CN214335145U - Resource board plug-in box and analog integrated circuit test equipment - Google Patents
Resource board plug-in box and analog integrated circuit test equipment Download PDFInfo
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- CN214335145U CN214335145U CN202120199589.8U CN202120199589U CN214335145U CN 214335145 U CN214335145 U CN 214335145U CN 202120199589 U CN202120199589 U CN 202120199589U CN 214335145 U CN214335145 U CN 214335145U
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- 238000004088 simulation Methods 0.000 abstract description 3
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- 230000009286 beneficial effect Effects 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
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Abstract
A resource board plug-in box and an analog integrated circuit test device are provided, wherein the resource board plug-in box comprises a box body, a structural frame is arranged inside the box body, a slot is arranged on the inner bottom surface of the box body, a control bus interface and an output interface are arranged through the structural frame, and the control bus interface and the output interface are arranged in a layered manner from top to bottom; when the test unit is inserted, the control bus interface is inserted into the backboard through the slot, and the output interface is directly connected with the external user-defined performance board. A cable is led out of the box body corresponding to each slot and is connected with a cable interface on a unit panel of a test unit, each unit panel corresponds to one slot and one cable, and the slot positions of the slots are mutually independent. The simulation integrated circuit test equipment is provided with the resource board plug box, and the unit panel is inserted into the slot of the resource board plug box. The utility model discloses can dispose the test unit resource wantonly, promote the stability and the accuracy of test, the operation is succinct, has also reduced structural cost and equipment debugging cost, changes in the extension.
Description
Technical Field
The utility model relates to a box structure, concretely relates to resource board subrack and analog integrated circuit test equipment.
Background
Integrated circuit test equipment (ATE) is divided into digital integrated circuit test equipment, analog integrated circuit test equipment, and hybrid integrated circuit test equipment that combines the two. Most of the digital integrated circuit test equipment is integrated by the same test unit, and the interchangeability and the universality are strong. The analog integrated circuit test equipment is mostly designed to be composed of various different test units according to requirements, and the interchangeability and the universality are poor. The structure of the existing analog integrated circuit test equipment is roughly divided into the following types: 1. the control bus is internal (on the backplane), the output interface is external (on the unit panel), the test devices (test fixture and application board) are connected to each test unit through external cables, and the number of connecting cables is large and complicated. Because of the bus structure, the configuration of the test unit can be freely changed. Such as NI corporation's plug-ins and modules. When testing of other kinds of integrated circuits is required, the testing apparatus (test jig and application board) needs to be replaced with a new one, and all external cables need to be unplugged during the operation. When the test unit needs to be reconfigured, the external cable also needs to be removed to insert and extract the test unit. The replacement scheme is complicated, errors are easy to occur, and the fool-proof characteristic is not good. Such protocols are generally suitable for laboratory use, and the operator is typically an experienced technician. Operators in a mass production environment are not suitable for such operations. 2. In a further improvement, the control bus is internal (on the backplane), the output interface is internal to the machine (on the cell panel), the output cables of each cell are gathered to a fixed cross-connect (performance board), the test devices (test fixture and application board) are connected to the performance board by a single external cable, and the connection cables are grouped, so that the test fixture is suitable for operators in a large-scale production environment. Because of the bus structure, the configuration of the test unit can be freely changed, but because the cross-connection device (performance board) in the machine and the cable in the machine have fixed definitions, most of the capability of changing the configuration is lost, and the capability can be only deleted on the designed full configuration. In addition, when the test unit is plugged in and pulled out, the cable needs to be pulled out first. When the test unit is verified, the verification board needs to be completely matched with the cross connection device (performance board). When the requirement obviously inconsistent with the original configuration appears, only one machine model can be redesigned, and the verification board is redesigned at the moment. For example, the output interface of the test equipment is configured to 2 test stations, and each test station is allocated with 2 high-voltage VI sources, 2 large-current VI sources, 32 common VI sources, 4 time measurement units, and 64 switching values. This configuration can be satisfactory for testing of analog integrated circuits in general, but may be insufficient or wasteful for some analog integrated circuits with special requirements. If an integrated circuit is provided, high voltage, large current and multi-path switches are not needed during testing, and only the number of common VI sources is needed as much as possible to meet the requirements of testing multiple devices simultaneously and improving efficiency, so that a large number of interface lines are not used in the configuration of the output interface, and only 32 common VI sources can be used. 3. The control bus is arranged inside (on the back plate), the output interface is also arranged inside (on the back plate), and the external part has no interface or cable and can be directly plugged in and pulled out of the unit; the output interface is internally connected out to the cross-connect (performance board) by a well-defined cable. Because the cables are already defined, the position and configuration of the test unit cannot be freely changed. But the replacement of new test devices (test fixture and application board) is very convenient, and the verification of each test unit in the equipment is also very convenient. At present, most of analog circuit test equipment uses 2 and 3 schemes, is suitable for mass production and is easy to prevent fool. But the testing capability of the device is limited by the structure and cannot be configured and expanded arbitrarily. If the requirement obviously does not conform to the original configuration, only one machine model can be redesigned, and the verification board is redesigned. This is also the reason for the large number of models of machines available from manufacturers.
SUMMERY OF THE UTILITY MODEL
The utility model discloses aim at provides a resource board subrack and simulation integrated circuit test equipment to the problem that simulation integrated circuit test equipment can not dispose in a flexible way among the above-mentioned prior art, and all test unit can dispose wantonly and change the slot.
In order to achieve the above object, the present invention provides the following technical solutions:
a resource board plug-in box comprises a box body, wherein a structural frame is arranged inside the box body, a slot is arranged on the inner bottom surface of the box body, a control bus interface and an output interface are arranged through the structural frame, and the control bus interface and the output interface are arranged in an up-and-down layered mode; when the test unit is inserted, the control bus interface is inserted into the backboard through the slot, and the output interface is directly connected with the external user-defined performance board.
The control bus interface is arranged on the upper layer, the output interface is arranged on the lower layer, the control bus interface and the output interface are not on the same plane by taking the end face of the box body as a reference, and the output interface exceeds the control bus interface.
The testing device comprises a box body and is characterized in that a plurality of slots are formed in the bottom surface of the interior of the box body, a plurality of control bus interfaces and output interfaces which are arranged in parallel are arranged through a structural frame, and one slot corresponds to one group of corresponding testing units with one control bus interface and one output interface.
A cable is led out of the box body corresponding to each slot and is connected with a cable interface on a unit panel of a test unit, each unit panel corresponds to one slot and one cable, and slot positions of the slots are mutually independent.
The unit panel is provided with an output circuit which can be directly connected with a cable.
The analog integrated circuit test equipment is provided with the resource board plug box, and a unit panel is inserted into a slot of the resource board plug box.
The optimal scheme of the analog integrated circuit test equipment also comprises a power supply control box, an LCR meter, a power amplifier, a computer case and a tester interface board which are arranged above and below the resource board plug box in a layered mode, wherein the resource board plug box is connected with the power supply control box, the LCR meter, the power amplifier, the computer case and the tester interface board in the box.
Compared with the prior art, the utility model discloses following beneficial effect has:
1. resources of the test unit can be configured at will, and the efficiency of the test equipment can be fully exerted;
2. the output interface of the test unit has no cable, and extends out of the machine. Some resonance, interference and series resistance caused by long lines can be avoided, and the method is beneficial to the stability and accuracy of the test.
3. The unit panel of the test unit is not provided with an output interface, and can be directly plugged and unplugged after being powered off. The external user-defined performance board can also be directly plugged and replaced. The method is not interfered with each other and is simple to operate.
4. Because the output cable is not arranged in the equipment, the problems of unknown accidents and unreliability caused by the complexity of the output cable are eliminated. Meanwhile, the structure cost and the assembly and debugging cost are also reduced.
5. Since the output interface of each test cell is defined in terms of formatting, all cells can be calibrated by the same calibration box (board). There is no need to design different calibration boxes (boards) for different cross-connect arrangements (performance boards).
6. The output interface of test unit directly goes out, because the influence of no long cable, can the general digital test passageway of direct compatibility, like this the utility model discloses analog integrated circuit test equipment expands into hybrid integrated circuit test equipment very easily.
Drawings
FIG. 1 is a schematic diagram of the front side of the device for testing an analog integrated circuit of the present invention;
FIG. 2 is a schematic view of the back side of the device for testing an analog integrated circuit of the present invention;
FIG. 3 is a schematic view of a side-sectional structure of the utility model of a resource board subrack;
FIG. 4 is a schematic view of the front side of the interface layout of the resource board subrack of the present invention;
FIG. 5 is a schematic view of the back side of the interface layout of the resource board subrack of the present invention;
FIG. 6 is a schematic diagram of a conventional resource board bay;
FIG. 7 is a schematic view of a resource board box installation calibration box of the present invention;
in the drawings: 1-a box body; 2-a structural frame; 3, inserting a slot; 4-control bus interface; 5-an output interface; 6-user self-defining performance board; 7-a cell panel; 8-cable interface; 9-inserting boxes for resource boards; 10-power supply control box; 11-LCR meter; 12-a power amplifier; 13-a computer chassis; 14-tester interface board; 15-output and cable ports; 16-red meter pen jack; 17-black stylus jack; 18-USB hole; 19-control bus panel.
Detailed Description
The present invention will be described in further detail with reference to the accompanying drawings.
Referring to fig. 3-5, the utility model discloses resource board subrack includes box 1, the inside of box 1 sets up structural framework 2, the inside bottom surface of box 1 sets up slot 3, sets up control bus interface 4 and output interface 5 through structural framework 2, control bus interface 4 and output interface 5 are set up and down in layers; the control bus interface 4 is arranged on the upper layer, the output interface 5 is arranged on the lower layer, the control bus interface 4 and the output interface 5 are not on the same plane by taking the end face of the box body 1 as a reference, and the output interface 5 exceeds the control bus interface 4. When the test unit is inserted, the control bus interface 4 is inserted into the backboard through the slot 3, and the output interface 5 is directly connected with the external user-defined performance board 6. The inside bottom surface of box 1 is equipped with a plurality of slot 3, sets up control bus interface 4 and output interface 5 that a plurality of arranged side by side through structural framework 2, and a slot 3 corresponds a test unit for a set of correspondence with a control bus interface 4 and an output interface 5. A cable is led out of the box body 1 corresponding to each slot 3 and is connected with a cable interface 8 on a unit panel 7 of a test unit, each unit panel 7 corresponds to one slot 3 and one cable, and the slots of each slot 3 are mutually independent. The unit panel 7 is provided with an output circuit for direct connection with the cable.
Referring to fig. 1-2, the analog ic testing apparatus of the present invention comprises a power control box 10, an LCR meter 11, a power amplifier 12, a computer case 13, and a tester interface board 14, which are layered above and below a resource board insertion box 9. The resource board slot 9 is connected to the power control box 10, the LCR meter 11, the power amplifier 12, the computer case 13, and the tester interface board 14 inside the case 1, and the unit panel 7 is inserted into the slot 3 of the resource board slot 9.
Referring to fig. 6, the conventional resource board bay control bus is internal and the output interface is external (unit panel). The test devices (test jig and application board) are connected to the respective test units by external cables, and the number of connecting cables is large and complicated. The existing plug box structure of the resource board supplies power to the unit panel on one hand through output and cable holes on the unit panel, outputs test data to an external performance board through a cable on the other hand, and then sends the data to an upper computer. Compared with the prior art, the utility model discloses an inserting box structure, the outward appearance is a cuboid, and there is the slot bottom, and two parts about the back design score, upper strata design are control bus interface module, and lower floor's design is output interface module, and the lower floor's of upper strata is than some projections in the inner chamber, and the direct and outside user-defined performance board of lower floor's output is connected. The cable connection external performance board of the original design is optimized to be directly connected with the unit panel design output circuit, so that the interference of resonance and the like of the circuit by the original external cable is reduced, the circuit performance is optimized, and the test precision is improved. In order to plug and pull cables and replace simple unit panels, the unit panels are designed with a cable interface, cables are fixed above the plug-in box and are parallel to the slots, namely, one unit panel corresponds to one slot and one cable, each slot is independent and is free of interference, and the slots are freely switched. The unit panels can be used independently or can be configured randomly according to requirements. When the unit panel is used, a shorter side faces upwards, the metal frame faces outwards, the two hands are stably supported to be inserted into the slots, cables corresponding to the slots are connected, the knob of the metal frame is used for fixing, the door of the tester is closed, the power-on switch is pressed down, the power-on of the equipment is waited for to be completed (the indicator light is changed from red to green), and measurement is prepared.
The utility model discloses the control bus of resource board subrack is inside (on the backplate), and output interface is outside (on the output panel), does not have output interface on the unit panel. All test units can be configured and replaced with slots at will. Correspondingly, the interface on the external output panel can be correspondingly replaced. The cross-connecting device (performance board) is arranged outside the machine, can be customized according to requirements, and is simple in design. The test fixture (test fixture and application board) is connected to the cross-connect fixture (performance board) by external cables, the connection being defined as required. When it is necessary to test other kinds of integrated circuits, it is only necessary to unplug a set of external cables when it is necessary to replace the test equipment (test fixture and application board). The cross-connect (performance board) can be replaced directly when the test cell needs to be reconfigured. The replacement scheme is simple and easy, and the fool-proof characteristic is good. When the verification is needed, the cross connection device (performance board) is removed, and the calibration boxes are respectively inserted into the output interfaces of the test units, so that the verification can be carried out on each test unit.
The utility model discloses can dispose the resource of test unit wantonly, efficiency that can full play test equipment. For example, 13 slots can be provided, and 13 test units can be configured at most, and the types of the test units are 5, namely 16 common VI sources (FVI16), 2 large current VI sources (FPVI), 2 high voltage VI sources (FVI1000), 4 time measurement units (QTMU), 8 medium power VI sources (OVI), and 48 switching value drive units (CBIT). If high power devices are to be tested, each device requires 2 high current VI sources and 4 common VI sources. The structure can be used for configuring 8 groups of FPVI +4 groups of OVI +1 groups of CBIT. Thus, 8 devices can be tested in parallel. With other configurations, the standard configuration typically does not exceed 2 sets of FPVIs, thus achieving parallel testing of up to 2 devices. If the same effect is to be achieved, the machine structure needs to be redesigned. If analog devices with a large pin count are to be tested, 100 normal VI's are required for each device. The structure can be configured into 8 groups of FVI16+2 groups of OVI +1 groups of CBIT, and can reach 112 VI sources to meet the test requirement. The standard configuration of other structures can not lead out so many resources, and the machine structure needs to be redesigned to meet the requirement.
Referring to fig. 7, the utility model discloses when the resource board subrack installation calibration box, use the hardware connection of calibration box: GPIB is required to connect the multimeter to the tester for communication. The USB hole is connected with a computer through a USB cable to supply power for the calibration box. One end of the red and black meter pen is connected with the calibration box according to the color, and the other end is connected with the V/omega end of the multimeter according to the color. The calibration box is inserted in the slot of the board to be detected.
The above-described preferred embodiments of the present invention are not intended to limit the present invention, and it should be understood by those skilled in the art that the present invention can be modified and replaced by other simple modifications and replacements without departing from the spirit and principle of the present invention, and these modifications and replacements also fall within the protection scope of the appended claims.
Claims (7)
1. A resource board subrack which characterized in that: the intelligent control box comprises a box body (1), wherein a structural frame (2) is arranged in the box body (1), a slot (3) is arranged on the inner bottom surface of the box body (1), a control bus interface (4) and an output interface (5) are arranged through the structural frame (2), and the control bus interface (4) and the output interface (5) are arranged in a vertically layered manner; when the test unit is inserted, the control bus interface (4) is inserted into the backboard through the slot (3), and the output interface (5) is directly connected with the external user-defined performance board (6).
2. The resource board subrack of claim 1, wherein: the control bus interface (4) is arranged on the upper layer, the output interface (5) is arranged on the lower layer, the control bus interface (4) and the output interface (5) are not on the same plane by taking the end face of the box body (1) as a reference, and the output interface (5) exceeds the control bus interface (4).
3. The resource board subrack of claim 1, wherein: the inside bottom surface of box (1) is equipped with a plurality of slot (3), sets up control bus interface (4) and output interface (5) that a plurality of was arranged side by side through structural framework (2), and a slot (3) corresponds as a set of test unit that corresponds with a control bus interface (4) and an output interface (5).
4. The resource board subrack of claim 3, wherein: a cable is led out of each slot (3) in the box body (1) and is connected with a cable interface (8) on a unit panel (7) of one test unit, each unit panel (7) corresponds to one slot (3) and one cable, and the slots of each slot (3) are mutually independent.
5. The resource board subrack of claim 4, wherein:
and an output circuit which can be directly connected with a cable is arranged on the unit panel (7).
6. An analog integrated circuit test apparatus, characterized by: with a resource board bay (9) as claimed in any of claims 1 to 5, a unit panel (7) is inserted in a slot (3) of the resource board bay (9).
7. The analog integrated circuit test apparatus of claim 6, wherein: the tester is characterized by further comprising a power control box (10), an LCR meter (11), a power amplifier (12), a computer case (13) and a tester interface board (14) which are arranged above and below the resource board plug-in box (9) in a layered mode, wherein the resource board plug-in box (9) is connected with the power control box (10), the LCR meter (11), the power amplifier (12), the computer case (13) and the tester interface board (14) inside the box body (1).
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202120199589.8U CN214335145U (en) | 2021-01-25 | 2021-01-25 | Resource board plug-in box and analog integrated circuit test equipment |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202120199589.8U CN214335145U (en) | 2021-01-25 | 2021-01-25 | Resource board plug-in box and analog integrated circuit test equipment |
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| CN214335145U true CN214335145U (en) | 2021-10-01 |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2026081414A1 (en) * | 2024-10-15 | 2026-04-23 | 杭州高坤电子科技有限公司 | Integrated circuit test machine |
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2021
- 2021-01-25 CN CN202120199589.8U patent/CN214335145U/en active Active
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2026081414A1 (en) * | 2024-10-15 | 2026-04-23 | 杭州高坤电子科技有限公司 | Integrated circuit test machine |
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Address after: Room 401, building 2, Fengze science and Technology Park, 170 West Avenue, high tech Zone, Xi'an, Shaanxi 710000 Patentee after: Saiyinte Semiconductor Technology (Xi'an) Co.,Ltd. Address before: Room 401, building 2, Fengze science and Technology Park, 170 West Avenue, high tech Zone, Xi'an, Shaanxi 710000 Patentee before: Shaanxi Sanhai Test Technology Development Co.,Ltd. |