CN221826936U - Chip carrier and system-level test device - Google Patents

Abstract

The utility model discloses a chip carrier device, including: a carrier platform; a support frame, a support frame is installed in the carrier platform, a movable cavity is evenly opened in the carrier platform, a second elastic member is installed in the movable cavity, a guide rod is evenly arranged at the bottom of the support frame, the guide rod extends into the movable cavity and is connected with the second elastic member, ear plates are arranged at the four corners of the support frame, a telescopic groove is opened in the ear plate, an elastic member is installed in the telescopic groove, and a conical block is fixed at the other end of the elastic member; a locking member, a locking member is arranged at a position corresponding to the ear plate in the carrier platform, the locking member includes a fixing rod, a truncated cone is fixed on the top of the fixing rod, and a truncated cone is movablely sleeved on the outer periphery of the fixing rod. By pressing the support frame downward and cooperating with the locking member, the chip can be quickly taken and placed without the aid of auxiliary tools such as tweezers, thereby improving the test efficiency, and at the same time, the chip can be effectively prevented from being damaged by auxiliary tools such as tweezers.

Description

Chip carrier and system-level test device

Technical Field

The utility model belongs to the technical field of chip testing equipment, and in particular relates to a chip carrying device and a system-level testing device.

Background Art

The chip needs to undergo system-level testing before leaving the factory. During the test, the chip must be placed on the carrier of the test equipment.

Currently, when testing a chip, it is necessary to place the chip on a carrier with the aid of auxiliary tools such as tweezers. After the test is completed, the chip also needs to be taken out with auxiliary tools such as tweezers, which is rather troublesome.

Utility Model Content

The utility model aims at solving the problems existing in the prior art and proposes the following technical solutions:

A chip carrier device, comprising:

Carrying platform;

A support frame is installed in the carrying platform, and movable cavities are evenly provided in the carrying platform, and a second elastic member is installed in the movable cavity. A guide rod is evenly provided at the bottom of the support frame, and the guide rod extends into the movable cavity and is connected with the second elastic member. Ear plates are provided at the four corners of the support frame, and a telescopic groove is provided in the ear plate, and an elastic member 1 is installed in the telescopic groove. A conical block is fixed to the other end of the elastic member 1, and the conical block passes through the ear plate;

A locking piece is provided at a position corresponding to the ear plate in the bearing platform, and the locking piece includes a fixing rod, a frustum one is fixed on the top of the fixing rod, a frustum two is movably sleeved on the outer periphery of the fixing rod, the frustum two is symmetrical with the frustum one, and the conical clamping block matches the frustum two and the frustum one.

As a preferred embodiment of the above technical solution, the support frame is symmetrically provided with notches.

As a preferred embodiment of the above technical solution, guide plates are symmetrically provided on both sides of the support frame, and guide grooves are correspondingly opened in the bearing platform, and the guide plates are slidably installed in the guide grooves.

As a preferred embodiment of the above technical solution, the inner dimension of the support frame is smaller than the outer dimension of the chip, and the outer edge of the chip is placed on the support frame.

Chip system-level test equipment, including:

The chip carrier device mentioned above;

A test seat, the test seat comprising a probe seat, the probe seat is installed in the bearing platform and located inside the support frame, and probes are evenly arranged on the probe seat;

The pressing mechanism includes a protective cover, the protective cover matches the bearing platform, the protective cover and the bearing platform are hingedly installed together, an adjusting rod is passed through the protective cover, a pressing cover is provided at one end of the adjusting rod, a pressing plate is sleeved in the pressing cover, and three elastic members are evenly provided between the pressing plate and the pressing cover.

The beneficial effects of the utility model are:

The utility model is provided with a support frame and a locking piece. By pressing the support frame downward and cooperating with the locking piece, the chip can be quickly taken and placed without the aid of auxiliary tools such as tweezers, thereby improving the test efficiency and also effectively preventing the chip from being damaged by auxiliary tools such as tweezers.

BRIEF DESCRIPTION OF THE DRAWINGS

Figure 1 is a schematic diagram of the overall structure of the utility model;

FIG2 is a schematic diagram of the cross-sectional structure of the load-bearing platform;

FIG3 is a schematic diagram of a cross-sectional structure of a pressing mechanism;

FIG. 4 is a schematic diagram of a conventional chip structure.

In the figure:

1. Carrying platform; 11. Guide groove; 12. Movable cavity; 2. Support frame; 21. Ear plate; 211. Telescopic groove; 212. Elastic part 1; 213. Conical block; 22. Guide plate; 23. Notch; 24. Guide rod; 25. Elastic part 2; 3. Locking part; 31. Fixing rod; 32. Cone truncated cone 1; 33. Cone truncated cone 2; 4. Test seat; 41. Probe seat; 42. Probe; 5. Pressing mechanism; 51. Protective cover; 52. Adjusting rod; 53. Pressing cover; 54. Pressing plate; 55. Elastic part 3.

DETAILED DESCRIPTION

In order to make the purpose, technical solution and advantages of the embodiments of the present utility model clearer, the technical solution of the present utility model will be clearly and completely described below in conjunction with the embodiments.

Example

As shown in Figure 1, Figure 2, and Figure 4;

The chip carrying device comprises a carrying platform 1, a groove is provided in the carrying platform 1, a support frame 2 is installed in the groove, the inner size of the support frame 2 is smaller than the outer size of the chip, the outer edge of the chip is placed on the support frame 2, an active cavity 12 is evenly provided in the carrying platform 1, an elastic member 25 is installed in the active cavity 12, and the elastic member 25 can be a spring, and a guide rod 24 is evenly provided at the bottom of the support frame 2, the guide rod 24 extends into the active cavity 12 and is connected to the elastic member 25, and ear plates 21 are provided at the four corners of the support frame 2, and a telescopic groove 211 is provided in the ear plate 21, and the telescopic groove 2 An elastic member 212 is installed in the bearing platform 11, and the elastic member 212 can be a spring. A conical block 213 is fixed at the other end of the elastic member 212, and the conical block 213 passes through the ear plate 21; a locking member 3 is provided at a position corresponding to the ear plate 21 in the bearing platform 1, and the locking member 3 includes a fixing rod 31, a frustum 32 is fixed on the top of the fixing rod 31, and a frustum 33 is movably sleeved on the periphery of the fixing rod 31, and the frustum 33 is symmetrical with the frustum 32, and the conical block 213 matches the frustum 33 and the frustum 32. When the chip needs to be tested During the test, the chip is placed on the support frame 2, and then the support frame 2 is pressed downward, and the conical block 213 is squeezed by the truncated cone 32 and retracted into the telescopic groove 211. When the conical block 213 moves to the bottom of the truncated cone 32, the conical block 213 is released from the restriction, and at the same time, the guide rod 24 squeezes the elastic member 25, and the elastic member 212 rebounds so that the conical block 213 extends out and rests under the truncated cone 32. The chip contacts the test equipment for testing. When the test is completed, the support frame 2 is pressed downward again, so that the conical block 213 is further squeezed by the truncated cone 32. The cone 2 33 is squeezed, and since the inclined surface of the cone 2 33 faces obliquely upward, the conical block 213 slowly extends out. At this time, from the opening support frame 2, due to the rebound of the elastic member 25, the conical block 213 will drive the cone 2 33 to move upward. When the cone 2 33 fits the cone 1 32, the conical block 213 slowly contracts, and thus cooperates with the elastic force of the elastic member 2 25 to move directly above the cone 1 32. At this time, the chip is lifted up, which is convenient for taking, thereby improving the test efficiency, and at the same time, it can also effectively prevent auxiliary tools such as tweezers from damaging the chip;

Furthermore, the support frame 2 is symmetrically provided with notches 23, which facilitate the operator to take out the chip with two fingers;

Furthermore, guide plates 22 are symmetrically provided on both sides of the support frame 2, and corresponding guide grooves 11 are opened in the supporting platform 1. The guide plates 22 are slidably installed in the guide grooves 11. On the one hand, this can ensure the stability of the support frame 2 when it moves up and down, and on the other hand, the support frame 2 can be moved down by pressing the guide plates 22, avoiding directly pressing the support frame 2 to hit the chip and damage the chip.

As shown in Figures 1 and 3;

The chip system-level testing device comprises the above-mentioned chip carrying device, a test seat 4 and a pressing mechanism 5. The test seat 4 comprises a probe seat 41, which is installed in the carrying platform 1 and located on the inner side of the support frame 2. Probes 42 are evenly arranged on the probe seat 41, and the chip is tested by contacting the probes 42 with the chip; the pressing mechanism 5 comprises a protective cover 51, which matches the carrying platform 1, and the protective cover 51 is hingedly installed with the carrying platform 1. On the one hand, the protective cover 51 can provide a dust-free environment for chip testing, thereby improving the test effect, and the protective cover An adjusting rod 52 is passed through 51, and the adjusting rod 52 can be a screw rod. A pressing cover 53 is provided at one end of the adjusting rod 52, and a pressing plate 54 is sleeved in the pressing cover 53. Elastic parts 55 are evenly arranged between the pressing plate 54 and the pressing cover 53, and the elastic parts 55 can be springs. The position of the pressing plate 54 can be adjusted by the adjusting rod 52, so that the pressing plate 54 can press the chip with appropriate force to avoid damaging the chip due to excessive force, and preventing the chip from being unable to contact the probe 42 due to insufficient force, resulting in the inability to perform the test. The elastic part 55 provides a buffer for the pressing plate 54, thereby better protecting the chip.

The above embodiments are only used to illustrate the technical solution of the utility model, but not to limit it.

Claims (5)

1. Chip carrier device, characterized by comprising:

A carrying platform (1);

the support frame (2), install in the load-bearing platform (1) and hold in the palm frame (2), evenly offered movable chamber (12) in load-bearing platform (1), install elastic component two (25) in movable chamber (12), hold in the palm frame (2) bottom evenly is equipped with guide bar (24), guide bar (24) stretch into in movable chamber (12) and be connected with elastic component two (25), four angles of holding in the palm frame (2) all are equipped with otic placode (21), telescopic slot (211) have been seted up in otic placode (21), install elastic component one (212) in telescopic slot (211), elastic component one (212) other end is fixed with toper fixture block (213), toper fixture block (213) run through otic placode (21);

The locking piece (3), the position that corresponds otic placode (21) in loading platform (1) is equipped with locking piece (3), locking piece (3) are including dead lever (31), dead lever (31) top is fixed with circular truncated cone (32), the peripheral movable sleeve of dead lever (31) has circular truncated cone two (33), circular truncated cone two (33) and circular truncated cone one (32) are symmetrical, toper fixture block (213) and circular truncated cone two (33) and circular truncated cone one (32) assorted.

2. The chip carrier according to claim 1, wherein: notches (23) are symmetrically formed in the support frame (2).

3. The chip carrier according to claim 2, wherein: guide plates (22) are symmetrically arranged on two sides of the support frame (2), guide grooves (11) are correspondingly formed in the bearing platform (1), and the guide plates (22) are slidably mounted in the guide grooves (11).

4. A chip carrier according to claim 3, wherein: the inner side size of the supporting frame (2) is smaller than the outer side size of the chip, and the outer side of the chip is erected on the supporting frame (2).

5. A system-on-chip test apparatus, comprising:

the chip carrier according to any one of claims 1-4;

The test seat (4), the test seat (4) includes the probe seat (41), the said probe seat (41) is installed in bearing platform (1), and lie in supporting the inboard of the frame (2), there are probes (42) on the said probe seat (41) evenly;

Pressing mechanism (5), pressing mechanism (5) include protection casing (51), protection casing (51) and loading platform (1) assorted, protection casing (51) are in the same place with loading platform (1) articulated installation, run through on protection casing (51) and be equipped with regulation pole (52), regulation pole (52) one end is equipped with presses cover (53), press cover (53) endotheca to have pressing plate (54), pressing plate (54) and pressing cover (53) between evenly be equipped with elastic component III (55).