CN213149018U

CN213149018U - Chip testing device

Info

Publication number: CN213149018U
Application number: CN202021985250.2U
Authority: CN
Inventors: 程进
Original assignee: Suzhou Xinhai Semiconductor Technology Co ltd
Current assignee: Suzhou Xinhai Semiconductor Technology Co ltd
Priority date: 2020-09-11
Filing date: 2020-09-11
Publication date: 2021-05-07
Anticipated expiration: 2030-09-11

Abstract

The utility model discloses a chip testing device, include the base and install the test jig on the base, the base is installed out the material platform on the terminal surface of cuboid structure and one side, the test jig has seted up the waste material mouth for L type structure and side, test groove has been seted up to the upper surface of base, the inside swing joint of test groove has the elevating platform, the lifter is installed to the bottom of elevating platform, the lifter is kept away from the one end of elevating platform and is passed through elevator motor and fix inside test groove, the blown down tank has been seted up towards one side of waste material mouth to the test groove, the test groove side is equipped with the roating seat, the inside swing joint of roating seat has the rotary rod, the rotating electrical machines is installed to the bottom of rotary rod, the transmission groove has been seted up to the one end of test jig, multiunit transmission rod is installed. This chip testing arrangement, through simple structural design, promote the testing efficiency of device.

Description

Chip testing device

Technical Field

The utility model belongs to the technical field of the chip test, concretely relates to chip testing device.

Background

In the production process of the microprocessor chip, in order to ensure that each performance of the chip reaches an index, the chip needs to be tested in detail.

Currently, a common testing method is to perform testing on automatic testing equipment. During the testing process, the chip on the feeding mechanism is usually automatically obtained by the transferring device, and then the chip is placed into the testing module for testing. However, with the progress of semiconductor manufacturing process, the size and weight of the chip are smaller and lighter, the difficulty of placing the chip is greater and greater, and the chip on the feeding mechanism is prone to being placed askew, which may cause the chip to be crushed when the chip is obtained by the feeding mechanism of the transferring device.

SUMMERY OF THE UTILITY MODEL

An object of the utility model is to provide a chip testing device to solve the problem that proposes among the above-mentioned background art.

In order to achieve the above object, the utility model provides a following technical scheme: the utility model provides a chip testing device, includes the base and installs the test jig on the base, install out the material platform on the terminal surface of base for cuboid structure and one side, the test jig has seted up the waste material mouth for L type structure and side, test groove has been seted up to the upper surface of base, the inside swing joint of test groove has the elevating platform, the lifter is installed to the bottom of elevating platform, the lifter is kept away from the one end of elevating platform and is passed through elevator motor and fix inside test groove, the blown down tank has been seted up towards one side of waste material mouth to the test groove, the side of test groove is equipped with the roating seat, the inside swing joint of roating seat has the rotary rod, the rotating electrical machines is installed to the bottom of rotary rod, the transmission groove has been seted up to the one end of test jig, the.

Preferably, a movable groove is formed in the inner wall of the test groove, a push plate is movably connected inside the movable groove, and the push plate is connected with a material pushing seat arranged beside the test frame through an external push rod.

Preferably, the bilateral symmetry welding of test jig has the supporting seat, install the bracing piece on the supporting seat, the mounting hole has been seted up on the outer wall that the top of bracing piece was arc and both sides.

Preferably, transmission gears are installed at two ends of the transmission rod, and anti-slip pads are installed on the outer wall of the transmission rod.

Preferably, the inner wall of the transmission groove is symmetrically provided with transmission grooves, a chain movably connected with the transmission gear is arranged inside the transmission grooves, and one end, away from the transmission gear, of the chain is provided with a transmission gear.

Preferably, the waste port is connected with a transmission device arranged inside the base, and the transmission device is communicated with the discharging table.

The utility model discloses a technological effect and advantage: according to the chip testing device, the conveying groove and the discharging groove are formed in the testing frame, so that chips can be conveniently classified when the device is used for testing, and the testing efficiency of the device is improved; the lifting rod is arranged in the test slot, so that the device can fix the chip when in use, and is convenient for operators to use; through setting up the roating seat and transmitting the cooperation of pole, with qualified chip transmission play the device, promote the transmission efficiency of the device. This chip testing arrangement, through simple structural design, promote the testing efficiency of device.

Drawings

Fig. 1 is a schematic structural view of the present invention;

FIG. 2 is a cross-sectional view of the test jig of the present invention;

fig. 3 is a cross-sectional view taken at a in fig. 1 according to the present invention.

In the figure: the device comprises a base 1, a 10 transmission gear, a 100 transmission groove, a 101 discharging platform, a 102 waste opening, a 103 testing frame, a 104 pushing seat, a 105 transmission groove, a 106 transmission rod, a 107 discharging groove, a 108 testing groove, a 109 supporting seat, an 11 rotating seat, a 110 mounting hole, a 112 supporting rod, a 113 rotating motor, a 114 rotating rod, a 115 lifting motor, a 116 lifting rod, a 117 lifting platform, a 118 pushing plate, a 119 transmission gear and a 120 chain.

Detailed Description

The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.

The utility model provides a chip testing device as shown in fig. 1-3, which comprises a base 1 and a testing frame 103 arranged on the base 1, wherein the base 1 is of a cuboid structure, a material discharging platform 101 is arranged on the end surface of one side of the base 1, the testing frame 103 is of an L-shaped structure, a waste material port 102 is arranged at the side of the testing frame, unqualified chips are conveyed out of the device through the waste material port 102, a testing groove 108 is arranged on the upper surface of the base 1, the inside of the testing groove 108 is movably connected with an elevating platform 117, an elevating rod 116 is arranged at the bottom of the elevating platform 117, one end of the elevating rod 116 far away from the elevating platform 117 is fixed inside the testing groove 108 through an elevating motor 115 (the elevating motor 115 can be selected but is not limited to a brushless motor), power is provided for the elevating platform 117 through the elevating motor 115, a material discharging groove 107, the side of test groove 108 is equipped with roating seat 11, the inside swing joint of roating seat 11 has rotary rod 114, rotating electrical machines 113 is installed to the bottom of rotary rod 114, transmission slot 105 has been seted up to the one end of test jig 103, multiunit transmission pole 106 is installed to transmission slot 105's inside equidistant, transmits qualified chip out the device through setting up transmission slot 105.

Specifically, a movable groove is formed in the inner wall of the test groove 108, a push plate 118 is movably connected inside the movable groove, the push plate 118 is connected with a material pushing seat 104 arranged beside the test frame 103 through an external push rod, and power is provided for the push plate 118 through the material pushing seat 104.

Specifically, the bilateral symmetry welding of test jig 103 has supporting seat 109, install bracing piece 112 on the supporting seat 109, the mounting hole 110 has been seted up for on the outer wall of arc and both sides at the top of bracing piece 112, through set up mounting hole 110 on bracing piece 112, is convenient for fix external feeding device on the device.

Specifically, the two ends of the transmission rod 106 are provided with the transmission gears 10, the outer wall of the transmission rod 106 is provided with the anti-slip pad, and the chips are transmitted out of the device through the transmission rod 106.

Specifically, the inner wall of the transmission groove 105 is symmetrically provided with transmission grooves 100, a chain 120 movably connected with the transmission gear 10 is arranged inside the transmission groove 100, one end of the chain 120, which is far away from the transmission gear 10, is provided with a transmission gear 119, the transmission gear 119 is connected with a driving motor (the driving motor can be selected, but is not limited to, a permanent magnet synchronous motor) arranged inside the test frame 103, and power is transmitted to the transmission rod 106 through the transmission gear 119.

Specifically, the waste port 102 is connected to a transmission device (the transmission device may be selected from but not limited to a belt conveyor) disposed inside the base 1, and the transmission device is communicated with the discharge table 101, and the unqualified chips are transmitted out of the device by setting the transmission device and the discharge table 101.

The working principle is as follows: this chip testing device, the chip that will need to detect is transmitted to test groove 108 inside through external feeding device, support the chip through setting up at the inside elevating platform 117 of test groove 108, detect the chip through external check out test set, will qualified chip follow test groove 108 inside proposition through the clamping device who sets up on rotary rod 114 when detecting qualified, transmit the chip to the external world through setting up at the inside transmission pole 106 of transmission groove 105, elevating platform 117 moves down when detecting unqualifiedly, push away unqualified chip through blown down tank 107 through the push pedal 118 of setting on test groove 108 inner wall, fall into inside waste material mouth 102, transmit unqualified chip to the external world through transmission device. The rotating motor 113 and the lifting motor 115 which are included in the device are both in the prior art and are electrically connected with an external main controller and 220V mains supply, and the main controller can be a computer and the like to play a role in controlling the prior art equipment. The chip testing device has the advantages of reasonable design, simple structure, high practicability and wide application.

Finally, it should be noted that: although the present invention has been described in detail with reference to the foregoing embodiments, it will be apparent to those skilled in the art that modifications and variations can be made in the embodiments or in part of the technical features of the embodiments without departing from the spirit and the scope of the invention.

Claims

1. The utility model provides a chip testing device, includes base (1) and installs test jig (103) on base (1), its characterized in that: the testing device is characterized in that the base (1) is of a cuboid structure, a discharging table (101) is installed on the end face of one side of the testing frame (103), a waste opening (102) is formed in the testing frame (103) in an L-shaped structure and is arranged beside the testing frame, a testing slot (108) is formed in the upper surface of the base (1), an elevating platform (117) is movably connected in the testing slot (108), an elevating rod (116) is installed at the bottom of the elevating platform (117), one end, far away from the elevating platform (117), of the elevating rod (116) is fixed in the testing slot (108) through an elevating motor (115), a discharging slot (107) is formed in one side, facing the waste opening (102), of the testing slot (108), a rotary seat (11) is arranged beside the testing slot (108), the rotary rod (114) is movably connected in the rotary seat (11), a rotary motor (113) is installed at the bottom of the rotary rod (, a plurality of groups of transmission rods (106) are arranged in the transmission groove (105) at equal intervals.

2. The chip testing device according to claim 1, wherein: the testing device is characterized in that a movable groove is formed in the inner wall of the testing groove (108), a push plate (118) is movably connected to the inner wall of the movable groove, and the push plate (118) is connected with a material pushing seat (104) arranged beside the testing frame (103) through an external push rod.

3. The chip testing device according to claim 1, wherein: the bilateral symmetry welding of test jig (103) has supporting seat (109), install bracing piece (112) on supporting seat (109), mounting hole (110) have been seted up on the outer wall of arc and both sides at the top of bracing piece (112).

4. The chip testing device according to claim 1, wherein: both ends of the transmission rod (106) are provided with transmission gears (10), and the outer wall of the transmission rod (106) is provided with an anti-slip pad.

5. The chip testing device according to claim 4, wherein: the transmission groove (100) is symmetrically formed in the inner wall of the transmission groove (105), a chain (120) movably connected with the transmission gear (10) is arranged inside the transmission groove (100), and a transmission gear (119) is arranged at one end, far away from the transmission gear (10), of the chain (120).

6. The chip testing device according to claim 1, wherein: the waste material opening (102) is connected with a transmission device arranged inside the base (1), and the transmission device is communicated with the discharging table (101).