CN221378046U

CN221378046U - Integrated circuit test seat

Info

Publication number: CN221378046U
Application number: CN202323092423.4U
Authority: CN
Inventors: 李智
Original assignee: Mingkesi Shanghai Microelectronics Technology Co ltd
Current assignee: Mingkesi Shanghai Microelectronics Technology Co ltd
Priority date: 2023-11-16
Filing date: 2023-11-16
Publication date: 2024-07-19
Anticipated expiration: 2033-11-16

Abstract

The application belongs to the technical field of integrated circuit detection and discloses an integrated circuit test seat, which comprises an operation table, wherein the top surface of the operation table is connected with a test top plate through a supporting rod, the top surface of the test top plate is provided with a probe device, the output end of the probe device is provided with a probe pin, the probe pin penetrates through the test top plate and extends to the bottom, the top surface of the test top plate is provided with a through groove, and two ends of the top surface of the test top plate are fixedly connected with vertical plates; the probe pin can move, and the screw rod is driven to rotate through the motor I, so that the connecting block and the probe device can move, further different positions of the integrated circuit can be detected, the integrated circuit board is placed on the supporting table, the driving cylinder enables the two clamping blocks to be close to each other, the integrated circuit board can be clamped, the operation is convenient, the supporting table is driven to rotate through the driving motor II, the integrated circuit board can be rotated, the probe pin can detect the integrated circuit boards at the different positions, and the use is more convenient.

Description

Integrated circuit test seat

Technical Field

The present application relates to the field of integrated circuit testing technology, and more particularly, to an integrated circuit test socket.

Background

An integrated circuit is a miniature electronic device or component, which adopts a certain technology to interconnect the elements such as transistors, resistors, capacitors, inductors and the like required in a circuit together, and the elements are manufactured on a small semiconductor wafer or a medium substrate or a plurality of small semiconductor wafers, and then are packaged in a tube shell to form a miniature structure with the required circuit function, wherein all the elements are structurally combined into a whole, so that the electronic element has a great step towards microminiaturization, low power consumption, intellectualization and high reliability.

The searched public number: the utility model provides an integrated circuit test seat that CN218885986U discloses relates to integrated circuit test technical field, includes the operation panel, the lift groove has been seted up on the top of operation panel, the inside of lift groove is equipped with elevating system, the inside bottom fixedly connected with base of lift groove, the top of base is close to both sides department and has all seted up the spout, opens two rotating electrical machines on the base to control the rotation number of turns of rotating electrical machines, and then drive two positive and negative lead screws of rotating electrical machines one end and rotate in the spout, can make two screw thread slider relative movement on the positive and negative lead screw, under the swing joint of first movable part and second movable part, the hinge pole carries out the angle modulation, and then makes the testboard carry out altitude mixture control, is favorable to under rotating electrical machines's rotation control, drives the testboard and adjusts to fixed altitude mixture department, makes the probe pin detect the integrated circuit board under the fixed support of bracing piece and test roof.

However, there is a certain deficiency in this application, the position of the probe pin is fixed, the probe pin cannot move, the electronic components of the integrated circuit are more, the detection items are more, the lack of the moving function needs to move the position of the integrated circuit instead, the use of the clamping mechanism is inconvenient, and the manual rotation is needed.

In order to solve the above-mentioned problems, the present application provides an integrated circuit test socket.

Disclosure of utility model

The application provides an integrated circuit test seat which adopts the following technical scheme:

The utility model provides an integrated circuit test seat, includes the operation panel, the top surface of operation panel is connected with the test roof through branch, and the top surface of test roof is provided with the probe ware, the output of probe ware is provided with the probe pin, and the probe pin runs through the test roof and stretches to the bottom, logical groove has been seted up to the top surface of test roof, the equal fixedly connected with riser in both ends of test roof top surface, two rotate between the riser and be connected with the lead screw, and lead screw threaded connection has the connecting block, the connecting block is installed at the preceding terminal surface of probe ware, riser side-mounting has motor one, and the output of motor one runs through the riser and with lead screw fixed connection, the reservation groove has been seted up to the top surface of operation panel, and the interior bottom surface fixed mounting of reservation groove has the electronic hydraulic stem, the output fixedly connected with backup pad of electronic hydraulic stem, and the top surface fixed mounting of backup pad has motor two, the output fixedly connected with brace table of motor, and the top surface fixed mounting of brace table has the grip block, the grip block of top surface fixedly connected with of brace table.

Through above-mentioned technical scheme, the probe foot can remove, drives the lead screw through motor one and rotates to make connecting block and probe ware remove, and then can detect integrated circuit different positions, place integrated circuit board on the brace table, drive cylinder makes two grip blocks be close to each other, can the centre gripping integrated circuit board, and the operation is comparatively convenient.

Further, the top surface fixedly connected with two other risers of test roof, and fixedly connected with gag lever post between two risers, the rear end face fixedly connected with of probe ware is additional connecting block, and connecting block and gag lever post sliding fit.

Through the technical scheme, the limiting rod between the vertical plates can limit the movement of the probe pins.

Further, the spout has all been seted up to the both sides of reservation groove, and the equal fixedly connected with vertical slide bar of bottom surface in the spout, the both sides of backup pad are all fixedly connected with slider, and the slider is run through by the slide bar and with slide bar sliding fit.

Through above-mentioned technical scheme, slider and slide bar can play spacing effect to the lift of backup pad, avoid producing the skew in the lift process.

Further, the outer periphery of the probe pin is provided with a transparent shell, and the shell is clamped with the outer periphery of the probe pin.

Through above-mentioned technical scheme, the casing can protect the probe foot, protects when not using, avoids debris such as contact dust.

Further, the center line of the through groove on the top surface of the test top plate coincides with the center of the center line of the test top plate, and the connecting blocks on the front end surface and the rear end surface of the probe are symmetrically distributed on the center line of the bottom surface of the probe.

Through above-mentioned technical scheme, logical groove position is reasonable, and two connecting blocks distribute evenly.

Further, elastic blocks are fixedly connected between the two clamping blocks, and anti-skidding patterns are arranged on the side surfaces of the elastic blocks.

Through the technical scheme, the elastic block can protect the integrated circuit board and avoid the integrated circuit board from being scratched.

Further, the second motor is arranged in the center of the top surface of the supporting plate, and a limiting block is arranged at the top end of the sliding rod.

Through above-mentioned technical scheme, make the brace table rotate through driving motor two to can make the integrated circuit board rotate, thereby can make the probe foot detect the integrated circuit board of different positions, it is more convenient to use.

In summary, the application has the following beneficial technical effects:

The probe pin can move, and the screw rod is driven to rotate through the motor I, so that the connecting block and the probe device can move, further different positions of the integrated circuit can be detected, the integrated circuit board is placed on the supporting table, the driving cylinder enables the two clamping blocks to be close to each other, the integrated circuit board can be clamped, the operation is convenient, the supporting table is driven to rotate through the driving motor II, the integrated circuit board can be rotated, the probe pin can detect the integrated circuit boards at the different positions, and the use is more convenient.

Drawings

FIG. 1 is a schematic diagram of the overall structure of the present application;

FIG. 2 is a schematic view of a connecting block structure according to the present application;

FIG. 3 is a schematic view of a support plate structure according to the present application;

Fig. 4 is an enlarged view of fig. 1a in accordance with the present application.

The reference numerals in the figures illustrate:

1. An operation table; 2. testing the top plate; 3. a probe; 4. a probe pin; 5. a housing; 6. a connecting block; 7. a vertical plate; 8. a screw rod; 9. a first motor; 10. a limit rod; 11. a reserved groove; 12. an electric hydraulic rod; 13. a chute; 14. a support plate; 15. a second motor; 16. a support table; 17. a cylinder; 18. a slide block; 19. a slide bar; 20. a clamping block; 21. an elastic block.

Detailed Description

The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present application; it is apparent that the described embodiments are only some embodiments of the present application, not all embodiments, and that all other embodiments obtained by persons of ordinary skill in the art without making creative efforts based on the embodiments in the present application are within the protection scope of the present application.

In the description of the present application, it should be noted that the positional or positional relationship indicated by the terms such as "upper", "lower", "inner", "outer", "top/bottom", etc. are based on the positional or positional relationship shown in the drawings, are merely for convenience of describing the present application and simplifying the description, and do not indicate or imply that the apparatus or elements referred to must have a specific orientation, be constructed and operated in a specific orientation, and thus should not be construed as limiting the present application. Furthermore, the terms "first," "second," and the like, are used for descriptive purposes only and are not to be construed as indicating or implying relative importance.

In the description of the present application, it should be noted that, unless explicitly specified and limited otherwise, the terms "mounted," "configured to," "engaged with," "connected to," and the like are to be construed broadly, and may be either fixedly connected, detachably connected, or integrally connected, for example; can be mechanically or electrically connected; can be directly connected or indirectly connected through an intermediate medium, and can be communication between two elements. The specific meaning of the above terms in the present application will be understood in specific cases by those of ordinary skill in the art.

Examples:

The embodiment of the application discloses an integrated circuit test seat, please refer to fig. 1, 2 and 3, which comprises an operation table 1, wherein the top surface of the operation table 1 is connected with a test top plate 2 through a supporting rod, the top surface of the test top plate 2 is provided with a probe device 3, the output end of the probe device 3 is provided with a probe pin 4, the probe pin 4 penetrates through the test top plate 2 and stretches to the bottom, the top surface of the test top plate 2 is provided with a through groove, both ends of the top surface of the test top plate 2 are fixedly connected with a vertical plate 7, a screw rod 8 is rotationally connected between the two vertical plates 7, the screw rod 8 is in threaded connection with a connecting block 6, the connecting block 6 is arranged on the front end surface of the probe device 3, a motor 9 is arranged on the side surface of the vertical plate 7, the output end of the motor 9 penetrates through the vertical plate 7 and is fixedly connected with the screw rod 8, and the motor 9 drives the screw rod 8 to rotate, so that the connecting block 6 and the probe device 3 move, and further different positions of an integrated circuit can be detected;

The periphery of probe pin 4 is provided with transparent casing 5, and casing 5 and probe pin 4 periphery joint, casing 5 can protect probe pin 4, protect when not using, avoid contacting debris such as dust, reservation groove 11 has been seted up to the top surface of operation panel 1, and bottom surface fixed mounting has electronic hydraulic stem 12 in the reservation groove 11, electronic hydraulic stem 12 can make backup pad 14 go up and down, the output fixedly connected with backup pad 14 of electronic hydraulic stem 12, and the top surface fixed mounting of backup pad 14 has motor two 15, the output fixedly connected with brace table 16 of motor two 15, and the top surface fixed mounting of brace table 16 has cylinder 17, the top surface fixedly connected with grip block 20 of brace table 16, the output fixedly connected with additional grip block 20 of cylinder 17, motor two 15 sets up the center at backup pad 14 top surface, the top of slide bar 19 is provided with the stopper, use brace table 16 through driving motor two 15 and rotate, thereby can make the integrated circuit board of probe pin 4 detect the integrated circuit board of different positions, it is more convenient to use.

Referring to fig. 2, the top surface of the test top plate 2 is fixedly connected with two other vertical plates 7, a limiting rod 10 is fixedly connected between the two vertical plates 7, the rear end surface of the probe 3 is fixedly connected with another connecting block 6, the connecting block 6 is in sliding fit with the limiting rod 10, sliding grooves 13 are formed in two sides of the reserved groove 11, vertical sliding rods 19 are fixedly connected to the inner bottom surface of the sliding grooves 13, sliding blocks 18 are fixedly connected to two sides of the support plate 14, the sliding blocks 18 are penetrated by the sliding rods 19 and are in sliding fit with the sliding rods 19, the sliding blocks 18 and the sliding rods 19 can play a limiting role on lifting of the support plate 14, offset is avoided in the lifting process, the center of a through groove center line of the top surface of the test top plate 2 coincides with the center of a center line of the test top plate 2, the connecting blocks 6 of the front end surface and the rear end surface of the probe 3 are symmetrically distributed by the center line of the bottom surface of the probe 3, the through groove positions are reasonable, and the two connecting blocks 6 are uniformly distributed.

Referring to fig. 1 and 4, an elastic block 21 is fixedly connected between two clamping blocks 20, and an anti-skid pattern is provided on a side surface of the elastic block 21, wherein the elastic block 21 can protect the integrated circuit board and prevent the integrated circuit board from being scratched.

The implementation principle of the embodiment is as follows: the probe pin 4 can move, the screw rod 8 is driven to rotate through the motor I9, so that the connecting block 6 and the probe device 3 can move, further different positions of an integrated circuit can be detected, the integrated circuit board is placed on the supporting table 16, the driving cylinder 17 enables the two clamping blocks 20 to be close to each other, the integrated circuit board can be clamped, the operation is convenient, the supporting table 16 is rotated through the driving motor II 15, the integrated circuit board can be rotated, the probe pin 4 can detect the integrated circuit boards at different positions, and the use is convenient.

The above embodiments are not intended to limit the scope of the present application, so: all equivalent changes in structure, shape and principle of the application should be covered in the scope of protection of the application.

Claims

1. The utility model provides an integrated circuit test seat, includes operation panel (1), the top surface of operation panel (1) is connected with test roof (2) through branch, and the top surface of test roof (2) is provided with probe ware (3), the output of probe ware (3) is provided with probe pin (4), and probe pin (4) run through test roof (2) and stretch to the bottom, its characterized in that: the utility model provides a test roof, logical groove has been seted up to the top surface of test roof (2), the equal fixedly connected with riser (7) in both ends of test roof (2) top surface, two rotate between riser (7) and be connected with lead screw (8), and lead screw (8) threaded connection has connecting block (6), connecting block (6) are installed at the preceding terminal surface of probe ware (3), riser (7) side-mounting has motor one (9), and the output of motor one (9) runs through riser (7) and with lead screw (8) fixed connection, reserve groove (11) have been seted up to the top surface of operation panel (1), and reserve groove (11) inner bottom surface fixed mounting have electronic hydraulic stem (12), the output fixedly connected with backup pad (14) of electronic hydraulic stem (12), and the top surface fixed mounting of backup pad (14) has motor two (15), the output fixedly connected with brace table (16) of motor two (15), and the top surface fixed mounting of brace table (16) has cylinder (17), the top surface fixed connection of brace table (16) has grip block (20), the output of other fixedly connected with cylinder (20).

2. An integrated circuit test socket as defined in claim 1, wherein: the top surface fixedly connected with two piece in test roof (2) riser (7) in addition, and fixedly connected with gag lever post (10) between two riser (7), the rear end face fixedly connected with of probe ware (3) is connected with other connecting block (6), and connecting block (6) and gag lever post (10) sliding fit.

3. An integrated circuit test socket as defined in claim 1, wherein: the two sides of the reserved groove (11) are provided with sliding grooves (13), the inner bottom surfaces of the sliding grooves (13) are fixedly connected with vertical sliding rods (19), the two sides of the supporting plate (14) are fixedly connected with sliding blocks (18), and the sliding blocks (18) are penetrated by the sliding rods (19) and are in sliding fit with the sliding rods (19).

4. An integrated circuit test socket as defined in claim 1, wherein: the outer periphery of the probe pin (4) is provided with a transparent shell (5), and the shell (5) is clamped with the outer periphery of the probe pin (4).

5. An integrated circuit test socket as defined in claim 1, wherein: the center line of the through groove of the top surface of the test top plate (2) coincides with the center of the center line of the test top plate (2), and connecting blocks (6) of the front end surface and the rear end surface of the probe device (3) are symmetrically distributed by the center line of the bottom surface of the probe device (3).

6. An integrated circuit test socket as defined in claim 1, wherein: elastic blocks (21) are fixedly connected between the two clamping blocks (20), and anti-skid patterns are arranged on the side surfaces of the elastic blocks (21).

7. An integrated circuit test socket according to claim 3, wherein: the second motor (15) is arranged in the center of the top surface of the supporting plate (14), and a limiting block is arranged at the top end of the sliding rod (19).