CN217766782U - LGA module process short circuit automatic test system - Google Patents

Abstract

The utility model discloses an LGA module process short circuit automatic test system, which comprises an LGA test module, a thimble clamp, an upper computer and a control panel; the control board comprises a main control module, a power supply circuit module, an LGA reset control circuit module and a slot position control module; the main control module is used for carrying out serial port communication with the upper computer and the LGA test module; the power supply circuit module is used for providing a direct current stabilized voltage power supply for the LGA test module; the power circuit module is used for providing direct-current voltage for the control panel; the LGA reset control circuit module is used for enabling the LGA test module to enter a reset state; the slot position control module is used for controlling the LGA test module in the corresponding slot position in the thimble clamp to enter a GPIO test mode. The utility model discloses set up the GPIO pin that LGA test module is adjacent according to input-output interval, detect the high low level of GPIO input port through the control panel, judge whether the adjacent pin of LGA test module short circuit, improved efficiency of software testing, reduced the test cost.

Description

A kind of LGA module process short-circuit automatic test system

technical field

The utility model relates to a test system, in particular to an automatic short-circuit test system for an LGA module process.

Background technique

Now more and more companies integrate single-chip microcomputer and a small amount of peripheral circuit design on a small circuit board to make an LGA (Land Grid Array, grid array package, a package method in which the pad is at the bottom of the component) package module. Realize the core functions of the product. Due to the limitation of product size, the size of the general LGA package module is required to be as small as possible, which results in a very small spacing between the pin pads. /Output) pins may cause a short circuit.

Since the LGA module is welded on the main board, the solder pad is sandwiched between the two boards, which cannot be directly inspected by naked eyes. The original inspection method is X-ray inspection + product function test. However, the X-ray detection speed is slow, the cost is high, the definition is poor, and it is easy to misjudge. The product function test may not cover all the pins. Some pin short circuits will only lead to unstable functions. The inspection equipment is expensive; and after the product is put into the X-ray inspection equipment, it has to go through steps such as moving scanning, selecting the inspection location, and checking and judging. Very clear, the upper and lower components and circuit board wiring will also affect the X-ray picture, generally only 80% of defective products can be intercepted, and the thin tin short circuit is often difficult to find, the clarity is poor, and it is easy to misjudge.

Utility model content

The purpose of the utility model is to overcome the defects of the prior art and provide an automatic short-circuit test system for the LGA module process. The GPIO pins adjacent to the LGA test module are set according to the input-output interval, and the high and low voltage of the GPIO input port is detected by the control board. Ping, to judge whether the adjacent pins of the LGA test module are short-circuited, which improves the test efficiency and reduces the test cost.

The purpose of this utility model is achieved like this: a kind of LGA module manufacturing process short-circuit automatic test system, comprises LGA test module, thimble fixture, upper computer and control panel; Described control panel comprises main control module, power supply circuit module, power supply circuit module , LGA reset control circuit module and slot control module;

Described main control module is used for carrying out serial port communication with upper computer and LGA test module; And output test voltage to LGA test module, and LGA test module is monitored and slot selection, assists to enter GPIO test mode;

The power supply circuit module is used to provide a DC stabilized power supply for the LGA test module;

The power circuit module is used to provide DC voltage for the control board;

The LGA reset control circuit module is used to make the LGA test module enter the reset state;

The slot control module is used to control the LGA test module in the corresponding slot in the thimble fixture to enter the GPIO test mode.

When the utility model is working, the LGA test module is put into the thimble fixture, the upper computer sends a test signal to the control board, and the control board controls the LGA test module to enter the GPIO test mode, and one of the two adjacent GPIO pins is set as an input, and Turn on the pull-up resistor, set the other as output, and the output is low level; when the state of the input port detected by the main control module is low level, then the two GPIO pins are connected or pulled, that is, two GPIO pins A short circuit occurs; the control board judges whether the adjacent pins are short-circuited by detecting the high and low levels of the adjacent pins of the LGA test module, and realizes the automatic test of the welding short circuit of the LGA test module; when a bad LGA test module is detected, it will Bad pins are displayed on the host computer.

The utility model adopts the above technical scheme, compared with the prior art, the beneficial effect is: the control board communicates with the upper computer and the LGA test module, the control board controls the LGA test module to enter the GPIO test mode, and the adjacent LGA test module GPIO pins are set according to the input-output (output-input) interval, and the high and low levels of the input port are detected through the control board, which realizes the automatic test of the welding short circuit of the LGA test module; reduces the test cost and improves the test efficiency. Each circuit The board takes only about 30 seconds; the reliability is high, and it can effectively intercept defective products with GPIO short circuit 100%, and the operation is convenient. The utility model relates to the content of the software program, and its function realization is the prior art. The solution is essentially an improvement on the composition and connection relationship of the hardware part, and does not involve the improvement on the software program itself.

Further, the main control module is electrically connected with the power circuit module, the power supply circuit module, the LGA reset control circuit module and the slot control module.

In order to improve test efficiency, the thimble fixture includes a plurality of test slots, the LGA test module is placed in the test slot, and the slot control module is electrically connected to the LGA test module in the corresponding slot through the thimble of the fixture.

Further, the control board communicates with the upper computer via the ISP serial port.

Further, the main control module adopts STC12C5A60 chip.

Further, the power supply circuit module adopts LM317 voltage regulator chip to provide 3V regulated DC power supply for the LGA test module.

Description of drawings

Fig. 1 system block diagram of the utility model.

Fig. 2 is the schematic circuit diagram of the main control module of the utility model.

Fig. 3 is the schematic circuit diagram of the power supply circuit module of the utility model.

Fig. 4 is the schematic circuit diagram of the power supply circuit module of the utility model.

Fig. 5 is a schematic circuit diagram of the LGA reset control circuit module of the utility model.

Fig. 6 is a schematic circuit diagram of the slot control module of the utility model.

Fig. 7 is a schematic diagram of pins at the bottom of the pad of the LGA module of the present invention.

Fig. 8 is a schematic circuit diagram of the utility model LGA module.

Detailed ways

As shown in Figure 1, an LGA module process short-circuit automatic test system includes an LGA test module, a thimble fixture, an upper computer and a control board; the control board communicates with the upper computer through the ISP serial port; the control board includes a main control module, a power supply The circuit module, the power supply circuit module, the LGA reset control circuit module and the slot control module; the main control module is electrically connected with the power circuit module, the power supply circuit module, the LGA reset control circuit module and the slot control module.

As shown in Figure 2, the main control module is used for serial communication with the host computer and the LGA test module; and outputs test voltage to the LGA test module, monitors and selects slots for the LGA test module, and assists in entering the GPIO test mode; The control module adopts STC12C5A60 chip; the ports DUT_TX and DUT_RX of the main control module are connected with Pin17 and Pin18 of the LGA test module, and realize serial communication with the LGA test module; ISP is the serial communication between the control board and the host computer, and the test program can be downloaded To the main control module; during the test, it is used as the communication between the control board and the host computer; the ports Current_voltage, port Low_voltage and port mA_Current_EN of the main control module are used to control the output test voltage to the LGA test module; the port DUT_Pin27 is used to monitor the LGA test module The power-on state of Pin27 assists in entering the GPIO test mode; ports P20-P25 are used for slot selection of the LGA test module; port P27 is used for the reset pin test and controls the LGA test module to enter the reset state.

As shown in Figure 3, the power supply circuit module is used to provide a DC regulated power supply for the LGA test module; the power supply circuit module uses an LM317 voltage regulator chip to provide a 3V regulated DC power supply for the LGA test module.

As shown in Figure 4, the power circuit module is used to provide DC voltage for the control board; the 12V DC adapter is connected to the power socket "DC_12V"; the circuit stabilizes 5V DC to supply the control board.

As shown in Figure 5, the LGA reset control circuit module is used to make the LGA test module enter the reset state; when the port P27 is turned on, the reset pin of the LGA test module is connected to the ground wire of the LGA test module, so that the LGA test module enters the reset state.

As shown in Figure 6, the slot control module is used to control the LGA test module in the corresponding slot in the thimble fixture to enter the GPIO test mode; the thimble fixture includes multiple test slots, and the LGA test module is placed in the test slot. The control module is electrically connected to the LGA test module in the corresponding slot through the thimble of the fixture;

In this embodiment, the thimble fixture includes 6 test slots, which can test up to 6 products at the same time, and each slot corresponds to a corresponding slot control module; the fixture is controlled by a relay to control the test products in 6 slots in time.

As shown in Figure 6, when testing slot 1, only P20 needs to be turned on, the relay K1/K2 is pulled in, and the LGA in slot 1 is controlled to enter the GPIO test program; The product under test is connected;

#1 pin (DUT1_Pin32) is connected to the PIN32 pin of the LGA test module;

#2 pin (DUT1_Pin30) is connected to the PIN30 pin of the LGA test module;

#3 pin (DUT1_Reset) is connected to the PIN29 pin of the LGA test module;

#4 pin (DUT1_Pin27) is connected to the PIN27 pin of the LGA test module;

#5 pin (DUT1_Pin17) is connected to the PIN17 pin of the LGA test module;

#6 pin (DUT1_Pin18) is connected to the PIN18 pin of the LGA test module.

When testing slot 2, only P21 is turned on, the relay K3/K4 is pulled in, and the LGA in slot 2 is controlled to enter the GPIO test program; the 6Pin socket DUT2 is connected to the LGA product to be tested in slot 2 through the thimble of the fixture;

#1 pin (DUT2_Pin32) is connected to the PIN32 pin of the LGA test module;

#2 pin (DUT2_Pin30) is connected to the PIN30 pin of the LGA test module;

#3 pin (DUT2_Reset) is connected to the PIN29 pin of the LGA test module;

#4 pin (DUT2_Pin27) is connected to the PIN27 pin of the LGA test module;

#5 pin (DUT2_Pin17) is connected to the PIN17 pin of the LGA test module;

#6 pin (DUT2_Pin18) is connected to the PIN18 pin of the LGA test module.

When testing slot 3, only P22 is turned on, the relay K5/K6 is pulled in, and the LGA in slot 3 is controlled to enter the GPIO test program; the 6Pin socket DUT3 is connected to the LGA product to be tested in slot 3 through the thimble of the fixture;

#1 pin (DUT3_Pin32) is connected to the PIN32 pin of the LGA test module;

#2 pin (DUT3_Pin30) is connected to the PIN30 pin of the LGA test module;

#3 pin (DUT3_Reset) is connected to the PIN29 pin of the LGA test module;

#4 pin (DUT3_Pin27) is connected to the PIN27 pin of the LGA test module;

#5 pin (DUT3_Pin17) is connected to the PIN17 pin of the LGA test module;

#6 pin (DUT3_Pin18) is connected to the PIN18 pin of the LGA test module.

When testing slot 4, only P23 is turned on, the relay K7/K8 is pulled in, and the LGA in slot 4 is controlled to enter the GPIO test program; the 6Pin socket DUT4 is connected to the LGA product to be tested in slot 4 through the thimble of the fixture;

#1 pin (DUT4_Pin32) is connected to the PIN32 pin of the LGA test module;

#2 pin (DUT4_Pin30) is connected to the PIN30 pin of the LGA test module;

#3 pin (DUT4_Reset) is connected to the PIN29 pin of the LGA test module;

#4 pin (DUT4_Pin27) is connected to the PIN27 pin of the LGA test module;

#5 pin (DUT4_Pin17) is connected to the PIN17 pin of the LGA test module;

#6 pin (DUT4_Pin18) is connected to the PIN18 pin of the LGA test module.

When testing slot 5, only P24 is turned on, the relay K9/K10 is pulled in, and the LGA in slot 5 is controlled to enter the GPIO test program; the 6Pin socket DUT5 is connected to the LGA product to be tested in slot 5 through the thimble of the fixture;

#1 pin (DUT5_Pin32) is connected to the PIN32 pin of the LGA test module;

#2 pin (DUT5_Pin30) is connected to the PIN30 pin of the LGA test module;

#3 pin (DUT5_Reset) is connected to the PIN29 pin of the LGA test module;

#4 pin (DUT5_Pin27) is connected to the PIN27 pin of the LGA test module;

#5 pin (DUT5_Pin17) is connected to the PIN17 pin of the LGA test module;

#6 pin (DUT5_Pin18) is connected to the PIN18 pin of the LGA test module.

When testing slot 6, only P25 is turned on, the relay K11/K12 is pulled in, and the LGA in slot 6 is controlled to enter the GPIO test program; the 6Pin socket DUT6 is connected to the LGA product to be tested in slot 6 through the thimble of the fixture;

#1 pin (DUT6_Pin32) is connected to the PIN32 pin of the LGA test module;

#2 pin (DUT6_Pin30) is connected to the PIN30 pin of the LGA test module;

#3 pin (DUT6_Reset) is connected to the PIN29 pin of the LGA test module;

#4 pin (DUT6_Pin27) is connected to the PIN27 pin of the LGA test module;

#5 pin (DUT6_Pin17) is connected to the PIN17 pin of the LGA test module;

#6 pin (DUT6_Pin18) is connected to the PIN18 pin of the LGA test module.

As shown in Figure 7-8, the size of the LGA test module after packaging is relatively small, which leads to a small spacing between the pin pads. When the production module is pasted on the motherboard and soldered in the oven, adjacent GPIO pins may cause a short circuit; The LGA test module is required for testing. The GPIO test mode has been set in advance in the LGA test module. The LGA test module in the picture is UE878 NMDG-R chip.

When the utility model works, the LGA test module to be detected is placed in the slot of the thimble fixture. After the LGA test module is powered on, the pin PIN27 of the LGA test module is at a high level; when the initialization of the main control module is completed, the PIN27 remains low. The level is 500 milliseconds. If the command of GPIO test mode is received during the time when PIN27 remains low, the main control module (single chip microcomputer) enters GPIO test mode; after PIN27 returns to high level, it enters user function mode. The main control module communicates with the serial port through PIN17 and PIN18, and the serial port sends commands to the LGA test module, which can set the GPIO status of the LGA test module or read the GPIO status of the module.

The host computer sends a test signal to the control board, and the LGA test module enters the GPIO test mode through the main control module. The GPIO pins of the LGA test module are first set according to the input-output interval, the input port opens the pull-up resistor, and the output port outputs a low power Ping, when the main control module detects that the state of the input port is not high level, it means that this port is short-circuited with the adjacent output port; when the main control module detects that the state of the input port is high level, it will continue to press the previous GPIO pin to output - Input interval setting, the original output port becomes an input port, and the pull-up resistor is turned on. If the main control module detects that the input port is not high level, it means that the port is short-circuited with the adjacent output port; when testing LGA test If the other GPIO pins of the module are short-circuited with the VDD pin, set the remaining GPIO pins as input ports and turn on the pull-down resistor. If the main control module detects that the input ports are not all low, then the Short circuit; when testing whether the remaining GPIO pins of the LGA test module are short-circuited with the GND pin, set the remaining GPIO pins as input ports and turn on the pull-up resistors. If the main control module detects that the input ports are not all high, Then there is a short circuit between the GPIO pin and GND; the high and low levels of the GPIO are automatically detected by the control board, and the automatic test of the welding short circuit of the LGA test module is realized; when a bad LGA test module is detected, the bad pin will be displayed on the host computer.

The utility model is not limited to the above-mentioned embodiments. On the basis of the technical solutions disclosed in the utility model, those skilled in the art can make some technical features based on the disclosed technical content without creative work. Replacement and deformation, these replacements and deformations are all within the protection scope of the present utility model.

Claims (6)

1. A kind of LGA module manufacturing process short-circuit automatic test system, it is characterized in that, comprises LGA test module, thimble fixture, upper computer and control panel; Described control panel comprises main control module, power supply circuit module, power supply circuit module, LGA reset control Circuit modules and slot control modules; Described main control module is used for carrying out serial port communication with upper computer and LGA test module; And output test voltage to LGA test module, and LGA test module is monitored and slot selection, assists to enter GPIO test mode; The power supply circuit module is used to provide a DC stabilized power supply for the LGA test module; The power circuit module is used to provide DC voltage for the control board; The LGA reset control circuit module is used to make the LGA test module enter a reset state; The slot control module is used to control the LGA test module in the corresponding slot in the thimble fixture to enter the GPIO test mode. 2. A kind of LGA module manufacturing process short circuit automatic test system according to claim 1, is characterized in that, described main control module is electrically connected with power supply circuit module, power supply circuit module, LGA reset control circuit module and slot position control module. 3. A kind of LGA module manufacturing process short-circuit automatic test system according to claim 1, is characterized in that, described thimble fixture comprises a plurality of test slot positions, and described LGA test module is placed in the test slot position, and described slot position The control module is electrically connected to the LGA test module in the corresponding slot through the thimble of the fixture. 4. A kind of LGA module manufacturing process short circuit automatic test system according to claim 1, is characterized in that, described control board carries out serial port communication with upper computer through ISP serial port. 5. A kind of LGA module process short circuit automatic test system according to claim 1, is characterized in that, described main control module adopts STC12C5A60 chip. 6. A kind of LGA module manufacturing process short circuit automatic test system according to claim 1, is characterized in that, described power supply circuit module adopts LM317 regulator chip, provides 3V regulated DC power supply for LGA test module.

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