CN220671605U - Electrical property measuring equipment of plate array capacitor - Google Patents

Abstract

The utility model relates to the technical field of electrical performance measurement of capacitors, in particular to electrical performance measurement equipment of a plate-type array capacitor. A placing groove is formed in the base; the backboard is vertically arranged on the base; the linkage mechanism is connected with the backboard in a sliding way; the contact pin assembly is arranged on the linkage assembly; the linkage assembly can drive the contact pin assembly to lift relative to the base, and the contact pin assembly can be in one-to-one corresponding abutting connection with a plurality of signal holes of a product to be tested in the placing groove; the measuring instrument is electrically connected with the contact pin assembly. The electrical connection mode of the contact pin assembly corresponds to the electrical connection mode of the plurality of signal holes, the contact pin assembly with the preset electrical connection mode is selected to be installed on the linkage assembly, the measurement of the electrical performance parameters of the plurality of signal holes can be correspondingly realized, whether the electrical performance parameters of a product to be measured meet the production requirements or not is rapidly measured, the working strength is greatly reduced, and the measurement time is shortened.

Description

Electrical property measuring equipment of plate array capacitor

Technical Field

The utility model relates to the technical field of capacitor electrical performance measurement, in particular to electrical performance measurement equipment of a plate array capacitor.

Background

The plate array capacitor is an integrated element of a feedthrough capacitor, and the number of the lead-out terminals is a prominent feature. The types of the leading-out ends can be divided into two types of leading-out ends of the grounding electrode and leading-out ends of the signal electrode, and generally, for a single product, only 1 grounding electrode leading-out end is positioned at the outer edge electrode part of the product; the signal electrode has several leading ends and several electrode parts in the holes in the product. In the measurement of withstand voltage and insulation resistance parameters, it is necessary to measure not only the parameter value of each signal pole to the ground but also the parameter value between adjacent signal poles (hereinafter, simply referred to as adjacent holes or between holes).

In a plate array capacitor, one hole is often adjacent to a plurality of holes, and if a pair of adjacent holes form a set of measurement combinations of parameters between holes, a plurality of measurement combinations may be formed. The dashed line box in fig. 1 is selected from hole No. 1 and all adjacent holes, which is very large if the adjacent combinations of all holes on the plate array capacitor are counted. The traditional measurement method is as follows: all combinations are measured one by one through a universal meter or a related detector, namely one combination and one combination are measured manually until all combinations are measured, the detection flow is complex, the data to be measured have poor foolproof effect, and whether good products and defective products are difficult to rapidly judge, namely whether the withstand voltage and insulation resistance parameters between all adjacent holes meet the production requirements or not is difficult to rapidly judge. Therefore, there is a need for a measuring device that can rapidly determine whether the electrical performance of a plate array capacitor meets the standards.

Disclosure of Invention

First, the technical problem to be solved

In view of the above-mentioned drawbacks and shortcomings of the prior art, the present utility model provides an electrical performance measurement apparatus for a plate array capacitor, which solves the technical problem that the detection flow of the electrical performance measurement apparatus for a plate array capacitor is relatively complex.

(II) technical scheme

In order to achieve the above object, an electrical property measuring apparatus of a plate array capacitor of the present utility model includes:

the base is provided with a placing groove;

the backboard is vertically arranged on the base;

the linkage mechanism is connected with the backboard in a sliding way;

the contact pin assembly is arranged on the linkage assembly; the linkage assembly can drive the contact pin assembly to lift relative to the base, and the contact pin assembly can be in butt joint with a plurality of signal holes of a product to be tested in the placing groove in a one-to-one correspondence manner;

and the measuring instrument is electrically connected with the pin assembly.

Optionally, the pin assembly includes a card board, and a first pin group and a second pin group disposed on the card board;

the clamping plate is detachably connected with the linkage assembly;

the first contact pin group and the second contact pin group are respectively and electrically connected with the measuring instrument.

Optionally, the first pin group and the second pin group each include a plurality of pins, and the diameters of the pins are matched with the diameters of the signal holes of the product to be tested.

Optionally, the first pin group and the second pin group are both in sliding connection with the clamping plate, so that the first pin group and the second pin group can be elastically abutted to a plurality of signal holes of a product to be tested in a one-to-one correspondence manner.

Optionally, a pin plate is detachably arranged on the clamping plate, and the first pin group and the second pin group are both connected with the pin plate.

Optionally, the clamping plate is an insulating clamping plate; the base is an insulating base.

Optionally, the linkage assembly comprises a lifting assembly and a base plate;

the lifting assembly is arranged on the backboard, the lifting assembly is connected with the substrate, and the lifting assembly can drive the substrate to lift relative to the base;

the contact pin assembly is in sliding connection with the substrate.

Optionally, the lifting component comprises a spanner, an ear seat, a compression bar, a bearing seat, a connecting plate and a pair of sliding bars;

the bearing seat is arranged on the back plate, and the compression bar is in sliding connection with the bearing seat;

the ear seat is arranged on the back plate, and the wrench is hinged with the ear seat;

the pressure lever is hinged with the wrench; the compression bars are arranged in parallel with the paired sliding bars;

the paired sliding rods are vertically arranged on the base, the connecting plates and the base plates are both in sliding connection with the sliding rods, and the pressing rods are connected with the connecting plates.

Optionally, a clamping groove is formed in the substrate, and the contact pin assembly is slidably connected with the clamping groove.

Optionally, a carrier is arranged on the base;

the carrying platform is detachably connected with the base;

the placing groove is arranged on the carrying platform.

(III) beneficial effects

The beneficial effects of the utility model are as follows: the linkage assembly can drive the contact pin assembly to lift, so that the contact pin assembly is inserted into a plurality of signal holes of a product to be tested, the electric connection of the plurality of signal holes is realized, and finally, the electric performance parameters are measured through the measuring instrument. The electrical connection mode of the contact pin assembly corresponds to the electrical connection mode of a plurality of signal holes, the contact pin assembly with the preset electrical connection mode is selected to be installed on the linkage assembly, the measurement of the electrical performance parameters of the plurality of signal holes can be correspondingly realized, whether the electrical performance parameters of a product to be measured meet the production requirements or not is rapidly measured, the working strength is greatly reduced, the detection flow is simplified, the measurement time is shortened, and the labor cost is saved.

Drawings

FIG. 1 is a schematic diagram of a plate array capacitor of the present utility model;

FIG. 2 is a schematic diagram of an electrical performance measuring apparatus of a plate array capacitor according to the present utility model;

FIG. 3 is a perspective view of an electrical performance measuring apparatus of a plate array capacitor of the present utility model;

FIG. 4 is a schematic view of a pin assembly of the present utility model;

FIG. 5 is a schematic circuit diagram of a pin assembly of the present utility model with approximately laterally distributed connections;

fig. 6 is a schematic circuit diagram of a nearly longitudinally distributed connection of the pin assembly of the present utility model.

[ reference numerals description ]

1: a base;

2: a back plate;

3: a linkage assembly; 31: a lifting assembly; 311: a wrench; 312: an ear seat; 313: a compression bar; 314: a bearing seat; 315: a connecting plate; 316: a slide bar; 32: a substrate;

4: a pin assembly; 41: a clamping plate; 411: a pin plate; 42: a first pin set; 43: a second pin set;

5: a signal hole;

7: a carrier.

Detailed Description

The utility model will be better explained by the following detailed description of the embodiments with reference to the drawings.

It should be noted that all directional indicators (such as up, down, left, right, front, and rear … …) in the embodiments of the present utility model are merely used to explain the relative positional relationship, movement, etc. between the components in a particular posture (as shown in the drawings), and if the particular posture is changed, the directional indicator is changed accordingly.

Furthermore, descriptions such as those referred to as "first," "second," and the like, are provided for descriptive purposes only and are not to be construed as indicating or implying a relative importance or implying an order of magnitude of the indicated technical features in the present disclosure. Thus, a feature defining "a first" or "a second" may explicitly or implicitly include at least one such feature. In the description of the present utility model, the meaning of "plurality" means at least two, for example, two, three, etc., unless specifically defined otherwise.

In the present utility model, unless specifically stated and limited otherwise, the terms "connected," "affixed," and the like are to be construed broadly, and for example, "affixed" may be a fixed connection, a removable connection, or an integral body; "coupled" may be mechanical or electrical; either directly or indirectly, through intermediaries, or both, may be in communication with each other or in interaction with each other, unless expressly defined otherwise. The specific meaning of the above terms in the present utility model can be understood by those of ordinary skill in the art according to the specific circumstances.

Referring to fig. 1 and 2, the utility model provides an electrical property measuring device of a plate array capacitor, which comprises a base 1, a back plate 2, a linkage assembly 3, a pin assembly 4 and a measuring instrument. A placing groove is formed in the base 1; the backboard 2 is vertically arranged on the base 1; the linkage assembly 3 is in sliding connection with the backboard 2; the contact pin assembly 4 is arranged on the linkage assembly 3; the linkage assembly 3 can drive the contact pin assembly 4 to lift relative to the base 1, and the contact pin assembly 4 can be in one-to-one corresponding abutting connection with a plurality of signal holes 5 of a product to be tested in the placing groove; the measuring instrument is electrically connected with the pin assembly 4.

The linkage assembly 3 can drive the contact pin assembly 4 to lift, so that the contact pin assembly 4 is inserted into a plurality of signal holes 5 of a product to be tested, the electric connection of the plurality of signal holes 5 is realized, and finally, the electric performance parameters are measured through a measuring instrument. The electrical connection mode of the contact pin assembly 4 corresponds to the electrical connection mode of the plurality of signal holes 5, the contact pin assembly 4 with the preset electrical connection mode is selected to be installed on the linkage assembly 3, the measurement of the electrical performance parameters of the plurality of signal holes 5 can be correspondingly realized, whether the electrical performance parameters of a product to be measured meet the production requirements or not is rapidly measured, the working strength is greatly reduced, the measurement time is shortened, and the labor cost is saved.

It should be noted that, the electrical performance parameters of the present utility model refer to the withstand voltage and insulation resistance parameters of the product to be tested, and the measurement of other electrical performance parameters is still within the protection scope of the present utility model under the premise of adopting the technical scheme of the present application. The product to be measured refers to a plate-type array capacitor, and hereinafter referred to as the product to be measured.

As shown in fig. 3 and 4, the pin assembly 4 includes a card 41, and a first pin group 42 and a second pin group 43 disposed on the card 41; the clamping plate 41 is detachably connected with the linkage assembly 3; the first pin group 42 and the second pin group 43 are electrically connected to the measuring instrument, respectively. Specifically, the clamping plate 41 can be quickly assembled and disassembled with the linkage assembly 3, so that the quick replacement of the pin assemblies 4 with different models can be realized, and the adaptability of the electrical property measuring equipment to the measurement of the products with multiple sizes to be measured can be improved. The pin assemblies 4 are electrically connected with the product to be tested, the first pin groups 42 are correspondingly and electrically connected with one part of the signal holes 5, the second pin groups 43 are correspondingly and electrically connected with the other part of the signal holes 5, so that the electrical connection of all the signal holes 5 is completed, and then the first pin groups 42 and the second pin groups 43 are respectively led to the measuring instrument, so that the electrical performance parameters of the product to be tested can be measured.

Second, the first pin group 42 and the second pin group 43 each include a plurality of pins, and the diameters of the pins are matched with the diameters of the signal holes 5 of the product to be tested. In this embodiment, as shown in fig. 5, a plurality of pins distributed in a nearly horizontal direction are electrically connected by leads, and then the plurality of leads distributed in a horizontal direction are electrically connected at intervals, for example, a plurality of leads in a 1 st, 3 rd, 5 th horizontal row are electrically connected as a first pin group 42; similarly, the plurality of leads in the 2 nd, 4 th and 6 th rows are electrically connected to form the second pin group 43, so that all the signal holes 5 adjacent to each other in the lateral direction of the product to be tested are electrically connected. And then the first pin group 42 and the second pin group 43 are respectively led to two measuring electrodes of the measuring instrument, so that whether the electrical performance parameters of all the signal holes 5 transversely adjacent to the product to be measured reach standards can be confirmed.

Similarly, as shown in fig. 6, a plurality of pins distributed approximately longitudinally are electrically connected by leads, and then the plurality of leads distributed longitudinally are electrically connected in a spaced connection manner, so that all longitudinally adjacent signal holes 5 of the product to be tested are electrically connected. The third contact pin group and the fourth contact pin group are respectively led to two measuring electrodes of the measuring instrument, so that whether the electrical performance parameters of all longitudinally adjacent signal holes 5 of the product to be measured reach the standard can be confirmed. Wherein, the third pin group and the fourth pin group are installed on the other pin assembly 4, the direction of the lead arrangement is longitudinal, and the direction of the lead arrangement of the first pin group 42 and the second pin group 43 is transverse. Of course, the leads of the pin assembly 4 may be welded or bonded to the pins in advance according to the model of the product to be tested, so as to save the time for testing.

By measuring all the transversely adjacent signal holes 5 and all the longitudinally adjacent signal holes 5 of the product to be measured respectively and integrating the detection results of the two, whether the withstand voltage and insulation resistance parameters between all the adjacent holes meet the production requirements can be rapidly judged. Compared with the traditional detection mode, namely the mode of measuring the electrical performance parameters of adjacent holes one by one through the universal meter, the measurement mode can greatly reduce the data to be measured, is not easy to make mistakes during operation, reduces the manual work intensity, can judge whether the product to be measured meets the standard through two times of measurement, and is suitable for high-intensity detection of large-scale products to be measured.

In addition, the first pin group 42 and the second pin group 43 are slidably connected with the clamping plate 41, so that the first pin group 42 and the second pin group 43 can elastically abut against the plurality of signal holes 5 of the product to be tested in a one-to-one correspondence. Namely, the clamping plate 41 can limit the descending of the first pin group 42 and the second pin group 43, the first pin group 42 and the second pin group 43 are supported on the clamping plate 41, and meanwhile, the first pin group 42 and the second pin group 43 can ascend relative to the clamping plate 41, so that when the first pin group 42 and the second pin group 43 are abutted against a product to be tested, the lifting stroke of the linkage assembly 3 can be self-adapted, and the situation that the pin assembly 4 collides with the product to be tested is effectively prevented.

Further, the card 41 is detachably provided with a pin plate 411, and the first pin group 42 and the second pin group 43 are connected to the pin plate 411. In this embodiment, when the different pin assemblies 4 are replaced, only the pin plate 411 needs to be replaced, the first pin group 42 and the second pin group 43 are replaced synchronously with the pin plate 411, and the clamping plate 41 can be used as the universal clamping plate 41, so that the equipment cost is saved. In addition, the pin plate 411 can also limit and support the pins, so that stability and safety in the replacement process of the first pin group 42 and the second pin group 43 are effectively improved, and the pins can be aligned with the signal holes 5 with high precision.

Secondly, the clamping plate 41 is an insulating clamping plate; the base 1 is an insulating base so as to reduce the interference of the equipment to the electric signal of the measuring instrument and improve the measuring precision of the measuring result.

In addition, the linkage assembly 3 includes a lifting assembly 31 and a base plate 32; the lifting assembly 31 is arranged on the backboard 2, the lifting assembly 31 is connected with the substrate 32, and the lifting assembly 31 can drive the substrate 32 to lift relative to the base 1; the pin assembly 4 is slidably connected to the base plate 32. The lifting assembly 31 can be lifted by motor control or manually by manual lifting, as long as the electrical connection of the pins with the signal holes 5 can be achieved. The base plate 32 is connected with the lifting component 31, and certain height difference exists between the base plate 32 and the lifting component, so that the contact pin component 4 cannot interfere with the lifting component 31 when sliding on the base plate 32, and enough lifting space exists when the contact pin is abutted to a product to be tested and lifted, the use safety of equipment during measurement is enhanced, and the equipment is effectively protected.

Further, the lifting assembly 31 includes a wrench 311, an ear mount 312, a pressing bar 313, a bearing block 314, a connecting plate 315, and a pair of sliding bars 316; the bearing seat 314 is arranged on the backboard 2, and the compression bar 313 is in sliding connection with the bearing seat 314; the ear seat 312 is arranged on the backboard 2, and the wrench 311 is hinged with the ear seat 312; the pressure bar 313 is hinged with the spanner 311; the compression bars 313 are arranged in parallel with the paired sliding bars 316; the paired slide bars 316 are vertically arranged on the base 1, the connecting plate 315 and the base plate 32 are both in sliding connection with the slide bars 316, and the pressing bars 313 are connected with the connecting plate 315. Specifically, the bearing housing 314 incorporates a plurality of balls to limit guide the pressing bar 313 and reduce friction. By rotating the wrench 311, the pressing rod 313 can be correspondingly lifted or pressed down, the contact pin assembly 4 and the workpiece to be tested can be correspondingly separated or abutted, the operation mode is simple and quick, the contact pin can be lifted relative to the clamping plate 41, and the error proofing performance of the device is improved. Wherein, slide bar 316 quantity and height can set up according to actual demand, and slide bar 316 can play the guide effect, improves the lift precision of contact pin subassembly 4, and then improves contact pin and signal hole 5's accuracy of registering, guarantees smoothly registering.

Next, a slot is formed in the substrate 32, and the pin assembly 4 is slidably connected to the slot. In this embodiment, the card slot is provided inside the substrate 32, and the card 41 can be inserted from the side surface of the card slot until the card 41 is completely abutted against the inner side, thereby ensuring the alignment accuracy of the plurality of pins and the plurality of signal holes 5, and the axes of the pins and the signal holes are positioned on the same straight line. The setting of draw-in groove for base plate 32 can lead to cardboard 41 and spacing, has made things convenient for contact pin assembly 4 quick assembly disassembly, has also guaranteed the position accuracy that contact pin assembly 4 changed.

In addition, a carrying platform 7 is arranged on the base; the carrying platform 7 is detachably connected with the base 1; the placement groove is arranged on the carrying platform 7. The size of the placing groove is matched with the size of the product to be measured. The plurality of carriers 7 can be correspondingly provided with a plurality of size placing grooves so as to improve the adaptability of the electrical property measuring equipment to the measurement of products to be measured with different sizes.

It should be understood that the above description of the specific embodiments of the present utility model is only for illustrating the technical route and features of the present utility model, and is for enabling those skilled in the art to understand the present utility model and implement it accordingly, but the present utility model is not limited to the above-described specific embodiments. All changes or modifications that come within the scope of the appended claims are intended to be embraced therein.

Claims (10)

1. An electrical performance measurement apparatus for a plate array capacitor, the electrical performance measurement apparatus comprising:

the device comprises a base (1), wherein a placing groove is formed in the base (1);

the backboard (2) is vertically arranged on the base (1);

the linkage assembly (3) is connected with the backboard (2) in a sliding way;

the contact pin assembly (4), the contact pin assembly (4) is arranged on the linkage assembly (3); the linkage assembly (3) can drive the contact pin assembly (4) to lift relative to the base (1), and the contact pin assembly (4) can be in butt joint with a plurality of signal holes (5) of a product to be tested in the placing groove in a one-to-one correspondence manner;

and the measuring instrument is electrically connected with the pin assembly (4).

2. The electrical performance measurement apparatus of a plate array capacitor according to claim 1, wherein the pin assembly (4) comprises a card board (41) and a first pin group (42) and a second pin group (43) provided on the card board (41);

the clamping plate (41) is detachably connected with the linkage assembly (3);

the first pin group (42) and the second pin group (43) are respectively electrically connected with the measuring instrument.

3. The device for measuring the electrical properties of a plate array capacitor according to claim 2, characterized in that the first pin set (42) and the second pin set (43) each comprise a plurality of pins, the diameter of which is adapted to the diameter of the signal holes (5) of the product to be measured.

4. The electrical performance measurement device of a chip-array capacitor according to claim 2, wherein the first pin group (42) and the second pin group (43) are slidably connected to the clamping plate (41), so that the first pin group (42) and the second pin group (43) can elastically abut against a plurality of signal holes (5) of a product to be measured in a one-to-one correspondence.

5. The electrical performance measurement apparatus of a plate array capacitor according to claim 2, wherein a pin plate (411) is detachably provided on the card board (41), and the first pin group (42) and the second pin group (43) are connected to the pin plate (411).

6. The electrical performance measurement apparatus of a plate array capacitor according to claim 2, wherein the clamping plate (41) is an insulating clamping plate; the base (1) is an insulating base.

7. The electrical performance measurement apparatus of a plate array capacitor according to any one of claims 1 to 6, wherein the linkage assembly (3) comprises a lifting assembly (31) and a base plate (32);

the lifting assembly (31) is arranged on the backboard (2), the lifting assembly (31) is connected with the base plate (32), and the lifting assembly (31) can drive the base plate (32) to lift relative to the base (1);

the pin assembly (4) is slidably connected to the base plate (32).

8. The electrical performance measurement apparatus of a plate array capacitor according to claim 7, wherein the lifting assembly (31) comprises a wrench (311), an ear mount (312), a pressing bar (313), a bearing mount (314), a connecting plate (315) and a pair of sliding bars (316);

the bearing seat (314) is arranged on the back plate (2), and the compression bar (313) is in sliding connection with the bearing seat (314);

the ear seat (312) is arranged on the back plate (2), and the wrench (311) is hinged with the ear seat (312);

the pressure lever (313) is hinged with the wrench (311); the compression bar (313) is arranged in parallel with the paired sliding bars (316);

the paired sliding rods (316) are vertically arranged on the base (1), the connecting plate (315) and the base plate (32) are both in sliding connection with the sliding rods (316), and the pressing rods (313) are connected with the connecting plate (315).

9. The electrical performance measurement apparatus of a plate array capacitor according to claim 7, wherein the base plate (32) is provided with a slot therein, and the pin assembly (4) is slidably connected to the slot.

10. The electrical property measuring device of a plate array capacitor according to any one of claims 1-6, characterized in that a carrier (7) is provided on the base;

the carrying platform (7) is detachably connected with the base (1);

the placing groove is arranged on the carrying platform (7).