CN215005728U - Power device reliability test device - Google Patents
Power device reliability test device Download PDFInfo
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- CN215005728U CN215005728U CN202121617705.XU CN202121617705U CN215005728U CN 215005728 U CN215005728 U CN 215005728U CN 202121617705 U CN202121617705 U CN 202121617705U CN 215005728 U CN215005728 U CN 215005728U
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Abstract
The utility model belongs to the technical field of power device test device, concretely relates to classification number is G06F's technical field, in particular to power device reliability test device. A reliability test device for a power device comprises a PCB clamp, wherein the power device is electrically connected to the PCB clamp; the test power supply is electrically connected with the PCB clamp; the upper computer controls the test power supply; the PCB plate clamp is detachably connected inside the oven, and a control panel of the oven is positioned on the upper portion of the oven. In the technical scheme, after the power device is installed on a PCB clamp, the power device is connected with a test power supply through a PCB, and then the test power supply is connected with an upper computer, so that the voltage stress test of the power device is realized; the PCB clamp connected with the test power supply is placed in an oven with adjustable temperature, so that the temperature stress test of the power device is realized, the simultaneous test of voltage and temperature is realized, and the test efficiency is improved.
Description
Technical Field
The utility model belongs to the technical field of power device test device, concretely relates to classification number is G06F's technical field, in particular to power device reliability test device.
Background
At present, a conventional detection method for a power device after packaging is functional test and reliability test. When the conventional power device reliability test device is used for a high-temperature reverse bias test in a reliability test, the space of the power device reliability test device is small, so that a large number of tests of power devices cannot be realized, and the tests of temperature and voltage stress cannot be simultaneously carried out. Therefore, a testing device capable of detecting the reliability of the power device under temperature stress and voltage stress in a large scale is needed.
Patent application No. CN201910415255.7 discloses a method, an apparatus, and a storage medium for evaluating reliability of a power device, where the apparatus for evaluating reliability of a power device in the patent only can evaluate reliability of voltage stress of a power device, and evaluation efficiency is low.
Patent application No. CN201410580089.3 discloses a method and a device for detecting the reliability of an IGBT power device, wherein in the technical scheme, a microscopic infrared thermal imaging device is used for detecting the voltage reliability of the IGBT power device, but the detection efficiency of the device is low.
SUMMERY OF THE UTILITY MODEL
In order to solve the above-mentioned technology, the utility model provides a power device reliability test device, which comprises a PCB clamp, wherein the PCB clamp is electrically connected with a power device; the test power supply is electrically connected with the PCB clamp; the upper computer controls the test power supply; the PCB plate clamp is detachably connected inside the oven, and a control panel of the oven is positioned on the upper portion of the oven.
As a preferable technical solution, a probe is arranged on the PCB clamp, and the probe is electrically connected with a terminal on the power device.
As a preferable technical scheme, the power device is further connected with a PCB clamp through a plastic nut.
As a preferred technical solution, the oven is a blower oven.
As a preferable technical scheme, the inner walls of the left side and the right side of the blower type oven are provided with channel holes, so as to improve the heating uniformity of the blower type oven.
As a preferred technical scheme, N clamping grooves are formed in the inner wall of the rear portion of the blowing type oven, a buckle is arranged on the PCB clamp, the PCB clamp is clamped with one clamping groove through the buckle, the PCB clamp is detachably connected with the blowing type oven, and N is larger than or equal to 20.
As a preferred technical scheme, a plurality of supporting blocks are respectively installed on the inner walls of the left side and the right side of the blowing type oven, and the left side and the right side of the PCB clamp are respectively placed on the supporting blocks to play a supporting role.
As a preferred technical solution, 22 card slots are formed on the inner wall of the rear portion of the blower type oven, and the 22 card slots include a first row and a second row which are parallel to each other.
As a preferred technical scheme, a supporting frame is arranged in the middle of the inside of the blowing type oven, 11 first supporting blocks are installed on the left side and the right side of the supporting frame, second supporting blocks are installed on the inner walls of the left side and the right side of the blowing type oven corresponding to the first supporting blocks, and the PCB clamp is supported and clamped through the clamping grooves, the first supporting blocks and the second supporting blocks.
As a preferred technical scheme, a transparent glass show window is arranged in the middle of an oven door of the oven.
Has the advantages that:
in the technical scheme, after the power device is installed on a PCB clamp, the power device is connected with a test power supply through a PCB, and then the test power supply is connected with an upper computer, so that the voltage stress test of the power device is realized; the PCB clamp connected with the test power supply is placed in an oven with adjustable temperature, so that the temperature stress test of the power device is realized, the simultaneous test of voltage and temperature is realized, and the test efficiency is improved. And because the oven has enough large space, a large number of power devices can be accommodated, and the large-batch test of the power devices is realized.
Drawings
Fig. 1 is a schematic view of the overall structure of a blower oven in example 1.
Fig. 2 is a schematic cross-sectional view of a section C-C of the blower oven of fig. 1.
Fig. 3 is a schematic structural view of the PCB board jig of embodiment 1 with a power device mounted thereon.
1-blast type oven, 2-control panel, 3-oven door, 4-transparent glass show window, 5-channel hole, 6-second supporting block, 7-PCB clamp and 8-power device.
Detailed Description
The present invention will be described in detail with reference to the following examples. It is necessary to point out here that some insubstantial modifications and adaptations made by those skilled in the art in light of the above teachings of the present invention are within the scope of the present invention.
Example 1
In order to solve the above technical problem, the present embodiment provides a reliability testing apparatus for a power device, including a PCB board clamp 7 as shown in fig. 3, wherein a power device 8 is electrically connected to the PCB board clamp 7; the test power supply is electrically connected with the PCB clamp 7; the upper computer controls the parameters of the test power supply and the electric leakage condition in the test process; the drying oven is a blower type drying oven 1 as shown in fig. 1 and fig. 2, the PCB clamp 7 is detachably connected inside the blower type drying oven 1, the control panel 2 of the blower type drying oven 1 is positioned at the upper part of the blower type drying oven 1, the temperature of the blower type drying oven 1 is controlled through the control panel 2, and the middle part of the drying oven door 3 of the blower type drying oven 1 is provided with a transparent glass show window 4. And probes are arranged on the PCB clamp 7 and electrically connected with terminals on the power device 8. The PCB clamp 7 is electrically connected with the power device 8 through the electric connection of the probe and the terminal, and the power device 8 is further connected with the PCB clamp 7 through the plastic nut to further fix the power device 8. And channel holes 5 are formed in the inner walls of the left side and the right side of the blowing type oven 1, so that the heating uniformity of the blowing type oven 1 is improved. 22 clamping grooves are formed in the inner wall of the rear portion of the blowing type oven 1, the 22 clamping grooves comprise a first row and a second row which are parallel to each other, and 11 clamping grooves are formed in the first row and the second row. The middle of the inside of the blowing type oven is provided with a support frame, 11 first support blocks are installed on the left side and the right side of the support frame, second support blocks 6 are installed on the inner walls of the left side and the right side of the blowing type oven and correspond to the first support blocks, and support of the PCB clamp 7 is achieved through the clamping grooves, the first support blocks and the second support blocks 6. After the power device 8 is installed on the PCB clamp 7, the power device is connected with a test power supply through the PCB clamp 7, the test power supply is connected with an upper computer, voltage stress test of the power device is achieved, and power supply parameters of the test power supply are controlled through the upper computer. The PCB clamp 7 connected with the test power supply is placed in the blowing type oven 1 with the adjustable temperature, so that the temperature stress test of the power device 8 is realized, the simultaneous test of voltage and temperature is realized, and the test efficiency is improved. And because the oven has enough large space, a large number of power devices 8 can be accommodated, and the large-scale test of the power devices is realized.
The above description is only for the preferred embodiment of the present invention, and is not intended to limit the present invention in other forms.
Claims (10)
1. The reliability test device for the power device is characterized by comprising a PCB clamp, wherein the PCB clamp is electrically connected with the power device; the test power supply is electrically connected with the PCB clamp; the upper computer controls the test power supply; the PCB plate clamp is detachably connected inside the oven, and a control panel of the oven is positioned on the upper portion of the oven.
2. The device for testing reliability of power device of claim 1, wherein the PCB clamp is provided with a probe, and the probe is electrically connected to the terminal of the power device.
3. The device for testing reliability of a power device according to claim 2, wherein the power device is further connected with the PCB clamp through a plastic nut.
4. The power device reliability testing apparatus according to any one of claims 1 to 3, wherein the oven is a blower type oven.
5. The device for testing reliability of a power device according to claim 4, wherein the inner walls of the left side and the right side of the blower oven are provided with channel holes to improve the temperature rise uniformity of the blower oven.
6. The power device reliability test device according to claim 4, wherein N clamping grooves are formed in the inner wall of the rear portion of the blower type oven, a buckle is arranged on the PCB clamp, the PCB clamp is clamped with one clamping groove through the buckle, and therefore the PCB clamp and the blower type oven can be detachably connected, wherein N is larger than or equal to 20.
7. The device for testing the reliability of the power device according to claim 6, wherein a plurality of supporting blocks are respectively installed on the inner walls of the left side and the right side of the blower type oven, and the left side and the right side of the PCB clamp are respectively placed on the supporting blocks to play a supporting role.
8. The device for testing the reliability of the power device according to claim 6, wherein 22 slots are formed on the rear inner wall of the blower oven, and the 22 slots include a first row and a second row which are parallel to each other.
9. The power device reliability test device according to claim 8, wherein a support frame is arranged in the middle of the inside of the blower type oven, 11 first support blocks are respectively installed on the left side and the right side of the support frame, second support blocks are installed on the left side and the right side of the blower type oven corresponding to the first support blocks, and the PCB clamp is supported and clamped through the clamping groove, the first support blocks and the second support blocks.
10. The power device reliability test device according to claim 1, wherein a transparent glass show window is arranged in the middle of the oven door of the oven.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202121617705.XU CN215005728U (en) | 2021-07-15 | 2021-07-15 | Power device reliability test device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202121617705.XU CN215005728U (en) | 2021-07-15 | 2021-07-15 | Power device reliability test device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN215005728U true CN215005728U (en) | 2021-12-03 |
Family
ID=79127199
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202121617705.XU Active CN215005728U (en) | 2021-07-15 | 2021-07-15 | Power device reliability test device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN215005728U (en) |
-
2021
- 2021-07-15 CN CN202121617705.XU patent/CN215005728U/en active Active
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