CN215375170U - Test equipment for efficiently testing crystal afterglow parameters - Google Patents

Test equipment for efficiently testing crystal afterglow parameters Download PDF

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Publication number
CN215375170U
CN215375170U CN202121694879.6U CN202121694879U CN215375170U CN 215375170 U CN215375170 U CN 215375170U CN 202121694879 U CN202121694879 U CN 202121694879U CN 215375170 U CN215375170 U CN 215375170U
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CN
China
Prior art keywords
crystal
support frame
platform
testing
fixedly connected
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Expired - Fee Related
Application number
CN202121694879.6U
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Chinese (zh)
Inventor
郑健
李文刚
李官友
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Jingjiang Antong Electronic Equipment Co ltd
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Jingjiang Antong Electronic Equipment Co ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Priority to CN202121694879.6U priority Critical patent/CN215375170U/en
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Publication of CN215375170U publication Critical patent/CN215375170U/en
Expired - Fee Related legal-status Critical Current
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Abstract

The utility model discloses a test device for efficiently testing crystal afterglow parameters, which has the technical scheme that: the automatic crystal testing device comprises an operating platform, wherein an automatic feeding assembly and an automatic material taking assembly are respectively arranged on two sides of the operating platform, a testing plate is arranged between the automatic feeding assembly and the automatic material taking assembly, and a crystal testing platform and a crystal placing platform are fixedly connected to one side of the operating platform; the top and the bottom of the operating platform are respectively fixedly connected with a first support frame and a second support frame, the first support frame is provided with a radioactive source for testing crystal afterglow parameters, and the outside of the first support frame and the second support frame are respectively provided with a protective baffle for shielding rays; the problems that in the prior art, manual operation is performed, the coupling precision of a crystal pixel light emitting surface and a PD chip pixel is poor, the accuracy of test data is poor and the test efficiency is low are effectively solved.

Description

Test equipment for efficiently testing crystal afterglow parameters
Technical Field
The utility model relates to the field of crystals, in particular to a test device for efficiently testing crystal afterglow parameters.
Background
The crystal is a structure in which a large number of microscopic material units (atoms, ions, molecules and the like) are orderly arranged according to a certain rule, so that the arrangement rule and the crystal form can be researched and judged according to the size of the structural units, and the afterglow parameter of the crystal needs to be tested when the afterglow parameter of the crystal is obtained.
However, most of the existing testing methods manually place the crystal to be tested on the PD chip, and such testing methods have the following testing disadvantages: 1. due to manual operation, the coupling precision of the crystal pixel light emitting surface and the PD chip pixel is poor, and the accuracy of the data obtained by testing is poor; 2. and when the test is carried out manually, the test efficiency is lower.
SUMMERY OF THE UTILITY MODEL
In view of the problems mentioned in the background art, the utility model aims to provide a testing device for efficiently testing crystal afterglow parameters, so as to solve the problems mentioned in the background art.
The technical purpose of the utility model is realized by the following technical scheme:
a test device for efficiently testing crystal afterglow parameters comprises an operation table, wherein an automatic feeding assembly and an automatic material taking assembly are respectively arranged on two sides of the operation table, a test board is arranged between the automatic feeding assembly and the automatic material taking assembly, and a crystal platform to be tested and a crystal placing platform are fixedly connected to one side of the operation table;
the top and the bottom of operation panel are fixedly connected with first support frame and second support frame respectively, be provided with the radiation source that is used for testing crystal afterglow parameter on the first support frame, first support frame with the outside of second support frame is all installed and is used for sheltering from the protective barrier of ray, is located the crystal awaits measuring platform and the platform department is placed to the crystal two rectangle openings have been seted up on the protective barrier, the rectangle opening part rotates and is connected with the guard gate.
According to the test equipment for efficiently testing the crystal afterglow parameters, automatic material taking and discharging are realized through the arrangement of the automatic feeding component and the automatic material taking component, crystal afterglow performance index parameters can be efficiently and accurately tested, meanwhile, manual operation is not needed in the test process, the test efficiency and the test precision are greatly improved, the problems that in the prior art, manual operation is poor in pixel coupling precision of a crystal pixel light emitting surface and a PD chip, the test data accuracy is poor and the test efficiency is low are effectively solved, most of the test equipment is automatically operated during testing, and the test precision and efficiency are greatly improved;
through the arrangement of the first support frame, the second support frame and the protective baffle, the protective performance can be improved, and the damage of rays emitted by a radioactive source to the health of operators is avoided; meanwhile, due to the arrangement of the rectangular opening and the protective door, the material can be conveniently discharged and taken.
Preferably, the two protection doors are oppositely opened and closed in opposite directions, and handles convenient to open and close are fixedly connected to the protection doors; the two protective doors can be opened and closed conveniently by opening and closing in the opposite direction and arranging the handle.
Preferably, a plurality of reinforcing rods are fixedly connected between the operating platform and the second supporting frame; the stability of operation panel can be improved through the setting of stiffener.
Preferably, the automatic feeding assembly and the automatic material taking assembly respectively comprise a first guide rail, a first sliding block, a second guide rail, a second sliding block, an automatic lifting platform arranged on the end face of the second sliding block and a plurality of servo motors; when the crystal picking device is used, the servo motor on the first guide rail is started to drive the first sliding block to move, the first sliding block drives the second guide rail to move, the servo motor on the second guide rail is restarted to drive the second sliding block to move with the automatic lifting platform, and the servo motor on the automatic lifting platform is restarted to drive the crystal picking suction head to lift, so that the crystal picking suction head is driven to move in all directions, and then the crystal is picked conveniently to the test board.
Preferably, crystal picking suction heads are arranged on the two automatic lifting tables; by arranging the crystal picking suction head, the picking efficiency can be improved.
Preferably, the top end of the first support frame is fixedly connected with a plurality of transverse plates, the bottoms of the transverse plates are fixedly connected with a mounting plate, and the radioactive source is fixedly mounted at the bottom of the mounting plate; through the setting of diaphragm and mounting panel, can improve the steadiness of radiation source.
Preferably, the first support frame and the second support frame both comprise a plurality of stainless steel hollow rectangular plates, and the wall thickness of each stainless steel hollow rectangular plate is 5-20 mm; the stainless steel hollow rectangular plate has good structural strength, low price and easy acquisition, can not be rusted, and has good durability.
In summary, the utility model mainly has the following beneficial effects:
according to the test equipment for efficiently testing the crystal afterglow parameters, automatic material taking and discharging are realized through the arrangement of the automatic feeding component and the automatic material taking component, crystal afterglow performance index parameters can be efficiently and accurately tested, meanwhile, manual operation is not needed in the test process, the test efficiency and the test precision are greatly improved, the problems that in the prior art, manual operation is poor in pixel coupling precision of a crystal pixel light emitting surface and a PD chip, the test data accuracy is poor and the test efficiency is low are effectively solved, most of the test equipment is automatically operated during testing, and the test precision and efficiency are greatly improved;
through the arrangement of the first support frame, the second support frame and the protective baffle, the protective performance can be improved, and the damage of rays emitted by a radioactive source to the health of operators is avoided; meanwhile, due to the arrangement of the rectangular opening and the protective door, the material can be conveniently discharged and taken.
Drawings
FIG. 1 is a schematic view of the present invention;
FIG. 2 is a second schematic structural diagram of the present invention;
FIG. 3 is a partial schematic view of the present invention;
FIG. 4 is a second partial schematic view of the present invention.
Reference numerals: 1. an operation table; 2. an automatic feeding assembly; 3. an automatic material taking assembly; 4. a test board; 5. a crystal stage to be tested; 6. a crystal placing table; 7. a first support frame; 8. a second support frame; 9. a radioactive source; 10. a protective baffle; 11. a rectangular opening; 12. a protective door; 13. a reinforcing bar; 14. a first guide rail; 15. a second guide rail; 16. a first slider; 17. a second slider; 18. a servo motor; 19. a crystal pick-up suction head; 20. a transverse plate; 21. mounting a plate; 22. a stainless steel hollow rectangular plate; 23. an automatic lifting table; 24. a handle.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
Examples
Referring to fig. 1-4, a testing apparatus for efficiently testing afterglow parameters of a crystal comprises an operating platform 1, wherein two sides of the operating platform 1 are respectively provided with an automatic feeding assembly 2 and an automatic material taking assembly 3, a testing plate 4 is arranged between the automatic feeding assembly 2 and the automatic material taking assembly 3, and one side of the operating platform 1 is fixedly connected with a crystal platform to be tested 5 and a crystal placing platform 6;
the top and the bottom of the operating table 1 are respectively fixedly connected with a first support frame 7 and a second support frame 8, a radioactive source 9 for testing crystal afterglow parameters is arranged on the first support frame 7, and protective baffles 10 for shielding rays are arranged outside the first support frame 7 and the second support frame 8.
Referring to fig. 1 and 2, two protection doors 12 open and close in opposite directions, and a handle 24 convenient for opening and closing is fixedly connected to the protection doors 12; the two protective doors 12 can be opened and closed conveniently through the reverse opening and closing and the arrangement of the handle 24.
Referring to fig. 3, a plurality of reinforcing rods 13 are fixedly connected between the operating platform 1 and the second supporting frame 8; the stability of the console 1 can be improved by the provision of the reinforcing bar 13.
Referring to fig. 3, the automatic feeding assembly 2 and the automatic material taking assembly 3 each include a first guide rail 14, a first slider 16, a second guide rail 15, a second slider 17, an automatic lifting platform 23 disposed on an end surface of the second slider 17, and a plurality of servo motors 18; during the use, the servo motor 18 on the first guide rail 14 is started to drive the first slide block 16 to move, the first slide block 16 drives the second guide rail 15 to move, the servo motor 18 on the second guide rail 15 is restarted to drive the second slide block 17 to move with the automatic lifting platform 23, the servo motor 18 on the automatic lifting platform 23 is restarted to drive the crystal picking suction head 19 to lift, the crystal picking suction head 19 can be driven to move in all directions, and then the crystal is picked to the test board 4 conveniently.
Referring to fig. 3, crystal pick-up tips 19 are mounted on both of the two automatic lifting tables 23; by providing the crystal pick-up tip 19, pick-up efficiency can be improved.
Referring to fig. 3, the top end of the first support frame 7 is fixedly connected with a plurality of transverse plates 20, the bottom of the transverse plates 20 is fixedly connected with a mounting plate 21, and the radioactive source 9 is fixedly mounted at the bottom of the mounting plate 21; through the setting of diaphragm 20 and mounting panel 21, can improve the steadiness of radiation source 9.
Referring to fig. 3, the first support frame 7 and the second support frame 8 each include a plurality of stainless steel hollow rectangular plates 22, and the wall thickness of each stainless steel hollow rectangular plate 22 is 10 mm; the stainless steel hollow rectangular plate 22 has good structural strength, is low in price and easy to obtain, is free from rusting, and is good in durability.
The use principle and the advantages are as follows:
when the test equipment for efficiently testing the afterglow parameters of the crystals is used, firstly, the protective door 12 at the position of the crystal platform 5 to be tested is opened to place the crystals to be tested on the crystal platform 5 to be tested, then the protective door 12 is closed, the automatic feeding group is driven to pick the crystals on the crystal platform 5 to be tested onto the test board 4, then the radioactive source 9 is started to emit rays to test the crystals on the test board 4, the test board 4 is communicated with test software during testing, then the radioactive source 9 is opened to irradiate the crystals, then the crystals on the test board 4 are classified according to the test results of the test software, then the automatic material taking component 3 is started to sequentially pick the crystals onto the crystal placing platform 6 according to the classification results of the test software, so that the crystals with different test results are placed in corresponding areas on the crystal placing platform 6, the convenience is brought for workers to take the materials, then the radioactive source 9 is closed, the operator opens the guard door 12 to remove the tested crystal.
Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that changes, modifications, substitutions and alterations can be made in these embodiments without departing from the principles and spirit of the utility model, the scope of which is defined in the appended claims and their equivalents.

Claims (7)

1. The utility model provides a test equipment of high-efficient test crystal afterglow parameter, includes operation panel (1), its characterized in that: an automatic feeding assembly (2) and an automatic material taking assembly (3) are respectively arranged on two sides of the operating platform (1), a test board (4) is arranged between the automatic feeding assembly (2) and the automatic material taking assembly (3), and a crystal platform to be tested (5) and a crystal platform (6) are fixedly connected to one side of the operating platform (1);
the top and the bottom of operation panel (1) are fixedly connected with first support frame (7) and second support frame (8) respectively, be provided with radiation source (9) that are used for testing crystal afterglow parameter on first support frame (7), first support frame (7) with the outside of second support frame (8) is all installed and is used for sheltering from protective baffle (10) of ray, is located the crystal is waited to examine platform (5) and the crystal is placed platform (6) department seted up two rectangle openings (11) on protective baffle (10), rectangle opening (11) department rotates and is connected with guard gate (12).
2. The test equipment for efficiently testing the afterglow parameters of the crystal as claimed in claim 1, wherein: the two protective doors (12) are oppositely opened and closed, and handles (24) which are convenient to open and close are fixedly connected to the protective doors (12).
3. The test equipment for efficiently testing the afterglow parameters of the crystal as claimed in claim 1, wherein: a plurality of reinforcing rods (13) are fixedly connected between the operating platform (1) and the second supporting frame (8).
4. The test equipment for efficiently testing the afterglow parameters of the crystal as claimed in claim 1, wherein: the automatic feeding assembly (2) and the automatic material taking assembly (3) comprise a first guide rail (14), a first sliding block (16), a second guide rail (15), a second sliding block (17), an automatic lifting platform (23) arranged on the end face of the second sliding block (17) and a plurality of servo motors (18).
5. The test equipment for efficiently testing the afterglow parameters of the crystal as claimed in claim 4, wherein: and crystal picking suction heads (19) are arranged on the two automatic lifting platforms (23).
6. The test equipment for efficiently testing the afterglow parameters of the crystal as claimed in claim 1, wherein: the top fixedly connected with of first support frame (7) a plurality of diaphragms (20), the bottom fixedly connected with mounting panel (21) of diaphragm (20), radiation source (9) installation is fixed the bottom of mounting panel (21).
7. The test equipment for efficiently testing the afterglow parameters of the crystal as claimed in claim 1, wherein: the first support frame (7) and the second support frame (8) respectively comprise a plurality of stainless steel hollow rectangular plates (22), and the wall thickness of each stainless steel hollow rectangular plate (22) is 5-20 mm.
CN202121694879.6U 2021-07-26 2021-07-26 Test equipment for efficiently testing crystal afterglow parameters Expired - Fee Related CN215375170U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202121694879.6U CN215375170U (en) 2021-07-26 2021-07-26 Test equipment for efficiently testing crystal afterglow parameters

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202121694879.6U CN215375170U (en) 2021-07-26 2021-07-26 Test equipment for efficiently testing crystal afterglow parameters

Publications (1)

Publication Number Publication Date
CN215375170U true CN215375170U (en) 2021-12-31

Family

ID=79611498

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202121694879.6U Expired - Fee Related CN215375170U (en) 2021-07-26 2021-07-26 Test equipment for efficiently testing crystal afterglow parameters

Country Status (1)

Country Link
CN (1) CN215375170U (en)

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CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20211231

CF01 Termination of patent right due to non-payment of annual fee