CN221946056U - Probe test fixture - Google Patents
Probe test fixture Download PDFInfo
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- CN221946056U CN221946056U CN202420085599.2U CN202420085599U CN221946056U CN 221946056 U CN221946056 U CN 221946056U CN 202420085599 U CN202420085599 U CN 202420085599U CN 221946056 U CN221946056 U CN 221946056U
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- workbench
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- 238000012360 testing method Methods 0.000 title claims abstract description 49
- 239000000523 sample Substances 0.000 title claims abstract description 45
- 230000007246 mechanism Effects 0.000 claims abstract description 29
- 230000003028 elevating effect Effects 0.000 claims abstract description 7
- 230000009194 climbing Effects 0.000 abstract description 6
- 230000004075 alteration Effects 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000003139 buffering effect Effects 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
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Abstract
The utility model discloses a probe test fixture, which belongs to the technical field of probe test and comprises a workbench, wherein rectangular mounting frames are arranged on the surface and the top of the workbench, and clamping mechanisms are arranged on two sides of the inside of the rectangular mounting frames and used for clamping a probe plate and a test plate; the inside of workstation is provided with the elevating system who is used for being located the elevating system of workstation top rectangle mounting bracket, and elevating system includes two climbing mechanisms, and two climbing mechanisms are fixed in the inside both ends of workstation respectively, and climbing mechanism's output is fixed with the arc fixed block, and the arc fixed block is close to the both ends of rectangle mounting bracket and with rectangle mounting bracket fixed connection. Through fixture for two horizontal grip blocks can remove towards probe card or test board, and then can carry out the centre gripping to probe card and the test board of different models, improve the clamping efficiency of rectangle mounting bracket, and then improve the suitability of rectangle mounting bracket.
Description
Technical Field
The utility model belongs to the technical field of probe testing, and particularly relates to a probe testing jig.
Background
The spring wire used in the PCB tester comprises a test probe support body which is integrally wound by a spring wire, and an electronic wire is welded at the lower end of the spring. The test probes can be movably arranged in the probe plates up and down and below the PCB to-be-tested point, the test probes are movably contacted with the upper ends of the springs, and when the PCB is tested, the probe plates in the upper test jig and the lower test jig are mutually extruded towards the PCB, so that the upper ends of the test probes in the probe plates are contacted with the test points of the circuit board, and simultaneously, the lower ends of the test probes are downwards moved to be contacted with the upper end support body of the springs in the spring connecting line, and test current flows to the electronic wires through the wire arrangement of the tester, flows to the springs through the electronic wires, and flows to the test probes after bypassing the springs, thereby realizing conductive test. The spring has the function of buffering the downward movement of the test probe, and the test probe is prevented from damaging the PCB.
As disclosed in patent (202022377365. X), a PCB probe test fixture is more flexible to operate, portable and convenient to move, and is applicable to PCB probe test fixtures in various different occasions by moving the PCB probe test fixture to test an immovable PCB workpiece;
when the above technology is used, the following technical problems are found in the prior art: the probe board and the test board of different models can not be well fixed, so that the applicability of the fixture fixing efficiency is reduced, and the use efficiency of the fixture is affected.
Disclosure of utility model
The utility model aims to provide a probe test fixture so as to solve the problem of the prior art in the use process.
In order to achieve the above purpose, the present utility model provides the following technical solutions: the probe test fixture comprises a workbench, wherein rectangular mounting frames are arranged on the surface and the top of the workbench, and clamping mechanisms are arranged on two sides of the inside of the rectangular mounting frames and used for clamping a probe plate and a test plate;
the inside of workstation is provided with the elevating system who is used for being located workstation top rectangle mounting bracket and goes up and down.
Preferably, the lifting mechanism comprises two jacking mechanisms, the two jacking mechanisms are respectively fixed at two ends of the inside of the workbench, an arc-shaped fixing block is fixed at the output end of the jacking mechanism, and the arc-shaped fixing block is close to two ends of the rectangular mounting frame and fixedly connected with the rectangular mounting frame.
Preferably, the jacking mechanism is a push rod motor or an air cylinder or a hydraulic cylinder.
Preferably, the clamping mechanism comprises a rectangular fixing block, the rectangular fixing block is close to one side of the workbench and is fixedly connected with the workbench, and two ends of one side, far away from the rectangular mounting frame, of the rectangular fixing block are respectively and rotatably connected with an oblique rotating column;
The inside of the rectangular fixed block is fixedly provided with a double-output-shaft cylinder, two output ends of the double-output-shaft cylinder are respectively fixedly provided with an L-shaped movable column, the inside of the L-shaped movable column is rotationally connected with a vertical movable rod, and the vertical movable rod penetrates through the inside of the oblique rotary column and is movably connected with the oblique rotary column;
One end of the oblique rotating column far away from the rectangular fixing block is rotationally connected with a transverse clamping block, and a telescopic assembly is arranged between the transverse clamping block and the rectangular mounting frame.
Preferably, the telescopic assembly comprises a circular sliding tube, the inside of the circular sliding tube is connected with a circular sliding block in a sliding mode, one end, close to the transverse clamping block, of the circular sliding block is fixed with a vertical polished rod, and the vertical polished rod is close to one end, close to the transverse clamping block, of the circular sliding block and is fixedly connected with the transverse clamping block.
Preferably, one side of the circular sliding tube, which is close to the rectangular mounting frame, is fixed with a dovetail sliding block, a dovetail sliding groove is formed in the rectangular mounting frame, and the circular sliding tube is in matched sliding connection with the rectangular mounting frame through the dovetail sliding block and the dovetail sliding groove.
Preferably, a transverse chute is formed in the oblique rotation column, and the vertical movable rod is movably connected with the oblique rotation column through the transverse chute.
Compared with the prior art, the utility model has the beneficial effects that:
This scheme is through fixture for two horizontal grip blocks can remove towards probe card or test board, and then can carry out the centre gripping to probe card and the test board of different models, improve the clamping efficiency of rectangle mounting bracket, and then improve the suitability of rectangle mounting bracket.
Drawings
FIG. 1 is a schematic view of the overall structure of the present utility model;
FIG. 2 is a cross-sectional view of the interior of the work table of the present utility model;
FIG. 3 is a schematic view of a rectangular mounting block and dual-output cylinder according to the present utility model;
fig. 4 is a structural cross-sectional view of the inside of the circular sliding tube of the present utility model.
In the figure: 1. a work table; 2. a rectangular mounting frame; 3. a jacking mechanism; 4. an arc-shaped fixed block; 5. a transverse clamping block; 6. a rectangular fixed block; 7. a dual-output shaft cylinder; 8. an L-shaped movable column; 9. a vertical movable rod; 10. a slant rotating column; 11. a circular sliding tube; 12. a vertical polish rod; 13. a circular sliding block.
Detailed Description
The following description of the embodiments of the present utility model will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present utility model, but not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the utility model without making any inventive effort, are intended to be within the scope of the utility model.
Referring to fig. 1-4, the probe test fixture comprises a workbench 1, wherein a rectangular mounting frame 2 is arranged on the surface and the top of the workbench 1, and clamping mechanisms are arranged on two sides of the interior of the rectangular mounting frame 2 and used for clamping a probe card and a test board;
The inside of workstation 1 is provided with the elevating system that is used for being located the rectangular mounting bracket 2 in workstation 1 top and goes up and down.
Further, elevating system includes two climbing mechanism 3, and two climbing mechanism 3 are fixed in the inside both ends of workstation 1 respectively, and climbing mechanism 3's output is fixed with arc fixed block 4, and arc fixed block 4 is close to rectangular mounting frame 2's both ends and with rectangular mounting frame 2 fixed connection.
According to the technical scheme, the rectangular mounting frame 2 at the top of the workbench 1 can be lifted by the operation of the jacking mechanism 3, so that the probe card can move towards the test board;
further, the jacking mechanism 3 is a push rod motor or an air cylinder or a hydraulic cylinder.
Through the technical scheme, the jacking mechanism 3 can have different use choices, so that the jacking mechanism 3 can be replaced according to different use requirements, and the use type of the jacking mechanism 3 can be changed;
Further, the clamping mechanism comprises a rectangular fixing block 6, one side of the rectangular fixing block 6 close to the workbench 1 is fixedly connected with the workbench 1, and two ends of one side of the rectangular fixing block 6 far away from the rectangular mounting frame 2 are respectively and rotatably connected with an oblique rotating column 10;
A double-shaft-outlet cylinder 7 is fixed in the rectangular fixed block 6, two output ends of the double-shaft-outlet cylinder 7 are both fixed with an L-shaped movable column 8, a vertical movable rod 9 is rotatably connected in the L-shaped movable column 8, and the vertical movable rod 9 penetrates through the inside of the oblique rotary column 10 and is movably connected with the oblique rotary column 10;
One end of the oblique rotation column 10, which is far away from the rectangular fixed block 6, is rotationally connected with a transverse clamping block 5, and a telescopic assembly is arranged between the transverse clamping block 5 and the rectangular mounting frame 2.
According to the technical scheme, through the operation of the double-output-shaft cylinder 7, the moving directions of the two L-shaped moving columns 8 are opposite, so that the two oblique rotating columns 10 can rotate, and the rotating directions are opposite;
Further, the telescopic assembly comprises a circular sliding tube 11, a circular sliding block 13 is connected inside the circular sliding tube 11 in a sliding manner, a vertical polished rod 12 is fixed at one end, close to the transverse clamping block 5, of the circular sliding block 13, and the vertical polished rod 12 is fixed at one end, close to the transverse clamping block 5, of the circular sliding block 13 and is fixedly connected with the transverse clamping block 5.
According to the technical scheme, the round sliding block 13 can slide in the round sliding tube 11, the vertical polished rod 12 penetrates through the round sliding tube 11 and is convenient for the round sliding tube 11 to be in sliding connection, and then the moving track of the transverse clamping block 5 can be limited;
Further, a dovetail sliding block is fixed on one side, close to the rectangular mounting frame 2, of the circular sliding tube 11, a dovetail sliding groove is formed in the rectangular mounting frame 2, and the circular sliding tube 11 is in matched sliding connection with the rectangular mounting frame 2 through the dovetail sliding block and the dovetail sliding groove.
Through the technical scheme, the circular sliding tube 11 can transversely slide in the rectangular mounting frame 2 through the arrangement of the dovetail sliding blocks and the dovetail sliding grooves;
Further, a transverse chute is formed in the oblique rotation column 10, and the vertical movable rod 9 is movably connected with the oblique rotation column 10 through the transverse chute.
According to the technical scheme, through the arrangement of the transverse sliding grooves, the vertical movable rod 9 can move in the oblique rotating column 10, so that the oblique rotating column 10 can rotate;
through fixture for two horizontal grip blocks 5 can remove towards probe card or test board, and then can carry out the centre gripping to probe card and the test board of different models, improve the clamping efficiency of rectangle mounting bracket 2, and then improve the suitability of rectangle mounting bracket 2.
Working principle: the probe plate or the test board is placed in the rectangular mounting frame 2, the double-output-shaft cylinder 7 is operated, so that the moving directions of the two L-shaped moving columns 8 are opposite, the L-shaped moving columns 8 are moved through the vertical movable rods 9 and the transverse sliding grooves, the two oblique rotating columns 10 can rotate, and the transverse clamping blocks 5 can move towards the probe plate or the test board due to the rotation of the two oblique rotating columns 10, so that the rectangular mounting frame 2 can fix the probe plate or the test board.
Although embodiments of the present utility model have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and alterations can be made therein without departing from the principles and spirit of the utility model, the scope of which is defined in the appended claims and their equivalents.
Claims (7)
1. Probe test fixture, its characterized in that: the test device comprises a workbench (1), wherein rectangular mounting frames (2) are arranged on the surface and the top of the workbench (1), and clamping mechanisms are arranged on two sides of the interior of the rectangular mounting frames (2) and used for clamping a probe card and a test board;
The inside of workstation (1) is provided with the elevating system who is used for being located the lift of workstation (1) top rectangle mounting bracket (2).
2. The probe test fixture of claim 1, wherein: the lifting mechanism comprises two lifting mechanisms (3), the two lifting mechanisms (3) are respectively fixed at two ends of the inside of the workbench (1), an arc-shaped fixing block (4) is fixed at the output end of the lifting mechanism (3), and the arc-shaped fixing block (4) is close to two ends of the rectangular mounting frame (2) and fixedly connected with the rectangular mounting frame (2).
3. The probe test fixture of claim 2, wherein: the jacking mechanism (3) is a push rod motor or an air cylinder or a hydraulic cylinder.
4. The probe test fixture of claim 2, wherein: the clamping mechanism comprises a rectangular fixing block (6), wherein the rectangular fixing block (6) is close to one side of the workbench (1) and is fixedly connected with the workbench (1), and two ends of one side, far away from the rectangular mounting frame (2), of the rectangular fixing block (6) are respectively and rotatably connected with an oblique rotating column (10);
The double-shaft cylinder (7) is fixed in the rectangular fixed block (6), two output ends of the double-shaft cylinder (7) are both fixed with an L-shaped movable column (8), a vertical movable rod (9) is rotatably connected in the L-shaped movable column (8), and the vertical movable rod (9) penetrates through the inside of the oblique rotary column (10) and is movably connected with the oblique rotary column (10);
one end of the oblique rotating column (10) far away from the rectangular fixed block (6) is rotationally connected with a transverse clamping block (5), and a telescopic assembly is arranged between the transverse clamping block (5) and the rectangular mounting frame (2).
5. The probe test fixture of claim 4, wherein: the telescopic assembly comprises a circular sliding tube (11), a circular sliding block (13) is connected inside the circular sliding tube (11) in a sliding mode, a vertical polished rod (12) is fixed to one end, close to the transverse clamping block (5), of the circular sliding block (13), and the vertical polished rod (12) is close to one end, close to the transverse clamping block (5) and is fixedly connected with the transverse clamping block (5).
6. The probe test fixture of claim 5, wherein: one side that circular sliding tube (11) is close to rectangle mounting bracket (2) is fixed with the forked tail slider, the forked tail spout has been seted up to the inside of rectangle mounting bracket (2), cooperation sliding connection through forked tail slider and forked tail spout between circular sliding tube (11) and rectangle mounting bracket (2).
7. The probe test fixture of claim 4, wherein: the inside of the oblique rotation column (10) is provided with a transverse chute, and the vertical movable rod (9) is movably connected with the oblique rotation column (10) through the transverse chute.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202420085599.2U CN221946056U (en) | 2024-01-12 | 2024-01-12 | Probe test fixture |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202420085599.2U CN221946056U (en) | 2024-01-12 | 2024-01-12 | Probe test fixture |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN221946056U true CN221946056U (en) | 2024-11-01 |
Family
ID=93250059
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202420085599.2U Active CN221946056U (en) | 2024-01-12 | 2024-01-12 | Probe test fixture |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN221946056U (en) |
-
2024
- 2024-01-12 CN CN202420085599.2U patent/CN221946056U/en active Active
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