CN217981660U - Multi-probe multi-beam testing device for array antenna - Google Patents
Multi-probe multi-beam testing device for array antenna Download PDFInfo
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Abstract
The utility model provides an array antenna multi-probe multi-beam testing device, which comprises a time schedule controller, a multi-probe array, a switch matrix, a scanning frame and a sampler; the multi-probe array is used for being arranged opposite to the array antenna to be detected at intervals; the scanning frame is fixedly provided with a multi-probe array and is used for driving the multi-probe array to move relative to the array antenna to be detected; the first end of the switch matrix is connected with the sampler, and the second end of the switch matrix is selectively connected with the multi-probe array; the time sequence controller is respectively and electrically connected with the sampler, the scanning driver of the scanning frame and the wave beam controller of the array antenna to be detected. The device greatly improves the multi-beam testing efficiency and the testing task amount of the array antenna; the method has the advantages of high integration degree, high precision, good stability, small volume and light weight; the device is flexible in configuration, has strong universality and expandability, and can be popularized and applied to the test requirements of array antennas with different systems and different calibers in different test fields.
Description
Technical Field
The utility model belongs to the technical field of antenna test system, concretely relates to array antenna multi-probe multi-beam testing arrangement.
Background
With the rapid development of the array antenna technology, especially the phased array antenna technology is widely applied in the fields of military and civil radars, 5G communication, electronic warfare, navigation and the like, and has become the mainstream direction of the development of modern antenna technology products, and the design of the antenna cannot be separated from the antenna measurement technology.
The traditional test mode of measuring a single beam by a single probe through one-time scanning obviously cannot meet the requirement of the multi-beam test efficiency of the phased array antenna. How to realize the automatic control of phased array antenna test, improve efficiency of software testing fast is the key problem who solves phased array antenna test in-process.
SUMMERY OF THE UTILITY MODEL
The utility model discloses aim at solving one of the technical problem that exists among the prior art at least, provide an array antenna multi-probe multi-beam testing arrangement.
The utility model provides an array antenna multi-probe multi-beam testing device, which comprises a time schedule controller, a multi-probe array, a switch matrix, a scanning frame and a sampler;
the multi-probe array is used for being arranged opposite to the array antenna to be detected at intervals;
the scanning frame is fixedly provided with the multi-probe array and is used for driving the multi-probe array to move relative to the array antenna to be detected;
a first end of the switch matrix is connected with the sampler, and a second end of the switch matrix is selectively connected with the multi-probe array;
the time schedule controller is respectively and electrically connected with the sampler, the scanning driver of the scanning frame and the beam controller of the array antenna to be detected; wherein,
the time sequence controller is used for generating a plurality of groups of time sequence signals according to the received test parameters, so that when the scanning frame moves to each test position, the corresponding groups of time sequence signals are used for synchronously triggering the switch matrix to switch the probe channel and the beam controller to switch the beam, and the sampler is controlled to sample the beam, so that the multi-beam test is completed.
Optionally, the scanning frame includes a base, a translation driving mechanism and a vertical driving mechanism;
the translation driving mechanism is fixed on the base, the vertical driving mechanism is movably arranged on the translation driving mechanism, and the vertical driving mechanism is provided with the multi-probe array.
Optionally, a wave absorbing material layer is arranged on one side of the scanning frame facing the array antenna to be detected.
Optionally, the device also comprises a multi-probe tool bracket,
the multi-probe tool support is used for fixedly arranging the multi-probe array on the scanning frame.
Optionally, a probe mounting adapter plate is arranged on the multi-probe tool support;
the probe mounting adapter plate is used for fixing the probe array on the multi-probe tool support.
Optionally, the multi-probe tool support further comprises a probe translation sliding block, the probe translation sliding block is arranged on the multi-probe tool support, and each probe in the multi-probe array is fixed on the probe translation sliding block;
and the probe translation sliding block is used for adjusting the center distance between the probes in the multi-probe array.
Optionally, the multi-probe array employs dual-polarized open waveguide probes.
Optionally, the multiple probe arrays are arranged in a straight line.
Optionally, the sampler is a vector network analyzer.
Optionally, the switch matrix adopts a microwave solid-state switch, the channel isolation of the microwave solid-state switch is 70dB, and the channel switching time of the microwave solid-state switch is less than 100ns.
The multi-probe multi-beam testing device of the array antenna effectively reduces the scanning range of the array antenna by the multi-probe array, thereby greatly improving the testing efficiency; the switch matrix channel electrical switching time replaces the probe moving time in the single probe, so that the test time is greatly shortened; the multi-probe specification and position adjustment can be carried out on the array antennas to be tested with different apertures, so that the array antennas to be tested with wide frequency bands and different apertures can be quickly tested; the time schedule controller is adopted to replace the traditional main control computer, software is adopted to carry out interactive communication among the devices, the optimal response speed of each device is fully optimized, the automatic rapid test of multiple probes and multiple beams of the phased array antenna is realized, and the multiple beam test efficiency and the test task amount of the array antenna are greatly improved; the whole measuring device has the advantages of high integration degree, high precision, good stability, small volume and light weight; the test device is flexible in configuration, has strong universality and expandability, and can be popularized and applied to test requirements of array antennas of different systems and different calibers in different test fields.
Drawings
Fig. 1 is a schematic structural diagram of a multi-probe multi-beam testing apparatus for an array antenna according to an embodiment of the present invention;
fig. 2 is a schematic view of a part of a gantry according to another embodiment of the present invention;
fig. 3 is a schematic structural view of a translation driving mechanism in a gantry according to another embodiment of the present invention;
fig. 4 is a schematic structural diagram of a vertical driving mechanism in a gantry according to another embodiment of the present invention;
fig. 5 is a schematic view of a partial structure of a gantry according to another embodiment of the present invention;
fig. 6 is a schematic diagram illustrating a motion flow of scanning an antenna to be tested during a four-probe array test according to another embodiment of the present invention;
fig. 7 is a schematic view of the structure and parameters of a multi-probe array according to another embodiment of the present invention, in which the probe antenna is a Ka-band dual-polarized open waveguide;
fig. 8 is a schematic diagram of a communication interface relationship of a timing controller according to another embodiment of the present invention;
fig. 9 is a schematic diagram of a front-rear angle structure of a timing controller according to another embodiment of the present invention.
Detailed Description
In order to make the technical solution of the present invention better understood by those skilled in the art, the present invention will be described in further detail with reference to the accompanying drawings and specific embodiments.
As shown in fig. 1, the present invention provides an array antenna multi-probe multi-beam testing apparatus 100, the apparatus 100 includes a timing controller 110, a multi-probe array 120, a switch matrix 130, a scanning frame 140 and a sampler 150.
The multi-probe array 120 is used to be spaced opposite to the array antenna 200 to be tested.
The scanning frame 140 is fixedly provided with the multi-probe array 120, and the scanning frame 140 is used for driving the multi-probe array 120 to move relative to the array antenna 200 to be tested. In the present embodiment, the gantry 140 adopts a rectangular coordinate structure style.
A first terminal of the switch matrix 130 is connected to the sampler 150 and a second terminal of the switch matrix 130 is selectively connected to the multi-probe array 120. The switch matrix 130 enables selection of each probe path. In the test process, each probe channel is electrically switched through the switch matrix 130, so that amplitude-phase time-sharing test of each probe channel is realized.
In this embodiment, the most convenient switch matrix 130 is used for the amplitude-phase sampling of the multi-probe array 120, and the ports of the individual probes are connected to the output port shared by the switch matrix 130. The switch matrix 130 can open and close different probe paths, and select corresponding rf radiation signal sampling probes and polarizations. The array antenna 200 under test is also a phased array antenna.
The timing controller 110 is electrically connected to the sampler 150, the scan driver 160 of the scan frame 140, and the beam controller 210 of the array antenna 200 to be tested, respectively. Wherein,
and the timing controller 110 is configured to generate a plurality of sets of timing signals according to the received test parameters, so as to synchronously trigger the switch matrix 130 to perform probe channel switching and beam switching by the beam controller 210 by using the corresponding timing signals when the scanning frame 140 moves to each test position, and control the sampler 150 to sample beams, thereby completing the multi-beam test.
It should be noted that, in this embodiment, the timing controller 110 directly controls the beam controller 210 of the array antenna 200 to be tested, the sampler 150, the scan driver 160 of the scan rack 140, and the switch matrix 130 in real-time communication through hard-triggered pulse timing based on a real-time control technology of an FPGA architecture, instead of performing interactive communication between the main control computer and the array antenna wave controller 210 and the sampler 150 in the conventional test system, so as to implement an automatic rapid test of multiple probes and multiple beams of the array antenna. The communication interaction time between the devices is effectively shortened, and therefore the testing efficiency is greatly improved.
It should be noted that the timing controller 110 is further used for electrically connecting the upper computer 300, in this embodiment, the upper computer 300 is a master control computer, and other upper computers may also be adopted, which is not specifically limited in this embodiment. The upper computer 300 sends the initialized array antenna test working parameters to the time sequence controller 110, and the test working parameters comprise test information such as the number of frequency points to be tested, the receiving and sending states of the antenna, the number of test channels, the number of wave bits, the number of discrete sampling points, the number of sampling probes, the trigger time delay and the like. The upper computer 300 can complete issuing of the test instruction of the array antenna 200 to be tested and reading of the multi-probe amplitude-phase data.
The utility model discloses an array antenna multi-probe multi-beam testing device, adopt the multi-probe array and adopt switch matrix passageway electricity switching time to replace the probe travel time when the single probe, compressed test time by a wide margin; the multi-probe specification and position adjustment can be carried out on the array antennas to be tested with different apertures, so that the array antennas to be tested with wide frequency bands and different apertures can be quickly tested; the time schedule controller is adopted to replace the traditional main control computer, software is adopted to carry out interactive communication among the devices, the optimal response speed of each device is fully optimized, the automatic rapid test of multiple probes and multiple beams of the phased array antenna is realized, and the multiple beam test efficiency and the test task amount of the array antenna are greatly improved; the whole measuring device has the advantages of high integration degree, high precision, good stability, small size and light weight. The test device is flexible in configuration, has strong universality and expandability, and can be popularized and applied to test requirements of array antennas of different systems and different calibers in different test fields.
Illustratively, as shown in fig. 2, 3 and 4, the gantry 140 includes a base 141, a translational drive mechanism 142, and a vertical drive mechanism 143. The translation driving mechanism 142 is fixed on the base 141, the vertical driving mechanism 143 is movably arranged on the translation driving mechanism 142, and the vertical driving mechanism 143 is provided with the multi-probe array 120.
Specifically, as shown in fig. 2 and 3, the translation drive mechanism 142 is used to drive the gantry 140 to translate, and thus the multi-probe array 120. In the present embodiment, the translation driving mechanism 142 is used to drive the gantry 140 to move along the X-axis direction. In this embodiment, the translation driving mechanism 142 adopts a slide rail slider, the translation slide rail 142a is disposed on the base 141, the translation slider 142b is connected to the scan rack 140, and the translation driving motor (not shown) drives the translation slider 142b to translate on the translation slide rail 142a, so that the scan rack 140 can be driven to move along the X-axis direction by the cooperation of the slide rail slider, thereby implementing the horizontal scanning of the multi-probe array 120 on the array antenna 200 to be detected. Of course, other devices, such as a linear motor, may be adopted for the translation driving mechanism 142, and the embodiment is not limited in particular.
As shown in fig. 4, a vertical driving mechanism 143 is movably disposed on the translation driving mechanism 142, the vertical driving mechanism 143 is connected to the multi-probe array 120, and the vertical driving mechanism 143 is used for driving the multi-probe array 143 to lift and lower. In the present embodiment, the vertical driving mechanism 143 is used to drive the multi-probe array 143 to ascend and descend in the Y-axis direction. In this embodiment, the vertical driving mechanism 143 employs a slide rail slider, a vertical slide rail (not shown) is disposed on the scanning frame 140, the vertical slide rail (not shown) is connected to the multi-probe array 120, and a vertical driving motor (not shown) drives the vertical slide rail to translate on the vertical slide rail, so that the multi-probe array 120 can be driven to move along the Y-axis direction by the cooperation of the slide rail slider, and the vertical scanning of the multi-probe array 120 on the array antenna 200 to be detected is realized. Of course, the vertical driving mechanism 143 may also be other devices, such as a linear motor, and the present embodiment is not limited in particular.
In the above embodiment, the translation driving mechanism 142 and the vertical driving mechanism 143 can realize the overall two-dimensional motion of the multi-probe array 120, and the scanning stroke is 1800mm × vertical Y: 1800mm.
Illustratively, as shown in fig. 1, a wave-absorbing material layer 144 is disposed on a side of the scanning frame 140 facing the array antenna 200 to be tested. The wave-absorbing material layer 144 is used to shield the exposed metal surface of the wave-facing surface of the gantry 140, so as to avoid the influence of electromagnetic wave scattering.
Illustratively, as shown in fig. 1, 3 and 4, the measuring device 100 further includes a multi-probe tool holder 170, and the multi-probe tool holder 170 fixes the multi-probe array 120 on the gantry 140. The multi-probe tooling support 170 is used to secure and adjust the multi-probe array 120.
Illustratively, a probe mounting adapter plate (not shown) is disposed on the multi-probe tooling support 170, and the probe mounting adapter plate is used for fixing the multi-probe array 120 on the multi-probe tooling support 170.
Illustratively, as shown in fig. 4 and 5, the multi-probe tool support further includes a probe translation slider 121, and the probe translation slider 121 is disposed on the multi-probe tool support 170, wherein each probe in the multi-probe array 120 is fixed on the probe translation slider 121. And the probe translation sliding block 121 is used for adjusting the center distance between the probes in the multi-probe array 120.
It should be noted that the center distance between the probes can be adjusted by adjusting the probe translation sliding block 121, wherein the center distance of the probes can be electrically and manually adjusted, and the probe arrays with different frequencies can be integrally replaced to realize wide frequency band coverage, and for the consideration of reducing the equipment cost, in the embodiment, the probe spacing is manually adjusted, manually adjusted and locked in place, the adjustable range is 300mm, and the positioning accuracy is less than 0.5mm.
In this embodiment, each probe mounting adapter plate is provided with 2 radio frequency wall penetrating heads, and the semi-rigid cable is connected with the dual-polarized probe. Considering the coverage of the wide frequency band, different probe combinations can be replaced by the same probe tooling bracket in each frequency band, and the bracket has the advantages of convenience in disassembly and assembly and easiness in probe adjustment.
It should be noted that, as shown in fig. 1, in this embodiment, the testing apparatus 100 further includes a switch 180, a first end of the switch 180 is electrically connected to the upper computer 300, and a second end of the switch 180 is electrically connected to the timing controller 110, the sampler 150, and the scan driver 160, respectively. The switch 180 may perform packet switching between the upper computer 300 and the timing controller 110, the sampler 150, and the scan driver 160.
Illustratively, multi-probe array 120 employs dual polarized open waveguide probes. The number of probes in the multi-probe array 120 generally uses a combination of 2 probes, 4 probes, or 8 probes. In this embodiment, the multi-probe array 120 employs four dual-polarized open waveguides, and probe combinations of different frequency bands are configured according to different operating frequency bands. Furthermore, the dual-polarization split waveguide probe antenna has the advantages of compact structure, wide frequency band, high-purity linear polarization and wide direction, and is an ideal near-field measuring probe. The type and number of the multi-probe array 120 are not particularly limited in this embodiment, and may be selected as needed.
Illustratively, as shown in fig. 4 and 5, the multi-probe array 120 is arranged in a straight line, including a row in the horizontal direction or a column in the vertical direction, and is fixed on the multi-probe tool holder 170. In this embodiment, the four probes in the multi-probe array 120 are linearly arranged and fixed on the multi-probe tool holder 170. The multi-probe array 120 is a linearly arranged dual-polarized open waveguide array, and serves as a receiving and transmitting antenna for microwave signals.
Illustratively, sampler 150 is a vector network analyzer. In this embodiment, the vector network analyzer may perform amplitude and phase sampling of the test location point and perform data recording. Of course, the sampler 150 may be other samplers, and the embodiment is not limited in particular.
Illustratively, the switch matrix 130 employs microwave solid state switches having a channel isolation of 70dB and a channel switching time of less than 100ns. In this embodiment, each dual polarized probe is connected to the switch matrix 130 by two radio frequency cables. Further, in this embodiment, the switch matrix 130 is an eight-in-one microwave solid-state switch, and correspondingly, eight total rf cables are respectively connected to the corresponding microwave solid-state switches.
The multi-probe array 120 is used for measuring the influence of channel inconsistency in the near-field amplitude-phase data obtained by the near-field test, a standard horn antenna is used as a transmitting antenna, each probe is sequentially aligned with the center of the standard horn, the switch matrix 130 is communicated with the corresponding probe channel, amplitude-phase inconsistency data among different probe channels are obtained, and corresponding automatic calibration is carried out on each probe channel during data processing. The near field test distance refers to 3 wavelengths to 10 wavelengths of the array antenna to be tested on the multi-probe array aperture surface.
The operation principle of the array antenna multi-probe multi-beam testing device 100 is as follows:
the timing controller 110 receives the test parameters configured by the upper computer 300 through the LAN interface line, and then stores a plurality of sets of encoded nested timing signals in advance.
In this embodiment, before the test starts, the main control computer combines the user-defined test information to form a plurality of test tasks written into the timing controller 110. After the test is started, the scanning probes in the multi-probe array 120 pass through each test point according to the preset scanning track, and while passing through the test points, the scanning device sends a trigger pulse to the timing controller 110, and the timing controller sends a string of coded wave control signals, timing signals, net branch trigger and matrix switch switching signals, coordinates and controls the array antenna 200 to work under different channels, different wave beams and different frequency points in sequence, triggers the vector network analyzer in real time to perform synchronous sampling and data recording, and finally realizes the multi-probe multi-beam automatic rapid test of the array antenna.
During testing, each time the scanning frame 140 moves to a scanning position, the scan driver 160 of the scanning frame 140 sends a level trigger signal, and the trigger timing controller 110 outputs a pre-stored timing signal to be sent to the array antenna beam controller 210, the switch matrix 130, the sampler 150, and other devices in parallel. On one hand, the communication control array antenna 200 performs multi-beam switching and controls time-sharing sampling of the multi-probe array 120; on the other hand, the sampler 150 is controlled to synchronously complete amplitude and phase sampling of the test position point, thereby realizing the multi-beam test. The task load of the designed test equipment for testing the beam in a single scanning mode can reach 1000 orders.
Taking Ka-band satellite communication circular polarization phased array antenna test as an example, the antenna aperture is 600mm multiplied by 600mm; the range of scan travel for array antenna edge scan truncation levels below-40 dB is about 1200mm x 1200mm.
Please refer to fig. 6, which is a schematic diagram of a motion flow of scanning the antenna to be tested with 3-5 wavelengths away from the antenna to be tested in the four-probe array test of the present embodiment. The probe center spacing of the multi-probe array 120 is adjusted to 300mm by the probe translation slider 121, so that the length of the four-probe array reaches 900mm of stroke. The test is carried out in a vertical column scanning mode (Y direction), and the 1200mm scanning stroke required by the original single probe can be covered only by integrally scanning the Y direction of the four-probe array by 300mm stroke. If the circularly polarized array antenna needs to be scanned for 2 times by adopting a linearly polarized single probe, obviously, the test efficiency of the dual-polarized multi-probe array is improved by 8 times theoretically.
Referring to fig. 7, in the embodiment, the probe antenna in the multi-probe array is a Ka-band dual-polarized open waveguide.
Referring to fig. 5, in the embodiment, the fixing and the spacing adjustment of the multi-probe array are realized by the probe translation sliding block 121 on the multi-probe array tooling support 170, and each probe is fixed on the probe translation sliding block 121 matched with the probe support 170, and can be manually adjusted and locked in place. The adjustable range of the center distance between the probes is 300mm, and the positioning accuracy of the probes is less than 0.5mm.
Referring to fig. 8, in the present embodiment, the timing controller 110 may synchronously trigger the switch matrix 130 at each scanning position of the scanning frame 140 to perform probe channel switching and beam switching of the antenna wave controller 210 according to the test parameters configured by the main control computer, and instruct the vector network analyzer to perform multiple sampling, so as to complete the multi-beam test. The inter-device synchronization trigger line is managed by the FPGA in the real-time controller 110, and generates and detects a trigger signal according to a test parameter configured by the main control computer, so as to coordinate real-time synchronization of each device.
Referring to fig. 9, the timing controller 110 may employ a serial port, a LAN port, and an upper computer to perform test command initialization configuration. The timing controller 110 triggers the line interface synchronously to BNC-J. The timing controller 110 interfaces with the beam controller 210 and the switch matrix 130 of the array antenna 200 to define the beam and channel pins using the standard DB25-J interface.
It is to be understood that the above embodiments are merely exemplary embodiments adopted to illustrate the principles of the present invention, and the present invention is not limited thereto. It will be apparent to those skilled in the art that various modifications and improvements can be made without departing from the spirit and substance of the invention, and these modifications and improvements are also considered to be within the scope of the invention.
Claims (10)
1. The array antenna multi-probe multi-beam testing device is characterized by comprising a time schedule controller, a multi-probe array, a switch matrix, a scanning frame and a sampler;
the multi-probe array is used for being arranged opposite to the array antenna to be detected at intervals;
the scanning frame is fixedly provided with the multi-probe array and is used for driving the multi-probe array to move relative to the array antenna to be detected;
a first end of the switch matrix is connected with the sampler, and a second end of the switch matrix is selectively connected with the multi-probe array;
the time schedule controller is respectively and electrically connected with the sampler, the scanning driver of the scanning frame and the beam controller of the array antenna to be detected; wherein,
the time sequence controller is used for generating a plurality of groups of time sequence signals according to the received test parameters, so that when the scanning frame moves to each test position, the corresponding groups of time sequence signals are used for synchronously triggering the switch matrix to switch the probe channel and the beam controller to switch the beam, and the sampler is controlled to sample the beam, so that the multi-beam test is completed.
2. The testing device of claim 1, wherein the gantry comprises a base, a translational drive mechanism, and a vertical drive mechanism;
the translation driving mechanism is fixed on the base, the vertical driving mechanism is movably arranged on the translation driving mechanism, and the vertical driving mechanism is provided with the multi-probe array.
3. The test device according to claim 2, wherein a wave absorbing material layer is arranged on one side of the scanning frame facing the array antenna to be tested.
4. The test device of any one of claims 1 to 3, further comprising a multi-probe tooling support,
the multi-probe tool support is used for fixedly arranging the multi-probe array on the scanning frame.
5. The testing device of claim 4, wherein a probe mounting adapter plate is arranged on the multi-probe tooling support;
the probe mounting adapter plate is used for fixing the probe array on the multi-probe tool support.
6. The test device of claim 5, further comprising a probe translation slider disposed on the multi-probe tooling support, wherein each probe in the multi-probe array is fixed to the probe translation slider;
and the probe translation sliding block is used for adjusting the center distance between the probes in the multi-probe array.
7. A test apparatus as claimed in any one of claims 1 to 3, wherein the multi-probe array employs dual polarised open waveguide probes.
8. A test apparatus as claimed in any one of claims 1 to 3, wherein the multi-probe array is arranged in a line.
9. A test apparatus as claimed in any one of claims 1 to 3, wherein the sampler is a vector network analyser.
10. The test apparatus as claimed in any one of claims 1 to 3, wherein the switch matrix employs microwave solid state switches, the channel isolation of the microwave solid state switches is 70dB, and the channel switching time of the microwave solid state switches is less than 100ns.
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN116539971A (en) * | 2023-04-21 | 2023-08-04 | 成都飞机工业（集团）有限责任公司 | Antenna near-field method measurement method composed of replaceable dual-polarized probe set |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN116539971A (en) * | 2023-04-21 | 2023-08-04 | 成都飞机工业（集团）有限责任公司 | Antenna near-field method measurement method composed of replaceable dual-polarized probe set |
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