CN215340197U - A transport mechanism for chip test - Google Patents

A transport mechanism for chip test Download PDF

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Publication number
CN215340197U
CN215340197U CN202121695550.1U CN202121695550U CN215340197U CN 215340197 U CN215340197 U CN 215340197U CN 202121695550 U CN202121695550 U CN 202121695550U CN 215340197 U CN215340197 U CN 215340197U
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axis
driving
transfer
base
driving device
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CN202121695550.1U
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Chinese (zh)
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张飞
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Suzhou Lingfusen Intelligent Equipment Manufacturing Technology Co ltd
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Suzhou Lingfusen Intelligent Equipment Manufacturing Technology Co ltd
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Abstract

The utility model relates to a transfer mechanism for chip testing, which sequentially comprises an X-axis transfer base, a Y-axis transfer base, a clamp platform and a transfer clamp from bottom to top, wherein a driving end of an X-axis driving device is in driving connection with an upper X-axis driving bearing seat in the X-axis direction through an X-axis driving rod, a driving end of a Y-axis driving device is in driving connection with an upper Y-axis driving bearing seat in the Y-axis direction through a Y-axis driving rod, the clamp platform is arranged on the Y-axis driving bearing seat, and the transfer clamp is arranged on the clamp platform. According to the transfer mechanism for chip testing, the structure arrangement of the X-axis transfer base, the Y-axis transfer base, the clamp platform and the transfer clamp is reasonable, the transfer operation in multiple axial directions can be realized, and the maintenance and use cost is low.

Description

A transport mechanism for chip test
Technical Field
The utility model relates to the technical field related to intelligent equipment processing, in particular to a transfer mechanism for chip testing.
Background
Integrated Circuits (ICs), or microcircuits, microchips, and chips (chips) are one way to miniaturize circuits (including primarily semiconductor devices, including passive components, etc.) in electronics, and are often fabricated on the surface of semiconductor wafers. In the production and processing process of loading the chip on the jig, a processing and transferring mechanism is usually needed, but the structure in the prior art is generally set by a simple structure of a plurality of conveyor belts or a complex structure of a plurality of mechanical arms, and the chip is single in function, complex in structure and high in cost.
In view of the above-mentioned drawbacks, the present designer is actively making research and innovation to create a transfer mechanism for chip testing, so that the transfer mechanism has industrial application value.
SUMMERY OF THE UTILITY MODEL
In order to solve the above technical problems, an object of the present invention is to provide a transfer mechanism for chip testing.
In order to achieve the purpose, the utility model adopts the following technical scheme:
a transfer mechanism for chip testing comprises an X-axis transfer base, a Y-axis transfer base, a clamp platform and a transfer clamp from bottom to top in sequence, wherein an X-axis driving device is arranged on the X-axis transfer base along one side in the X-axis direction, a driving end of the X-axis driving device is in driving connection with an upper X-axis driving bearing seat in the X-axis direction through an X-axis driving rod, the bottom of the X-axis driving bearing seat is connected with an X-axis guide rail on the X-axis transfer base through an X-axis sliding block, a Y-axis driving device is arranged on the Y-axis transfer base along one side in the Y-axis direction, a driving end of the Y-axis driving device is in driving connection with an upper Y-axis driving bearing seat in the Y-axis direction through a Y-axis driving rod, the bottom of the Y-axis driving bearing seat is connected with a Y-axis guide rail on the Y-axis transfer base through a Y-axis sliding block, and the clamp platform is arranged on the Y-axis driving bearing seat, and a transfer clamp is arranged on the clamp platform.
As a further improvement of the utility model, the transfer fixture comprises a fixture base, the fixture base is arranged along the Y-axis direction, one side of the fixture base along the Y-axis direction is provided with a fixture driving device, the fixture base close to one side of the fixture driving device is provided with a movable clamping plate, the fixture base far away from one side of the fixture driving device is provided with a fixed clamping plate, the driving end of the fixture driving device is in driving connection with the movable clamping plate in the Y-axis direction, a clamping cavity is formed between the fixed clamping plate and the movable clamping plate, a fixed clamping cushion block is arranged on the contact surface on the inner side of the fixed clamping plate, and a movable clamping cushion block is arranged on the contact surface on the inner side of the movable clamping plate.
As a further improvement of the utility model, the clamp base is also provided with a guide post, and the movable clamping plate is connected with the guide post.
As a further improvement of the utility model, the fixed clamping cushion block and the movable clamping cushion block are both rubber cushion blocks or silica gel cushion blocks.
As a further improvement of the utility model, a rotary cylinder is also arranged on the Y-axis driving bearing seat, and a driving end at the top of the rotary cylinder is in driving connection with an upper clamp platform.
As a further improvement of the utility model, the bottom of the X-axis driving bearing seat is also provided with an X-axis grating ruler, and a plurality of X-axis grating ruler seats matched with the X-axis grating ruler are uniformly arranged on the X-axis transferring base along the X-axis direction.
As a further improvement of the utility model, the bottom of the Y-axis driving bearing seat is also provided with a Y-axis grating ruler, and a plurality of Y-axis grating ruler seats matched with the Y-axis grating ruler are uniformly arranged on the Y-axis transferring base along the Y-axis direction.
As a further improvement of the utility model, the X-axis driving device and the Y-axis driving device are both servo driving motors, and the X-axis driving rod and the Y-axis driving rod are both screw rods.
As a further improvement of the utility model, the X-axis driving device and the Y-axis driving device are both cylinders, and the X-axis driving rod and the Y-axis driving rod are both piston rods.
As a further improvement of the utility model, the clamp driving device is an air cylinder.
By the scheme, the utility model at least has the following advantages:
according to the transfer mechanism for chip testing, the structure arrangement of the X-axis transfer base, the Y-axis transfer base, the clamp platform and the transfer clamp is reasonable, the transfer operation in multiple axial directions can be realized, and the maintenance and use cost is low; the rotary cylinder arranged on the bearing seat is driven by the Y shaft, so that the rotary operation function of the clamp platform can be realized, and the flexibility is stronger.
The foregoing description is only an overview of the technical solutions of the present invention, and in order to make the technical solutions of the present invention more clearly understood and to implement them in accordance with the contents of the description, the following detailed description is given with reference to the preferred embodiments of the present invention and the accompanying drawings.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings needed to be used in the embodiments will be briefly described below, it should be understood that the following drawings only illustrate some embodiments of the present invention and therefore should not be considered as limiting the scope, and for those skilled in the art, other related drawings can be obtained according to the drawings without inventive efforts.
FIG. 1 is a schematic structural diagram of a transfer mechanism for testing a chip according to the present invention.
In the drawings, the meanings of the reference numerals are as follows.
2X-axis driving device of 1X-axis transfer base
3X-axis driving rod 4X-axis guide rail
6X-axis driving bearing seat of 5X-axis grating ruler seat
7X-axis slide block 8X-axis grating ruler
9Y-axis transfer base 10Y-axis driving rod
12Y-axis slide block of 11Y-axis driving device
13Y-axis grating ruler seat 14Y-axis grating ruler
15Y-axis guide rail 16Y-axis driving bearing seat
17 clamp platform 18 clamp base
19 fixed clamping plate 20 fixed clamping cushion block
21 movable clamping cushion block 22 movable clamping plate
23 jig drive 24 guide post
Detailed Description
The following detailed description of embodiments of the present invention is provided in connection with the accompanying drawings and examples. The following examples are intended to illustrate the utility model but are not intended to limit the scope of the utility model.
In order to make the technical solutions of the present invention better understood, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. The components of embodiments of the present invention generally described and illustrated in the figures herein may be arranged and designed in a wide variety of different configurations. Thus, the following detailed description of the embodiments of the present invention, presented in the figures, is not intended to limit the scope of the utility model, as claimed, but is merely representative of selected embodiments of the utility model. All other embodiments, which can be derived by a person skilled in the art from the embodiments of the present invention without making any creative effort, shall fall within the protection scope of the present invention.
Examples
As shown in figure 1 of the drawings, in which,
a transfer mechanism for chip testing comprises an X-axis transfer base 1, a Y-axis transfer base 9, a clamp platform 17 and a transfer clamp from bottom to top in sequence, wherein an X-axis driving device 2 is arranged on one side of the X-axis transfer base 1 along the X-axis direction, the driving end of the X-axis driving device 2 is in driving connection with an upper X-axis driving bearing seat 6 along the X-axis direction through an X-axis driving rod 3, the bottom of the X-axis driving bearing seat 6 is connected with an X-axis guide rail 4 on the X-axis transfer base 1 through an X-axis sliding block 7, a Y-axis driving device 11 is arranged on one side of the Y-axis transfer base 9 along the Y-axis direction, the driving end of the Y-axis driving device 11 is in driving connection with an upper Y-axis driving bearing seat 16 along the Y-axis direction through a Y-axis driving rod 10, the bottom of the Y-axis driving bearing seat 16 is connected with a Y-axis guide rail 15 on the Y-axis transfer base 9 through a Y-axis sliding block 12, the Y-axis driving bearing seat 16 is provided with a clamp platform 17, and the clamp platform 17 is provided with a transferring clamp.
Preferably, the transfer fixture comprises a fixture base 18, the fixture base 18 is arranged along the Y-axis direction, a fixture driving device 23 is arranged on one side of the fixture base 18 along the Y-axis direction, a movable clamping plate 22 is arranged on the fixture base 18 close to one side of the fixture driving device 23, a fixed clamping plate 19 is arranged on the fixture base 18 far away from one side of the fixture driving device 23, the driving end of the fixture driving device 23 is in driving connection with the movable clamping plate 22 in the Y-axis direction, a clamping cavity is formed between the fixed clamping plate 19 and the movable clamping plate 22, a fixed clamping cushion block 20 is arranged on the contact surface on the inner side of the fixed clamping plate 19, and a movable clamping cushion block 21 is arranged on the contact surface on the inner side of the movable clamping plate 22. Wherein the product jig is positioned between the fixed clamping plate 19 and the movable clamping plate 22 on the clamp base 18.
Preferably, the clamp base 18 is further provided with guide posts 24, and the movable clamping plate 22 is connected with the guide posts 24.
Preferably, the fixed clamping cushion block 20 and the movable clamping cushion block 21 are both rubber cushion blocks or silica gel cushion blocks.
Preferably, a rotary cylinder is further arranged on the Y-axis driving bearing seat 16, and a driving end at the top of the rotary cylinder is in driving connection with the upper fixture platform 17.
Preferably, the bottom of the X-axis driving bearing seat 6 is also provided with an X-axis grating ruler 8, and a plurality of X-axis grating ruler seats 5 matched with the X-axis grating ruler 8 are uniformly arranged on the X-axis transferring base 1 along the X-axis direction.
Preferably, a Y-axis grating ruler 14 is further disposed at the bottom of the Y-axis driving bearing seat 16, and a plurality of Y-axis grating ruler seats 13 disposed to match with the Y-axis grating ruler 14 are uniformly disposed on the Y-axis transferring base 9 along the Y-axis direction.
Preferably, the X-axis driving device 2 and the Y-axis driving device 11 are both servo driving motors, and the X-axis driving rod 3 and the Y-axis driving rod 10 are both lead screws.
Preferably, the X-axis driving device 2 and the Y-axis driving device 11 are both air cylinders, and the X-axis driving rod 3 and the Y-axis driving rod 10 are both piston rods.
Preferably, the jig driving means 23 is a cylinder.
According to the transfer mechanism for chip testing, the transfer of the clamp platform in the X-axis direction can be comprehensively realized through the structural arrangement of the X-axis transfer base, the transfer of the clamp platform in the Y-axis direction can be comprehensively realized through the structural arrangement of the Y-axis transfer base, the rotary operation of the clamp platform can be comprehensively realized through the rotary air cylinder arranged on the bearing seat driven by the Y-axis, and the clamping operation of a transferred product is realized through the transfer clamp.
According to the transfer mechanism for chip testing, the structure arrangement of the X-axis transfer base, the Y-axis transfer base, the clamp platform and the transfer clamp is reasonable, the transfer operation in multiple axial directions can be realized, and the maintenance and use cost is low; the rotary cylinder arranged on the bearing seat is driven by the Y shaft, so that the rotary operation function of the clamp platform can be realized, and the flexibility is stronger.
In the description of the present invention, it is to be understood that the terms "center", "longitudinal", "lateral", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", and the like, indicate orientations or positional relationships based on those shown in the drawings, and are used only for convenience in describing the present invention and for simplicity in description, and do not indicate or imply that the referenced devices or elements must have a particular orientation, be constructed and operated in a particular orientation, and thus, are not to be construed as limiting the present invention. Furthermore, the terms "first," "second," and the like are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly referring to the number of technical features being grined. Thus, a feature defined as "first," "second," etc. may explicitly or implicitly include one or more of that feature. In the description of the present invention, "a plurality" means two or more unless otherwise specified.
In the description of the present invention, it should be noted that, unless otherwise explicitly specified or limited, the terms "mounted," "connected," and "connected" are to be construed broadly, e.g., as meaning either a fixed connection, a removable connection, or an integral connection: either mechanically or electrically: the terms may be directly connected or indirectly connected through an intermediate member, or may be a communication between two elements.
The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention, it should be noted that, for those skilled in the art, many modifications and variations can be made without departing from the technical principle of the present invention, and these modifications and variations should also be regarded as the protection scope of the present invention.

Claims (10)

1. A transfer mechanism for chip testing is characterized by sequentially comprising an X-axis transfer base (1), a Y-axis transfer base (9), a clamp platform (17) and a transfer clamp from bottom to top, wherein an X-axis driving device (2) is arranged on one side of the X-axis transfer base (1) along the X-axis direction, the driving end of the X-axis driving device (2) is in driving connection with an upper X-axis driving bearing seat (6) on the X-axis direction through an X-axis driving rod (3), the bottom of the X-axis driving bearing seat (6) is connected with an X-axis guide rail (4) on the X-axis transfer base (1) through an X-axis sliding block (7), a Y-axis driving device (11) is arranged on one side of the Y-axis direction on the Y-axis transfer base (9), the driving end of the Y-axis driving device (11) is in driving connection with an upper Y-axis driving bearing seat (16) on the Y-axis direction through a Y-axis driving rod (10), the bottom of the Y-axis driving bearing seat (16) is connected with a Y-axis guide rail (15) on the Y-axis transferring base (9) through a Y-axis sliding block (12), a clamp platform (17) is arranged on the Y-axis driving bearing seat (16), and a transferring clamp is arranged on the clamp platform (17).
2. The transfer mechanism for testing chips according to claim 1, wherein the transfer fixture includes a fixture base (18), the fixture base (18) is disposed along the Y-axis direction, a fixture driving device (23) is disposed on one side of the fixture base (18) along the Y-axis direction, a movable clamping plate (22) is disposed on the fixture base (18) near one side of the fixture driving device (23), a fixed clamping plate (19) is disposed on the fixture base (18) far from one side of the fixture driving device (23), a driving end of the fixture driving device (23) is drivingly connected to the movable clamping plate (22) in the Y-axis direction, a clamping cavity is formed between the fixed clamping plate (19) and the movable clamping plate (22), and a fixed clamping cushion block (20) is disposed on a contact surface inside the fixed clamping plate (19), and a movable clamping cushion block (21) is arranged on the contact surface of the inner side of the movable clamping plate (22).
3. The transfer mechanism for chip testing according to claim 2, wherein the clamp base (18) is further provided with a guide post (24), and the movable clamping plate (22) is connected with the guide post (24).
4. The transfer mechanism for chip testing according to claim 2, wherein the fixed clamping cushion block (20) and the movable clamping cushion block (21) are both rubber cushion blocks or silica gel cushion blocks.
5. The transfer mechanism for chip testing according to claim 1, wherein a rotary cylinder is further disposed on the Y-axis driving bearing seat (16), and a driving end of a top portion of the rotary cylinder is drivingly connected to the upper fixture platform (17).
6. The transfer mechanism for chip testing according to claim 1, wherein the bottom of the X-axis driving carrier seat (6) is further provided with an X-axis grating ruler (8), and a plurality of X-axis grating ruler seats (5) matched with the X-axis grating ruler (8) are uniformly arranged on the X-axis transfer base (1) along the X-axis direction.
7. The transfer mechanism for chip testing according to claim 1, wherein a Y-axis grating ruler (14) is further disposed at the bottom of the Y-axis driving carrier base (16), and a plurality of Y-axis grating ruler bases (13) disposed to match with the Y-axis grating ruler (14) are uniformly disposed on the Y-axis transfer base (9) along the Y-axis direction.
8. The transfer mechanism for chip testing according to claim 1, wherein the X-axis driving device (2) and the Y-axis driving device (11) are servo driving motors, and the X-axis driving rod (3) and the Y-axis driving rod (10) are lead screws.
9. The transfer mechanism for chip testing according to claim 1, wherein the X-axis driving device (2) and the Y-axis driving device (11) are both air cylinders, and the X-axis driving rod (3) and the Y-axis driving rod (10) are both piston rods.
10. The transfer mechanism for chip testing according to claim 2, wherein the jig driving means (23) is an air cylinder.
CN202121695550.1U 2021-07-23 2021-07-23 A transport mechanism for chip test Active CN215340197U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202121695550.1U CN215340197U (en) 2021-07-23 2021-07-23 A transport mechanism for chip test

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202121695550.1U CN215340197U (en) 2021-07-23 2021-07-23 A transport mechanism for chip test

Publications (1)

Publication Number Publication Date
CN215340197U true CN215340197U (en) 2021-12-28

Family

ID=79569987

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202121695550.1U Active CN215340197U (en) 2021-07-23 2021-07-23 A transport mechanism for chip test

Country Status (1)

Country Link
CN (1) CN215340197U (en)

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