CN217787181U - Automatic testing device for integrated circuit - Google Patents
Automatic testing device for integrated circuit Download PDFInfo
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- CN217787181U CN217787181U CN202221757358.5U CN202221757358U CN217787181U CN 217787181 U CN217787181 U CN 217787181U CN 202221757358 U CN202221757358 U CN 202221757358U CN 217787181 U CN217787181 U CN 217787181U
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- integrated circuit
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- 238000012360 testing method Methods 0.000 title claims abstract description 103
- 230000005540 biological transmission Effects 0.000 claims abstract description 10
- 230000001681 protective effect Effects 0.000 claims description 5
- 230000000694 effects Effects 0.000 abstract description 7
- 230000007306 turnover Effects 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000002146 bilateral effect Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000000149 penetrating effect Effects 0.000 description 1
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Abstract
The utility model discloses an automatic testing arrangement of integrated circuit, including being used for whole testing arrangement to support and the device frame of adjustment usefulness, device frame upper end is provided with and is used for the fixed centre gripping mount of integrated circuit board test clamping, and device frame upper end is setting up the test jig that is used for the integrated circuit test to use. This automatic testing arrangement of integrated circuit, make the carriage move the adjustment interval on the lead screw, it is fixed to the integrated circuit board centre gripping to utilize both sides holder, can adjust first test head and second test head under the first arm and the second arm effect that set up, a test for integrated circuit board, reduce manual operation, can be at the third motor, it rotates to drive the holder through the pivot drive under the third bevel gear group effect, thereby drive integrated circuit board and rotate, to its upset, conveniently test the opposite side, can be at first motor, first bevel gear group and transmission shaft effect drive the centre gripping mount and rotate, help the integrated circuit board test to go on in succession.
Description
Technical Field
The utility model relates to an integrated circuit tests technical field, specifically is an integrated circuit automatic testing arrangement.
Background
The integrated circuit board is a carrier for loading the integrated circuit, but the integrated circuit board is also brought when the integrated circuit board is often said to be processed, the integrated circuit board needs to be tested after being processed, faults are eliminated, most of the integrated circuit boards are tested through a manual operation test meter when being tested, the efficiency is low, although the existing integrated circuit board automatic testing device can be used for testing the integrated circuit, when partial integrated circuit boards need to be tested on two sides, the existing integrated circuit board testing device is inconvenient for automatically overturning and testing the integrated circuit board, the integrated circuit board needs to be overturned and clamped again after being manually disassembled, and the integrated circuit board testing device is troublesome and needs to improve the structure.
SUMMERY OF THE UTILITY MODEL
An object of the utility model is to provide an automatic testing arrangement of integrated circuit to solve the most integrated circuit board that proposes in the above-mentioned background art and when testing, test through manual operation test table, efficiency is lower, and current integrated circuit board testing arrangement is inconvenient to the automatic upset test of integrated circuit board, needs artifical clamping of overturning again after dismantling, comparatively troublesome problem.
In order to achieve the above object, the utility model provides a following technical scheme: the automatic integrated circuit testing device comprises a device frame for supporting and adjusting the whole testing device, wherein a clamping fixing frame for fixing the integrated circuit board in a testing and clamping manner is arranged at the upper end of the device frame, and a testing frame for testing the integrated circuit is arranged at the upper end of the device frame.
Preferably, the device frame comprises a first motor which is arranged inside the device frame and used for driving the transmission shaft to rotate.
Through adopting above-mentioned technical scheme, rotate through first motor drive transmission shaft and drive centre gripping mount and rotate.
Preferably, the clamping fixing frame comprises a screw rod which is rotatably connected to the inner wall of the clamping fixing frame and used for adjusting the distance between the moving frames, and one end of the screw rod is connected with the second motor through a second bevel gear set.
Through adopting above-mentioned technical scheme, the second motor drives the lead screw rotation through the second bevel gear group.
Preferably, the inner wall of the movable frame is rotatably connected with a rotating shaft, the inner end of the rotating shaft is connected with a clamping frame for clamping and fixing the integrated circuit board, and meanwhile, a protective pad for protecting the clamping surface of the clamped integrated circuit board is arranged on the inner wall of the clamping frame.
By adopting the technical scheme, the integrated circuit board is clamped by the clamping frame, and the protective pad can protect the clamping surface of the integrated circuit board.
Preferably, the test jig comprises a test meter arranged at the inner top end of the test jig and used for testing the integrated circuit, and the inner top end of the test jig is provided with a first mechanical arm used for adjusting the first test head and a second mechanical arm used for adjusting the second test head.
Through adopting above-mentioned technical scheme, can be to first test head and second test head adjustment through first arm and second arm.
Compared with the prior art, the beneficial effects of the utility model are that: the automatic testing device for the integrated circuit comprises a testing device,
(1) Can be at the second motor, second bevel gear group and lead screw effect down, make the carriage move the adjustment interval on the lead screw, it is fixed to the integrated circuit board centre gripping to utilize both sides holder, can adjust first test head and second test head under first arm and the second arm effect that sets up, a test for integrated circuit board, reduce manual operation, can be at the third motor, it rotates to drive the holder through the pivot drive holder under the third bevel gear group effect, thereby drive integrated circuit board and rotate, to its upset, conveniently test the opposite side, can be at first motor, first bevel gear group and transmission shaft effect drive the centre gripping mount and rotate, help integrated circuit board test to go on in succession.
Drawings
FIG. 1 is a schematic view of the front cross-sectional structure of the device frame of the present invention;
fig. 2 is a schematic view of the front cross-sectional structure of the clamping holder of the present invention;
FIG. 3 is a schematic top view of the clamping frame of the present invention;
fig. 4 is a schematic view of the overlooking structure of the clamping fixing frame of the present invention.
In the figure: 1. a device frame; 101. a first motor; 102. a first bevel gear set; 103. a drive shaft; 2. clamping the fixing frame; 201. a lead screw; 202. a second bevel gear set; 203. a second motor; 204. a movable frame; 205. a rotating shaft; 206. a clamping frame; 207. a protective pad; 208. a third bevel gear set; 209. a third motor; 3. a test jig; 301. a test meter; 302. a first robot arm; 303. a first test head; 304. a second mechanical arm; 305. a second test head.
Detailed Description
The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative efforts all belong to the protection scope of the present invention.
Referring to fig. 1-4, the present invention provides a technical solution: an automatic integrated circuit testing device is disclosed, as shown in fig. 1, comprising a device frame 1 for supporting and adjusting the whole testing device, a clamping fixing frame 2 can be rotatably adjusted through the device frame 1, continuous testing is facilitated, the device frame 1 comprises a first motor 101 arranged inside the device frame 1 and used for driving a transmission shaft 103 to rotate, specifically, the first motor 101 is connected with the transmission shaft 103 through a first bevel gear set 102, and the upper end of the transmission shaft 103 penetrates through the device frame 1 and is connected with the clamping fixing frame 2
In the above scheme, the transmission shaft 103 is driven to rotate by the first bevel gear set 102 under the action of the first motor 101, the clamping fixing frame 2 is driven to rotate, the integrated circuit board is driven to rotate to the position below the first test head 303 and the second test head 305 for testing, and meanwhile, the integrated circuit board is clamped on the group of clamping frames 206 on the right side at the moment for preliminary use, so that the continuous testing of the integrated circuit board is facilitated.
As shown in fig. 2, fig. 3 and fig. 4, a clamping fixing frame 2 for fixing the integrated circuit board in a test clamping manner is arranged at the upper end of the device frame 1, the integrated circuit board is clamped and fixed by adjusting the clamping fixing frame 2, the clamping fixing frame 2 comprises a screw 201 which is rotatably connected to the inner wall of the clamping fixing frame 2 and used for adjusting the distance between the movable frames 204, and one end of the screw 201 is connected with a second motor 203 through a second bevel gear set 202, specifically, the screw 201 is provided with two screws 201, the two screws 201 are arranged in bilateral symmetry with respect to the clamping fixing frame 2, two sections of reverse threads are arranged on the screw 201, and the two movable frames 204 are arranged on the screw 201 in a penetrating manner.
In the scheme, the second motor 203 drives the lead screw 201 to rotate through the second bevel gear set 202, so that the two side moving frames 204 move and adjust on the lead screw 201.
Further, the inner wall of the movable frame 204 is rotatably connected with a rotating shaft 205, the inner end of the rotating shaft 205 is connected with a clamping frame 206 for clamping and fixing the integrated circuit board, meanwhile, a protective pad 207 for protecting the clamping surface of the clamped integrated circuit board is arranged on the inner wall of the clamping frame 206, the integrated circuit board can be clamped by a group of clamping frames 206 on the right side of the clamping frame 2, and particularly, the rotating shaft 205 on one side penetrates through the corresponding movable frame 204 and is connected with a third motor 209 through a third bevel gear set 208.
In the above further scheme, the integrated circuit board is clamped by the clamping frame 206, the protection pad 207 can protect the clamping surface of the integrated circuit board, and the clamping frame 206 is driven to rotate under the action of the third motor 209, the third bevel gear set 208 and the rotating shaft 205, so that the integrated circuit board is driven to turn over to test the other side.
As shown in fig. 1, a testing jig 3 for testing an integrated circuit is disposed at an upper end of the device frame 1, the testing jig 3 tests the clamped integrated circuit board under action of the testing jig 3, the testing jig 3 includes a testing table 301 disposed at an inner top end of the testing jig 3 for testing the integrated circuit, the inner top end of the testing jig 3 is provided with a first robot arm 302 for adjusting a first testing head 303 and a second robot arm 304 for adjusting a second testing head 305, specifically, the second robot arm 304 is disposed at a right side of the first robot arm 302, and the first testing head 303, the second testing head 305 and the testing table 301 are electrically connected.
In the preferred embodiment, the test table 301, the first test head 303 and the second test head 305 are used to test the ic board, and the first test head 303 and the second test head 305 are adjustable under the actions of the first robot arm 302 and the second robot arm 304.
The power is switched on, the movable frame 204 can move on the screw 201 to adjust the distance under the action of the second motor 203, the second bevel gear set 202 and the screw 201, the integrated circuit board is clamped and fixed by the clamping frames 206 on two sides, the transmission shaft 103 is driven to rotate through the first bevel gear set 102 under the action of the first motor 101 to drive the clamping frame 2 to rotate the integrated circuit board to the lower parts of the first test head 303 and the second test head 305 for testing, the first test head 303 and the second test head 305 can be adjusted under the action of the first mechanical arm 302 and the second mechanical arm 304, the clamping frames 206 are driven to rotate through the rotating shaft 205 under the action of the third motor 209 and the third bevel gear set 208, so that the integrated circuit board is driven to rotate and turn over, and the other side is conveniently tested.
The terms "central," "longitudinal," "lateral," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," "outer," and the like are used in the orientation or positional relationship indicated in the drawings for ease of description, but are not intended to indicate or imply that the device or element so referred to must have a particular orientation, be constructed and operated in a particular orientation, and are not to be considered limiting of the scope of the invention.
Although the present invention has been described in detail with reference to the foregoing embodiments, it will be apparent to those skilled in the art that modifications may be made to the embodiments or portions thereof without departing from the spirit and scope of the invention.
Claims (5)
1. The utility model provides an integrated circuit automatic testing device, is including being used for whole testing device to support and adjust device frame (1) of usefulness, its characterized in that: the upper end of the device frame (1) is provided with a clamping fixing frame (2) for fixing the test clamping of the integrated circuit board, and the upper end of the device frame (1) is provided with a test frame (3) for testing the integrated circuit.
2. The automatic integrated circuit test equipment of claim 1, wherein: the device frame (1) comprises a first motor (101) which is arranged in the device frame (1) and used for driving a transmission shaft (103) to rotate.
3. The automatic integrated circuit test equipment of claim 1, wherein: the clamping fixing frame (2) comprises a lead screw (201) which is rotatably connected to the inner wall of the clamping fixing frame (2) and used for adjusting the distance between the moving frames (204), and one end of the lead screw (201) is connected with a second motor (203) through a second bevel gear set (202).
4. An automatic integrated circuit testing device according to claim 3, wherein: the inner wall of the movable frame (204) is rotatably connected with a rotating shaft (205), the inner end of the rotating shaft (205) is connected with a clamping frame (206) for clamping and fixing the integrated circuit board, and meanwhile, a protective pad (207) for protecting the clamping surface of the clamped integrated circuit board is arranged on the inner wall of the clamping frame (206).
5. An automatic integrated circuit test device according to claim 1, characterized in that: the testing jig (3) comprises a testing meter (301) which is arranged at the inner top end of the testing jig (3) and used for testing the integrated circuit, and a first mechanical arm (302) used for adjusting a first testing head (303) and a second mechanical arm (304) used for adjusting a second testing head (305) are arranged at the inner top end of the testing jig (3).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202221757358.5U CN217787181U (en) | 2022-07-07 | 2022-07-07 | Automatic testing device for integrated circuit |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202221757358.5U CN217787181U (en) | 2022-07-07 | 2022-07-07 | Automatic testing device for integrated circuit |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN217787181U true CN217787181U (en) | 2022-11-11 |
Family
ID=83939132
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202221757358.5U Active CN217787181U (en) | 2022-07-07 | 2022-07-07 | Automatic testing device for integrated circuit |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN217787181U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116047267A (en) * | 2023-01-03 | 2023-05-02 | 赵维华 | A circuit board circuit detection equipment and its technology |
-
2022
- 2022-07-07 CN CN202221757358.5U patent/CN217787181U/en active Active
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116047267A (en) * | 2023-01-03 | 2023-05-02 | 赵维华 | A circuit board circuit detection equipment and its technology |
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