CN217238283U

CN217238283U - Power-on test device for integrated circuit chip

Info

Publication number: CN217238283U
Application number: CN202123064730.2U
Authority: CN
Inventors: 庄渊胜; 杨勇
Original assignee: Dongguan Qianying Electronics Co ltd
Current assignee: Dongguan Qianying Electronics Co ltd
Priority date: 2021-12-08
Filing date: 2021-12-08
Publication date: 2022-08-19
Anticipated expiration: 2031-12-08

Abstract

The utility model belongs to the field of circuit chips, and discloses a power-on testing device for integrated circuit chips, which comprises a bottom plate and a detection plate, wherein the detection plate is fixedly connected with the bottom plate, the top of the detection plate is provided with a plurality of placing grooves, and the bottom of the bottom plate is provided with a plurality of moving mechanisms; the moving mechanism comprises an electric telescopic rod fixedly connected with the bottom plate, a sliding block is fixedly connected with the output end of the electric telescopic rod, a sliding groove matched with the sliding block is formed in the inner side of the bottom plate, and the sliding groove is formed along the edge position of the detection plate. Control electric telescopic handle passes through the slider and drives connecting plate along the spout motion, makes connecting plate and other of pick-up plate side have different voltage to be worth the circular telegram groove and connect, through the shop voltage value to circuit chip input difference, measures multiunit data, also can artifical swing circular telegram piece in addition be connected with a pair of connecting block, makes the circuit chip in two standing grooves parallelly connected, gathers multiunit data.

Description

Power-on test device for integrated circuit chip

Technical Field

The utility model relates to a circuit chip field, more specifically say, relate to an circular telegram testing arrangement for integrated circuit chip.

Background

The integrated circuit chip is an electronic element comprising a silicon substrate, at least one circuit, a fixed seal ring, a grounding ring and at least one protective ring. The circuit is formed on the silicon substrate and is provided with at least one input/output pad. The fixed seal ring is formed on the silicon substrate and surrounds the circuit and the input/output pad. The grounding ring is formed between the silicon substrate and the input/output pad and is electrically connected with the fixed seal ring. The protective ring is arranged on the silicon substrate and surrounds the output/input pad for being electrically connected with the fixed seal ring.

To the correlation technique among the above-mentioned, the inventor thinks that at present in the market to the circular telegram test of integrated circuit chip, the data acquisition under the different situation of being not convenient for carries out, the use of inconvenient equipment, consequently, the utility model provides a circular telegram testing arrangement for integrated circuit chip.

SUMMERY OF THE UTILITY MODEL

1. Technical problem to be solved

An object of the utility model is to provide an circular telegram testing arrangement for integrated circuit chip to solve the problem that proposes among the above-mentioned background art.

2. Technical scheme

A power-on test device for an integrated circuit chip comprises a bottom plate and a detection plate, wherein the detection plate is fixedly connected with the bottom plate, the top of the detection plate is provided with a plurality of placing grooves, and the bottom of the bottom plate is provided with a plurality of moving mechanisms; the moving mechanism comprises an electric telescopic rod fixedly connected with the bottom plate, a sliding block is fixedly connected with the output end of the electric telescopic rod, a sliding groove matched with the sliding block is formed in the inner side of the bottom plate, the sliding groove is formed along the edge position of the detection plate, a connecting clamping plate is arranged at the top of the sliding block, and a power-on groove matched with the connecting clamping plate is formed in the side face of the detection plate.

Preferably, the top of the bottom plate is provided with a groove, the bottom of the inner wall of the groove is fixedly connected with a limiting block, a screw rod is rotatably connected in the limiting block, a fixing block is arranged on the outer side of the screw rod, and the top of the fixing block is fixedly connected with a wiping plate.

Preferably, the top edge position of the bottom plate is fixedly connected with a fixed rod, a detection rod is arranged on the outer side of the fixed rod, and a detection head is fixedly connected to one end, far away from the fixed rod, of the detection rod.

Preferably, the bottom of the inner wall of the groove is fixedly connected with a pair of limiting plates which are symmetrically arranged, and the screw rod is far away from one end of each limiting plate which is fixedly connected with a handle.

Preferably, a pair of two connecting blocks are fixedly connected between the placing grooves, a pair of positioning blocks are fixedly connected between the placing grooves, and the top of each positioning block is rotatably connected with a power-on block matched with the two connecting blocks.

Preferably, threaded grooves are formed in the inner sides of the connecting clamp plate and the detecting plate, limit nuts are arranged in the threaded grooves, and a plurality of bearing columns are fixedly connected to the bottom of the base plate and are uniformly distributed.

3. Advantageous effects

Compared with the prior art, the utility model has the advantages of: control electric telescopic handle passes through the slider and drives connecting plate along the spout motion, makes connecting plate and other of pick-up plate side have different voltage to be worth the circular telegram groove and is connected, through the shop's voltage value different to the circuit chip input, measures multiunit data, also can artifical swing circular telegram piece be connected with a pair of connecting block moreover, makes the circuit chip in two standing grooves parallelly connected, gathers multiunit data.

After detecting circuit chip and accomplishing, the manual work is held the handle, and the screw rod is twisted, drives the wiper plate through the fixed block and slides, cleans and clears up the bottom of pick-up plate, clears up the adsorbed dust behind the pick-up plate circular telegram, prevents that too much dust from piling up and causing the influence to the pick-up plate.

Drawings

Fig. 1 is a schematic view of a first viewing angle axial measurement structure of the present invention;

fig. 2 is a schematic view of a second viewing angle axial measurement structure of the present invention;

FIG. 3 is a schematic view of the structure at A of FIG. 1 according to the present invention;

fig. 4 is a schematic structural diagram of the point B in fig. 1 according to the present invention.

The reference numbers in the figures illustrate: 1. a base plate; 2. a load-bearing column; 3. a chute; 4. wiping the board; 5. a screw; 6. a fixed block; 7. a limiting plate; 8. a groove; 9. detecting a plate; 10. a detection head; 11. connecting the clamping plates; 12. a detection lever; 13. fixing the rod; 14. an electric telescopic rod; 15. a slider; 16. a handle; 17. a limit nut; 18. a current-carrying groove; 19. connecting blocks; 20. a power-on block; 21. positioning blocks; 22. a placement groove; 23. and a limiting block.

Detailed Description

In the description of the present invention, it is to be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", and the like indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings, and are only for convenience of description and to simplify the description, but do not indicate or imply that the device or element referred to must have a particular orientation, be constructed and operated in a particular orientation, and therefore should not be construed as limiting the present invention.

In the description of the present invention, "a plurality" means two or more unless specifically limited otherwise.

In the description of the present invention, it is to be noted that, unless otherwise explicitly specified or limited, the terms "mounted", "provided", "sleeved/connected", "connected", and the like are to be understood in a broad sense, such as "connected", which may be fixedly connected, detachably connected, or integrally connected; can be mechanically or electrically connected; they may be connected directly or indirectly through intervening media, or they may be interconnected between two elements. The specific meaning of the above terms in the present invention can be understood in specific cases to those skilled in the art.

Referring to fig. 1-4, the present invention provides a technical solution:

an electrifying test device for an integrated circuit chip comprises a bottom plate 1 and a detection plate 9, wherein the detection plate 9 is fixedly connected with the bottom plate 1, a plurality of placing grooves 22 are formed in the top of the detection plate 9, and a plurality of moving mechanisms are arranged at the bottom of the bottom plate 1; the moving mechanism comprises an electric telescopic rod 14 fixedly connected with a bottom plate 1, a slide block 15 is fixedly connected with an output end of the electric telescopic rod 14, a sliding groove 3 matched with the slide block 15 is formed in the inner side of the bottom plate 1, the sliding groove 3 is arranged along the edge position of a detection plate 9, a connecting clamp plate 11 is arranged at the top of the slide block 15, an electrifying groove 18 matched with the connecting clamp plate 11 is formed in the side surface of the detection plate 9, the detection plate 9 is powered through the connecting clamp plate 11, a detection rod 12 is manually rotated, a circuit chip in a placement groove 22 is detected through a detection head 10, a limit nut 17 is manually twisted, the limit of the connecting clamp plate 11 on the detection plate 9 is released, the electric telescopic rod 14 is controlled to drive the connecting clamp plate 11 to move along the sliding groove 3 through the slide block 15, the connecting clamp plate 11 is connected with the electrifying grooves 18 with other side surfaces of the detection plate 9 by different voltage values, and different shop voltage values are input to the circuit chip, to measure multiple sets of data.

Referring to fig. 1-4, a groove 8 is formed at the top of a bottom plate 1, a limiting block 23 is fixedly connected to the bottom of the inner wall of the groove 8, a screw 5 is rotatably connected to the limiting block 23, a fixing block 6 is arranged on the outer side of the screw 5, a wiping plate 4 is fixedly connected to the top of the fixing block 6, a handle 16 is manually held, the screw 5 is twisted, the wiping plate 4 is driven by the fixing block 6 to slide, the bottom of the detection plate 9 is wiped and cleaned, dust adsorbed by the detection plate 9 after being electrified is cleaned, influence on the detection plate 9 due to excessive dust accumulation is prevented, a fixing rod 13 is fixedly connected to the edge position of the top of the bottom plate 1, a detection rod 12 is arranged on the outer side of the fixing rod 13, a detection head 10 is fixedly connected to one end of the detection rod 12, which is far away from the fixing rod 13, the detection rod 12 is arranged by adopting a soft pipeline, and can be bent, which is an existing technology in the market, the detection plate 9 is powered by a connecting clamp plate 11, the detection lever 12 is manually rotated to detect the circuit chip in the placement groove 22 by the detection head 10.

Referring to fig. 1-4, the bottom of the inner wall of the groove 8 is fixedly connected with a pair of limiting plates 7 which are symmetrically arranged, one end of the screw 5 away from the limiting block 23 is fixedly connected with a handle 16, the handle 16 is manually held, the screw 5 is twisted, the fixing block 6 drives the wiping plate 4 to slide, the bottom of the detection plate 9 is wiped and cleaned, two connecting blocks 19 are fixedly connected between a pair of placing grooves 22, a positioning block 21 is fixedly connected between the pair of placing grooves 22, the top of the positioning block 21 is rotatably connected with an energizing block 20 which is matched with the two connecting blocks 19, the energizing block 20 is manually swung to be connected with the pair of connecting blocks 19, circuit chips in the two placing grooves 22 are connected in parallel, multiple groups of data are collected, threaded grooves are respectively formed in the inner sides of the connecting clamp plate 11 and the detection plate 9, limiting nuts 17 are arranged in the threaded grooves, the bottom of the bottom plate 1 is fixedly connected with a plurality of bearing columns 2, a plurality of heel posts 2 are evenly distributed, and a plurality of heel posts 2 play the bearing effect to bottom plate 1.

Its supporting hydraulic system and solenoid valve and pipeline also can be provided by the producer, in addition, the utility model discloses in relate to circuit and electronic components and module and be prior art, the technical staff in the field can realize completely, need not proud, the utility model discloses the content of protection does not relate to the improvement to inner structure and method yet.

The working principle is as follows: the circuit chip to be detected is placed in the placing groove 22, the detecting plate 9 is powered through the connecting clamp plate 11, the detecting rod 12 is manually rotated, the circuit chip in the placing groove 22 is detected through the detecting head 10, the limit nut 17 is manually twisted, the limit of the connecting clamp plate 11 on the detecting plate 9 is released, the electric telescopic rod 14 is controlled to drive the connecting clamp plate 11 to move along the sliding groove 3 through the sliding block 15, the connecting clamp plate 11 is connected with the conducting grooves 18 with different voltage values on the side surfaces of the detecting plate 9, different shop voltage values are input to the circuit chip to measure multiple groups of data, the conducting block 20 can be manually swung to be connected with the pair of connecting blocks 19, the circuit chips in the two placing grooves 22 are connected in parallel, multiple groups of data are collected, after the detection of the circuit chip is completed, the handle 16 is manually held, the screw rod 5 is twisted, the wiping plate 4 is driven to slide through the fixing block 6, the bottom of the detection plate 9 is wiped and cleaned, dust adsorbed after the detection plate 9 is electrified is cleaned, and the influence on the detection plate 9 caused by excessive dust accumulation is prevented.

The foregoing shows and describes the general principles, essential features, and advantages of the invention. It should be understood by those skilled in the art that the present invention is not limited by the above embodiments, and the description in the above embodiments and the description is only preferred examples of the present invention, and is not intended to limit the present invention, and that the present invention can have various changes and modifications without departing from the spirit and scope of the present invention, and these changes and modifications all fall into the scope of the claimed invention. The scope of the invention is defined by the appended claims and equivalents thereof.

Claims

1. A power-on test apparatus for an integrated circuit chip, comprising: the detection device comprises a bottom plate (1) and a detection plate (9), wherein the detection plate (9) is fixedly connected with the bottom plate (1), a plurality of placing grooves (22) are formed in the top of the detection plate (9), and a plurality of moving mechanisms are arranged at the bottom of the bottom plate (1);

the moving mechanism comprises an electric telescopic rod (14) fixedly connected with the bottom plate (1), a sliding block (15) is fixedly connected with the output end of the electric telescopic rod (14), a sliding groove (3) matched with the sliding block (15) is formed in the inner side of the bottom plate (1), the sliding groove (3) is formed along the edge position of the detection plate (9), a connecting clamp plate (11) is arranged at the top of the sliding block (15), and an electrifying groove (18) matched with the connecting clamp plate (11) is formed in the side face of the detection plate (9).

2. A power-on test apparatus for integrated circuit chips as defined in claim 1, wherein: the top of bottom plate (1) is seted up flutedly (8), the inner wall bottom fixedly connected with stopper (23) of recess (8), stopper (23) internal rotation is connected with screw rod (5), the outside of screw rod (5) is provided with fixed block (6), the top fixedly connected with of fixed block (6) cleans board (4).

3. A power-on test apparatus for integrated circuit chips as defined in claim 1, wherein: the top edge position fixedly connected with dead lever (13) of bottom plate (1), the outside of dead lever (13) is provided with test rod (12), test rod (12) are kept away from the one end fixedly connected with of dead lever (13) detects head (10).

4. A power-on test apparatus for integrated circuit chips as defined in claim 2, wherein: the inner wall bottom fixedly connected with of recess (8) is a pair of limiting plate (7) that are the symmetry and set up, screw rod (5) are kept away from the one end fixedly connected with handle (16) of limiting block (23).

5. A power-on test apparatus for integrated circuit chips as defined in claim 1, wherein: two connecting blocks (19) are fixedly connected between the pair of placing grooves (22), a positioning block (21) is fixedly connected between the pair of placing grooves (22), and the top of the positioning block (21) is rotatably connected with a power-on block (20) matched with the two connecting blocks (19).

6. A power-on test apparatus for integrated circuit chips as defined in claim 1, wherein: the detecting plate is characterized in that threaded grooves are formed in the inner sides of the connecting clamp plate (11) and the detecting plate (9), limiting nuts (17) are arranged in the threaded grooves, and the bottom of the base plate (1) is fixedly connected with a plurality of bearing columns (2) and a plurality of bearing columns (2) are uniformly distributed.