CN223272609U - Chip resistor auxiliary test device - Google Patents
Chip resistor auxiliary test deviceInfo
- Publication number
- CN223272609U CN223272609U CN202422413980.XU CN202422413980U CN223272609U CN 223272609 U CN223272609 U CN 223272609U CN 202422413980 U CN202422413980 U CN 202422413980U CN 223272609 U CN223272609 U CN 223272609U
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- chip resistor
- connecting rod
- cavity
- test
- pcb
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Abstract
本实用新型提供了一种片式电阻辅助测试装置，属于片式电阻领域。该装置包括底座、压紧机构和PCB板，压紧机构和PCB板设置于底座上，压紧机构包括连接杆和压头杆，连接杆和压头杆竖直设置在PCB板的上方，压头杆设置在连接杆的底部，连接杆和压头杆被配置为靠近或者远离PCB板运动，PCB板上设置有测试接头和测试导线，测试导线一端与测试接头连接，另一端与外部测试设备连接。采用本实用新型实施例所提供的一种片式电阻辅助测试装置，能够解决现有技术中测试效率较低且容易对片式电阻造成损伤的问题。
The present invention provides a chip resistor auxiliary test device, which belongs to the field of chip resistors. The device includes a base, a clamping mechanism and a PCB board, wherein the clamping mechanism and the PCB board are arranged on the base, the clamping mechanism includes a connecting rod and a pressure head rod, the connecting rod and the pressure head rod are vertically arranged above the PCB board, the pressure head rod is arranged at the bottom of the connecting rod, and the connecting rod and the pressure head rod are configured to move toward or away from the PCB board. A test connector and a test wire are provided on the PCB board, one end of the test wire is connected to the test connector, and the other end is connected to an external test device. The chip resistor auxiliary test device provided by the embodiment of the present invention can solve the problems of low test efficiency and easy damage to chip resistors in the prior art.
Description
Technical Field
The utility model relates to the field of chip resistors, in particular to an auxiliary testing device for a chip resistor.
Background
The chip resistor is widely applied to modern production and life, after the chip resistor is produced, the chip resistor needs to be tested to detect whether the chip resistor is qualified or not and meet daily use requirements, and when the chip resistor is tested, the chip resistor needs to be fixed through the chip resistor auxiliary testing device, so that the chip resistor is conveniently subjected to subsequent testing.
The existing chip resistor auxiliary test device generally clamps and fixes two sides of a chip resistor through a clamp, connects the chip resistor with a wire and is communicated with external test equipment, the chip resistor is required to be placed between jaws of the clamp for clamping and wiring through the mode, due to the fact that the size of the chip resistor is small, when an operator performs clamping wiring operation, operation is complex, test efficiency is low, meanwhile, the chip resistor is easy to scratch and even damage due to clamping from two sides of the chip resistor.
The chip resistor auxiliary test device in the prior art has lower test efficiency and is easy to damage the chip resistor.
Disclosure of utility model
The embodiment of the utility model provides a chip resistor auxiliary testing device, which can solve the problems of lower testing efficiency and easiness in damaging chip resistors in the prior art. The technical scheme is as follows:
An auxiliary testing device for chip resistor comprises a base, a pressing mechanism and a PCB,
The PCB is characterized in that the pressing mechanism and the PCB are arranged on the base, the pressing mechanism comprises a connecting rod and a pressing head rod, the connecting rod and the pressing head rod are vertically arranged above the PCB, the pressing head rod is arranged at the bottom of the connecting rod, the connecting rod and the pressing head rod are configured to be close to or far away from the PCB to move, a test connector and a test wire are arranged on the PCB, one end of the test wire is connected with the test connector, and the other end of the test wire is connected with external test equipment.
Optionally, the press head rod and the connecting rod are detachably connected.
Optionally, a rubber pad is arranged at the bottom of the pressure head rod.
Optionally, the PCB board is provided with a plurality of test connectors, and a plurality of test connectors are provided on each PCB board in an array.
Optionally, the compressing mechanism comprises a supporting frame, a handle and a supporting rod,
The support frame is vertical to be set up on the base, the support frame includes the cavity, the bracing piece is vertical to be set up in the cavity, the mounting hole has been seted up to cavity top and bottom, the connecting rod passes two the mounting hole sets up, the one end of handle is located the cavity is outside, the other end of handle with the connecting rod is articulated, the middle part of handle with the bracing piece is articulated.
Optionally, the cavity is provided with a chute along the vertical direction, the chute is connected with the mounting hole at the bottom of the cavity, and the connecting rod is slidably arranged in the chute.
Optionally, the compressing mechanism further comprises a connecting plate and a spring, the connecting plate and the spring are arranged in the cavity, the connecting plate is horizontally arranged on the connecting rod and located between the hinging position of the handle and the connecting rod and the top of the cavity, and the spring is arranged between the connecting plate and the top of the cavity.
Optionally, the support frame includes right angle support, the right angle support sets up the bottom of cavity, be provided with the step face on the base, the right angle of right angle support with the step corner phase-match of step face.
The technical scheme provided by the embodiment of the utility model has the beneficial effects that at least:
According to the chip resistor auxiliary testing device provided by the embodiment of the utility model, the connecting rod and the pressure head rod are controlled to be far away from the PCB, so that the chip resistor to be tested is conveniently placed at the testing joint on the PCB horizontally, the chip resistor to be tested is connected with external testing equipment through the testing lead, and then the connecting rod and the pressure head rod are controlled to be close to the PCB and tightly press the chip resistor to be tested on the PCB, so that the chip resistor to be tested is stably contacted with the testing joint on the PCB, the connection of the testing circuit is ensured, the resistor to be tested is tested, and the connecting rod and the pressure head rod are tightly pressed from the top of the chip resistor to be tested, so that the stress area is larger, the damage to the chip resistor to be tested is avoided, and meanwhile, the corresponding testing circuit is arranged on the PCB, so that the testing can be started when the chip resistor to be tested is tightly contacted with the testing joint, and the problems of lower testing efficiency and easiness in damaging the chip resistor in the prior art can be effectively solved.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present utility model, the drawings required for the description of the embodiments will be briefly described below, and it is apparent that the drawings in the following description are only some embodiments of the present utility model, and other drawings may be obtained according to these drawings without inventive effort for a person skilled in the art.
FIG. 1 is a front view of an overall device provided by an embodiment of the present utility model;
FIG. 2 is a left side view of an overall device provided by an embodiment of the present utility model;
FIG. 3 is a schematic left-hand cross-sectional view of an apparatus according to an embodiment of the present utility model;
FIG. 4 is a schematic cross-sectional view of a support frame according to an embodiment of the present utility model;
FIG. 5 is an overall top view of an apparatus provided by an embodiment of the present utility model;
Fig. 6 is a top view of a PCB board provided by an embodiment of the present utility model;
fig. 7 is a top view of another PCB provided in an embodiment of the present utility model.
The drawing shows that the device comprises a 1-base, a 11-step surface, a 2-pressing mechanism, a 21-connecting rod, a 22-pressing head rod, a 23-supporting frame, a 231-cavity, a 232-mounting hole, a 233-sliding groove, a 234-right angle support, a 24-handle, a 25-supporting rod, a 26-connecting plate, a 27-spring, a 28-rubber pad, a 3-PCB, a 31-testing connector and a 32-testing wire.
Detailed Description
For the purpose of making the objects, technical solutions and advantages of the present utility model more apparent, the embodiments of the present utility model will be described in further detail with reference to the accompanying drawings.
Fig. 1 is a front view of an entire device provided by an embodiment of the present utility model, fig. 2 is a left view of an entire device provided by an embodiment of the present utility model, fig. 3 is a schematic cross-sectional view of an entire device provided by an embodiment of the present utility model, fig. 4 is a schematic cross-sectional view of a support frame provided by an embodiment of the present utility model, fig. 5 is a top view of an entire device provided by an embodiment of the present utility model, fig. 6 is a top view of a PCB provided by an embodiment of the present utility model, and fig. 7 is a top view of another PCB provided by an embodiment of the present utility model. The chip resistor auxiliary testing device comprises a base 1, a pressing mechanism 2 and a PCB 3, wherein the pressing mechanism 2 and the PCB 3 are arranged on the base 1, the pressing mechanism 2 comprises a connecting rod 21 and a pressing head rod 22, the connecting rod 21 and the pressing head rod 22 are vertically arranged above the PCB 3, the pressing head rod 22 is arranged at the bottom of the connecting rod 21, the connecting rod 21 and the pressing head rod 22 are configured to move close to or far away from the PCB 3, a testing connector 31 and a testing wire 32 are arranged on the PCB 3, one end of the testing wire 32 is connected with the testing connector 31, and the other end of the testing wire 32 is connected with external testing equipment.
Illustratively, in the embodiment of the present utility model, the PCB 3 is placed on the base 1 directly under the connection rod 21 and the presser bar 22, so that the presser bar 22 can press the chip resistor to be tested against the test connector 31 when moving toward the PCB 3. The control connecting rod 21 and the pressing head rod 22 are far away from the PCB 3, the chip resistor to be tested is placed at the test joint 31 on the PCB 3, at the moment, the control connecting rod 21 and the pressing head rod 22 are close to the PCB 3, the pressing head rod 22 presses the chip resistor to be tested on the PCB 3, normally one chip resistor to be tested corresponds to two test joints 31, the test joints 31 are connected with external detection equipment through test wires 32, and when two ends of the chip resistor to be tested are respectively contacted with the two test joints 31, the chip resistor to be tested can be directly connected into an external circuit for testing. Compared with the prior art, the chip resistor is clamped from the two ends of the chip resistor to be tested through the clamp, and the chip resistor to be tested is easy to damage due to the small stress areas of the two ends, the device in the embodiment is used for pressing and fixing the chip resistor from the top of the chip resistor to be tested, the stress area is large, the operation is simple, the chip resistor to be tested can be detected while being pressed, the extra wiring work for the chip resistor to be tested is not needed, and the detection efficiency is greatly improved.
According to the chip resistor auxiliary testing device provided by the embodiment of the utility model, the connecting rod 21 and the pressing head rod 22 are controlled to be far away from the PCB 3, so that the chip resistor to be tested is conveniently and horizontally placed at the testing joint 31 on the PCB 3, the chip resistor to be tested is connected with external testing equipment through the testing lead 32, and then the connecting rod 21 and the pressing head rod 22 are controlled to be close to the PCB 3 and tightly press the chip resistor to be tested on the PCB 3, so that the chip resistor to be tested is stably contacted with the testing joint 31 on the PCB 3, the connection of a testing circuit is ensured, the chip resistor to be tested is tested, and the connecting rod 21 and the pressing head rod 22 are tightly pressed from the top of the chip resistor to be tested, so that the stress area is larger, the chip resistor to be tested is not damaged, and meanwhile, the corresponding testing circuit is arranged on the PCB 3, so that the chip resistor to be tested can be started when the chip resistor to be tested is tightly contacted with the testing joint, and the problems of low testing efficiency and easiness in damage to the chip resistor in the prior art can be effectively solved.
Optionally, the ram 22 and the connecting rod 21 are detachably connected.
In the embodiment of the utility model, the pressing head rod 22 is a part directly contacted with the chip resistor to be tested, and the pressing head rod 22 and the connecting rod 21 are detachably connected, so that after the pressing head rod 22 is worn due to excessive use, the pressing head rod 22 can be independently replaced, other parts are not required to be replaced, the use cost of the device is reduced, and the service life of the device is prolonged.
Optionally, the bottom of the ram 22 is provided with a rubber pad 28.
By arranging the rubber pad 28, when the pressure head rod 22 contacts with the chip resistor to be tested, the rubber pad 28 is used for buffering, so that hard contact between the pressure head rod 22 and the chip resistor to be tested is prevented, a certain protection is provided for the chip resistor to be tested, damage to the chip resistor to be tested is further prevented, abrasion of the pressure head rod 22 is reduced, and the service life of the device is further prolonged.
Optionally, the number of the test connectors 31 on the plurality of PCBs 3 is different, and the plurality of test connectors 31 are arranged on each PCB 3 in an array.
In the embodiment of the present utility model, as shown in fig. 6, two test connectors 31 are disposed on the PCB 3, and the test connectors 31 are connected to an external test device through test wires 32, and during testing, a chip resistor to be tested is correspondingly placed, so that two ends of the chip resistor to be tested are respectively contacted with the two test connectors 31 to complete connection of a test circuit. As shown in fig. 7, four test connectors 31 are disposed on the PCB 3, the test connectors 31 are connected with an external test device through test wires 32, and two chip resistors to be tested are correspondingly placed during testing, so that two ends of each chip resistor to be tested are respectively contacted with the two test connectors 31 to complete connection of a test circuit, and at this time, the two chip resistors to be tested are connected in parallel. Correspondingly, more PCB boards 3 with different forms can be designed, and the numbers of the test connectors 31 and the test wires 32 on different PCB boards 3 are different to form circuits with different forms, so that different tests can be carried out on the chip resistor to be tested, and the universality of the device is improved.
Alternatively, the hold-down mechanism 2 comprises a support frame 23, a handle 24 and a support bar 25,
The support frame 23 is vertical to be set up on base 1, and support frame 23 includes cavity 231, and bracing piece 25 is vertical to be set up in cavity 231, and mounting hole 232 has been seted up to cavity 231 top and bottom, and connecting rod 21 passes two mounting hole 232 settings, and handle 24's one end is located cavity 231 outside, and handle 24's the other end is articulated with connecting rod 21, and handle 24's middle part is articulated with bracing piece 25.
Illustratively, in the embodiment of the present utility model, when the control handle 24 is pressed down, the connecting rod 21 is moved upward along the direction of the mounting hole 232, and at this time, the pressure head rod 22 located at the bottom of the connecting rod 21 is far away from the PCB board 3, so that the chip resistor to be tested is conveniently placed on the PCB board 3, and when the chip resistor to be tested is placed, the pressed down handle 24 is loosened, and the connecting rod 21 and the pressure head rod 22 are lowered under the action of gravity, so that the pressure head rod 22 generates pressure and fixes the chip resistor to be tested. Through setting up this structure, the simple operation, operating personnel only need control handle 24 can accomplish the reciprocates to connecting rod 21 and pressure head pole 22 to this the operating convenience of device has been improved.
Optionally, the cavity 231 is provided with a chute 233 along a vertical direction, the chute 233 is connected to a mounting hole 232 at the bottom of the cavity 231, and the connecting rod 21 is slidably disposed in the chute 233.
Illustratively, in the embodiment of the present utility model, by providing the chute 233, the movement of the connecting rod 21 in the vertical direction can be assisted, and the tilting of the connecting rod 21 when moving in the vertical direction is prevented, so that the chip resistor to be tested is not pressed, and by providing the chute 233, the stability of the device is improved.
Optionally, the pressing mechanism further includes a connection plate 26 and a spring 27, the connection plate 26 and the spring 27 are disposed in the cavity 231, the connection plate 26 is horizontally disposed on the connection rod 21 and located between the hinge of the handle 24 and the connection rod 21 and the top of the cavity 231, and the spring 27 is disposed between the connection plate 26 and the top of the cavity 231.
Illustratively, in the embodiment of the present utility model, the spring 27 is in a compressed state, and by providing the connection plate 26 and the spring 27, the spring 27 always applies a downward force to the connection rod 21 without applying a force to the handle 24, so that the pressure head rod 22 below the connection rod 21 generates a pressure to the chip resistor to be tested on the PCB board 3, so that the connection rod 21 and the pressure head rod 22 fix the chip resistor to be tested not only by gravity, but also by the pressure transmitted by the spring 27, so that the chip resistor to be tested is more firmly fixed on the PCB board 3, thereby improving the stability of the device only by one step.
Optionally, the support 23 includes a right-angle support 234, the right-angle support 234 is disposed at the bottom of the cavity 231, the base 1 is provided with the step surface 11, and the right angle of the right-angle support 234 is matched with the step corner of the step surface 11.
Illustratively, in the embodiment of the present utility model, by providing the right-angle support 234 and the step surface 11 to cooperate, the step corner of the step surface 11 provides a limiting effect on the right-angle support 234, and the horizontal plate surface of the right-angle support 234 and the step surface 11 may be provided with mounting holes, and the bracket support and the step surface 11 are fixed by screws, so that the bracket 23 is integrally and firmly fixed on the base 1, thereby further improving the stability of the device.
Unless defined otherwise, technical or scientific terms used herein should be given the ordinary meaning as understood by one of ordinary skill in the art to which this utility model belongs. The terms "first," "second," and the like in the description and in the claims, are not used for any order, quantity, or importance, but are used for distinguishing between different elements. Likewise, the terms "a" or "an" and the like do not denote a limitation of quantity, but rather denote the presence of at least one. The word "comprising" or "comprises", and the like, is intended to mean that elements or items that are present in front of "comprising" or "comprising" are included in the word "comprising" or "comprising", and equivalents thereof, without excluding other elements or items. The terms "connected" or "connected," and the like, are not limited to physical or mechanical connections, but may include electrical connections, whether direct or indirect. "upper", "lower", "left", "right", etc. are used merely to denote relative positional relationships, which may also change accordingly when the absolute position of the object to be described changes.
The foregoing description of the preferred embodiments of the present utility model is not intended to limit the utility model, but rather, the utility model is to be construed as limited to the appended claims.
Claims (8)
1. The chip resistor auxiliary testing device is characterized by comprising a base (1), a pressing mechanism (2) and a PCB (3),
Hold-down mechanism (2) with PCB board (3) set up in on base (1), hold-down mechanism (2) include connecting rod (21) and pressure head pole (22), connecting rod (21) with pressure head pole (22) are vertical to be set up the top of PCB board (3), pressure head pole (22) set up the bottom of connecting rod (21), connecting rod (21) with pressure head pole (22) are configured to be close to or keep away from PCB board (3) motion, be provided with test connector (31) and test wire (32) on PCB board (3), test wire (32) one end with test connector (31) are connected, and the other end is connected with external test equipment.
2. Chip resistor auxiliary test device according to claim 1, characterized in that the crimp lever (22) and the connecting lever (21) are detachably connected.
3. The chip resistor auxiliary test device according to claim 1, wherein a rubber pad (28) is provided at the bottom of the indenter lever (22).
4. Chip resistor auxiliary test device according to claim 1, characterized in that the number of the test joints (31) on the number of the PCB boards (3) is different, and that the number of the test joints (31) on each PCB board (3) is arranged in an array.
5. The chip resistor auxiliary test device according to claim 1, wherein the hold-down mechanism (2) comprises a support frame (23), a handle (24) and a support bar (25),
The support frame (23) is vertical to be set up on base (1), support frame (23) include cavity (231), bracing piece (25) are vertical to be set up in cavity (231), mounting hole (232) have been seted up at cavity (231) top and bottom, connecting rod (21) pass two mounting hole (232) set up, one end of handle (24) is located cavity (231) outside, the other end of handle (24) with connecting rod (21) are articulated, the middle part of handle (24) with bracing piece (25) are articulated.
6. The chip resistor auxiliary test device according to claim 5, wherein the cavity (231) is provided with a chute (233) along a vertical direction, the chute (233) is connected with a mounting hole (232) at the bottom of the cavity (231), and the connecting rod (21) is slidably disposed in the chute (233).
7. The chip resistor auxiliary test device according to claim 5, wherein the pressing mechanism further comprises a connecting plate (26) and a spring (27), the connecting plate (26) and the spring (27) are arranged in the cavity (231), the connecting plate (26) is horizontally arranged on the connecting rod (21) and located between the hinge joint of the handle (24) and the connecting rod (21) and the top of the cavity (231), and the spring (27) is arranged between the connecting plate (26) and the top of the cavity (231).
8. The chip resistor auxiliary test device according to claim 5, wherein the supporting frame (23) comprises a right-angle support (234), the right-angle support (234) is arranged at the bottom of the cavity (231), the base (1) is provided with a step surface (11), and the right angle of the right-angle support (234) is matched with the step corner of the step surface (11).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202422413980.XU CN223272609U (en) | 2024-09-30 | 2024-09-30 | Chip resistor auxiliary test device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202422413980.XU CN223272609U (en) | 2024-09-30 | 2024-09-30 | Chip resistor auxiliary test device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN223272609U true CN223272609U (en) | 2025-08-26 |
Family
ID=96800152
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202422413980.XU Active CN223272609U (en) | 2024-09-30 | 2024-09-30 | Chip resistor auxiliary test device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN223272609U (en) |
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2024
- 2024-09-30 CN CN202422413980.XU patent/CN223272609U/en active Active
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