes, and each reserved hole penetrates through one corner of the test substrate.
The utility model provides a flash memory chip test board, which has the following beneficial effects:
(1) This flash memory chip test board rotates the lead screw through the manpower and carries out rotatory operation for mount, lead screw, regulating plate, gag lever post, movable frame, suppression frame, the operation of mutually supporting of spring realize the effect of adjustable centre gripping, can carry out corresponding regulation operation according to the chip of different thickness, in order to guarantee to carry out the centre gripping to the chip and protect the operation again, and then reach the effect that improves chip test board practicality.
(2) This flash memory chip test board moves the operation through the manual force pulling movable frame for remove frame, regulating plate, spring, carriage, spout mutually support the operation, realize convenient effect of getting the material, provide convenient precondition for the material operation of staff, and then reach the effect that improves chip test board and use the convenience.
Drawings
FIG. 1 is a perspective view of the present utility model;
FIG. 2 is a cross-sectional view of a press frame of the present utility model;
FIG. 3 is a schematic view of a fixing frame according to the present utility model;
FIG. 4 is a schematic diagram of a test socket according to the present utility model.
[ Main reference numerals Specification ]
1. The test device comprises a test substrate, a socket, a test seat, a groove, a mounting groove contact, a fixing frame, a screw rod, an adjusting plate, a limit rod, a moving frame, a pressing frame, a spring, a 13, a sliding groove, a 14, a sliding frame, a 15 and a reserved hole, wherein the test substrate, the socket, the test seat, the mounting groove contact, the groove, the fixing frame, the screw rod, the adjusting plate, the limit rod, the moving frame, the pressing frame, the spring, the 13, the sliding groove, the 14 and the 15.
Detailed Description
The embodiment of the utility model provides a flash memory chip test board.
Referring to fig. 1, fig. 2, fig. 3 and fig. 4, the chip tester comprises a test substrate 1, the test substrate 1 is a test circuit board, a socket 2 is arranged on the front side of the test substrate 1, the socket 2 is connected with a test instrument, a test seat 3 is arranged in the middle of the test substrate 1, the test seat 3 is used for placing chips, a groove 4 is formed in the middle of the test seat 3, a plurality of mounting groove contacts 5 are arranged on two sides of the test seat 3, the mounting groove contacts 5 are connected and supplied with power for testing, a fixing frame 6 is fixed on the rear side of the test substrate 1, a connecting structure is arranged on the fixing frame 6, the connecting structure comprises a screw rod 7, an adjusting plate 8 is connected with the outer surface of the screw rod 7 in a threaded manner, a limiting rod 9 is slidably connected with the other end of the adjusting plate 8, a movable frame 10 is slidably connected with the middle of the adjusting plate 8, a pressing frame 11 is fixedly arranged at the lower end of the movable frame 10, a spring 12 is fixedly arranged at the upper end of the pressing frame 11, the screw rod 7 is rotated by manpower, the screw rod 7 drives the adjusting plate 8 to perform position movement operation under the limiting of the limiting rod 9, the position of the adjusting plate 8 is pressed by the spring 12, the pressing height of the spring 12 is changed by the adjusting plate 8, so that the strength of the spring 12 can be correspondingly adjusted, the strength of the chip tester can be used for testing chips, and the chip tester can be adjusted, and the chip tester can be practically and the thickness can be adjusted.
Referring to fig. 1, fig. 2, fig. 3 and fig. 4 again, it should be specifically explained that the outer surface of the screw rod 7 is rotatably connected to one side of the upper end of the fixing frame 6, the upper end of the limiting rod 9 is fixed to the other side of the upper end of the fixing frame 6, the vertical section of the limiting rod 9 is T-shaped, the outer surface of the screw rod 7 is in threaded connection to one side of the adjusting plate 8, the outer surface of the limiting rod 9 is slidably connected to the other side of the adjusting plate 8, the outer surface of the moving frame 10 is slidably connected to the middle of the upper end of the fixing frame 6, the middle of the upper end of the pressing frame 11 is fixed to the lower end of the moving frame 10, the outer surface of the pressing frame 11 contacts with the inner wall of the groove 4, one end of the spring 12 is fixed to the upper end of the pressing frame 11, and the other end of the spring 12 is fixed to the lower end of the adjusting plate 8.
Referring to fig. 1, fig. 2, fig. 3 and fig. 4 again, it is worth specifically explaining that the middle part of the test seat 3 is provided with a chute 13, the inner wall of the chute 13 is slidably connected with a sliding frame 14, the chute 13 penetrates through the middle part of the test seat 3, the outer surface of the sliding frame 14 is slidably connected with the inner wall of the chute 13, the inner wall of the sliding frame 14 is slidably connected with the outer surface of the test seat 3, the outer surface of the sliding frame 14 is in contact with the outer surface of the pressing frame 11, the moving pressing frame 11 can drive the sliding frame 14 to move, the moving sliding frame 14 can drive the chip to lift, the worker can conveniently take the tested chip, and convenience is provided for the use of the worker.
The utility model is used when in use: firstly, the screw rod 7 is rotated by manpower to perform rotary operation, so that the adjusting plate 8 in threaded connection with the outer surface of the screw rod 7 performs sliding operation under the limit of the limit rod 9, the sliding adjusting plate 8 can pressurize or decompress the spring 12 fixed at the lower end, when the adjusting plate 8 is at the lowest position, the pressing force on the spring 12 is maximum, the force required by a worker to pull the movable frame 10 to perform moving operation is also maximum, a few thinner chips can be placed on the test seat 3 to perform pressing stabilization operation, when the adjusting plate 8 is at the highest position, the pressing force on the spring 12 is minimum, the force required by the worker to pull the movable frame 10 to perform moving operation is also minimum, a few thicker chips can be placed on the test seat 3 to perform pressing stabilization operation, and the effect of adjustable clamping is achieved, the corresponding adjustment operation can be carried out according to the chips with different thicknesses so as to ensure the chips to be clamped and simultaneously carry out the protection operation on the chips, further achieve the effect of improving the practicability of the chip test board, then the movable frame 10 is pulled by manpower to carry out the movement operation, the pressing frame 11 fixed with the movable frame 10 is enabled to carry out the movement operation, the movable pressing frame 11 can carry out the compression operation on the connected springs 12, the pressing frame 11 obtains the compression space, the sliding frame 14 contacted with the compression space is driven to carry out the upward movement operation under the limit of the sliding groove 13 in the process of the upward movement of the pressing frame 11 obtaining the compression space, the upward movement sliding frame 14 carries out the jacking operation on the chips placed on the test seat 3, the jacked chips are convenient for workers to take, the effect of convenient material taking is achieved, and the convenience precondition is provided for the material taking operation of the workers, thereby achieving the effect of improving the use convenience of the chip test board.
The working principle is that the screw rod 7 is rotated by manpower to perform rotary operation, so that the screw rod 7 drives the adjusting plate 8 to perform moving operation, the effect of adjustable clamping is realized, corresponding adjusting operation can be performed according to chips with different thicknesses, the chips are ensured to be clamped, meanwhile, the chips are protected, the effect of improving the practicability of the chip test board is achieved, then the moving frame 10 is pulled by manpower to perform moving operation, the pressing frame 11 fixed with the moving frame 10 drives the sliding frame 14 to perform moving operation, the effect of conveniently taking materials is realized, convenience preconditions are provided for the taking operation of workers, and the effect of improving the use convenience of the chip test board is achieved.
Referring to fig. 1, 2, 3 and 4 again, it should be noted that the four corners of the test substrate 1 are provided with the preformed holes 15, each preformed hole 15 penetrates through one corner of the test substrate 1, the preformed holes 15 facilitate the effect that the worker uses the fastening members such as bolts to mount the test substrate 1 on the test platform, and effectively improve the use stability of the chip test board.
The foregoing has shown and described the basic principles and main features of the present utility model and the advantages of the present utility model. It will be understood by those skilled in the art that the present utility model is not limited to the embodiments described above, and that the above embodiments and descriptions are merely illustrative of the principles of the present utility model, and various changes and modifications may be made without departing from the spirit and scope of the utility model, which is defined in the appended claims. The scope of the utility model is defined by the appended claims and equivalents thereof.
Claims (7)
1. The flash memory chip test board comprises a test substrate (1) and is characterized in that a socket (2) is arranged on the front side of the test substrate (1), and a test seat (3) is arranged in the middle of the test substrate (1);
the novel testing device is characterized in that a groove (4) is formed in the middle of the testing seat (3), a plurality of mounting groove contacts (5) are arranged on two sides of the testing seat (3), a fixing frame (6) is fixed on the rear side of the testing substrate (1), a connecting structure is arranged on the fixing frame (6), an adjusting plate (8) and a pressing frame (11) are arranged on the connecting structure, and the connecting structure can slide in the depth direction of the groove (4) with the adjusting plate (8) and the pressing frame (11) to adjust different pressures for clamping.
2. The flash memory chip test board according to claim 1, wherein the connecting structure comprises a screw rod (7), an adjusting plate (8) is connected to the outer surface of the screw rod (7) in a threaded mode, a limit rod (9) is connected to the other end of the adjusting plate (8) in a sliding mode, a movable frame (10) is connected to the middle of the adjusting plate (8) in a sliding mode, a pressing frame (11) is fixed to the lower end of the movable frame (10), and a spring (12) is fixed to the upper end of the pressing frame (11).
3. The flash memory chip test board of claim 2, wherein the outer surface of the screw rod (7) is rotatably connected to one side of the upper end of the fixing frame (6), the upper end of the limiting rod (9) is fixed to the other side of the upper end of the fixing frame (6), the vertical section of the limiting rod (9) is in a T-shaped arrangement, the outer surface of the screw rod (7) is in threaded connection with one side of the adjusting plate (8), and the outer surface of the limiting rod (9) is in sliding connection with the other side of the adjusting plate (8).
4. The flash memory chip test board of claim 2, wherein the outer surface of the movable frame (10) is slidably connected to the middle part of the adjusting plate (8), the outer surface of the movable frame (10) is slidably connected to the middle part of the upper end of the fixed frame (6), the middle part of the upper end of the pressing frame (11) is fixed to the lower end of the movable frame (10), the outer surface of the pressing frame (11) is in contact with the inner wall of the groove (4), one end of the spring (12) is fixed to the upper end of the pressing frame (11), and the other end of the spring (12) is fixed to the lower end of the adjusting plate (8).
5. The flash memory chip test board of claim 1, wherein a chute (13) is formed in the middle of the test seat (3), and a sliding frame (14) is slidably connected to the inner wall of the chute (13).
6. The flash memory chip test board according to claim 5, wherein the sliding groove (13) penetrates through the middle of the test seat (3), the outer surface of the sliding frame (14) is slidably connected to the inner wall of the sliding groove (13), the inner wall of the sliding frame (14) is slidably connected to the outer surface of the test seat (3), and the outer surface of the sliding frame (14) is in contact with the outer surface of the pressing frame (11).
7. The flash memory chip test board of claim 1, wherein the four corners of the test substrate (1) are provided with preformed holes (15), and each preformed hole (15) penetrates through one corner of the test substrate (1).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202422006435.9U CN223273025U (en) | 2024-08-19 | 2024-08-19 | Flash memory chip test board |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202422006435.9U CN223273025U (en) | 2024-08-19 | 2024-08-19 | Flash memory chip test board |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN223273025U true CN223273025U (en) | 2025-08-26 |
Family
ID=96802878
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202422006435.9U Active CN223273025U (en) | 2024-08-19 | 2024-08-19 | Flash memory chip test board |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN223273025U (en) |
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2024
- 2024-08-19 CN CN202422006435.9U patent/CN223273025U/en active Active
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| Date | Code | Title | Description |
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| GR01 | Patent grant | ||
| GR01 | Patent grant |