CN217085034U - Test needle mounting structure for QFN series chip test - Google Patents
Test needle mounting structure for QFN series chip test Download PDFInfo
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- CN217085034U CN217085034U CN202220465823.1U CN202220465823U CN217085034U CN 217085034 U CN217085034 U CN 217085034U CN 202220465823 U CN202220465823 U CN 202220465823U CN 217085034 U CN217085034 U CN 217085034U
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Abstract
The utility model relates to a chip testing technical field specifically is a test needle mounting structure is used in test of QFN series chip, include: the test device comprises a cover plate, an outer frame, a long-edge mounting frame, a short-edge mounting frame and a test needle; the cover plate is fixed on the upper surface of the outer frame, and a test slot for placing a chip to be tested is arranged in the middle of the cover plate; a transverse long groove is arranged on the outer frame, and longitudinal short grooves are arranged on two sides of the middle part of the transverse long groove; the long edge mounting rack is arranged in the transverse long groove, and the short edge mounting rack is arranged in the longitudinal short groove; all detachable installs the test needle on long limit mounting bracket and the minor face mounting bracket, and the upper end of test needle contacts with the chip pin that awaits measuring in the test groove, and the lower extreme of test needle contacts with outside survey test panel pin. The test needle mounting structure for the QFN series chip test is convenient for replacement and maintenance of the test needles, and improves the test efficiency of the QFN series chip.
Description
Technical Field
The utility model relates to a chip testing technical field specifically is a test needle mounting structure is used in test of QFN series chip.
Background
The test seat has the advantages that various performance tests are required in the large-scale research and development and production processes of semiconductor chips, the chip test seat is a key part in testing, the test seat has the function of positioning the chips and then transmitting electronic signal current between circuit boards, so that the test effect is achieved, and the quality and the matching degree of the test seat directly influence the test judgment accuracy.
The most common QFN series semiconductor chip test module in the market at present is found after long-time work: poor contact needs often to be changed after the test needle appears wearing and tearing, and the test needle installation is inconvenient, reduces efficiency of software testing. In view of this, we propose a test pin mounting structure for QFN series chip testing.
SUMMERY OF THE UTILITY MODEL
An object of the utility model is to provide a QFN series chip test is with test needle mounting structure to solve the problem that proposes in the above-mentioned background art.
In order to achieve the above object, the utility model provides a following technical scheme:
a test pin mounting structure for QFN series chip test comprises: the test device comprises a cover plate, an outer frame, a long-edge mounting frame, a short-edge mounting frame and a test needle;
the cover plate is fixed on the upper surface of the outer frame, and a test slot for placing a chip to be tested is arranged in the middle of the cover plate;
a transverse long groove is formed in the outer frame, and longitudinal short grooves are formed in two sides of the middle of the transverse long groove;
the long edge mounting rack is placed in the transverse long groove, and the short edge mounting rack is placed in the longitudinal short groove;
all demountable installations on long limit mounting bracket and the minor face mounting bracket the test needle, just the upper end of test needle with the chip pin contact that awaits measuring in the test groove, the lower extreme and the outside survey test panel pin of test needle contact.
Preferably, four corners of the cover plate are fixed to the outer frame through bolts.
Preferably, the transverse long groove and the longitudinal short groove form a cross-shaped groove body.
Preferably, the long side mounting frame and the short side mounting frame each include: the left clamping block, the right clamping block, the baffle and the bolt;
the left clamping block and the right clamping block are fixed through the pins, the baffle left side and right side of the long edge mounting frame are connected with four groups of test needles, and the baffle left side and right side of the short edge mounting frame are connected with two groups of test needles.
Preferably, the test needles each include a first needle holder and a second needle holder.
Compared with the prior art, the beneficial effects of the utility model are that: this test needle mounting structure is used in test of QFN series chip is through long limit mounting bracket of frame installation and minor face mounting bracket for both ends meet with a plurality of pins of chip and external test board that await measuring respectively about the test needle on long limit mounting bracket and the minor face mounting bracket, play the purpose of test with this, and test needle detachable mounting means can change and maintain the in-process and conveniently operate more, improve the efficiency of software testing of QFN series chip.
Drawings
Fig. 1 is a schematic view of the overall structure of the present invention;
FIG. 2 is a schematic structural view of the middle cover plate of the present invention;
FIG. 3 is a schematic structural view of the outer frame of the present invention;
FIG. 4 is a schematic structural view of the middle long side mounting frame and the short side mounting frame of the present invention;
FIG. 5 is a schematic view of the structure of the middle long side mounting frame and the short side mounting frame of the present invention;
fig. 6 is a schematic structural view of the middle test pin of the present invention.
In the figure:
1. a cover plate; 11. a test slot; 12. a bolt;
2. an outer frame; 21. a transverse elongated slot; 22. a longitudinal short slot;
3. a long edge mounting rack; 4. a short edge mounting rack;
a. a left clamp block; b. a right clamp block; c. a baffle plate; d. a bolt;
5. a test pin; 51. a first needle frame; 52. a second needle frame.
Detailed Description
The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.
In the description of the present invention, it is to be understood that the terms "center", "longitudinal", "lateral", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", and the like, indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings, and are only for convenience of description and simplicity of description, and do not indicate or imply that the device or element being referred to must have a particular orientation, be constructed and operated in a particular orientation, and therefore, should not be construed as limiting the present invention.
In the description of this patent, it is noted that unless otherwise specifically stated or limited, the terms "mounted," "connected," and "disposed" are to be construed broadly and can include, for example, fixedly connected, disposed, detachably connected, disposed, or integrally connected and disposed. The specific meaning of the above terms in this patent may be understood by those of ordinary skill in the art as appropriate.
Furthermore, the terms "first", "second" and "first" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature.
Referring to fig. 1-6, the present invention provides a technical solution:
a test pin mounting structure for QFN series chip test comprises: the test device comprises a cover plate 1, an outer frame 2, a long edge mounting frame 3, a short edge mounting frame 4 and a test needle 5; the cover plate 1 is fixed on the upper surface of the outer frame 2, and a test slot 11 for placing a chip to be tested is arranged in the middle of the cover plate 1; a transverse long groove 21 is arranged on the outer frame 2, and longitudinal short grooves 22 are arranged on two sides of the middle part of the transverse long groove 21; the long edge mounting frame 3 is arranged in the transverse long groove 21, and the short edge mounting frame 4 is arranged in the longitudinal short groove 22; all demountable installation has test pin 5 on long limit mounting bracket 3 and the minor face mounting bracket 4, and the upper end of test pin 5 contacts with the chip pin that awaits measuring in the test groove 11, and the lower extreme of test pin 5 contacts with outside survey test panel pin. Therefore, through frame 2 installation long limit mounting bracket 3 and minor face mounting bracket 4 for the both ends meet with a plurality of pins of chip and external test board that await measuring respectively about 5 test pins on long limit mounting bracket 3 and the minor face mounting bracket 4, play the purpose of test with this, and 5 detachable mounting means of test pin can change with the maintenance in-process convenient operation more, improve QFN series chip's efficiency of software testing.
It is worth explaining that the four corners of the cover plate 1 are fixed with the outer frame 2 through the arranged bolts 12, so that the cover plate 1 is convenient to install and fix, and the cover plate 1 can limit the long edge mounting frame 3 and the short edge mounting frame 4 in the test slot 11.
Further, the transverse long groove 21 and the longitudinal short groove 22 form a cross-shaped groove body, so that the upper end of the test needle 5 can be connected with a plurality of pins of a chip to be tested through the cross-shaped groove body, and the long edge mounting frame 3 and the short edge mounting frame 4 can be conveniently and fixedly mounted.
Specifically, long limit mounting bracket 3 and minor face mounting bracket 4 all include: the clamping device comprises a left clamping block a, a right clamping block b, a baffle c and a bolt d; left clamp splice an and right clamp splice b pass through the bolt d with baffle c centre gripping fixed, the baffle c left and right sides joint of long limit mounting bracket 3 has four groups of test needles 5, and the baffle c left and right sides joint of minor face mounting bracket 4 has two sets of test needles 5. Through left clamp splice an and right clamp splice b with the 5 centre gripping of test needle of baffle c both sides joint fixed, and change test needle 5 only need unpack apart left clamp splice an and right clamp splice b can, easy and simple to handle, and test needle 5 realizes the joint through the draw-in groove on the baffle c in this embodiment and fixes.
In addition, the testing needles 5 each include a first needle frame 51 and a second needle frame 52, and in order to correspond to the number of pins on the chip to be tested, two contact ends are disposed at the upper and lower ends of the testing needle 5 through the first needle frame 51 and the second needle frame 52 in this embodiment.
The test needle mounting structure is used in QFN series chip test of this embodiment, through frame 2 installation long limit mounting bracket 3 and minor face mounting bracket 4, make test needle 5 on long limit mounting bracket 3 and the minor face mounting bracket 4 about both ends meet with a plurality of pins of chip and external test board that awaits measuring respectively, with this purpose of playing the test, it is fixed with the 5 centre gripping of test needle of baffle c both sides joint through left clamp splice an and right clamp splice b, and change test needle 5 only need unpack apart left clamp splice an and right clamp splice b can, test needle 5 detachable mounting means can change with the maintenance in-process more convenient operation, the efficiency of software testing of QFN series chip is improved.
The foregoing shows and describes the general principles, essential features, and advantages of the invention. It should be understood by those skilled in the art that the present invention is not limited by the above embodiments, and the description in the above embodiments and the description is only preferred examples of the present invention, and is not intended to limit the present invention, and that the present invention can have various changes and modifications without departing from the spirit and scope of the present invention, and these changes and modifications all fall into the scope of the claimed invention. The scope of the invention is defined by the appended claims and equivalents thereof.
Claims (5)
1. The utility model provides a test needle mounting structure is used in test of QFN series chip which characterized in that includes: the testing device comprises a cover plate (1), an outer frame (2), a long edge mounting rack (3), a short edge mounting rack (4) and a testing needle (5);
the cover plate (1) is fixed on the upper surface of the outer frame (2), and a test slot (11) for placing a chip to be tested is arranged in the middle of the cover plate (1);
a transverse long groove (21) is formed in the outer frame (2), and longitudinal short grooves (22) are formed in two sides of the middle of the transverse long groove (21);
the long-edge mounting rack (3) is placed in the transverse long groove (21), and the short-edge mounting rack (4) is placed in the longitudinal short groove (22);
equal demountable installation is gone up in long limit mounting bracket (3) and minor face mounting bracket (4) test needle (5), just the upper end of test needle (5) with the chip pin contact that awaits measuring in test groove (11), the lower extreme of test needle (5) contacts with the outside survey test panel pin.
2. The test pin mounting structure for QFN series chip testing according to claim 1, wherein: four corners of the cover plate (1) are fixed with the outer frame (2) through arranged bolts (12).
3. The test pin mounting structure for QFN series chip testing according to claim 1, wherein: the transverse long grooves (21) and the longitudinal short grooves (22) form a cross-shaped groove body.
4. The test pin mounting structure for QFN series chip testing according to claim 1, wherein: long limit mounting bracket (3) and minor face mounting bracket (4) all include: the clamping device comprises a left clamping block (a), a right clamping block (b), a baffle (c) and a bolt (d);
left side clamp splice (a) and right clamp splice (b) will through bolt (d) baffle (c) centre gripping is fixed, the baffle (c) left and right sides joint of long limit mounting bracket (3) has four groups test needle (5), the baffle (c) left and right sides joint of minor face mounting bracket (4) has two sets ofly test needle (5).
5. The test pin mounting structure for QFN series chip testing according to any one of claims 1 to 4, wherein: the test needles (5) each comprise a first needle holder (51) and a second needle holder (52).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202220465823.1U CN217085034U (en) | 2022-03-04 | 2022-03-04 | Test needle mounting structure for QFN series chip test |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202220465823.1U CN217085034U (en) | 2022-03-04 | 2022-03-04 | Test needle mounting structure for QFN series chip test |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN217085034U true CN217085034U (en) | 2022-07-29 |
Family
ID=82547428
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202220465823.1U Active CN217085034U (en) | 2022-03-04 | 2022-03-04 | Test needle mounting structure for QFN series chip test |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN217085034U (en) |
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2022
- 2022-03-04 CN CN202220465823.1U patent/CN217085034U/en active Active
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