CN218331688U - Test setup for chip pins - Google Patents

Abstract

The application relates to a test device for chip pins, including a test bench, and also includes: a pressure sensor arranged on the test bench, the pressure sensor is connected to a display piece; a detection fixture arranged on the pressure sensor, the detection fixture is used to contain Place the chip; the lower pressing block is set above the jig, and the test bench is provided with a driving assembly for driving the lower pressing block up and down. On the test bench, a support plate is vertically provided on the side of the pressure sensor. The drive motor at the top of the support plate, the screw rod fixedly connected to the output shaft of the drive motor, the guide rail vertically arranged on the side of the support plate, and the lifting plate slidingly arranged on the guide rail, the thread of the screw rod runs through the lifting plate, and the lifting plate is connected to the lower plate. The briquetting contact is used to drive the lower briquetting up and down. The application has the effect of effectively improving the detection efficiency of chip pins.

Description

Test setup for chip pins

technical field

The present application relates to the technical field of chip testing, in particular to a testing device for chip pins.

Background technique

With the continuous development of science and technology, electronic informatization and the development of the Internet are becoming more and more advanced. The chip is an important integration and transmission carrier for information transmission. According to the type of signal transmission structure, chips can generally be divided into pin-type chips or pin-type chips. The pins in pin-type chips are retractable. When in use, the chip is installed on a signal transmission carrier such as a PCB board. It is squeezed to contact with the contact point on the PCB board, so as to complete the signal transmission.

However, due to its refined structural characteristics, the assembly of the pins of the chip may partially fail, that is, the stretchability of the pins is damaged. It is difficult for the chip under the circumstances to meet the relevant use requirements, and the current chip is usually placed under a magnifying glass and manually inspected after the assembly of the pins is completed, which is time-consuming and labor-intensive.

Utility model content

In order to solve the above technical problems, the present application provides a chip pin testing device, which can quickly and conveniently detect whether the expansion and contraction performance of the chip pins is invalid, and saves manpower.

In order to achieve the above object, the technical scheme of the utility model is as follows:

A test device for chip pins, including a test bench, also includes:

a pressure sensor arranged on the test bench, the pressure sensor is connected with a display;

A detection jig arranged on the pressure sensor, the detection jig is used to hold the chip;

The lower pressing block is arranged above the jig, and the test bench is provided with a driving assembly for driving the lower pressing block to lift.

To achieve the above technical solution, place the chip in the detection fixture, which is in the initial state at this time, and the display part shows the reading of the pressure sensor in the initial state, and then start the driving component to drive the lower pressing block to move down, so that the lower pressing block touches the chip , continue to drive the lower pressing block to move, causing the pins to stretch and deform, and the rebound force of multiple pins is transmitted to the pressure sensor through the detection fixture. If the pins are normally stretched, the pressure sensor will be subject to a standard pressure value. If some pins are damaged, The pressure received by the pressure sensor will be less than the standard pressure value, which can determine the damage of the pin.

As one of the preferred solutions of the present application, the detection fixture includes a supporting plate horizontally arranged on the pressure sensor, a first magnetic attraction arranged on the upper surface of the supporting plate, and a magnetic attraction arranged on the first magnetic attraction. The placement board is provided with a placement groove for placing chips.

To achieve the above technical solution, the placement board is disassembled and installed on the supporting board through the first magnetic attraction, and the placement board can be provided with various specifications, and the size of each placement slot is different. When testing chips of different sizes, only The placement board needs to be disassembled and replaced, so as to meet the test requirements of different chips and improve applicability.

As one of the preferred solutions of the present application, a second magnetic attraction is provided on the bottom surface of the lower pressing block, and a contact block is attached to the bottom surface of the second magnetic attraction.

To achieve the above technical solution, the contact block can be easily disassembled from the second magnetic attraction. When facing chips of different sizes, the contact block can be replaced with different specifications, and the bottom surface of the contact block can be set to be the same size as the chip. , so as to ensure the uniformity of contact between the contact block and the chip, can adapt to chips of different sizes, and improve the accuracy of detection.

As one of the preferred solutions of the present application, a guide column is vertically provided on the supporting plate, a guide sleeve is vertically provided on the lower pressing block, and the guide sleeve is slidably arranged on the outside of the guide column.

Realizing the technical solution above further improves the accuracy when the lower pressing block presses the chip, and improves the accuracy of detection.

As one of the preferred solutions of the present application, the outer wall of the guide column is covered with a buffer spring.

By realizing the above technical solution, when the pressing block is lowered, it is buffered by the buffer spring, and the pressing process of the chip is more stable and accurate.

As one of the preferred solutions of the present application, a support plate is vertically provided on one side of the pressure sensor on the test bench, and the drive assembly includes a drive motor vertically arranged at the top of the support plate, fixedly connected with the output shaft of the drive motor The screw mandrel, the guide rail vertically arranged on the side of the support plate and the lifting plate slidingly arranged on the guide rail, the thread of the screw mandrel runs through the lifting plate, and the lifting plate is in contact with the lower pressing block to drive the lower pressing block to lift.

To achieve the above technical solution, a specific structure of the drive assembly is proposed. The output shaft of the driving motor rotates, which drives the screw to rotate, and then drives the lifting plate to rise or move down. The lifting plate contacts the lower pressing block, thereby driving the lower pressing block to rise and fall. , This kind of driving assembly is independent from the lower pressing block, so it is more convenient to disassemble the lower pressing block.

As one of the preferred solutions of the present application, a third magnetic attraction is provided on the bottom surface of the lifting plate, and an extruding block is attached to the bottom surface of the third magnetic attraction.

To achieve the above technical solution, the extruding block can be replaced, thereby ensuring the uniformity of contact between the extruding block and the lower pressing block, thereby improving the force uniformity of the chip and improving the detection accuracy.

In summary, the present application includes at least one of the following beneficial technical effects:

1. By placing the chip on the pressure sensor and using the pressing component to drive the chip down, the pins are stretched and stretched to generate extrusion force on the pressure sensor. Through the pressure value displayed on the pressure sensor, it is convenient and fast to judge whether the pin is Damage occurs, so as to judge the yield rate of the chip;

2. The test fixture is set as a split support plate and a placement plate, and the placement plate is detachably fixed on the support plate using the first magnetic attraction, so that it can be easily replaced according to chips of different sizes, and the applicability is stronger .

Description of drawings

In order to more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the following will briefly introduce the accompanying drawings that need to be used in the description of the embodiments or the prior art. Obviously, the accompanying drawings in the following description These are only some embodiments of the utility model, and those skilled in the art can also obtain other drawings based on these drawings without creative work.

Fig. 1 is the overall structure schematic diagram of testing device;

Figure 2 is a front view of the testing device.

Reference signs: 1. Test bench; 2. Pressure sensor; 21. Display part; 3. Detection fixture; 31. Supporting plate; 32. First magnetic attraction part; 33. Placement board; 331. Placement slot; 4 , the lower pressure block; 41, the second magnetic attraction; 42, the contact block; 5, the drive assembly; 51, the drive motor; 52, the screw; 53, the guide rail; 7, buffer spring; 8, support plate; 91, the third magnetic attraction piece; 92, extrusion block; 10, support frame.

detailed description

The present application will be described in further detail below in conjunction with accompanying drawings 1-2.

Referring to FIG. 1 and FIG. 2 , it is a test device for chip pins disclosed in the embodiment of the present application. The test device includes a test bench 1, a support frame 10 is provided on the surface of the test bench 1, and a pressure sensor 2 is arranged on the support frame 10. The pressure sensor 2 is connected to a display part 21 through a wire, and the display part 21 is a pressure display screen, which is displayed in real time. The numerical value of the pressure sensor 2; the pressure sensor 2 is provided with a detection jig 3, and the detection jig 3 includes a support plate 31 fixed horizontally on the pressure sensor 2, and a first magnetic member adsorbed on the support plate 31 32 and the placement plate 33 that is adsorbed and arranged on the first magnetic attraction 32, the placement plate 33 is provided with a placement groove 331 for placing chips, the supporting plate 31 is bolted to the pressure sensor 2, and other fixings can also be used. In this way, the placement plate 33 can be conveniently replaced from the first magnetic member 32 according to chips of different sizes, which effectively improves the applicability of the testing device.

Referring to Fig. 1 and Fig. 2, a lower pressing block 4 is horizontally provided above the placement plate 33, and a plurality of guide sleeves 62 are vertically provided on the bottom surface of the lower pressing block 4, and vertically at the four corners of the upper surface of the supporting plate 31. Directly provided with guide post 61, guide post 61 and guide sleeve 62 are slidingly plugged and fitted, and the outer wall of guide post 61 is also sleeved with buffer spring 7, used to ensure the stability of lower pressing block 4 when moving down. Adsorption on the bottom surface of the lower pressing block 4 is provided with a second magnetic attraction 41, and the bottom surface of the second magnetic attraction 41 is horizontally adsorbed with a contact block 42. The contact block 42 is in contact with the chip, and the contact block 42 can be more convenient. When disassembling and replacing chips of different sizes, the contact block 42 can ensure full contact with the chips, thereby improving the uniformity of pressing down on the chips and improving the detection accuracy.

Referring to Fig. 1 and Fig. 2, a support plate 8 is vertically provided on the side where the test bench 1 is located at the pressure sensor 2, and a driving assembly 5 for driving the lower pressing block 4 to lift is provided above the lower pressing block 4, and the driving assembly 5 is set On the support plate 8, the drive assembly 5 includes a drive motor 51 vertically arranged on the top of the support plate 8, a screw 52 fixedly connected to the output shaft of the drive motor 51, a guide rail 53 vertically arranged on the side of the support plate 8, and a sliding The lifting plate 54 arranged on the guide rail 53, the screw mandrel 52 threaded through the lifting plate 54 is set, the bottom end of the screw mandrel 52 is arranged on the test bench 1 by bearing rotation, the lifting plate 54 is in contact with the lower pressing block 4 to drive the pressing down Block 4 lifts, and the bottom surface of lifting plate 54 is provided with the 3rd magnetic suction piece 91, and the bottom surface of the 3rd magnetic suction piece 91 is adsorbed and is provided with extruding piece 92, is also in order to guarantee the uniformity of contact. Wherein the first magnetic attractor 32 , the second magnetic attractor 41 and the third magnetic attractor 91 are all configured as ordinary magnets, and may also be configured as electromagnets or the like.

The implementation principle of a test device for chip pins in the embodiment of the present application is: when it is necessary to test the function of the chip pins, the chip is placed in the placement groove 331. At this time, it is in the initial state, and the display part 21 shows that the pressure sensor 2 is in the initial state. Then start the driving component 5 to drive the lower pressing block 4 to move down, the contact block 42 below the lower pressing block 4 evenly and comprehensively touches the chip, and continues to drive the lower pressing block 4 to move, so that the pins are stretched and deformed, and the number of pins The rebound force is transmitted to the pressure sensor 2 through the detection fixture 3. If the pins are stretched normally, the pressure sensor 2 will receive a standard pressure value. If some pins are damaged, the pressure on the pressure sensor 2 will be less than the standard pressure value, and the pins can be judged damaged condition. Wherein the standard pressure value can be a qualified sample carefully checked manually by the staff and placed in the placement tank 331, and the value recorded in the preliminary test can be sufficient.

All of the above are preferred embodiments of the application, and are not intended to limit the protection scope of the application. Therefore, all equivalent changes made according to the structure, shape, and principle of the application should be covered by the protection scope of the application. Inside.

Claims (7)

1. A test device for chip pins, comprising a test bench (1), is characterized in that, also includes: a pressure sensor (2) arranged on the test bench (1), the pressure sensor (2) being connected with a display part (21); A detection jig (3) arranged on the pressure sensor (2), the detection jig (3) is used to hold the chip; The lower pressing block (4) is arranged above the jig, and the test bench (1) is provided with a driving assembly (5) for driving the lower pressing block (4) to lift. 2. The testing device for chip pins according to claim 1, characterized in that: the detection jig (3) includes a support plate (31) horizontally arranged on the pressure sensor (2), and a support plate (31) arranged on the support plate (31) The first magnetic attraction (32) on the upper surface and the placement plate (33) that is adsorbed and arranged on the first magnetic attraction (32), and the placement plate (33) is provided with a placement groove for placing chips (331). 3. The test device for chip pins according to claim 2, characterized in that: the bottom surface of the lower pressing block (4) is provided with a second magnetic attraction (41), and the bottom surface of the second magnetic attraction (41) is Adsorption is provided with a contact block (42). 4. The testing device for chip pins according to claim 2, characterized in that: a guide post (61) is vertically provided on the support plate (31), and a vertical guide column (61) is vertically provided on the lower pressing block (4). There is a guide sleeve (62), and the guide sleeve (62) is slidingly sleeved on the outside of the guide column (61). 5. The chip pin testing device according to claim 4, characterized in that: the outer wall of the guide post (61) is covered with a buffer spring (7). 6. The test device for chip pins according to claim 1, characterized in that: a support plate (8) is vertically arranged on one side of the pressure sensor (2) on the test bench (1), and the drive assembly (5) comprising a drive motor (51) vertically arranged on the top of the support plate (8), a screw mandrel (52) fixedly connected to the output shaft of the drive motor (51), and a guide rail vertically arranged on the side of the support plate (8) (53) and the lifting plate (54) that is slidably arranged on the guide rail (53), the screw mandrel (52) threaded through the lifting plate (54) is provided, and the lifting plate (54) is in contact with the lower pressing block (4) It is used to drive the lower pressing block (4) to lift. 7. The test device for chip pins according to claim 6, characterized in that: the bottom surface of the lifting plate (54) is provided with a third magnetic attraction (91), and the bottom surface of the third magnetic attraction (91) absorbs An extrusion block (92) is provided.

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