CN218549866U - Solar cell test equipment and test system - Google Patents

Abstract

The application discloses a solar battery testing device and a testing system, including: a device main body, a table panel, and a plurality of bus bar assemblies arranged at intervals; the bus bar assembly includes: a base and a bus bar; the table panel and the device main body are detachably connected ; The base is connected to the table panel; the bus bar is arranged on the side of the base away from the table panel, and the bus bar is used for contacting the grid lines of the solar cells. Multiple bus bar assemblies can be assembled with the table panel in advance, and the relative position of the bus bar assembly and the table panel can be adjusted. When the bus bar of the test equipment needs to be replaced, only the table panel needs to be installed on the main body of the equipment, and fine-tuned The relative position between the table panel and the main body of the equipment is enough, which shortens the downtime of the equipment; and, using bus bars instead of multiple probes in the traditional probe row can save the time required for adjusting the probes, and can further shorten the replacement time. The downtime of equipment is reduced, the production capacity loss of equipment is reduced, and the operation is more convenient.

Description

Solar cell test equipment and test system

technical field

The application belongs to the technical field of photovoltaics, and in particular relates to a solar cell testing device and a testing system.

Background technique

With the continuous consumption of traditional energy and its negative impact on the environment, solar energy, as a pollution-free and renewable energy, has been developed and utilized rapidly, especially photovoltaic cells with high conversion efficiency have become the focus of current research. After the solar cell is manufactured, it is necessary to test each solar cell, such as: current-voltage characteristic (Current Voltage, IV) test, electroluminescence (Electro Luminescence, EL) test, and then the efficiency of the battery can be analyzed according to the test results. file, efficiency calibration, screening of unqualified products, etc.

In the solar cell test equipment of the related art, a plurality of probes are installed on the probe row, and the probe row is directly fixed on the test equipment. When it is necessary to replace the probes, there are usually two replacement methods: the first method The probe is not disassembled, and the probe is replaced directly after the shutdown of the production site; the second method is to prepare the spare probe row in advance, install the probe on the spare probe row in advance, and directly replace the spare probe row at the production site. row of probes.

However, as solar cells gradually become multi-busbar, the number of grid lines on the surface of solar cells increases continuously, and the number of probe rows and probes installed on the test equipment also increases accordingly. The test equipment in the related technology adopts the first method, directly replacing the probes at the production site, which takes a long time and is difficult to operate in the small space on site; while the second method is used to directly replace the spare probe rows, because the number of probe rows is relatively small. There are many, and after replacing the spare probe row, each probe row and the probes on the probe row need to be adjusted separately, and the total time consumption is still long. Therefore, it takes a lot of effective production time to replace the probes of the test equipment using the related technology, resulting in a large loss of production capacity of the test equipment.

Utility model content

The purpose of this application is to provide a solar cell testing equipment and testing system to solve the problem of the testing equipment in the related art. When replacing the probes, it takes a lot of effective production time, resulting in a large loss of production capacity of the testing equipment.

In order to solve the above-mentioned technical problems, the application is implemented as follows:

In the first aspect, the embodiment of the present application proposes a solar cell testing device, including: a device body, a table panel, and a plurality of bus bar assemblies arranged at intervals;

The bus bar assembly includes: a base and a bus bar;

The table top is detachably connected to the device main body; the base is connected to the table top;

The bus bar is arranged on the side of the base away from the table panel, and the bus bar is used for contacting the grid lines of the solar cells.

Optionally, the bus bar assembly further includes: a connecting shaft;

The connecting shaft includes a first end and a second end arranged away from each other, the first end is connected to the base, and the second end is connected to the table top.

Optionally, the bus bar assembly further includes: an elastic member and an adjusting nut;

The elastic member is arranged between the base and the table top, and the connecting shaft passes through the elastic member;

The adjusting nut is arranged on the side of the table top away from the elastic member; the table top is provided with a through hole, and the connecting shaft can be movably passed through the through hole, and the first connecting shaft The two ends are connected with the adjusting nut.

Optionally, the bus bar assembly further includes: a linear bearing;

The linear bearing is arranged in the through hole, and the adjusting nut is arranged on the side of the linear bearing away from the base;

The connecting shaft is passed through the linear bearing, and the second end of the connecting shaft is connected with the adjusting nut.

Optionally, the bus bar assembly further includes: a voltage probe and a voltage bar;

The voltage bar is arranged on the side of the base away from the bus bar; one end of the voltage probe is connected to the voltage bar; the other end of the voltage probe passes through the base and the bus bar in turn. The bus bar, and leaks from the bus bar.

Optionally, the bus bar assembly further includes: an insulating bar;

The insulating strip is disposed between the voltage strip and the base; the other end of the voltage probe passes through the insulating strip, the base, and the bus bar in turn, and leaks outside the bus bar.

Optionally, the solar battery testing equipment also includes: a wiring socket;

The wiring socket is arranged on the table panel; the wiring socket is electrically connected to the device main body, and the voltage bar and the bus bar are respectively electrically connected to the wiring socket.

Optionally, the bus bar is detachably connected to the base.

Optionally, a plurality of protrusions arranged at intervals are provided on the side of the bus bar away from the base, and the protrusions are used for contacting the grid lines of the solar cells.

In a second aspect, an embodiment of the present application provides a solar cell testing system, including the solar cell testing device described in any one of the foregoing.

In the embodiment of the present application, the solar cell testing equipment includes a device main body, a table panel and a plurality of bus bar assemblies, the bus bar assembly includes a base and a bus bar, the table panel is detachably connected to the equipment main body, and the base is connected to the table panel , the bus bar is arranged on the side of the base away from the platform, and the bus bar is used for contacting the grid lines of the solar cells. Since the position of the grid lines on the solar cell is relatively fixed, multiple bus bar assemblies can be assembled with the table panel in advance, and the relative positions of the bus bar assembly and the table panel can be adjusted to form a spare replacement assembly. When the bus bar is replaced, it is only necessary to install the table panel in the spare replacement component to the main body of the equipment, and fine-tune the relative position between the table panel and the equipment main body, which greatly shortens the equipment downtime for replacing the bus bar; and, every The use of bus bars in a bus bar assembly to replace multiple probes in a traditional probe row can save the time required to replace and adjust the probes in the probe row, which can further reduce equipment downtime and help reduce equipment. The loss of production capacity, and the operation is more convenient.

Additional aspects and advantages of the invention will be set forth in the description which follows, and in part will be obvious from the description, or may be learned by practice of the invention.

Description of drawings

The above and/or additional aspects and advantages of the present utility model will become apparent and easy to understand from the description of the embodiments in conjunction with the following drawings, wherein:

Fig. 1 is a schematic structural view of a solar cell testing device according to an embodiment of the present invention;

Fig. 2 is one of the local structural schematic diagrams of the solar cell testing equipment according to the embodiment of the present invention;

Fig. 3 is the second schematic diagram of the partial structure of the solar cell testing equipment according to the embodiment of the present invention;

Fig. 4 is one of the structural schematic diagrams of the bus bar assembly according to the embodiment of the present invention;

Fig. 5 is the second structural schematic diagram of the bus bar assembly according to the embodiment of the present invention;

Fig. 6 is the third structural schematic diagram of the bus bar assembly according to the embodiment of the present invention;

Fig. 7 is the fourth structural schematic diagram of the bus bar assembly according to the embodiment of the present invention;

Fig. 8 is the third schematic diagram of the partial structure of the solar cell testing equipment according to the embodiment of the present utility model.

Reference signs:

10, table panel; 20, bus bar assembly; 201, base; 202, bus bar; 2021, raised part; 203, connecting shaft; 204, elastic member, 205, adjusting nut; 206, linear bearing; 2061, bearing Retaining ring; 2062, bearing pad; 207, voltage probe; 208, voltage strip; 209, insulating strip; 30, wiring socket; 40, equipment main body; 401, equipment base; 402, infrared camera; 403, light source; 404. Detection and control module; 50. Solar battery.

Detailed ways

Embodiments of the present invention will be described in detail below, examples of which are shown in the drawings, wherein the same or similar reference numerals represent the same or similar elements or elements having the same or similar functions throughout. The embodiments described below by referring to the figures are exemplary, and are only for explaining the present application, and should not be construed as limiting the present application. Based on the embodiments in this application, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of this application.

The features of the terms "first" and "second" in the description and claims of the present application may explicitly or implicitly include one or more of these features. In the description of the present application, unless otherwise specified, "plurality" means two or more. In addition, "and/or" in the specification and claims means at least one of the connected objects, and the character "/" generally means that the related objects are an "or" relationship.

In the description of this application, it should be understood that the terms "center", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", " The orientation or positional relationship indicated by "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "axial", "radial" and "circumferential" are based on The orientation or positional relationship shown in the drawings is only for the convenience of describing the present application and simplifying the description, and does not indicate or imply that the referred device or element must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as Limitations on this Application.

In the description of this application, it should be noted that unless otherwise specified and limited, the terms "installation", "connection", and "connection" should be understood in a broad sense, for example, it can be a fixed connection or a detachable connection. Connected, or integrally connected; it can be mechanically connected or electrically connected; it can be directly connected or indirectly connected through an intermediary, and it can be the internal communication of two components. Those of ordinary skill in the art can understand the specific meanings of the above terms in this application in specific situations.

The solar cell testing equipment and testing system provided by the embodiments of the present application will be described in detail below through specific embodiments and application scenarios in conjunction with the accompanying drawings.

As shown in FIGS. 1 to 4 , the solar cell testing equipment according to some embodiments of the present application includes: a device main body 40 , a table panel 10 and a plurality of bus bar assemblies 20 arranged at intervals; the bus bar assembly 20 includes: a base 201 and the bus bar 202; the table top 10 is detachably connected to the device main body 40; the base 201 is connected to the table top 10; grid contact.

In the embodiment of the present application, by setting the table panel 10 and multiple bus bar assemblies 20, since the positions of the grid lines on the solar cell 50 are relatively fixed, multiple bus bar assemblies 20 can be assembled with the table panel 10 respectively in advance, And adjust the relative position of the bus bar assembly 20 and the table top 10 to form a spare replacement assembly. When the bus bar 202 of the test equipment needs to be replaced, only the table top 10 in the spare replacement assembly needs to be installed on the equipment. main body 40, and fine-tune the relative position of the table panel 10 and the equipment main body 40, which greatly shortens the equipment downtime for replacing the bus bar; The plurality of probes can save the time required for replacing and adjusting the probes in the probe row, can further shorten the equipment downtime, help reduce the production loss of the equipment, and make the operation more convenient.

Specifically, the solar battery testing equipment includes a device main body 40, a table panel 10 and a plurality of bus bar assemblies 20, the table panel 10 is detachably connected to the equipment main body 40, and a plurality of bus bar assemblies 20 are respectively connected to the table panel 10, and a plurality of The bus bar assemblies 20 are spaced apart from each other. Each bus bar assembly 20 includes a base 201 and a bus bar 202, the bus bar 202 is arranged on the base 201, the base 201 is connected with the table top 10, and the bus bar 202 is arranged on the side of the base 201 away from the table top 10 , during the test, the bus bar 202 is in contact with the grid lines on the surface of the solar cell 50 .

It can be understood that a plurality of main grids and a plurality of fine grids are arranged on the surface of the solar cell 50, and the plurality of main grids are arranged in parallel at intervals, and each main grid is connected with a plurality of fine grids. During the test, each bus bar assembly The bus bar 202 in 20 corresponds to the position of a main grid on the surface of the solar cell 50 . For the solar cell 50 to be detected, the number and position of the main grids on its surface are fixed, therefore, based on the number and position of the main grids on the surface of the solar cell 50 to be detected, a corresponding number of bus bar assemblies 20 can be fixedly installed in advance. on the table top 10, and adjust the position of each bus bar assembly 20 on the table top 10 to form a spare replacement assembly. When the bus bar 202 needs to be replaced on the production site, only the table panel 10 in the spare replacement component is installed on the main body 40 of the equipment, and the quick replacement can be realized, which can greatly shorten the downtime of the equipment during the replacement.

In the embodiment of the present application, the bus bar assembly 20 is provided with a bus bar 202. During the test, the contact between the bus bar 202 and the grid line on the surface of the solar cell 50 is achieved by contacting the bus bar 202 in the test equipment. current transfer between them. For example, when carrying out the IV test, the current generated by the solar cell 50 is collected through the grid wire, and the collected current is transmitted to the bus bar 202, and the current is transmitted to the device main body 40 by the bus bar 202, so that the device main body 40 is used for Current characteristic detection. For another example, when performing an EL test, the bus bar 202 transmits an external current to the grid lines, and then the grid lines inject current into the solar cell 50 , so as to perform an electroluminescence test on the solar cell 50 .

Compared with the solar cell testing equipment of the related art, the bus bar assembly 20 replaces the probe row, and the bus bar 202 is arranged in the bus bar assembly 20 to replace a plurality of probes in the probe row, and replace the probe row in the bus bar assembly 20. The bus bar 202 is more convenient and fast, and compared with replacing multiple probes in the probe row, the time required for the operation can be reduced.

In some embodiments, the table top 10 can be made of metal material to increase the strength of the table top 10. For example, it can be made of stainless steel, and of course it can also be made of other metal materials. Do limit.

Specifically, a hollow structure may be provided on the table top 10 to reduce the shadowing of the solar cell 50 by the table top 10 during the test.

In some embodiments, threaded holes can be provided at corresponding positions on the table top 10 and the device main body 40, and screws are respectively threaded with the threaded holes on the panel and the device main body 40 to realize the connection between the table top 10 and the device main body 40. Removable connection for quick removal and installation. Of course, other connection methods can also be used between the table top 10 and the device main body 40 , and those skilled in the art can choose according to actual needs, which is not limited in this embodiment of the present application.

In some embodiments, as shown in FIG. 1 , the device main body 40 may further include: a device base 401, an infrared camera 402, a light source 403, and a detection control module 404, among which the bus bar assembly 20, the infrared camera 402, the light source 403 can be electrically connected to the detection control module 404 respectively, and the table panel 10 is detachably connected to the equipment base 401 . The infrared camera 402 is used to take infrared images of the solar cell 50 , and the light source 403 is used to emit light to the solar cell 50 .

It can be understood that, in practical applications, when the solar cell 50 is tested for EL using the solar cell testing equipment, the detection control module 80 can be used to control the solar cell 50 to be powered on, and the infrared camera 60 can be used to take an infrared image of the solar cell 50, and then The EL characteristics of solar cells were tested. When using the solar cell testing equipment to perform IV test on the solar cell 50 , the light source 70 can be used to emit light to the surface of the solar cell 50 , and then the detection and control module 80 can be used to test the I-V characteristics of the solar cell 50 .

It should be noted that the device main body 40 may also include other components, which can be set by those skilled in the art according to actual needs, which is not limited in this embodiment of the present application. Optionally, as shown in FIG. 8 , the bus bar assembly 20 further includes: a connecting shaft 203; the connecting shaft 203 includes a first end and a second end set away from each other, the first end is connected to the base 201, and the second end is connected to the table Panel 10 is connected.

In the embodiment of the present application, a connecting shaft 203 is provided in the bus bar assembly 20, and the base 201 is connected to the table top 10 by using the connecting shaft 203. By adjusting the relative position of the connecting shaft 203 and the table top 10, the bus bar assembly can be adjusted. 20 relative to the table top 10, so as to facilitate the quick assembly and disassembly of the bus bar assembly 20 and the table top 10, and at the same time, facilitate the position adjustment of the bus bar assembly 20 installed on the table top 10.

Specifically, since the grid lines on the surface of the solar cell 50 are elongated, the base 201 and the bus bars 202 in the bus bar assembly 20 are also arranged in elongated shapes, so that the bus bars can fit the grid lines. On the base 201 , a connecting shaft 203 can be provided at both ends along the long side direction, and the bus bar assembly 20 can be installed on the table top 10 through the two connecting shafts 203 .

By adjusting the length of the connecting shaft 203 between the base 201 and the table top 10 , the relative distance between both ends of the base 201 and the table top 10 can be adjusted, thereby adjusting the relative position of the bus bar assembly 20 and the table top 10 . It is also possible to fixedly connect one end of the base 201 to the table top 10 through the connecting shaft 203, and adjust the length of the connecting shaft 203 between the other end of the base 201 and the table top 10 to further align the bus bar assembly 20 with the table top 10. Fine-tune the relative position of .

It can be understood that a plurality of bus bar assemblies 20 can be installed on the table top 10 in advance, and by adjusting the connecting shaft 203 in each bus bar assembly 20, the relative position of the corresponding bus bar assembly 20 and the table top 10 can be adjusted. to form a spare replacement component. After the spare replacement assembly is installed on the main body 40 of the device, by fine-tuning the connecting shaft 203 in each bus bar assembly 20 , the precise adjustment of the positions of multiple bus bar assemblies 20 can be further realized, thereby improving the detection accuracy of the device.

In some embodiments, the connecting shaft 203 includes a first end and a second end, the first end of the connecting shaft 203 is connected to the base 201 , and the second end of the connecting shaft 203 is insulatedly connected to the table top 10 . Specifically, an insulating pad can be provided between the second end of the connecting shaft 203 and the table top 10, and the insulating pad can be used to realize the insulation between the connecting shaft 203 and the table top 10, wherein the insulating pad can be made of an insulating material, such as : Ceramics, insulating rubber, insulating plastics and other insulating materials.

It should be noted that the insulating connection between the second end of the connecting shaft 203 and the table panel 10 can also adopt other structures, such as spraying an insulating layer on the outer surface of the connection part of the connecting shaft 203 and the connecting table panel 10, through the insulation The layer realizes insulation between the connection shaft 203 and the table top 10 . Those skilled in the art can set according to actual needs, which is not limited in this embodiment of the present application.

Optionally, as shown in FIG. 3 , FIG. 4 and FIG. 8 , the bus bar assembly 20 further includes: an elastic member 204 and an adjusting nut 205; Located in the elastic member 204; the adjusting nut 205 is arranged on the side of the table top 10 away from the elastic member 204; the table top 10 is provided with a through hole, and the connecting shaft 203 can be movably penetrated in the through hole, and the second connecting shaft 203 The end is connected with the adjusting nut 205.

In the embodiment of the present application, by setting the elastic member 204 and the adjusting nut 205, the elastic member 204 is arranged between the base 201 and the table top 10, and the adjusting nut 205 is arranged on the side of the table top 10 away from the elastic member 204, so that The first end of the connecting shaft 203 is connected to the base 201, and the second end of the connecting shaft 203 passes through the elastic member 204 and the table top 10 in sequence, and then is connected with the adjusting nut 205, thereby adjusting the adjusting nut on the second end of the connecting shaft 203 205 , the distance between the base 201 and the table top 10 can be adjusted, and then the relative position of the bus bar assembly 20 and the table top 10 can be adjusted.

Specifically, an elastic member 204 is provided between the base 201 and the table top 10, the elastic member 204 may include a spring, one end of the elastic member 204 abuts against the base 201, and the other end of the elastic member 204 abuts against the table top 10, Along the direction from the base 201 to the table top 10 , the elastic member 204 can be elastically deformed. The table top 10 is provided with a through hole, and the side of the table top 10 away from the elastic member 204 is provided with an adjusting nut 205, the first end of the connecting shaft 203 is connected with the base 201, and the second end of the connecting shaft 203 passes through the After the elastic member 204 and the through hole on the table top 10 are connected with the adjusting nut 205 .

Wherein, the connecting shaft 203 is loosely fitted with the through hole, so that the connecting shaft 203 can reciprocate in the through hole along the axial direction of the connecting shaft 203 . The adjusting nut 205 is sleeved on the second end of the connecting shaft 203 , and the adjusting nut 205 is screwed to the second end of the connecting shaft 203 . During use, the length of the connecting shaft 203 between the table top 10 and the base 201 can be changed by turning the adjusting nut 205 on the second end of the connecting shaft 203, thereby adjusting the distance between the base 201 and the table top 10, The adjustment of the relative position of the bus bar assembly 20 and the table panel 10 is realized.

When the adjusting nut 205 moves toward the first end of the connecting shaft 203, the length of the connecting shaft 203 between the adjusting nut 205 and the base 201 decreases, the elastic member 204 is compressed, and the connection between the base 201 and the table top 10 When the adjusting nut 205 moves away from the first end of the connecting shaft 203, the length of the connecting shaft 203 between the adjusting nut 205 and the base 201 increases, and the elastic member 204 is under the action of resilience Rebound occurs, and the distance between the base 201 and the table top 10 increases. Therefore, by adjusting the position of the adjusting nut 205 on the second end of the connecting shaft 203 , the distance between the base 201 and the table top 10 can be adjusted.

Further, during the use of the test equipment, the bus bar 202 in the bus bar assembly 20 is in contact with the surface of the solar cell 50, and the elastic deformation of the elastic member 204 can play a buffering role for the bus bar assembly 20, reducing the bus current. The rigid contact between the bar assembly 20 and the bus bar assembly 20 reduces the impact damage caused by the bus bar assembly 20 to the solar cell 50 .

Optionally, as shown in FIG. 3 , FIG. 4 and FIG. 8 , the bus bar assembly 20 further includes: a linear bearing 206; the linear bearing 206 is disposed in the through hole, and the adjusting nut 205 is disposed on a side of the linear bearing 206 away from the base 201 side; the connecting shaft 203 is passed through the linear bearing 206 , and the second end of the connecting shaft 203 is connected with the adjusting nut 205 .

In the embodiment of the present application, a linear bearing 206 is provided in the through hole of the table top 10, and the connecting shaft 203 is passed through the linear bearing 206, so that the first end of the connecting shaft 203 is connected to the base 201, and the second end of the connecting shaft 203 After the two ends pass through the elastic member 204 and the linear bearing 206 in turn, they are connected with the adjusting nut 205, and then in the process of adjusting the relative position of the bus bar assembly 20 and the table panel 10, the connecting shaft 203 cooperates with the linear bearing 206 to reduce the The frictional resistance of the connecting shaft 203 during movement improves the adjustment accuracy.

In some embodiments, the side of the table top 10 close to the base 201 is provided with a bearing pad 2062 and a bearing retaining ring 2061, the linear bearing 206 is passed through the through hole on the table top 10, and the linear bearing 206 is close to the base. One end of the seat 201 leaks out through the hole, and the bearing pad 2062 is clamped on the outer wall of the linear bearing 206. The bearing pad 2062 is fixedly connected with the table panel 10, so that the linear bearing 206 can be installed and fixed on the table through the bearing pad 2062. on panel 10.

The bearing retaining ring 2061 is arranged between the elastic member 204 and the linear bearing 206, the end of the elastic member 204 away from the base 201 abuts against the bearing retaining ring 2061, and the elastic member 204 is separated from the linear bearing 206 by the bearing retaining ring 2061, In this way, the damage caused by the elastic member 204 to the linear bearing 206 during deformation under force is reduced, thereby protecting the linear bearing 206 .

Optionally, as shown in FIGS. 4 to 7, the bus bar assembly 20 further includes: a voltage probe 207 and a voltage bar 208; the voltage bar 208 is arranged on the side of the base 201 away from the bus bar 202; One end is connected to the voltage bar 208 ; the other end of the voltage probe 207 passes through the base 201 and the bus bar 202 sequentially, and leaks out of the bus bar 202 .

In the embodiment of the present application, a voltage probe 207 and a voltage bar 208 are provided in the bus bar assembly 20, and the voltage probe 207 is fixed on the base 201 by the voltage bar 208, and one end of the voltage probe 207 is at least partly leaked In the bus bar 202 , the voltage probe 207 can be used to test the voltage characteristics of the solar cell 50 .

Specifically, a voltage bar 208 is provided on the side of the base 201 away from the bus bar 202, and one end of the voltage probe 207 is connected to the voltage bar 208, and the other end of the voltage probe 207 passes through the base 201 and the bus bar 202 in sequence, The voltage probe 207 leaking outside the bus bar 202 is used to contact the grid wire of the solar cell 50 .

It can be understood that the solar cell test equipment can be used for IV testing of the solar cell 50, and the bus bar 202 and the voltage probe 207 are provided in the bus bar assembly 20 at the same time, wherein the bus bar 202 is set to assist in testing the solar cell 50 The current characteristic of the solar cell 50 is provided with a voltage probe 207 for assisting in testing the voltage characteristic of the solar cell 50 .

In the related art solar cell test equipment, there are usually a plurality of probe rows, and each probe row is provided with a plurality of current probes and a plurality of voltage probes 207, and generally the number of current probes is more than that of voltage probes. The number of 207. When testing the multi-busbar solar cell 50 , the total number of probes that need to be set in the entire testing equipment is relatively large. However, in the embodiment of the present application, the bus bar 202 is used to replace the current probe, and then only a few voltage probes 207 need to be set in each bus bar assembly 20, which can greatly reduce the number of probes in the test equipment. .

For example, in the test equipment used to detect solar cells 50 with 9 main grids, if the test equipment in the related art is used, 50 probes need to be set on each probe row, and 459 probes need to be set in the entire test equipment. The total number of probes is very large, and it takes a long time to replace the probes, and the replacement operation is inconvenient. With the test equipment in the embodiment of the present application, only 2-8 voltage probes 207 need to be set on each bus bar assembly 20, and 18-72 probes need to be set in the whole test equipment, which is different from the test equipment in the related art. In comparison, the number of probes is reduced by 84.3%-96.1%, which can greatly reduce the number of probes used, not only reduce the cost of probe consumables, but also reduce the production downtime required to replace the probes.

Optionally, as shown in FIGS. 4 to 7 , the bus bar assembly 20 further includes: an insulating bar 209; the insulating bar 209 is arranged between the voltage bar 208 and the base 201; the other end of the voltage probe 207 passes through the insulating bar in turn The bar 209 , the base 201 and the bus bar 202 , and leaks out of the bus bar 202 .

In the embodiment of the present application, an insulating strip 209 is provided between the voltage bar 208 and the base 201, so that the voltage bar 208 and the base 201 are insulated from each other, thereby realizing the insulation between the voltage probe 207 and the bus bar 202 , reduce the mutual interference between the voltage probe 207 and the bus bar 202 during the test, and improve the test accuracy.

In some embodiments, one end of the voltage probe 207 is connected to the voltage bar 208, and the other end of the voltage probe 207 passes through the insulating bar 209, the base 201 and the bus bar 202 in turn, and the voltage probe 207 and the base 201 are arranged. And the bus bars 202 are insulated from each other to avoid conducting current between the voltage probe 207 and the bus bars 202 .

Specifically, probe holes can be provided on the base 201 and the bus bar 202 corresponding to the positions of the voltage probes 207, so that the diameter of the probe holes is larger than the diameter of the voltage probes 207, and the voltage probes 207 are penetrated in the probe holes , and keep the voltage probe 207 not in contact with the inner wall of the probe hole, so as to avoid conducting current between the voltage probe 207 and the bus bar 202 .

It is also possible to set an insulating sleeve in the probe hole, and use the insulating sleeve to separate the voltage probe 207 from the base 201 and the bus bar 202, so as to realize the mutual connection between the voltage probe 207, the base 201 and the bus bar 202. Insulation, wherein the insulating sleeve can be made of insulating materials, such as ceramics, insulating rubber, insulating plastics and other insulating materials.

In some embodiments, the voltage probe 207 may include a probe base and a probe head, the probe base is fixed on the voltage bar 208, one end of the probe head is detachably connected to the probe base, and the other end of the probe head is in turn Pass through the insulating strip 209 , the base 201 and the bus bar 202 , and leak out of the bus bar 202 .

Optionally, as shown in FIGS. 2 and 3 , the solar battery testing equipment further includes: a wiring socket 30; the wiring socket 30 is arranged on the table panel 10; the wiring socket 30 is electrically connected to the main body 40 of the device, and the voltage bar 208 and the bus bar 202 are respectively electrically connected to the wiring sockets 30 .

In the embodiment of the present application, a wiring socket 30 may also be provided on the table panel 10, and the wiring socket 30 is electrically connected to the device main body 40, and the voltage bar 208 and the bus bar 202 are respectively electrically connected to the wiring socket 30, thereby realizing the voltage probe 207. For the electrical connection between the bus bar 202 and the main body 40 of the device, the wiring socket 30 is provided to simplify the circuit connection line and facilitate the circuit connection during the replacement of the bus bar assembly 20 .

Specifically, a wiring socket 30 can be set on the table top 10, and the voltage bar 208 and the bus bar 202 are respectively electrically connected to the wiring socket 30 through wires. It is electrically connected to the device main body 40 .

In the test equipment in the related art, in the process of replacing the probes, each probe row needs to be electrically connected to the device main body 40 through wires. There are a large number of wires, which are prone to missing or wrong connections. However, in the test equipment of the embodiment of the present application, by setting the wiring socket 30 on the table panel 10, each bus bar assembly 20 can be connected to the wiring socket 30 by a wire in advance, and in the replacement process, only the wiring socket 30 needs to be connected by the wire. 30 is electrically connected to the device main body 40, which is convenient to operate and reduces the probability of missing or wrong connections.

Optionally, as shown in FIG. 5 , the bus bar 202 is detachably connected to the base 201 . In the embodiment of the present application, the bus bar 202 is detachably connected to the base 201 , so as to facilitate the replacement of the bus bar 202 in each bus bar assembly 20 .

In some embodiments, the bus bar 202 can be fixed on the base 201 with screws to facilitate the disassembly and installation of the bus bar 202, and other detachable connection methods can also be used to fix the bus bar 202 on the base 201. , the specific detachable connection manner can be set according to actual needs, which is not limited in this embodiment of the present application.

In some embodiments, the bus bar 202 can be made of brass, and optionally, the surface of the bus bar 202 made of brass can be plated with silver to improve the performance of the bus bar 202 .

Optionally, as shown in FIG. 5 and FIG. 6 , the side of the bus bar 202 away from the base 201 is provided with a plurality of protrusions 2021 arranged at intervals, and the protrusions 2021 are used to communicate with the solar cell 50 touch.

In the embodiment of the present application, a plurality of protrusions 2021 are provided on the side of the bus bar 202 away from the base 201, and the plurality of protrusions 2021 are arranged at intervals. The grid line contact of 50° not only ensures the effective contact between the bus bar 202 and the grid line, but also reduces the contact area between the bus bar 202 and the grid line, thereby improving the accuracy of the test.

Specifically, a raised portion 2021 is provided on the side of the bus bar 202 away from the base 201, the orthographic area of the raised portion 2021 on the base 201 is smaller than the orthographic area of the bus bar 202 on the base 201, and the bus bar The raised portion 2021 on the 202 is used to contact the grid wire of the solar cell 50, thereby reducing the contact area between the bus bar and the grid wire while ensuring the contact between the bus bar 202 and the grid wire.

Further, the bus bar 202 is in the shape of a strip, and the bus bar 202 is provided with a plurality of protrusions 2021, and the plurality of protrusions 2021 are arranged at intervals along the long side of the strip shape, and the protrusions 2021 are used to communicate with the solar energy. The grid wire contacts of the cell 50 .

It can be understood that, during the testing process, the bus bar 202 needs to be in contact with the grid lines of the solar cell 50 to realize the current transmission between the bus bar 202 and the solar cell 50 . However, when the contact area between the bus bar 202 and the grid line is large, if there is a broken grid in the grid line, since the bus bar 202 covers the position where the grid line has a broken grid, the broken grid at this position cannot be tested. Therefore, by arranging a plurality of protruding portions 2021 at intervals on the bus bar 202, the contact requirement between the bus bar 202 and the grid line can be met, and the contact area between the bus bar 202 and the grid line can be reduced as much as possible, and further Improve test accuracy.

It should be noted that the number, shape and size of the protrusions 2021 provided on the bus bar 202 and the distance between adjacent protrusions 2021 can be set according to actual needs, which is not limited in this embodiment of the present application.

In some embodiments, a probe hole can be provided between two adjacent protrusions 2021 on the bus bar 202 , so that the voltage probe 207 can pass through the probe hole. By arranging the voltage probe 207 between the protrusions 2021 on the bus bar 202 , the mutual interference between the bus bar 202 and the voltage probe 207 is reduced when they are in contact with the grid lines of the solar cell 50 at the same time, and the detection accuracy is improved.

An embodiment of the present application further provides a solar cell testing system, including the solar cell testing device in the above embodiment.

In the embodiment of the present application, the solar cell testing equipment includes a device main body 40, a table panel 10 and a plurality of bus bar assemblies 20, the bus bar assembly 20 includes a base 201 and a bus bar 202, and the table panel 10 is detachably connected to the device main body 40 , the base 201 is connected to the table top 10 , the bus bar 202 is disposed on the side of the base 201 away from the table top 10 , and the bus bar 202 is used to contact the grid lines of the solar cells 50 . Since the positions of the grid lines on the solar cell 50 are relatively fixed, multiple bus bar assemblies 20 can be assembled with the table top 10 in advance, and the relative positions of the bus bar assemblies 20 and the table top 10 can be adjusted to form a spare replacement assembly. When it is necessary to replace the bus bar 202 of the test equipment, it is only necessary to install the table panel 10 in the spare replacement component to the equipment main body 40, and fine-tune the relative position between the table panel 10 and the equipment main body 40, which greatly shortens the time for replacing the bus bar 202. The equipment downtime of bar 202; And, adopt bus bar 202 to replace a plurality of probes in the conventional probe row in each bus bar assembly 20, can save due to the time needed for adjusting the probe in the probe row, can further Shortening the downtime of the equipment for replacing the bus bar 202 helps to reduce the production loss of the equipment, and the replacement operation is more convenient.

It should be noted that the solar battery testing system in the embodiment of the present application may include the solar battery testing equipment in any of the above-mentioned embodiments, and the specific structure of the solar battery testing equipment may refer to the foregoing content, and the embodiments of the present application will not repeat them here. .

In the description of this specification, references to the terms "one embodiment," "some embodiments," "exemplary embodiments," "example," "specific examples," or "some examples" are intended to mean that the implementation A specific feature, structure, material, or characteristic described by an embodiment or example is included in at least one embodiment or example of the present application. In this specification, schematic representations of the above terms do not necessarily refer to the same embodiment or example. Furthermore, the specific features, structures, materials or characteristics described may be combined in any suitable manner in any one or more embodiments or examples.

Although the embodiments of the present application have been shown and described, those skilled in the art can understand that various changes, modifications, substitutions and variations can be made to these embodiments without departing from the principle and spirit of the present application. The scope of the application is defined by the claims and their equivalents.

Claims (10)

1. A solar cell testing apparatus, comprising: the bus bar assembly comprises an equipment main body, a table panel and a plurality of bus bar assemblies arranged at intervals;

the bus bar assembly includes: a base and a bus bar;

the table panel is detachably connected with the equipment main body; the base is connected with the table panel;

the bus bar is arranged on one side, far away from the table panel, of the base, and the bus bar is used for being in contact with a grid line of the solar cell.

2. The solar cell testing apparatus of claim 1, wherein the bus bar assembly further comprises: a connecting shaft;

the connecting shaft comprises a first end and a second end which deviate from the setting, the first end is connected with the base, and the second end is connected with the table panel.

3. The solar cell testing apparatus of claim 2, wherein the bus bar assembly further comprises: an elastic member and an adjusting nut;

the elastic piece is arranged between the base and the table panel, and the connecting shaft is arranged in the elastic piece in a penetrating mode;

the adjusting nut is arranged on one side of the table panel, which is far away from the elastic piece; the table panel is provided with a through hole, the connecting shaft movably penetrates through the through hole, and the second end of the connecting shaft is connected with the adjusting nut.

4. The solar cell testing apparatus of claim 3, wherein the bus bar assembly further comprises: a linear bearing;

the linear bearing is arranged in the through hole, and the adjusting nut is arranged on one side of the linear bearing, which is far away from the base;

the connecting shaft penetrates through the linear bearing, and the second end of the connecting shaft is connected with the adjusting nut.

5. The solar cell testing apparatus according to any one of claims 1 to 4, wherein the bus bar assembly further comprises: a voltage probe and a voltage bar;

the voltage bar is arranged on one side, far away from the bus bar, of the base; one end of the voltage probe is connected with the voltage bar; the other end of the voltage probe sequentially penetrates through the base and the bus bar and is leaked out of the bus bar.

6. The solar cell testing apparatus of claim 5, wherein the bus bar assembly further comprises: an insulating strip;

the insulating strip is arranged between the electric pressing strip and the base; the other end of the voltage probe sequentially penetrates through the insulating bar, the base and the bus bar and is leaked out of the bus bar.

7. The solar cell testing apparatus of claim 5, further comprising: a connection socket;

the wiring socket is arranged on the table panel; the wiring socket is electrically connected with the equipment main body, and the electric pressing strip and the bus bar are respectively electrically connected with the wiring socket.

8. The solar cell testing apparatus of claim 1, wherein the bus bar is removably connected to the base.

9. The solar cell testing apparatus of claim 8, wherein a plurality of protrusions are spaced apart from each other on a side of the bus bar away from the base, and the protrusions are configured to contact the grid lines of the solar cells.

10. A solar cell testing system comprising the solar cell testing apparatus according to any one of claims 1 to 9.

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