CN218383164U

CN218383164U - Probe control equipment for chip testing

Info

Publication number: CN218383164U
Application number: CN202222164534.0U
Authority: CN
Inventors: 车志东; 潘其好
Original assignee: Nanjing Kexing Semiconductor Testing Equipment Co ltd
Current assignee: Nanjing Kexing Semiconductor Testing Equipment Co ltd
Priority date: 2022-08-17
Filing date: 2022-08-17
Publication date: 2023-01-24
Anticipated expiration: 2032-08-17

Abstract

The utility model discloses a probe control device for chip testing, which comprises a bracket and a fixing mechanism, wherein the fixing mechanism is arranged on the upper part of one side of the bracket, a connecting seat in the fixing mechanism is arranged on the upper part of one side of the bracket, the fixing mechanism also comprises a chute, a sliding strip, a bolt, a connecting plate, a first spring, a clamping block and a pull rod, and the chute is arranged at the bottom of the connecting seat; the utility model discloses a fixed establishment's setting, it can be to the same dismouting of probe and whole group of probe to possess, thereby do benefit to subsequent single or whole group and together change the operation, and easy operation is convenient, and the work efficiency is improved, utilize the connecting seat, the spout, the cooperation of draw runner and bolt is convenient to the probe body dismouting of whole group, through feeding agencies's setting, chip after convenient automatic will detecting the completion takes off, so that follow-up chip of placing once more undetected, not only do benefit to the operation, and improved the efficiency of detection.

Description

Probe control equipment for chip testing

Technical Field

The utility model relates to a chip test probe technical field, concretely relates to probe controlgear for chip testing.

Background

The detection of the chip is required to ensure the qualification of the chip after the production of the chip, the detection of the chip is indispensable for detecting the failed or semi-failed chip, the detection of the chip is required to be carried out by a probe during the detection, the probe is a probe control equipment test probe for testing the PCBA and used for chip testing, the surface of the probe is plated with gold, and a high-performance spring with the average service life of 3 ten thousand to 10 ten thousand is arranged in the probe,

among the prior art, notice number CN216449623U discloses a probe platform that is used for probe controlgear of chip test to be used for high-accuracy chip test, relates to high-accuracy chip test technical field, the utility model discloses a base, base upper surface are equipped with gag lever post, lift lead screw, cylinder and support frame, and the gag lever post surface is equipped with the elevating platform, and the lift lead screw pierces through the elevating platform and with elevating platform threaded connection, and the lift lead screw upper surface is equipped with the motor, and motor output coaxial coupling has the connecting rod, connecting rod and lift lead screw coaxial coupling. The utility model discloses a cylinder, when using, starts the cylinder to it is fixed with fixed slot and supporting shoe to go up and down the workstation, passes through the chip afterwards, and it is rotatory that the starter motor drives the lift lead screw afterwards, thereby drives the elevating platform and goes up and down, moves the sliding block afterwards and removes the probe to the position that needs the test, thereby tests the chip, when needs test other positions, rotatory workstation, thereby test other positions, it is comparatively convenient.

Although the technical problems of height adjustment and position movement are solved by the technology, the probe or the whole group of probes are not easily detached, disassembled and replaced after frequent work, so that the disassembly and assembly are difficult, and the work efficiency is reduced.

SUMMERY OF THE UTILITY MODEL

An object of the utility model is to provide a probe controlgear for chip test possesses can be to probe and the same dismouting of whole group of probe to do benefit to subsequent single or whole group and together change the operation, and easy operation is convenient, has improved work efficiency, with the problem of proposing in solving above-mentioned background art.

In order to achieve the above object, the utility model provides a following technical scheme: a probe control device for chip testing comprises a support and a fixing mechanism, wherein the fixing mechanism is arranged at the upper part of one side of the support, and a connecting seat in the fixing mechanism is arranged at the upper part of one side of the support;

the fixing mechanism further comprises a sliding groove, a sliding strip, a bolt, a connecting plate, a first spring, a clamping block and a pull rod, the sliding groove is formed in the bottom of the connecting seat, the sliding strip is connected inside the sliding groove in a sliding mode, the bolt is connected to one side of the connecting seat in a threaded mode, the connecting plate is installed at the bottom of the sliding strip, the first spring is installed on the two sides of the inner cavity of the connecting plate respectively, the clamping block is installed on one side of the first spring, and the pull rod is installed on one side of the clamping block.

Preferably, an electric sliding table is installed at the top of one side of the support, the bottom of the electric sliding table is installed on an electric push rod, and the connecting seat is installed at the output end of the electric push rod.

Preferably, one end of the support is provided with an adjusting mechanism, the adjusting mechanism comprises a bottom plate, a first motor and a turntable base, and the bottom plate is installed at one end of the support.

Preferably, the first motor is mounted on the top of the bottom plate, the turntable base is mounted on an output shaft of the first motor, and the probe body is clamped on the inner side of the clamping block.

Preferably, the top of carousel seat is provided with feeding agencies, feeding agencies includes mounting panel, second spring, clamp plate, gyro wheel, second motor, transmission shaft and drive wheel, the mounting panel is installed in the top of carousel seat.

Preferably, the second spring is installed at the bottom of the installation plate, the pressing plate is installed at one end of the second spring, and the roller is movably installed at the bottom of the pressing plate.

Preferably, the second motor is installed in an inner cavity of the turntable base, the transmission shaft is connected to an output shaft of the second motor in a key mode, and the driving wheels are installed on two sides of the surface of the transmission shaft respectively.

Compared with the prior art, the beneficial effects of the utility model are that:

1. the utility model discloses a fixed establishment's setting possesses and to the probe and the same dismouting of whole group probe to do benefit to subsequent single or whole group and together change the operation, and easy operation is convenient, has improved work efficiency, utilizes the cooperation convenience of connecting seat, spout, draw runner and bolt to carrying out the dismouting to whole group probe body, and the cooperation of connecting plate, first spring, grip block and pull rod then is used for single probe body to carry out dismouting work.

2. The utility model discloses through feeding agencies's setting, chip after convenient automatic will detecting the completion is taken off, so that follow-up chip of placing once more not detecting, not only do benefit to the operation, and improved the efficiency of detection, utilize the mounting panel, the second spring, the cooperation of clamp plate and gyro wheel is convenient compresses tightly it when placing the chip, and the gyro wheel still can assist it to get material work, by the second motor, the cooperation of transmission shaft and drive wheel conveniently makes the drive wheel roll and with the convenient chip after will detecting of gyro wheel cooperation work of unloading.

Drawings

FIG. 1 is a schematic structural view of the present invention;

FIG. 2 is a schematic diagram of the structure of the connection plate of the present invention;

FIG. 3 is a schematic view of a partial enlarged structure at A in FIG. 1 according to the present invention;

FIG. 4 is a schematic view of a partial enlarged structure at B of FIG. 1 according to the present invention;

fig. 5 is a schematic view of the turntable base of the present invention.

In the figure: 1. a support; 2. a fixing mechanism; 21. a connecting seat; 22. a chute; 23. a slide bar; 24. a bolt; 25. a connecting plate; 26. a first spring; 27. a clamping block; 28. a pull rod; 3. an adjustment mechanism; 31. a base plate; 32. a first motor; 33. a turntable base; 4. a material taking mechanism; 41. mounting a plate; 42. a second spring; 43. pressing a plate; 44. a roller; 45. a second motor; 46. a drive shaft; 47. a drive wheel; 5. a probe body; 6. an electric sliding table; 7. an electric push rod.

Detailed Description

The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.

Referring to fig. 1 to 5, the present invention provides a probe control device for chip testing, which includes a support 1 and a fixing mechanism 2, wherein the fixing mechanism 2 is disposed on an upper portion of one side of the support 1, and a connecting seat 21 of the fixing mechanism 2 is disposed on an upper portion of one side of the support 1, and the connecting seat 21 is used for connection;

the fixing mechanism 2 further comprises a sliding groove 22, a sliding strip 23, a bolt 24, a connecting plate 25, a first spring 26, a clamping block 27 and a pull rod 28, the sliding groove 22 is formed in the bottom of the connecting seat 21, the sliding strip 23 is connected to the inside of the sliding groove 22 in a sliding mode, the bolt 24 is connected to one side of the connecting seat 21 in a threaded mode, the connecting plate 25 can be taken and placed conveniently by utilizing the sliding connection relationship between the sliding groove 22 and the sliding strip 23, and the bolt 24 is used for locking and fixing the connecting plate 25 during installation;

the connecting plate 25 is arranged at the bottom of the sliding strip 23, the first springs 26 are respectively arranged at two sides of an inner cavity of the connecting plate 25, the clamping blocks 27 are arranged at one sides of the first springs 26, the pull rod 28 is arranged at one side of the clamping blocks 27, the clamping blocks 27 are pushed by the elasticity of the first springs 26 to be convenient for clamping and fixing the probe body 5, the pull rod 28 is pulled to enable the clamping blocks 27 to be separated from the probe body 5 when the probe body 5 needs to be taken down, and then the probe body 5 can be directly taken down.

Further, as shown in fig. 1, electric sliding table 6 is installed at the top of support 1 one side, and electric sliding table 6's bottom is installed in electric putter 7, and connecting seat 21 is installed in electric putter 7's output, starts electric sliding table 6 and is convenient for drive the part that the below is connected and together removes work about to be convenient for carry out position adjustment, and starts electric putter 7 and then is used for promoting the part of its output, thereby does benefit to and adjusts its required height position.

As shown in fig. 1, an adjusting mechanism 3 is disposed at one end of the bracket 1, the adjusting mechanism 3 includes a bottom plate 31, a first motor 32 and a turntable base 33, the bottom plate 31 is mounted at one end of the bracket 1, and the bottom plate 31 serves as a supporting connection.

In addition, as shown in fig. 1, the first motor 32 is mounted on the top of the bottom plate 31, the turntable seat 33 is mounted on the output shaft of the first motor 32, the probe body 5 is clamped on the inner side of the clamping block 27, and the first motor 32 is started to drive the turntable seat 33 to rotate, so that the position of the chip is adjusted, the undetected chip is automatically replaced, the turntable seat 33 is favorable for placing a plurality of groups of chips, and the probe body 5 is pushed to realize the detection work.

Preferably, as shown in fig. 1 and 5, the material taking mechanism 4 is disposed on the top of the turntable base 33, the material taking mechanism 4 includes a mounting plate 41, a second spring 42, a pressing plate 43, a roller 44, a second motor 45, a transmission shaft 46 and a driving wheel 47, the mounting plate 41 is mounted on the top of the turntable base 33, and the mounting plate 41 can be used for mounting the second spring 42.

As shown in fig. 1 and 5, the second spring 42 is installed at the bottom of the mounting plate 41, the pressing plate 43 is installed at one end of the second spring 42, the rollers 44 are movably installed at the bottom of the pressing plate 43, the pressing plate 43 and the rollers 44 at the bottom of the pressing plate 43 are pushed by the elasticity of the second spring 42 to conveniently press the chip, and the rollers 44 are provided with two groups, two in each group, one in the front and back, so as to facilitate the unloading operation.

As shown in fig. 1, the second motor 45 is installed in the inner cavity of the turntable base 33, the transmission shaft 46 is connected to the output shaft of the second motor 45 in a keyed mode, the driving wheels 47 are installed on two sides of the surface of the transmission shaft 46 respectively, when unloading is needed after detection is completed, the second motor 45 is started, the second motor 45 is utilized to drive the transmission shaft 46 and the driving wheels 47 to rotate, so that the chips are driven to move outwards, and unloading is achieved.

Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that changes, modifications, substitutions and alterations can be made in these embodiments without departing from the principles and spirit of the invention, the scope of which is defined in the appended claims and their equivalents.

Claims

1. A probe control device for chip testing, comprising a support (1) and a fixing mechanism (2), characterized in that: the fixing mechanism (2) is arranged at the upper part of one side of the bracket (1), and the connecting seat (21) in the fixing mechanism (2) is arranged at the upper part of one side of the bracket (1);

fixed establishment (2) are still including spout (22), draw runner (23), bolt (24), connecting plate (25), first spring (26), grip block (27) and pull rod (28), the bottom of connecting seat (21) is seted up in spout (22), draw runner (23) sliding connection is in the inside of spout (22), bolt (24) threaded connection is in one side of connecting seat (21), the bottom in draw runner (23) is installed in connecting plate (25), the both sides in connecting plate (25) inner chamber are installed respectively in first spring (26), grip block (27) are installed in one side of first spring (26), one side in grip block (27) is installed in pull rod (28).

2. The probe control apparatus for chip testing according to claim 1, wherein: electric sliding table (6) is installed at the top of support (1) one side, the bottom of electric sliding table (6) is installed in electric putter (7), connecting seat (21) are installed in the output of electric putter (7).

3. The probe control apparatus for chip testing according to claim 1, wherein: one end of the support (1) is provided with an adjusting mechanism (3), the adjusting mechanism (3) comprises a bottom plate (31), a first motor (32) and a turntable seat (33), and the bottom plate (31) is installed at one end of the support (1).

4. The probe control apparatus for chip testing according to claim 3, wherein: the probe comprises a first motor (32) and a rotating disc seat (33), wherein the first motor is mounted at the top of a bottom plate (31), the rotating disc seat (33) is mounted at an output shaft of the first motor (32), and a probe body (5) is clamped at the inner side of a clamping block (27).

5. The probe control apparatus for chip testing according to claim 4, wherein: the top of carousel seat (33) is provided with feeding agencies (4), feeding agencies (4) include mounting panel (41), second spring (42), clamp plate (43), gyro wheel (44), second motor (45), transmission shaft (46) and drive wheel (47), the top in carousel seat (33) is installed in mounting panel (41).

6. The probe control apparatus for chip testing according to claim 5, wherein: the second spring (42) is installed at the bottom of the installation plate (41), the pressing plate (43) is installed at one end of the second spring (42), and the roller (44) is movably installed at the bottom of the pressing plate (43).

7. The probe control apparatus for chip testing according to claim 6, wherein: the second motor (45) is installed in the inner cavity of the turntable base (33), the transmission shaft (46) is connected to the output shaft of the second motor (45) in a key mode, and the driving wheels (47) are installed on the two sides of the surface of the transmission shaft (46) respectively.