CN213240210U - Test fixture - Google Patents

Test fixture Download PDF

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Publication number
CN213240210U
CN213240210U CN202020695617.0U CN202020695617U CN213240210U CN 213240210 U CN213240210 U CN 213240210U CN 202020695617 U CN202020695617 U CN 202020695617U CN 213240210 U CN213240210 U CN 213240210U
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board
test
test fixture
auxiliary
connecting portion
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CN202020695617.0U
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Chinese (zh)
Inventor
谢容健
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Shenzhen Neoway Technology Co Ltd
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Shenzhen Neoway Technology Co Ltd
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Abstract

The utility model relates to a test fixture for the work piece that awaits measuring tests, test fixture includes: the body comprises a test probe which is used for abutting against the workpiece to be tested. The adapter is fixed on the body and can be electrically connected with the test probe. And the auxiliary single board is detachably connected with the adapter piece. The auxiliary single board is detachably connected with the adapter, so that the auxiliary single board can be quickly mounted and dismounted on the adapter, the effect of improving the replacement speed of the auxiliary single board is achieved, the situation that the test of the single board to be tested is delayed due to the fact that the test of the single board to be tested has long waiting time is avoided, the replacement time of the auxiliary single board is shortened as far as possible, and the working efficiency of the test fixture is improved to the maximum extent. In addition, the damage of the auxiliary single board in the binding installation and forced disassembly process can be effectively avoided, and the test cost of the test fixture can be reduced.

Description

Test fixture
Technical Field
The utility model relates to a test technical field especially relates to a test fixture.
Background
The test fixture can be used for detecting the test performance of the module or the single board, and in the process of testing workpieces to be tested such as the module or the single board, the auxiliary single board is generally required to be connected with the workpieces to be tested, moreover, the software of the workpieces to be tested may be changed, the material of the workpieces to be tested may be changed to increase or modify test items, the test fixture itself may be upgraded, and the test fixture may have hardware faults. Therefore, under the background of the above situations, the auxiliary board of the test fixture needs to be replaced, but the process of replacing the auxiliary board is complicated, which undoubtedly affects the working efficiency of the test fixture.
SUMMERY OF THE UTILITY MODEL
The utility model provides a technical problem be how to improve test fixture's work efficiency.
A test fixture for testing a workpiece to be tested, the test fixture comprising:
the body comprises a test probe, and the test probe is used for abutting against the workpiece to be tested;
the adapter is fixed on the body and can be electrically connected with the test probe; and
the auxiliary single board is detachably connected with the adaptor.
In one embodiment, the adaptor includes a first mounting plate and a first thimble, the first mounting plate has a first surface and a second surface opposite in orientation, the first surface is disposed opposite to the auxiliary single plate, the first thimble is connected with the first mounting plate and protrudes relative to the first surface, the second surface is disposed opposite to the auxiliary single plate, the second surface is provided with a jack, and the jack can be matched with the auxiliary single plate.
In one embodiment, the first thimble comprises a first connecting portion and a second connecting portion, one end of the first connecting portion is connected with the first mounting plate, the other end of the first connecting portion is connected with the second connecting portion, and the cross section of the second connecting portion gradually decreases along the direction in which the first connecting portion points to the second connecting portion.
In one embodiment, the first mounting plate is rectangular in cross-section.
In one embodiment, the auxiliary single board includes a second mounting board and a second ejector pin, the second mounting board has a third surface, the third surface is disposed toward the adaptor, the second ejector pin is connected to the second mounting board and protrudes relative to the third surface, and the second ejector pin can be inserted into the adaptor.
In one embodiment, the second thimble comprises a third connecting portion and a fourth connecting portion, one end of the third connecting portion is connected with the second mounting plate, the other end of the third connecting portion is connected with the fourth connecting portion, and the cross section of the fourth connecting portion gradually decreases along the direction in which the third connecting portion points to the fourth connecting portion.
Through the simple plug of the second thimble relative to the jack, the installation and the disassembly of the auxiliary veneer on the adaptor can be quickly realized, so that the replacement speed of the auxiliary veneer is improved, the situation that the test of the veneer to be tested is delayed due to the long waiting time is avoided, the replacement time of the auxiliary veneer is shortened as much as possible, and the working efficiency of the test fixture is improved to the maximum extent. In addition, in the process of plugging and unplugging the second thimble relative to the jack, the damage of the auxiliary single plate can be effectively avoided, so that the additional material cost caused by the damage of the auxiliary single plate is prevented, and the test cost of the test fixture can be reduced to a certain extent.
In one embodiment, the second mounting plate is rectangular in cross-section.
In one embodiment, the test probe further comprises a connecting line, one end of the connecting line is connected with the adapter, and the other end of the adapter is connected with the test probe.
In one embodiment, the connector further comprises a sleeve, and the sleeve is sleeved on the connecting wire.
In one embodiment, the connecting line comprises a copper core and an insulating layer, and the insulating layer wraps the copper core.
The copper core is used for conducting electricity so as to realize the electrical connection between the first thimble and the test probe. The insulating layer parcel is in the outside of copper core, and the insulating layer adopts the extremely low rubber materials of conductivity to make for the insulating layer plays the guard action to the copper core, prevents that the copper core from leaking electricity and causing the incident.
The sleeve has excellent wear resistance, corrosion resistance and impact resistance, and good ultraviolet resistance and light aging resistance, thereby playing a good role in protecting the connecting wire. In addition, the sleeve also has good insulativity, the possibility of electric leakage of the copper core is further prevented, and the safety of the connecting wire is higher.
The utility model discloses a technical effect of an embodiment is: the auxiliary single board is detachably connected with the adaptor, so that the binding relation between the auxiliary single board and the body is eliminated, and forced detachment and binding installation brought in the replacement process of the auxiliary single board are avoided. When the auxiliary single board needs to be replaced to meet the test requirements of different workpieces to be tested, the auxiliary single board can be quickly detached from the adapter, and a new auxiliary single board can be quickly mounted on the adapter, so that the auxiliary single board can be quickly mounted and dismounted on the adapter, the effect of improving the replacement speed of the auxiliary single board is achieved, delay caused by long-time waiting of the test of the single board to be tested is avoided, the replacement time of the auxiliary single board is shortened as much as possible, and the working efficiency of the test jig is improved to the maximum extent. In addition, the damage of the auxiliary single board in the binding installation and forced disassembly process can be effectively avoided, so that the additional material cost caused by the damage of the auxiliary single board is prevented, and the test cost of the test fixture can be reduced to a certain extent.
Drawings
Fig. 1 is a schematic partial structure diagram of a test fixture according to an embodiment;
fig. 2 is a block diagram of the connection and function between the board to be tested, the switch link and the auxiliary board.
Detailed Description
In order to facilitate understanding of the present invention, the present invention will be described more fully hereinafter with reference to the accompanying drawings. The preferred embodiments of the present invention are shown in the drawings. The invention may, however, be embodied in many different forms and should not be construed as limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete.
It will be understood that when an element is referred to as being "secured to" another element, it can be directly on the other element or intervening elements may also be present. When an element is referred to as being "connected" to another element, it can be directly connected to the other element or intervening elements may also be present. The terms "inner", "outer", "left", "right" and the like as used herein are for illustrative purposes only and do not represent the only embodiments.
Referring to fig. 1 and fig. 2, the testing apparatus 10 of the present invention is used for testing a workpiece, for example, testing the electrical performance of a module or a board. When the testing jig is used to test the single board, the single board is marked as the single board 20 to be tested.
First embodiment
Referring to fig. 1 and 2, the test fixture 10 includes a body, an adaptor 100, an auxiliary board 200, and a connection line 300. The body includes the test probe, and the test probe can the columnar structure, and when test fixture 10 tested the veneer 20 that awaits measuring, the test probe can butt each other with the veneer 20 that awaits measuring to the relevant test parameter of the veneer 20 that awaits measuring is gathered to the test probe of test fixture 10.
The adaptor 100 is fixed on the body, the adaptor 100 can be electrically connected with the test probe, the adaptor 100 comprises a first mounting plate 110 and a first thimble 120, the first mounting plate 110 has a first surface 111 and a second surface 112, and the first surface 111 and the second surface 112 are oppositely oriented. The first surface 111 may be an upper surface of the first mounting plate 110, the first surface 111 being disposed opposite to the auxiliary single plate 200; the second surface 112 may be a lower surface of the first mounting plate 110, the second surface 112 is disposed toward the auxiliary single plate 200, and the second surface 112 has a hole for matching with the auxiliary single plate 200.
The first pin 120 is substantially a cylindrical structure, the first pin 120 is connected to the first mounting plate 110, and the first pin 120 protrudes a certain height relative to the first surface 111. The first thimble 120 includes a first connection portion 121 and a second connection portion 122, one end (lower end) of the first thimble 120 is fixedly connected to the first mounting plate 110, and the other end (upper end) of the first thimble 120 is connected to the second connection portion 122, and along a direction in which the first connection portion 121 points to the second connection portion 122, that is, along a direction from bottom to top, a cross-sectional size of the second connection portion 122 gradually decreases, for example, the second connection portion 122 may have a substantially tapered structure. The cross-sectional dimension of the first connection portion 121 may be equal everywhere, and the first connection portion 121 may have a pillar-shaped structure. The first mounting plate 110 may be generally rectangular parallelepiped in configuration such that the first mounting plate 110 is rectangular in cross-section.
The auxiliary board 200 includes a second mounting board 210 and a second thimble 220, the second mounting board 210 has a third surface 211, the third surface 211 is disposed toward the first mounting board 110, that is, disposed toward the second surface 112 of the first mounting board 110, the second thimble 220 is connected to the second mounting board 210, the second thimble 220 protrudes a certain height relative to the third surface 211, the second thimble 220 can be inserted into the jack of the first mounting board 110, so that the second thimble 220 and the jack are matched with each other, thereby implementing physical connection and electrical connection between the auxiliary board 200 and the adaptor 100.
The second thimble 220 includes a third connection portion 221 and a fourth connection portion 222, one end (lower end) of the third connection portion 221 is connected to the second mounting plate 210, and the other end (upper end) of the third connection portion 221 is connected to the fourth connection portion 222, and the cross-sectional dimension of the fourth connection portion 222 gradually decreases along a direction in which the third connection portion 221 points to the fourth connection portion 222, that is, along a direction from bottom to top. For example, the fourth connection portion 222 may have a substantially conical structure. The cross-sectional dimension of the third connection portion 221 may be equal everywhere, and the third connection portion 221 may have a pillar structure. The second mounting plate 210 may be generally rectangular parallelepiped in configuration such that the second mounting plate 210 is rectangular in cross-section.
One end (lower end) of the connection line 300 is connected to the first thimble 120 of the adaptor 100, and the other end (upper end) of the connection line 300 is connected to the test probe, so as to electrically connect the first thimble 120 and the test probe. The connection line 300 includes a copper core and an insulating layer, and the copper core is used for conducting electricity to realize the electrical connection between the first thimble 120 and the test probe. The insulating layer parcel is in the outside of copper core, and for example, the insulating layer can adopt the extremely low rubber materials of conductivity to make for the insulating layer plays the guard action to the copper core, prevents that the copper core from leaking electricity and causing the incident.
In the design process of the test fixture 10, if the auxiliary board 200 is directly connected to the main body, the auxiliary board 200 and the main body form a strong binding relationship, which inevitably causes the following defects:
firstly, when the software of the board 20 to be tested is changed or upgraded, the software of the auxiliary board 200 also needs to be changed or upgraded accordingly in order to ensure the testing accuracy. Generally, when the auxiliary board 200 is fixedly connected with the main body to form a binding relationship with strong dependence, it is difficult to change or upgrade the software of the auxiliary board 200 through the upper computer while the auxiliary board 200 and the main body are not detached. In such a situation, it is inevitable to forcibly detach the original auxiliary board 200 from the main body, and then change or upgrade the software of the auxiliary board 200 and then bind and install the auxiliary board 200 with the main body again. Or, the detached auxiliary board 200 is discarded, a new auxiliary board 200 that is matched with the board 20 to be tested after the software is changed or upgraded is additionally designed, and then the new auxiliary board 200 is bound with the body in a welding connection manner and is installed and connected. Therefore, when the old auxiliary board 200 is forcibly detached from the main body, the operation process is complicated, and the auxiliary board 200 is easily damaged, so that the test of the board 20 to be tested is delayed, thereby affecting the working efficiency of the test fixture 10. Meanwhile, when the auxiliary board 200 after software change or upgrade or the newly designed auxiliary board 200 is bound with the body again, the welding connection process is also complicated, and the work efficiency of the test fixture 10 is also affected by the test delay of the board 20 to be tested.
Secondly, when the material of the board 20 to be tested is changed, or the test items need to be added and modified, or the auxiliary board 200 itself has a hardware fault, the auxiliary board 200 needs to be replaced. During replacement, the original auxiliary single board 200 is first forcibly detached from the main body, and then the new auxiliary single board 200 is bound and installed on the main body again, similarly, the forcible detachment of the auxiliary single board 200 and the binding and installation of the new auxiliary single board 200 are both cumbersome, time and labor are wasted in the forcible detachment and binding installation, which results in that the test of the single board 20 to be tested cannot be performed in time and a certain delay exists, thereby affecting the working efficiency of the test fixture 10. And when the new auxiliary veneer 200 is connected with the body by welding, the new auxiliary veneer 200 may be damaged. When the new damaged auxiliary board 200 needs to be replaced again, the testing cost of the testing fixture 10 will be undoubtedly increased, and the testing of the board 20 to be tested is further delayed, which further affects the working efficiency of the testing fixture 10.
For the test fixture 10 of this embodiment, when the software of the board 20 to be tested is changed or upgraded, the upper computer may directly change or upgrade the software of the auxiliary board 200 connected to the adaptor 100, so as to be suitable for testing the board 20 to be tested after the software is changed or upgraded. Therefore, the auxiliary board 200 does not need to be disassembled and assembled, thereby saving the workload and the working time generated by disassembling and assembling, enabling the test fixture 10 to be suitable for testing the new board 20 to be tested in a short time, and further improving the working efficiency of the test fixture 10. Of course, the second thimble 220 of the auxiliary board 200 may also be directly pulled out from the jack of the adaptor 100, and then the pulled-out auxiliary board 200 is subjected to software change or upgrade and then inserted into the adaptor 100 again. Due to the simple plugging of the second thimble 220 relative to the jack, the auxiliary board 200 can be quickly mounted and dismounted on the adaptor 100, so that the replacement speed of the auxiliary board 200 is increased, the test of the board 20 to be tested is prevented from being delayed for a long time, and the test fixture 10 is ensured to have higher working efficiency. In addition, in the process of inserting and pulling the second thimble 220 into and out of the jack, the auxiliary board 200 can be effectively prevented from being damaged.
When the material of the board 20 to be tested is changed, or the test items need to be added and modified, or the auxiliary board 200 itself has a hardware fault, the auxiliary board 200 needs to be replaced. When replacing, the second thimble 220 is firstly pulled out from the jack, so that the auxiliary single board 200 is detached from the adaptor 100, and then the second thimble 220 of the new auxiliary single board 200 is directly inserted into the jack of the adaptor 100, so that the new auxiliary single board 200 is installed on the adaptor 100 to be suitable for the test of the single board 20 to be tested again. Similarly, due to the simple insertion and extraction of the second thimble 220 with respect to the jack, the auxiliary board 200 can be quickly mounted and dismounted on the adaptor 100, so as to increase the replacement speed of the auxiliary board 200, avoid the delay of the test of the board 20 to be tested due to the long waiting time, compress the replacement time of the auxiliary board 200 as much as possible, and increase the working efficiency of the test fixture 10 to the maximum extent. In addition, in the process of inserting and pulling the second thimble 220 into and out of the jack, the auxiliary board 200 can be effectively prevented from being damaged, so that the additional material cost caused by the damage of the auxiliary board 200 can be prevented, and the testing cost of the testing fixture 10 can be reduced to a certain extent.
Therefore, the test fixture 10 of this embodiment effectively eliminates the binding relationship between the auxiliary board 200 and the main body, prevents the forced detachment and welding connection generated during the replacement of the auxiliary board 200, greatly reduces the time and difficulty of detaching the auxiliary board 200, and also reduces the damage generated during the detaching process of the auxiliary board 200. When the board 20 to be tested next time is changed, the new board 20 to be tested can be adapted by plugging and pulling the new auxiliary board 200.
For the installation of the test fixture 10, a body of the test fixture 10 is provided first, then the adaptor 100 is provided, the adaptor 100 is fixedly installed on the body, and then the second thimble 220 of the auxiliary board 200 is inserted into the jack of the first installation board 110. When testing the single board 20 to be tested, the test probe of the test fixture 10 is contacted with the test position of the single board 20 to be tested.
Second embodiment
The second embodiment is different from the first embodiment in that the test fixture 10 further includes a sleeve, that is, the test fixture 10 of the second embodiment includes a body, an adaptor 100, an auxiliary board 200, a connection line 300, and a sleeve.
The adaptor 100 is fixed on the body, the adaptor 100 can be electrically connected with the test probe, the adaptor 100 comprises a first mounting plate 110 and a first thimble 120, the first mounting plate 110 has a first surface 111 and a second surface 112, and the first surface 111 and the second surface 112 are oppositely oriented. The first surface 111 may be an upper surface of the first mounting plate 110, the first surface 111 being disposed opposite to the auxiliary single plate 200; the second surface 112 may be a lower surface of the first mounting plate 110, the second surface 112 is disposed toward the auxiliary single plate 200, and the second surface 112 has a hole for matching with the auxiliary single plate 200.
The first pin 120 is substantially a cylindrical structure, the first pin 120 is connected to the first mounting plate 110, and the first pin 120 protrudes a certain height relative to the first surface 111. The first thimble 120 includes a first connection portion 121 and a second connection portion 122, one end (lower end) of the first thimble 120 is fixedly connected to the first mounting plate 110, and the other end (upper end) of the first thimble 120 is connected to the second connection portion 122, and along a direction in which the first connection portion 121 points to the second connection portion 122, that is, along a direction from bottom to top, a cross-sectional size of the second connection portion 122 gradually decreases, for example, the second connection portion 122 may have a substantially tapered structure. The cross-sectional dimension of the first connection portion 121 may be equal everywhere, and the first connection portion 121 may have a pillar-shaped structure. The first mounting plate 110 may be generally rectangular parallelepiped in configuration such that the first mounting plate 110 is rectangular in cross-section.
The auxiliary board 200 includes a second mounting board 210 and a second thimble 220, the second mounting board 210 has a third surface 211, the third surface 211 is disposed toward the first mounting board 110, that is, disposed toward the second surface 112 of the first mounting board 110, the second thimble 220 is connected to the second mounting board 210, the second thimble 220 protrudes a certain height relative to the third surface 211, the second thimble 220 can be inserted into the jack of the first mounting board 110, so that the second thimble 220 and the jack are matched with each other, thereby implementing physical connection and electrical connection between the auxiliary board 200 and the adaptor 100.
The second thimble 220 includes a third connection portion 221 and a fourth connection portion 222, one end (lower end) of the third connection portion 221 is connected to the second mounting plate 210, and the other end (upper end) of the third connection portion 221 is connected to the fourth connection portion 222, and the cross-sectional dimension of the fourth connection portion 222 gradually decreases along a direction in which the third connection portion 221 points to the fourth connection portion 222, that is, along a direction from bottom to top. For example, the fourth connection portion 222 may have a substantially conical structure. The cross-sectional dimension of the third connection portion 221 may be equal everywhere, and the third connection portion 221 may have a pillar structure. The second mounting plate 210 may be generally rectangular parallelepiped in configuration such that the second mounting plate 210 is rectangular in cross-section.
One end (lower end) of the connection line 300 is connected to the first thimble 120 of the adaptor 100, and the other end (upper end) of the connection line 300 is connected to the test probe, so as to electrically connect the first thimble 120 and the test probe. The connection line 300 includes a copper core and an insulating layer, and the copper core is used for conducting electricity to realize the electrical connection between the first thimble 120 and the test probe. The insulating layer parcel is in the outside of copper core, and for example, the insulating layer can adopt the extremely low rubber materials of conductivity to make for the insulating layer plays the guard action to the copper core, prevents that the copper core from leaking electricity and causing the incident.
The sleeve is sleeved on the connecting line 300 and can be a heat-shrinkable sleeve which is formed by compounding a radiation cross-linked polyolefin substrate and a special sealing hot melt adhesive, and the special sealing hot melt adhesive is well bonded with the polyolefin substrate and the surface of the connecting line 300. When the heat-shrinkable tubing is installed on the fish connecting line 300, the special sealing hot melt adhesive can be heated, and under the bonding action of the special sealing hot melt adhesive, the heat-shrinkable tubing is tightly wrapped outside the connecting line 300, so that the heat-shrinkable tubing and the connecting line 300 form a firmly combined whole. The heat-shrinkable tubing has excellent wear resistance, corrosion resistance, impact resistance and good ultraviolet resistance and light aging resistance, thereby playing a good role in protecting the connecting wire 300. In addition, the heat-shrinkable tubing also has good insulativity, so that the possibility of electric leakage of the copper core is further prevented, and the safety of the connecting wire 300 is stronger.
For the installation of the test fixture 10, a body of the test fixture 10 is provided first, then the adaptor 100 is provided, the adaptor 100 is fixedly installed on the body, and then the second thimble 220 of the auxiliary board 200 is inserted into the jack of the first installation board 110. When testing the single board 20 to be tested, the test probe of the test fixture 10 is contacted with the test position of the single board 20 to be tested. When the board 20 to be tested next time is changed, the new board 20 to be tested can be adapted by plugging and pulling the new auxiliary board 200.
Similarly, similar to the first embodiment, the second thimble 220 is simply inserted into and pulled out of the jack, so that the auxiliary board 200 can be quickly mounted and dismounted on the adaptor 100, the replacement speed of the auxiliary board 200 is increased, the delay caused by the long waiting time in the test of the board 20 to be tested is avoided, the replacement time of the auxiliary board 200 is shortened as much as possible, and the working efficiency of the test fixture 10 is improved to the maximum extent. In addition, in the process of inserting and pulling the second thimble 220 into and out of the jack, the auxiliary board 200 can be effectively prevented from being damaged, so that the additional material cost caused by the damage of the auxiliary board 200 can be prevented, and the testing cost of the testing fixture 10 can be reduced to a certain extent.
The technical features of the embodiments described above may be arbitrarily combined, and for the sake of brevity, all possible combinations of the technical features in the embodiments described above are not described, but should be considered as being within the scope of the present specification as long as there is no contradiction between the combinations of the technical features.
The above-mentioned embodiments only represent some embodiments of the present invention, and the description thereof is specific and detailed, but not to be construed as limiting the scope of the present invention. It should be noted that, for those skilled in the art, without departing from the spirit of the present invention, several variations and modifications can be made, which are within the scope of the present invention. Therefore, the protection scope of the present invention should be subject to the appended claims.

Claims (10)

1. A test fixture for testing a workpiece to be tested, the test fixture comprising:
the body comprises a test probe, and the test probe is used for abutting against the workpiece to be tested;
the adapter is fixed on the body and can be electrically connected with the test probe; and
the auxiliary single board is detachably connected with the adaptor.
2. The test fixture of claim 1, wherein the adaptor includes a first mounting plate and a first thimble, the first mounting plate has a first surface and a second surface facing opposite directions, the first surface is disposed opposite to the auxiliary board, the first thimble is connected to the first mounting plate and protrudes relative to the first surface, the second surface is disposed facing the auxiliary board, and a jack is disposed on the second surface, and the jack is capable of being engaged with the auxiliary board.
3. The test fixture of claim 2, wherein the first thimble comprises a first connecting portion and a second connecting portion, one end of the first connecting portion is connected to the first mounting plate, the other end of the first connecting portion is connected to the second connecting portion, and a cross section of the second connecting portion gradually decreases in a direction in which the first connecting portion points to the second connecting portion.
4. The test fixture of claim 2, wherein the first mounting plate is rectangular in cross-section.
5. The test fixture of claim 1, wherein the auxiliary single board includes a second mounting board and a second thimble, the second mounting board has a third surface, the third surface is disposed toward the adaptor, the second thimble is connected to the second mounting board and protrudes relative to the third surface, and the second thimble is insertable into the adaptor.
6. The test fixture of claim 5, wherein the second thimble comprises a third connecting portion and a fourth connecting portion, one end of the third connecting portion is connected to the second mounting plate, and the other end of the third connecting portion is connected to the fourth connecting portion, and a cross section of the fourth connecting portion gradually decreases along a direction in which the third connecting portion points to the fourth connecting portion.
7. The test fixture of claim 5, wherein the second mounting plate is rectangular in cross-section.
8. The test fixture of claim 1, further comprising a connecting wire, wherein one end of the connecting wire is connected to the adapter, and the other end of the adapter is connected to the test probe.
9. The test fixture of claim 8, further comprising a sleeve, wherein the sleeve is sleeved on the connection line.
10. The test fixture of claim 8, wherein the connecting wires comprise a copper core and an insulating layer, and the insulating layer is wrapped outside the copper core.
CN202020695617.0U 2020-04-29 2020-04-29 Test fixture Active CN213240210U (en)

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN115389904A (en) * 2022-07-12 2022-11-25 浙江众合科技股份有限公司 Automatic testing system and method for single board of heterogeneous processor in rail transit

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN115389904A (en) * 2022-07-12 2022-11-25 浙江众合科技股份有限公司 Automatic testing system and method for single board of heterogeneous processor in rail transit

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