CN220475736U

CN220475736U - Solar cell test probe row

Info

Publication number: CN220475736U
Application number: CN202321901981.8U
Authority: CN
Inventors: 张玉娟; 王峰; 李国杰
Original assignee: Wuxi Zhitonghe Electronic Technology Co ltd
Current assignee: Wuxi Zhitonghe Electronic Technology Co ltd
Priority date: 2023-07-19
Filing date: 2023-07-19
Publication date: 2024-02-09
Anticipated expiration: 2033-07-19

Abstract

The utility model discloses a solar cell test probe row, which belongs to the technical field of photovoltaic solar cell tests and comprises a support, wherein a cross rod is fixedly arranged in the middle of an inner cavity of the support, a supporting seat is movably sleeved outside the cross rod, limit rods are fixedly connected to the front side and the rear side of the inner cavity of the supporting seat, moving blocks are movably sleeved on the left side and the right side of the outer sides of the two limit rods, an inner cavity of the supporting seat is provided with an inclined block matched with the moving blocks, one side of the moving block is fixedly connected with an L-shaped rod, one side corresponding to the L-shaped rod is fixedly connected with a positioning rod, and a rectangular groove is formed in the bottom of the supporting seat. The utility model can facilitate the movement of the probe row, has simple structure, is convenient for the operation of staff, improves the test accuracy, can facilitate the replacement and maintenance of part of the probe row, can reduce the waste of resources and reduces the maintenance cost of the device.

Description

Solar cell test probe row

Technical Field

The utility model relates to the technical field of photovoltaic solar cell testing, in particular to a solar cell testing probe row.

Background

In the field of new energy power generation, solar cell power generation occupies an important position. The solar cell can directly convert electric energy into electric energy, and has the advantages of no pollution, long service life, no need of maintenance and the like in use, so that the solar cell manufacturing and production rapidly develop in recent years, the demand of the solar cell is very large in photovoltaic power stations and distributed application, and the higher the conversion efficiency of the solar cell is, the lower the electricity cost is, so that the solar cell is beneficial to large-scale application.

The patent document with publication number CN217522798U discloses an enhanced solar cell testing probe row, which consists of a bracket, a conventional probe set and a current conducting belt, and is fixed with a corresponding current probe through the current conducting belt, so that the contact between the probe row and a cell is changed from a point to a line, the wear resistance of the probe is improved, the contact area is enlarged, the oxidation resistance effect is enhanced, and the current collection performance is further improved. The current conducting strip includes: the conducting strip body is arranged in a rectangle, is opposite to the position of the conventional probe set, has one end flush with the bottom of the probe, and is provided with a positioning groove opposite to the position of the voltage probe. Through being provided with the constant head tank, the constant head tank sets up in voltage probe lower extreme, can provide voltage probe motion region, and when the current conduction band motion, voltage probe's structural property and motion performance can not receive the influence.

According to the technical scheme, the probe row of the device is fixedly arranged on the support, so that the probe row is inconvenient to move, the contact position is inaccurate easily, the accuracy of test data of the tester is seriously affected, and the probe row is inconvenient to detach, when one of the probe modules is damaged, the whole probe row needs to be replaced, the resource waste is caused, and the maintenance cost is increased; therefore we propose a solar wafer test probe row to solve this problem.

Disclosure of Invention

The utility model aims to provide a solar cell test probe row to solve the problems in the background art.

In order to achieve the above purpose, the present utility model adopts the following technical scheme:

the utility model provides a solar wafer test probe row, includes the support, the centre fixed mounting of support inner chamber has the horizontal pole, the outside movable sleeve of horizontal pole is equipped with the supporting seat, the equal fixedly connected with gag lever post in both sides around the supporting seat inner chamber, two the equal movable sleeve in left and right sides in gag lever post outside is equipped with the movable block, the inner chamber of supporting seat is provided with the sloping block with the movable block looks adaptation, one side fixedly connected with L type pole of movable block, the equal fixedly connected with locating lever in one side that L type pole corresponds, rectangular channel has been seted up to the bottom of supporting seat, the quantity of rectangular channel is three, and is equidistant distribution, the inner chamber of rectangular channel is provided with the probe row, the equal fixedly mounted on the left and right sides at rectangular channel inner chamber top has the base, the bottom rotation of base is connected with the arc clamp, the number of arc clamp is two sets of, and is bilateral symmetry distribution.

Preferably, the front side and the rear side of the left side and the right side of the inner cavity of the supporting seat are fixedly connected with first springs, one sides of the first springs are fixedly connected with the moving block, and the first springs are sleeved on the outer sides of the limiting rods.

Preferably, the inclined plane of the inclined block is contacted with the inclined planes of the moving blocks at two sides, a handle is fixedly arranged at the top of the inclined block, and the top of the handle penetrates through the supporting seat.

Preferably, the support plates are fixedly arranged on one sides of the two arc clamps, the top of each support plate is fixedly connected with a second spring, and the top of each second spring is fixedly connected with the base.

Preferably, one side of the positioning rod penetrates through the supporting seat and extends to the inside of the support, and round grooves matched with the positioning rod are formed in the left side and the right side of the support.

Preferably, limiting blocks matched with the arc clamps are fixedly arranged on the left side and the right side of the top of the probe row.

Compared with the prior art, the utility model has the beneficial effects that:

1. according to the utility model, the handle is pressed downwards, the sliding block is driven to move downwards by the handle, the sliding block drives the moving blocks at two sides to move outwards, the L-shaped rods at two sides are driven to move outwards by the moving blocks, and simultaneously the first springs are compressed, and the L-shaped rods drive the positioning rods to move outwards, so that the positioning rods are far away from the bracket, the probe row can be conveniently moved, the structure is simple, the operation of staff is convenient, and the testing accuracy is improved.

2. According to the utility model, the probe row is pulled downwards, the probe row drives the limiting block to move downwards, the limiting block drives the arc clamps on two sides to expand outwards, and meanwhile, the second spring is compressed, so that part of the probe row can be conveniently taken out to replace and maintain the probe row, the waste of resources can be reduced, and the maintenance cost of the device is reduced.

Drawings

Fig. 1 is a schematic perspective view of a solar cell testing probe row according to the present utility model;

fig. 2 is a schematic perspective view of another view angle of the solar cell testing probe row according to the present utility model;

fig. 3 is a schematic cross-sectional structural view of a solar cell testing probe row according to the present utility model;

FIG. 4 is an enlarged view of a portion A of FIG. 3;

fig. 5 is a partial enlarged view of a portion B in fig. 3.

In the figure: 1. a bracket; 2. a cross bar; 3. a support base; 4. a limit rod; 5. a moving block; 6. an L-shaped rod; 7. a positioning rod; 8. a first spring; 9. a sloping block; 10. a handle; 11. rectangular grooves; 12. a probe row; 13. a base; 14. an arc clamp; 15. a support plate; 16. a second spring; 17. a limiting block; 18. a circular groove.

Detailed Description

The following description of the embodiments of the present utility model will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present utility model, but not all embodiments.

Referring to fig. 1-5, a solar cell test probe row comprises a support 1, a cross rod 2 is fixedly installed in the middle of an inner cavity of the support 1, a supporting seat 3 is movably sleeved on the outer side of the cross rod 2, limiting rods 4 are fixedly connected to the front side and the rear side of the inner cavity of the supporting seat 3, moving blocks 5 are movably sleeved on the left side and the right side of the outer side of the two limiting rods 4, inclined blocks 9 matched with the moving blocks 5 are arranged in the inner cavity of the supporting seat 3, one side of each moving block 5 is fixedly connected with an L-shaped rod 6, one side corresponding to the L-shaped rod 6 is fixedly connected with a positioning rod 7, rectangular grooves 11 are formed in the bottom of the supporting seat 3, the number of the rectangular grooves 11 is three and distributed at equal intervals, a base 13 is fixedly installed on the left side and the right side of the top of the inner cavity of the rectangular grooves 11, arc clamps 14 are rotatably connected to the bottom of the base 13, the arc clamps 14 are in two groups and are symmetrically distributed left and right, and the supporting seat 3 can be positioned through the positioning rods 7.

In this embodiment, the front and back both sides of supporting seat 3 inner chamber left and right sides all fixedly connected with first spring 8, one side and the movable block 5 fixed connection of first spring 8, the outside at gag lever post 4 is established to first spring 8 cover, the inclined plane of sloping block 9 contacts with the inclined plane of the movable block 5 of both sides, the top fixed mounting of sloping block 9 has handle 10, the supporting seat 3 is run through at the top of handle 10, through gag lever post 4, can carry out spacingly to the movable block 5, the mobility stability of movable block 5 has been improved.

In this embodiment, the backup pad 15 is all fixed mounting in one side of two arc presss from both sides 14, the top fixedly connected with second spring 16 of backup pad 15, the top and the base 13 fixed connection of second spring 16, the inside that support seat 3 and extended to support 1 is run through to one side of locating lever 7, the circular slot 18 with locating lever 7 looks adaptation has all been seted up to the left and right sides of support 1, the stopper 17 with arc clamp 14 looks adaptation is all fixed mounting in the left and right sides at probe row 12 top, through second spring 16, can reset arc clamp 14.

In this embodiment, when using, through pressing handle 10 downwards, handle 10 drives sloping block 9 and moves downwards, sloping block 9 drives the movable block 5 of both sides and moves outwards, movable block 5 drives the L type pole 6 of both sides and moves outwards and compresses first spring 8 simultaneously, L type pole 6 drives locating lever 7 and moves outwards, make locating lever 7 keep away from support 1, can be convenient for remove probe row 12, through pulling probe row 12 downwards, probe row 12 drives stopper 17 and moves downwards, stopper 17 drives the arc clamp 14 of both sides and expands outwards, simultaneously compress second spring 16, can be convenient for take out partial probe row 12 and change it and maintain.

The solar cell test probe row provided by the utility model is described in detail above. The principles and embodiments of the present utility model have been described herein with reference to specific examples, which are intended to be merely illustrative of the methods of the present utility model and their core ideas. It should be noted that it will be apparent to those skilled in the art that various modifications and adaptations of the utility model can be made without departing from the principles of the utility model and these modifications and adaptations are intended to be within the scope of the utility model as defined in the following claims.

Claims

1. Solar wafer test probe row, including support (1), its characterized in that: the middle fixed mounting of support (1) inner chamber has horizontal pole (2), the outside movable sleeve of horizontal pole (2) is equipped with supporting seat (3), the equal fixedly connected with gag lever post (4) in front and back both sides of supporting seat (3) inner chamber, two the equal movable sleeve in left and right sides in gag lever post (4) outside is equipped with movable block (5), the inner chamber of supporting seat (3) is provided with oblique piece (9) with movable block (5) looks adaptation, one side fixedly connected with L type pole (6) of movable block (5), the equal fixedly connected with locating lever (7) of one side that L type pole (6) corresponds, rectangular channel (11) have been seted up to the bottom of supporting seat (3), the quantity of rectangular channel (11) is three, and is equidistant distribution, the inner chamber of rectangular channel (11) is provided with needle bar (12), the equal fixed mounting in left and right sides at rectangular channel (11) inner chamber top has base (13), the bottom of base (13) rotates and is connected with clamp (14), the number of arc clamp (14) just is two sets of arc.

2. The solar wafer test probe row of claim 1, wherein: the device is characterized in that first springs (8) are fixedly connected to the front side and the rear side of the left side and the right side of the inner cavity of the supporting seat (3), one side of each first spring (8) is fixedly connected with the moving block (5), and the first springs (8) are sleeved on the outer sides of the limiting rods (4).

3. The solar wafer test probe row of claim 1, wherein: the inclined plane of sloping block (9) contacts with the inclined plane of movable block (5) of both sides, handle (10) are installed fixedly to the top of sloping block (9), the top of handle (10) runs through supporting seat (3).

4. The solar wafer test probe row of claim 1, wherein: one side of each arc-shaped clamp (14) is fixedly provided with a supporting plate (15), the top of each supporting plate (15) is fixedly connected with a second spring (16), and the top of each second spring (16) is fixedly connected with the base (13).

5. The solar wafer test probe row of claim 1, wherein: one side of the positioning rod (7) penetrates through the supporting seat (3) and extends to the inside of the support (1), and round grooves (18) matched with the positioning rod (7) are formed in the left side and the right side of the support (1).

6. The solar wafer test probe row of claim 1, wherein: limiting blocks (17) matched with the arc clamps (14) are fixedly arranged on the left side and the right side of the top of the probe row (12).