CN222636204U - Semiconductor device test fixture - Google Patents
Semiconductor device test fixture Download PDFInfo
- Publication number
- CN222636204U CN222636204U CN202420928611.1U CN202420928611U CN222636204U CN 222636204 U CN222636204 U CN 222636204U CN 202420928611 U CN202420928611 U CN 202420928611U CN 222636204 U CN222636204 U CN 222636204U
- Authority
- CN
- China
- Prior art keywords
- plate
- fixed
- push
- rod
- semiconductor device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Landscapes
- Tests Of Electronic Circuits (AREA)
Abstract
The utility model discloses a semiconductor device testing fixture, which comprises a test bench, wherein a placing plate is arranged in the center of the test bench, the placing plate is used for placing a device body, a push plate is symmetrically arranged on the upper surface of the test bench and is related to the placing plate, fixed plugs are respectively arranged on the opposite sides of the two push plates, insertion holes which are correspondingly arranged with the fixed plugs are respectively arranged on the two sides of the device body, a fixed plate is arranged on the test bench and is positioned on the opposite sides of the two push plates, an electric push rod is arranged between the fixed plate and the push plate, the movable end of the electric push rod is fixedly connected with the push plate, the fixed plugs are fixedly arranged in the middle of a fixed rod, a connecting rod is arranged between the two ends of the fixed rod and the push plate, and a sliding block is arranged between the push plate and the sliding rod. The semiconductor device testing clamp is simple and convenient to operate, greatly saves the fixing time, can be suitable for testing components with different sizes, and expands the whole application range of the device.
Description
Technical Field
The utility model relates to the technical field of clamps, in particular to a semiconductor device testing clamp.
Background
In the development of products, a series of testing work is often performed to verify the performance of the device and the matching capability with a system, and defective components are removed, so that the devices are required to be tested after being clamped and fixed by a clamp.
Through searching, the patent with the patent publication number of CN206804693U discloses an electronic semiconductor device testing clamp, which comprises a testing plate, wherein a limiting groove for placing an electronic device to be tested is formed in the middle of the top surface of the testing plate, a bonding pad and a wire guiding groove are arranged around the limiting groove, a plurality of first screw holes are formed around the limiting groove of the testing plate, the clamp also comprises a fixing seat and a locking screw, a limiting hole for placing the electronic device to be tested is formed in the middle of the fixing seat, the position of the limiting hole corresponds to the limiting groove, a second screw hole which is the same as the first screw hole in size and corresponds to the first screw hole in position is formed around the limiting hole of the fixing seat, a surrounding frame surrounding the limiting hole is arranged on the top surface of the fixing seat, a strip-shaped compression joint groove is formed in the top surface of the surrounding frame, and the locking screw is matched with the first screw hole and the second screw hole. The device is favorable for rapidly expanding test and verification work of alternative devices of multiple manufacturers, reduces product development time and saves product development cost.
In the prior art, when testing components and parts, the components and parts need to be fixed on a test board through bolts, so that the time spent in fixing the components and parts is more, and only the components and parts with fixed specifications can be tested, and the applicability of the device is poor.
Disclosure of utility model
The utility model aims to provide the semiconductor device testing clamp which is simple and convenient to operate, greatly saves the fixing time, can be suitable for testing components with different sizes, and expands the whole application range of the device.
The technical scheme includes that the semiconductor device testing fixture comprises a testing table, a positioning plate, a plurality of fixing plugs and a plurality of fixing pins, wherein the testing table is provided with the positioning plate at the central position and is used for placing a device body;
The test bench is provided with a fixing plate which is arranged on the opposite sides of the two pushing plates, an electric push rod is arranged between the fixing plate and the pushing plates, and the movable end of the electric push rod is fixedly connected with the pushing plates.
The further improved scheme in the technical scheme is as follows:
1. In the above scheme, the fixed plug is fixedly arranged in the middle of a fixed rod, and a connecting rod is arranged between two ends of the fixed rod and the push plate.
2. In the above scheme, a limiting block is respectively arranged on the two sides of the fixed plug and on the test bench, a sliding rod is arranged between the limiting block and the fixed plate, and the pushing plate is slidably sleeved on the outer wall of the sliding rod.
3. In the scheme, a sliding block is arranged between the push plate and the sliding rod.
4. In the scheme, a plurality of magnetic blocks are arranged at intervals at the top of the placing plate.
Due to the application of the technical scheme, compared with the prior art, the utility model has the following advantages:
According to the semiconductor device testing fixture, the fixed plugs are respectively arranged on the opposite sides of the two push plates, the jacks which are arranged corresponding to the fixed plugs are respectively arranged on the two sides of the device body, the fixed plates are arranged on the opposite sides of the two push plates and are arranged on the test bench, the electric push rods are arranged between the fixed plates and the push plates, and the two push plates are pushed to be close to each other by the two electric push rods, so that the fixed plugs on the opposite sides of the push plates are embedded into the jacks of the device body, the connection of components is realized, the operation is simple and convenient, compared with the mode of fixing by using screws, the fixing time is greatly saved, the device is also suitable for testing components with different sizes, and the whole application range of the device is enlarged.
Drawings
FIG. 1 is a schematic view of a first view angle structure of a semiconductor device testing jig according to the present utility model;
FIG. 2 is a schematic view of a second view angle structure of the semiconductor device test fixture of the present utility model;
fig. 3 is a schematic diagram showing an exploded structure of the semiconductor device testing jig of the present utility model.
In the drawing, 1, a test bench, 2, a fixed plate, 3, an electric push rod, 4, a push plate, 5, a connecting rod, 6, a fixed rod, 7, a fixed plug, 8, a sliding rod, 9, a limiting block, 10, a sliding block, 11, a placing plate, 12, a magnetic attraction block, 13, a device body, 14 and a jack.
Detailed Description
The present patent will be further understood by the specific examples given below, which are not intended to be limiting.
The embodiment 1 is a semiconductor device testing fixture, which comprises a test bench 1, a placing plate 11, a plurality of pushing plates 4, fixing plugs 7 and insertion holes 14, wherein the placing plate 11 is arranged in the center of the test bench 1, the placing plate 11 is used for placing a device body 13, the pushing plates 4 are symmetrically arranged on the upper surface of the test bench 1 and are arranged on the placing plate 11, the fixing plugs 7 are respectively arranged on the opposite sides of the two pushing plates 4, and the insertion holes 14 which are arranged corresponding to the fixing plugs 7 are respectively arranged on the two sides of the device body 13;
The device body is placed above the placing plate, the device body is adsorbed by the magnetic attraction block, the electric push rod is started, the push plate is driven to move by the electric push rod, the push plate moves on the sliding rod through the sliding block, the movement of the push plate is limited by the limiting block and the fixing plate, the stability of the push plate during movement is improved, and shaking is avoided;
A fixed plate 2 is arranged on the test bench 1 and positioned on the opposite sides of the two push plates 4, an electric push rod 3 is arranged between the fixed plate 2 and the push plates 4, and the movable end of the electric push rod 3 is fixedly connected with the push plates 4;
The connecting rod is driven to move through the push plate, the fixed rod is driven to move through the connecting rod, the fixed plug is driven to move through the fixed rod, the fixed plug is moved to the inside of the jack, the device body is clamped, then the device body can be tested, the fixed time is saved, the device can be flexibly adjusted and fixed according to the size of the device, and the device is more convenient for people to use.
The fixed plug 7 is fixedly installed in the middle of a fixed rod 6, and a connecting rod 5 is disposed between two ends of the fixed rod 6 and the push plate 4.
A limiting block 9 is respectively arranged on the two sides of the fixed plug 7 and the test bench 1, a sliding rod 8 is arranged between the limiting block 9 and the fixed plate 2, and the push plate 4 is sleeved on the outer wall of the sliding rod 8 in a sliding manner.
A sliding block 10 is arranged between the push plate 4 and the sliding rod 8.
A plurality of magnetic attraction blocks 12 are arranged at intervals on the top of the placement plate 11.
Embodiment 2 a semiconductor device testing jig comprises a test bench 1 provided with a placing plate 11 in the center, wherein the placing plate 11 is used for placing a device body 13, a push plate 4 is symmetrically arranged on the upper surface of the test bench 1 and about the placing plate 11, a fixed plug 7 is respectively arranged on the opposite sides of the two push plates 4, and two sides of the device body 13 are respectively provided with a jack 14 which is arranged corresponding to the fixed plug 7;
A fixed plate 2 is arranged on the test bench 1 and positioned on the opposite sides of the two push plates 4, an electric push rod 3 is arranged between the fixed plate 2 and the push plates 4, and the movable end of the electric push rod 3 is fixedly connected with the push plates 4;
The two push plates are pushed to be close to each other through the two electric push rods, so that the fixed plugs on the opposite sides of the push plates are embedded into the jacks of the device body, connection of components is achieved, operation is simple and convenient, compared with a mode of fixing by using screws, fixing time is greatly saved, the device can be suitable for testing components of different sizes, and the whole application range of the device is enlarged.
The fixed plug 7 is fixedly installed in the middle of a fixed rod 6, and a connecting rod 5 is disposed between two ends of the fixed rod 6 and the push plate 4.
A limiting block 9 is respectively arranged on the two sides of the fixed plug 7 and the test bench 1, a sliding rod 8 is arranged between the limiting block 9 and the fixed plate 2, and the push plate 4 is sleeved on the outer wall of the sliding rod 8 in a sliding manner.
A sliding block 10 is arranged between the push plate 4 and the sliding rod 8.
A plurality of magnetic attraction blocks 12 are arranged at intervals on the top of the placement plate 11.
The electric push rod 3 is fixedly installed inside the fixing plate 2.
The magnetic blocks 12 are equidistantly spaced.
The working principle of the utility model is as follows:
When the device is used, the device body is firstly placed above the placing plate, the device body is adsorbed by the magnetic attraction block, the electric push rod is started, the push plate is driven to move by the electric push rod, the push plate moves on the sliding rod through the sliding block, the movement of the push plate is limited by the limiting block and the fixing plate, the stability of the push plate during movement is improved, and shaking is avoided;
The connecting rod is driven to move through the push plate, the fixed rod is driven to move through the connecting rod, the fixed plug is driven to move through the fixed rod, the fixed plug is moved to the inside of the jack, the device body is clamped, then the device body can be tested, the fixed time is saved, the device can be flexibly adjusted and fixed according to the size of the device, and the device is more convenient for people to use.
When the semiconductor device testing clamp is adopted, the two pushing plates are pushed to be close to each other through the two electric pushing rods, so that the fixed plugs on the opposite sides of the pushing plates are embedded into the jacks of the device body, connection of components is realized, the operation is simple and convenient, compared with the mode of fixing by adopting screws, the fixing time is greatly saved, the device can also be suitable for testing components with different sizes, and the whole application range of the device is enlarged.
The above embodiments are provided to illustrate the technical concept and features of the present utility model and are intended to enable those skilled in the art to understand the content of the present utility model and implement the same, and are not intended to limit the scope of the present utility model. All equivalent changes or modifications made in accordance with the spirit of the present utility model should be construed to be included in the scope of the present utility model.
Claims (5)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202420928611.1U CN222636204U (en) | 2024-04-30 | 2024-04-30 | Semiconductor device test fixture |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202420928611.1U CN222636204U (en) | 2024-04-30 | 2024-04-30 | Semiconductor device test fixture |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN222636204U true CN222636204U (en) | 2025-03-18 |
Family
ID=94959411
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202420928611.1U Active CN222636204U (en) | 2024-04-30 | 2024-04-30 | Semiconductor device test fixture |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN222636204U (en) |
-
2024
- 2024-04-30 CN CN202420928611.1U patent/CN222636204U/en active Active
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN102645592B (en) | Machine for testing service life of connector | |
| CN211979115U (en) | Multi-interface test fixture | |
| CN206178048U (en) | Antenna test fixture | |
| CN204008920U (en) | Test system and its alignment fixture | |
| CN222636204U (en) | Semiconductor device test fixture | |
| CN202676749U (en) | Multi-interface plug-in movable test fixture | |
| CN110824334A (en) | A PCB board inspection fixture with positioning function | |
| CN204142913U (en) | Electrical measuring equipment | |
| CN114706019B (en) | A connector sampling test tool and its test method | |
| CN204346695U (en) | Buffer mobile phone clamping device | |
| CN211700897U (en) | Quick positioning tool for double-station cable connector | |
| CN110568355B (en) | Multiunit that small-size motor used drags laboratory bench | |
| CN212180855U (en) | Micro motor testing device | |
| CN213593916U (en) | An easy-to-install printing fixture | |
| CN221746228U (en) | PCB board frock testboard | |
| CN221916315U (en) | Chip tray packaging device | |
| CN119936446B (en) | Probe card detection device and operation method thereof | |
| CN223532337U (en) | A multi-station fixture for electronic assembly testing | |
| CN222386806U (en) | A fixture positioning device | |
| CN218155866U (en) | PIN needle conduction testing equipment | |
| CN222337242U (en) | Fixing device for performance test of electronic element | |
| CN222212880U (en) | Integrated circuit plug-in test structure | |
| CN217586650U (en) | Clamp for measuring mechanical and electrical properties of flexible electronic device | |
| CN221781840U (en) | An electronic connector detection device capable of rapid positioning | |
| CN217238141U (en) | Cordless kettle plug testing machine |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant |