CN216013571U

CN216013571U - Semiconductor testing device

Info

Publication number: CN216013571U
Application number: CN202122445779.6U
Authority: CN
Inventors: 赖士文; 储利强; 邱景来; 陈象象; 吴仲山
Original assignee: Kunshan Qiaogeli Photoelectric Technology Co ltd
Current assignee: Kunshan Qiaogeli Photoelectric Technology Co ltd
Priority date: 2021-10-11
Filing date: 2021-10-11
Publication date: 2022-03-11
Anticipated expiration: 2031-10-11

Abstract

The utility model relates to a semiconductor testing device, comprises a workbench, the workstation up end has seted up the spout, slide in the spout and be equipped with the slide, the spout internal rotation is equipped with the threaded rod, threaded rod and slide threaded connection, the threaded rod extends right and runs through the workstation, the threaded rod right-hand member is connected and is equipped with servo motor, slide up end left and right sides all is equipped with fixture, fixture includes fixed plate, fly leaf and connecting rod, fixed plate and fly leaf interval evenly are provided with a plurality ofly, the connecting rod symmetry is provided with two, a plurality of fly leaves and two connecting rods respectively fixed mounting, a plurality of fixed plates and two connecting rods respectively sliding mounting, all connect between adjacent a plurality of fixed plates and fly leaves and be equipped with the spring, a plurality of springs all install in the connecting rod outside, all be equipped with the spacing ring on one side of a plurality of connecting rods; the efficiency is improved by the design of the sliding plate; the clamping mechanism is designed to facilitate clamping; the design of dust cover guarantees dustproof.

Description

Semiconductor testing device

Technical Field

The utility model relates to a semiconductor test technical field specifically is a semiconductor testing device.

Background

Semiconductors are various functional devices made using the electro-photon conversion effect. Like semiconductor photoelectric detector, photomultiplier, shimmer image intensifier, vacuum camera pipe, CCD and CMOS image device, refrigeration and non-refrigeration infrared image device, ultraviolet image device and X ray image device etc, current semiconductor need detect it after production is accomplished, current patent such as patent number 202022792258.3, including test subject, device mobile jib and detector etc, although the device makes things convenient for the staff to detect, the convenience of device use has been promoted greatly, but the device is inconvenient detects a plurality of semiconductors simultaneously when using, installation and dismantlement efficiency remain to be improved, and the form awl wholly lacks suitable dustproof construction.

SUMMERY OF THE UTILITY MODEL

Technical problem to be solved

Not enough to prior art, the utility model provides a semiconductor testing device.

(II) technical scheme

In order to achieve the above object, the utility model provides a following technical scheme: a semiconductor testing device comprises a workbench, wherein a chute is formed in the upper end face of the workbench, a sliding plate is arranged in the chute in a sliding manner, a threaded rod is arranged in the chute in a rotating manner, the threaded rod is in threaded connection with the sliding plate, the threaded rod extends rightwards to penetrate through the workbench, a servo motor is connected to the right end of the threaded rod and is connected with an external power supply, clamping mechanisms are arranged on the left side and the right side of the upper end face of the sliding plate respectively and comprise a fixed plate, a movable plate and connecting rods, a plurality of fixed plates and movable plates are uniformly arranged at intervals, the connecting rods are symmetrically provided with two movable plates and two connecting rods are fixedly arranged respectively, the fixed plates and the two connecting rods are arranged in a sliding manner respectively, springs are arranged between the adjacent fixed plates and the movable plates respectively, and the springs are arranged on the outer sides of the connecting rods, and a plurality of limiting rings are arranged on one side of the opposite surface of the connecting rod.

Preferably in further, the workstation up end central point puts and is equipped with the dust cover, the dust cover sets up to the bottom opening form, logical groove has all been seted up to both ends bottom about the dust cover, two it all is equipped with dustproof curtain to lead to the groove top, realizes dustproof to the testing process.

Preferably, the lower end face of the dust cover is provided with a positioning rod, the upper end face of the workbench is provided with a positioning hole corresponding to the positioning rod, and the positioning rods and the positioning holes are provided with a plurality of positioning holes, so that the dust cover is conveniently positioned and installed.

Preferably in further, the upper end face of the dust cover is provided with a first handle, the front end of the dust cover is provided with an observation window, so that the interior of the dust cover can be observed conveniently, and the disassembly operation is convenient.

Preferably in further, a plurality of mounting grooves are formed in one side of the opposite surfaces of the fixed plate and the movable plate, and the mounting grooves are mounted in a limiting mode.

It is further preferred that a plurality of all be equipped with anti-skidding rubber pad on the mounting groove inner wall, guarantee that the centre gripping is stable.

In further preferred, a plurality of the connecting rod is kept away from the spacing ring one end all is equipped with the second handle, conveniently operates the connecting rod.

(III) advantageous effects

Compared with the prior art, the utility model provides a semiconductor testing device possesses following beneficial effect:

in the utility model, the power supply of the servo motor is started by the design of the sliding plate, the servo motor is arranged on the workbench through the bracket, the motor shaft of the servo motor drives the threaded rod to rotate, the threaded rod is in threaded fit with the slider, so that the slider slides rightwards relative to the sliding groove, and multiple stations are alternately carried out, thereby improving the efficiency; the clamping mechanism is designed in such a way that a connecting rod with a second handle is pulled leftwards, the connecting rod drives the movable plates to move leftwards, so that the springs are stretched to a certain extent, the plurality of semiconductors are correspondingly inserted into the mounting grooves of the movable plates and the fixed plate, the anti-skid rubber pads guarantee the stability of clamping, the second handle is loosened, the springs drive the movable plates to rebound to clamp the plurality of semiconductors, and the clamping operation is facilitated; the design of dust cover, the gripping first in command, the dust cover that will have the locating lever corresponds the locating hole and installs, and the dust cover corresponds to be installed in the workstation upper end, guarantees dustproof effect.

Drawings

Fig. 1 is a schematic view of a preferred overall structure of a semiconductor testing device according to the present invention;

fig. 2 is a schematic view of a preferred matching structure of the worktable, the threaded rod and the servo motor of the semiconductor testing device of the present invention;

fig. 3 is a schematic view of a preferred structure of a dust cover, a dust curtain, a positioning rod, a first handle and an observation window of the semiconductor testing device according to the present invention;

fig. 4 is a schematic view of a right clamping mechanism of a semiconductor testing device according to the present invention.

In the figure: 1. a work table; 2. a chute; 3. a slide plate; 4. a threaded rod; 5. a servo motor; 6. a fixing plate; 7. a movable plate; 8. a connecting rod; 9. a spring; 10. a limiting ring; 11. a dust cover; 12. a through groove; 13. a dust curtain; 14. positioning a rod; 15. positioning holes; 16. a first handle; 17. an observation window; 18. mounting grooves; 19. an anti-skid rubber pad; 20. a second handle.

Detailed Description

The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.

The first embodiment is as follows:

referring to fig. 1, 2 and 4, a semiconductor testing device comprises a worktable 1, a chute 2 is formed on the upper end surface of the worktable 1, a sliding plate 3 is slidably arranged in the chute 2, a threaded rod 4 is rotatably arranged in the chute 2, the threaded rod 4 is in threaded connection with the sliding plate 3, the threaded rod 4 extends rightwards to penetrate through the worktable 1, a servo motor 5 is connected to the right end of the threaded rod 4, the servo motor 5 is connected with an external power supply, clamping mechanisms are arranged on the left side and the right side of the upper end surface of the sliding plate 3, each clamping mechanism comprises a fixed plate 6, a movable plate 7 and a connecting rod 8, a plurality of fixed plates 6 and movable plates 7 are uniformly arranged at intervals, the connecting rods 8 are symmetrically arranged, the movable plates 7 and the connecting rods 8 are respectively fixedly arranged, the fixed plates 6 and the connecting rods 8 are respectively slidably arranged, springs 9 are respectively arranged between the adjacent fixed plates 6 and movable plates 7, a plurality of springs 9 are all installed in the connecting rod 8 outside, and 8 opposite face one side of a plurality of connecting rods all are equipped with spacing ring 10.

Referring to fig. 1-3, in this embodiment, a dust cover 11 is disposed at a center position of an upper end surface of a workbench 1, the dust cover 11 is configured to be open at a bottom end, through grooves 12 are formed at bottoms of left and right ends of the dust cover 11, dust curtains 13 are disposed at tops of the two through grooves 12, a positioning rod 14 is disposed at a lower end surface of the dust cover 11, a positioning hole 15 is formed in the upper end surface of the workbench 1 corresponding to the positioning rod 14, the positioning rod 14 and the positioning hole 15 are both provided with a plurality of positioning holes, a first handle 16 is disposed at the upper end surface of the dust cover 11, an observation window 17 is disposed at a front end of the dust cover 11, the first handle 16 is grasped, the dust cover 11 with the positioning rod 14 is mounted corresponding to the positioning hole 15, the dust cover 11 is correspondingly mounted at the upper end of the workbench 1, the dust curtains 13 prevent dust in the through grooves 12, and the observation window 17 is preferably made of tempered glass.

Referring to fig. 4, in the present embodiment, mounting grooves 18 are formed on opposite sides of the plurality of fixed plates 6 and the movable plate 7, anti-slip rubber pads 19 are disposed on inner walls of the mounting grooves 18, the semiconductor is limited and mounted in the mounting grooves 18, and the anti-slip rubber pads 19 increase clamping stability.

Referring to fig. 1 and 4, in the present embodiment, the ends of the connecting rods 8 far from the limiting ring 10 are respectively provided with a second handle 20, and the second handle 20 is grasped to pull the connecting rods 8.

Example two:

in conclusion, when using, at first install the device wholly, grasp first in the handle 16, the dust cover 11 that will have locating lever 14 corresponds locating hole 15 and installs, the dust cover 11 corresponds and installs in workstation 1 upper end, the installation is accomplished the back, slide 3 is at the left side of spout 2 this moment, install left fixture, correspond the installation with a plurality of semiconductors that wait to detect, the pulling has the connecting rod 8 of second handle 20 left, connecting rod 8 drives a plurality of fly leaf 7 and removes left, and then realize the extension of spring 9, after stretching to a certain degree, correspond a plurality of semiconductors and insert in fly leaf 7 and fixed plate 6's mounting groove 18, the stability of centre gripping is guaranteed to antiskid rubber pad 19, loosen second handle 20, a plurality of springs 9 drive fly leaf 7 kick-backs and carry out the centre gripping to a plurality of semiconductors.

Example three:

in conclusion, when the clamping device is used, after the clamping operation is finished, the power supply of the servo motor 5 is started, the servo motor 5 is arranged on the workbench 1 through the bracket, the motor shaft of the servo motor 5 drives the threaded rod 4 to rotate, the threaded rod 4 is in threaded fit with the sliding block, thereby realizing that the slide block slides rightwards relative to the slide groove 2, passes through the through groove 12 with the dustproof curtain 13 rightwards, the clamping mechanism at the left end is correspondingly conveyed to the inner side of the dustproof cover 11, the detection mechanism on the workbench 1 detects a plurality of semiconductors, and simultaneously the clamping mechanism at the right side of the slide plate 3 correspondingly conveys the right side, the clamping mechanism on the right side is clamped, after a period of time, detection is completed, the servo motor 5 rotates reversely to drive the sliding plate 3 to slide leftwards, the clamping mechanism on the right end enters the inside, the detected semiconductor is sent out by the clamping mechanism on the left end, the semiconductor is disassembled, and the semiconductor which is not detected is clamped.

Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that changes, modifications, substitutions and alterations can be made in these embodiments without departing from the principles and spirit of the invention, the scope of which is defined in the appended claims and their equivalents.

Claims

1. The semiconductor testing device comprises a workbench (1) and is characterized in that a sliding groove (2) is formed in the upper end face of the workbench (1), a sliding plate (3) is arranged in the sliding groove (2) in a sliding mode, a threaded rod (4) is arranged in the sliding groove (2) in a rotating mode, the threaded rod (4) is in threaded connection with the sliding plate (3), the threaded rod (4) extends rightwards to penetrate through the workbench (1), a servo motor (5) is connected to the right end of the threaded rod (4), clamping mechanisms are arranged on the left side and the right side of the upper end face of the sliding plate (3) respectively and comprise a fixed plate (6), a plurality of movable plates (7) and connecting rods (8), the fixed plate (6) and the movable plates (7) are uniformly arranged at intervals, the connecting rods (8) are symmetrically provided with two movable plates (7) and two connecting rods (8) are fixedly installed respectively, it is a plurality of fixed plate (6) and two connecting rod (8) are slidable mounting respectively, and adjacent a plurality of all connect between fixed plate (6) and fly leaf (7) and be equipped with spring (9), and are a plurality of spring (9) are all installed the connecting rod (8) outside, it is a plurality of connecting rod (8) opposite face one side all is equipped with spacing ring (10).

2. A semiconductor test apparatus as claimed in claim 1, characterized in that: workstation (1) up end central point puts and is equipped with dust cover (11), dust cover (11) set up to the bottom opening form, logical groove (12), two have all been seted up to both ends bottom about dust cover (11) logical groove (12) top all is equipped with dustproof curtain (13).

3. A semiconductor test apparatus according to claim 2, wherein: the lower end face of the dust cover (11) is provided with a positioning rod (14), the upper end face of the workbench (1) is provided with a positioning hole (15) corresponding to the positioning rod (14), and the positioning rods (14) and the positioning holes (15) are provided with a plurality of positioning holes.

4. A semiconductor test apparatus according to claim 3, wherein: the dustproof cover is characterized in that a first handle (16) is arranged on the upper end face of the dustproof cover (11), and an observation window (17) is arranged at the front end of the dustproof cover (11).

5. A semiconductor test apparatus as claimed in claim 1, characterized in that: and a plurality of mounting grooves (18) are formed in one side of the opposite surfaces of the fixed plate (6) and the movable plate (7).

6. A semiconductor test apparatus as claimed in claim 5, wherein: and anti-skid rubber pads (19) are arranged on the inner walls of the mounting grooves (18).

7. A semiconductor test apparatus as claimed in claim 1, characterized in that: a plurality of connecting rods (8) are far away from one end of the limiting ring (10) and are provided with second handles (20).