CN212494002U - Pick-and-place mechanism and electronic element testing and sorting machine - Google Patents

Pick-and-place mechanism and electronic element testing and sorting machine Download PDF

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Publication number
CN212494002U
CN212494002U CN202021323910.0U CN202021323910U CN212494002U CN 212494002 U CN212494002 U CN 212494002U CN 202021323910 U CN202021323910 U CN 202021323910U CN 212494002 U CN212494002 U CN 212494002U
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pick
place
driving
feeding
tray
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CN202021323910.0U
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仇葳
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Tianjin Jinhaitong Semiconductor Equipment Co ltd
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Tianjin Jinhaitong Semiconductor Equipment Co ltd
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Abstract

The utility model provides a pick-and-place mechanism and an electronic component testing and sorting machine, which comprises a main frame, a feeding mechanism, a testing mechanism, a receiving mechanism, an automatic control device and a transportation mechanism; the feeding mechanism, the testing mechanism, the receiving mechanism and the transporting mechanism are all assembled on the main frame; the transport mechanism comprises two transfer arms and two sets of pick-and-place mechanisms. A get and put mechanism and electronic component test sorting machine, the mechanism of getting of having solved traditional electronic component test sorting machine can not satisfy the test requirement, leads to prolonging test time greatly to greatly reduced efficiency of software testing's technical problem.

Description

Pick-and-place mechanism and electronic element testing and sorting machine
Technical Field
The utility model belongs to the electronic component test field especially relates to a get and put mechanism and electronic component test sorter.
Background
Fig. 1 is a schematic structural diagram of a mainstream electronic component testing handler in the market. As shown in the figure, a feeding and receiving mechanism 01 is arranged right ahead the machine table and is composed of a plurality of feeding mechanisms and receiving mechanisms, a plurality of testing mechanisms 05 are arranged behind the machine table, each testing mechanism 05 is composed of a plurality of testing devices, and each testing device comprises a plurality of testing seats 051 and a testing circuit board 052 working in cooperation with the testing seats. The center of the machine platform is provided with a pick-and-place mechanism 06 component; a Y-direction transfer arm mechanism 07 component and an X-direction transfer arm mechanism 08 component. Between test mechanism 05 and material loading and receiving agencies 01, be equipped with carrying mechanism 03, install carrier 031 on this mechanism, the design has the working hole that the interval is the same between with test seat 051 on carrier 031, for example total 4 test seats 051, test seat 051 has two in X to, X is to the interval 40mm, there are two rows in Y to, Y is to the interval 60mm, then corresponding carrier 031 also has 4 working holes, and also can have two rows in X to, X is to the interval 40mm, there are two rows in Y, Y is to the interval 60mm, it is identical completely with the distribution interval of test seat 051. An empty tray transfer mechanism 04 for transferring an empty tray to the receiving mechanism is attached to the Y-direction transfer arm.
The specific working principle of the electronic component testing and sorting machine is as follows:
the feeding and receiving mechanism 01 is provided with at least one tray 018 capable of receiving a plurality of electronic components, the tray 018 is a tray specially customized according to the receiving requirements of different electronic components, different electronic components correspond to different trays, and the distribution intervals of the cavities in each tray are different. The feeding and receiving mechanism 01 has different functions for receiving trays, for example, 011 is used for receiving a tray 018 containing a plurality of electronic components to be tested and used as a feeding mechanism to be tested; 012 for receiving a plurality of empty trays 018, which are used as empty tray receiving mechanism; 013 is used for receiving a plurality of empty trays 018 and used as an empty tray feeding mechanism; 014-. The carrying mechanism 03 is used for feeding the electronic components to be tested into the testing mechanism 05 and also for feeding the tested electronic components out of the testing mechanism 05. The transport mechanism is composed of a pick-and-place mechanism 06, a Y-direction transfer arm mechanism 07 and an X-direction transfer arm mechanism 08, as shown in fig. 2. A component 07, i.e., a Y-direction transfer arm, which is mainly responsible for Y-direction movement of the transport mechanism 06, and this mechanism is mounted on an X-direction transfer arm mechanism 08 with X-direction freedom; a component 08, i.e., an X-direction transfer arm, mainly responsible for the X-direction movement of the Y-direction transfer arm mechanism 07; the part 06, i.e. pick and place mechanism, is provided with a plurality of pick and place mechanisms with variable spacing in the Y direction for picking and placing the electronic components to be tested and the tested electronic components, and the part 06 is mounted on the part 07 with the degree of freedom in the X-Y-Z direction. Because the electronic components are various, each electronic component corresponds to a unique tray 018, the test seats 051 and the test circuit boards 052 are specially customized for different electronic components and different test methods, and particularly the intervals between the plurality of test seats 051 are various, so that the intervals between the electronic components in the tray 018 and the intervals between the plurality of test seats 051 are often different, and if one-time picking and placing work is required, picking and placing work between the electronic components and the plurality of test seats 051 is finished by using a picking and placing mechanism with variable intervals in the X-Y direction.
The pick-and-place mechanism 06 has two main tasks, the first is to send the electronic components to be tested in the feeding mechanism 011 to the carrying mechanism 03, and the second is to send the tested and sorted electronic components from the carrying mechanism 03 to the receiving mechanism 014-.
Please refer to fig. 3 and 4 for the pick-and-place mechanism 06. The pick-and-place mechanism 06 is mainly composed of three parts, namely a Y-direction fixed pick-and-place mechanism 061, a Y-direction moving pick-and-place mechanism 062 and a Y-direction moving driving mechanism 063. The Y-direction fixed pick-and-place mechanism 061 is provided with two pick-and-place devices 061A and 061B, and further provided with two driving motors 061E and 061F. The fixed measuring driving motors 061E and 061F respectively drive the taking and placing device 061A and the taking and placing device 061B to move in the Z direction through a set of belt wheel assemblies 061D and a set of fixed measuring spline shaft assemblies 061C. The Y-direction moving pick-and-place mechanism 062 is provided with two pick-and-place devices 062A and 062B and two driving motors 062E and 062F. The driving motors 062E and 062F respectively drive the fixed first pick-and-place device 062A and the fixed second pick-and-place device 062B to perform Z-direction displacement movement through a set of belt wheel assemblies 062D and a set of spline shaft assemblies 061C. The Y-direction moving pick-and-place mechanism 062 is mounted on a slider of the Y-direction guide rail mechanism 063C, has a degree of freedom of movement in the Y-direction, and can be driven by a Y-direction driving motor 063A of the Y-direction moving driving mechanism 063 to drive a Y-direction belt component 063D to move in the Y-direction through a Y-direction belt wheel 063B, thereby adjusting the Y-direction distance between the moving pick-and-place devices 062A and 062B and the fixed pick-and-place devices 061A and 061B.
The above-mentioned conventional electronic component test handler has the following drawbacks. First, with the continuous development of electronic device testing machines, the capability of testing electronic devices is increasing every day, which requires the electronic device testing handler to test as many electronic devices as possible at the same time, thereby improving the productivity and efficiency of testing. However, the pick-and-place mechanism of the conventional electronic component testing and sorting machine has only 4 pick-and-place devices, and if the number of products to be tested exceeds 4, the test requirements can be met only by picking and placing the products for many times, but the test time is greatly prolonged, so that the test efficiency is greatly reduced. The second defect is that only the Y-direction spacing of the pick-and-place mechanism of the conventional electronic component testing and sorting machine is adjustable, the fixed pick-and-place devices 061A and 062A and the X-direction spacing of the movable pick-and-place devices 061B and 062B are constant and unchangeable, which causes that the pick-and-place devices cannot pick and place electronic components once in the tray 018 or in the carrier 031, but can pick and place the electronic components in batches for many times, thus greatly increasing the pick-and-place time, prolonging the invalid testing time, reducing the testing efficiency and finally reducing the productivity of the sorting machine.
Disclosure of Invention
In view of this, the utility model aims at providing a pick-and-place mechanism and an electronic component testing and sorting machine, which solves the technical problems that the pick-and-place mechanism of the traditional electronic component testing and sorting machine can not meet the testing requirements, which results in greatly prolonging the testing time and greatly reducing the testing efficiency;
the technical problem that the pick-and-place mechanism of the traditional electronic component testing sorting machine cannot adjust the pick-and-place device in multiple directions is further solved.
In order to achieve the above purpose, the technical scheme of the utility model is realized like this:
a pick-and-place mechanism comprises a first driving motor, a second driving motor, an X-direction spacing adjusting mechanism, a Y-direction spacing adjusting mechanism and eight driving sources capable of grabbing electronic components;
first driving motor's output with X is connected to interval guiding mechanism, two the driving source is a set of driving source, every group the driving source all sets up through a slip table subassembly X is to interval guiding mechanism is last, two of every group the driving source sets up X is to both sides around interval guiding mechanism, every group in the driving source at least one the driving source can be followed Y to the translation, every can follow Y all with the driving source of translation Y is connected to interval guiding mechanism, second driving motor's output pass through drive mechanism with Y is connected to interval guiding mechanism.
Furthermore, Y is to interval guiding mechanism including Y to drive mechanism and Y to follow-up mechanism, drive mechanism pass through Y to drive mechanism with Y is to follow-up mechanism connection, every can follow the driving source that the Y moved along all with Y is to follow-up mechanism connection.
Further, when the pick-and-place mechanism picks and places electronic components, the X-direction distance adjusting mechanism can control the four groups of driving sources to open at equal intervals, and when the pick-and-place devices of the four groups of driving sources are adjusted to the minimum distance, the distance between two adjacent groups of driving sources is zero.
Furthermore, the X-direction distance adjusting mechanism comprises a support structure, a rotating shaft, two first gears and two second gears, one of the first gears and one of the second gears are both mounted on an output shaft of the X-direction driving motor, the other of the first gears and the other of the second gears are both mounted on the rotating shaft, one of the first gears is connected with the other of the first gears through a first synchronous belt, one of the second gears is connected with the other of the second gears through a second synchronous belt, the rotating shaft is connected with the support structure, and the section radius of the first gears is twice that of the second gears;
the four driving sources are a first group of driving sources, a second group of driving sources, a third group of driving sources and a fourth group of driving sources in sequence from left to right, the first group of driving sources can be connected with the lower side of a first synchronous belt through a sliding table assembly capable of doing linear motion in the X-Y direction, the second group of driving sources can be connected with the lower side of a second synchronous belt through a sliding table assembly capable of doing linear motion in the X-Y direction, the third group of driving sources can be connected with the support structure through a sliding table assembly capable of doing linear motion in the Y direction, and the fourth group of driving sources can be connected with the upper side of the second synchronous belt through a sliding table assembly capable of doing linear motion in the X-Y direction.
Further, can include first Y to guide rail, first Y to slider, can be connected with the driving source the mounting panel and can be connected with the driving source the first installation base at X-Y to the slip table subassembly that is linear motion, be equipped with the locking device that can be connected with the hold-in range on the first installation base, first Y is to the guide rail setting and is in the one end tip of mounting panel, first Y to the guide rail with first Y is to slider sliding connection, first Y to the slider with the connection can be dismantled to first installation base, first Y to the slider through a follower with Y is connected to follower.
Further, can include second Y to guide rail, second Y to slider, second installation base and two fixed bases in Y to the slip table subassembly that is linear motion, two fixed base symmetry sets up, one fixed base can with the driving source is connected, second Y to guide rail and another fixed base connects, second Y to the guide rail with second Y is to slider sliding connection, second installation base with second Y can dismantle the connection to the slider, second installation base can be connected with the driving source, second Y to slider and second installation base all with Y can dismantle the connection to the follow-up mechanism.
Furthermore, Y is to servo mechanism includes two deflectors that set up side by side, each servo device all sets up two between the deflector, second Y is to slider and second installation base all with two the deflector can dismantle the connection.
Further, the follower device is a follower wheel mechanism for a driving source.
Further, still include interval guiding mechanism base plate, be equipped with two X that set up side by side on the interval guiding mechanism base plate to the guide rail, each X is to being equipped with three X to the slider on the guide rail, X all is connected with the mounting panel of a slip table subassembly that can be at X-Y to being linear motion to each X to the slider of guide rail.
Furthermore, the two fixing bases are symmetrically arranged on the distance adjusting mechanism substrate in a front-back manner.
Furthermore, Y is to drive mechanism including ball, ball nut and location base, the location base sets up on the interval guiding mechanism base plate, ball passes the location base, ball nut with ball is connected, ball nut with Y is to follow-up mechanism connects, ball with drive mechanism connects.
Furthermore, the Y-direction transmission mechanism further comprises a Y-direction linear guide rail mechanism, the Y-direction linear guide rail mechanism comprises a third Y-direction guide rail and a third Y-direction sliding block, the third Y-direction guide rail is arranged on the distance adjusting mechanism substrate, the third Y-direction sliding block is arranged on the third Y-direction guide rail in a sliding mode, and the ball nut is connected with the Y-direction follow-up mechanism through the third Y-direction sliding block.
An electronic component testing and sorting machine comprises a main frame, a feeding mechanism, a testing mechanism, a receiving mechanism, an automatic control device and a conveying mechanism;
the feeding mechanism, the testing mechanism, the receiving mechanism and the conveying mechanism are all assembled on the main rack;
the transportation mechanism comprises two transfer arms and two sets of the above pick-and-place mechanisms, one set of the pick-and-place mechanisms is a feeding pick-and-place mechanism, the other set of the pick-and-place mechanisms is a receiving pick-and-place mechanism, the feeding pick-and-place mechanism is arranged on one transfer arm, the receiving pick-and-place mechanism is arranged on the other transfer arm, when the test sorting machine tests the electronic elements, the feeding pick-and-place mechanism can grab one or more electronic elements on the feeding mechanism at one time, then one or more electronic elements are placed in the test seats of the test mechanism at the same time, and the receiving pick-and-place mechanism can grab the tested electronic elements in one or more test seats on the test mechanism at one time, and then place one or more electronic elements in the receiving mechanism at the same time;
the automatic control device can control the feeding mechanism to feed materials, the automatic control device can control the material receiving mechanism to receive materials, the automatic control device can control the testing mechanism to test the materials, the automatic control device can control the two transfer arms to perform transfer movement, and the automatic control device can control the feeding taking and placing mechanism and the material receiving taking and placing mechanism to perform taking and placing movement.
Further, the feeding mechanism is a material tray feeding mechanism, the material tray feeding mechanism comprises an electronic component feeding mechanism to be tested, an empty tray discharging mechanism and an empty tray conveying mechanism, when the tray of the electronic component feeding mechanism to be tested is an empty tray, the empty tray conveying mechanism conveys the empty tray to the empty tray discharging mechanism, and the material receiving mechanism is an automatic material receiving mechanism.
Further, receiving agencies has surveyed electronic component receiving mechanism including empty tray income set mechanism and three tray formula, and is three electronic component receiving mechanism has been surveyed to the tray formula has all been installed on the main frame, empty tray income set mechanism can pass through empty tray transport mechanism has surveyed empty tray of electronic component receiving mechanism conveying to any tray formula, when any tray formula has surveyed when having surveyed the tray on the electronic component receiving mechanism and filled with electronic component, empty tray transport mechanism shifts out the tray that has filled with, then empty tray transport mechanism mends an empty tray back to the position of former tray.
Compared with the prior art, a get and put mechanism and electronic component test sorter have following advantage:
the utility model discloses a pick-and-place mechanism and electronic component test sorting machine, through increasing the pick-and-place device quantity in the pick-and-place mechanism, can pick and place more electronic components once like this; the pick-and-place mechanism is a novel spacing adjustment mechanism, and particularly, an X-direction spacing adjustment mechanism is additionally arranged, so that the pick-and-place mechanism has adjustment capability in two X-Y directions, and also has the capability, and simultaneously creates a spacing adjustment range as large as possible, and can only correspond to various spacings of a tray 018 and a carrier 031. Finally, the mechanism can be synchronously taken and placed at one time, so that the taking and placing efficiency is improved, the testing and sorting efficiency is improved, and the testing capacity of the machine is greatly improved.
Drawings
The accompanying drawings, which form a part hereof, are included to provide a further understanding of the invention, and are incorporated in and constitute a part of this specification, illustrate embodiments of the invention and together with the description serve to explain the invention without undue limitation. In the drawings:
FIG. 1 is a schematic diagram of a commercially available mainstream electronic component test handler configuration;
FIG. 2 is a schematic view of a conveyor assembly of a commercially available mainstream electronic component testing handler;
TI in FIG. 3 is a front view of the pick and place mechanism assembly of a commercially available mainstream electronic component test handler;
t2 in FIG. 3 is a side view of a pick and place mechanism assembly of a commercially available mainstream electronic component testing handler;
FIG. 4 is a detailed exploded view of the pick and place mechanism of the mainstream electronic component testing and sorting machine on the market
Fig. 5 is a schematic view (one) of an electronic component testing and sorting machine according to an embodiment of the present invention;
fig. 6 is a schematic configuration diagram (one) of a feeding pick-and-place mechanism according to an embodiment of the present invention;
fig. 7 is a schematic configuration diagram (ii) of the feeding pick-and-place mechanism according to the embodiment of the present invention;
fig. 8 is a top sectional view of the feeding pick-and-place mechanism according to the embodiment of the present invention;
fig. 9 is a front sectional view of the feeding pick-and-place mechanism according to the embodiment of the present invention;
fig. 10 is a schematic configuration diagram (iii) of a feeding pick-and-place mechanism according to an embodiment of the present invention;
t3 in fig. 11 is a schematic view showing the Y-direction spacing adjustment mechanism of the feeding pick-and-place mechanism according to the embodiment of the present invention;
t4 in FIG. 11. the embodiment of the present invention provides a closed schematic view of Y-direction spacing adjustment mechanism for feeding pick-and-place mechanism
Fig. 12 is a schematic view of a feeding pick-and-place mechanism X-direction spacing adjustment mechanism according to an embodiment of the present invention shown in T5;
t6 in FIG. 12 for opening and closing the feeding mechanism X to the distance adjusting mechanism
T7 in fig. 13 is a feeding pick and place mechanism according to an embodiment of the present invention;
t8 in fig. 13 is a material collecting and placing mechanism according to an embodiment of the present invention;
fig. 14 is a schematic configuration diagram (iv) of the feeding pick-and-place mechanism according to the embodiment of the present invention;
fig. 15 is a schematic bottom view of the embodiment of the present invention when the distance between the feeding pick-and-place mechanisms is adjusted simultaneously;
fig. 16 is a schematic configuration diagram (v) of the feeding pick-and-place mechanism according to the embodiment of the present invention;
fig. 17 is a schematic view of an electronic component testing handler configuration according to an embodiment of the present invention (ii);
fig. 18 is a schematic view (three) of an electronic component testing and sorting machine according to an embodiment of the present invention;
fig. 19 is a schematic view (four) of an electronic component testing and sorting machine according to an embodiment of the present invention;
fig. 20 is a schematic view (five) of an electronic component testing and sorting machine according to an embodiment of the present invention;
fig. 21 is a schematic view (six) of an electronic component testing and sorting machine according to an embodiment of the present invention;
fig. 22 is a schematic view (seven) of an electronic component testing and sorting machine according to an embodiment of the present invention;
fig. 23 is a schematic view (eight) of an electronic component testing and sorting machine according to an embodiment of the present invention;
fig. 24 is a schematic view (nine) of an electronic component testing and sorting machine according to an embodiment of the present invention;
fig. 25 is a schematic view (ten) of an electronic component testing and sorting machine according to an embodiment of the present invention;
fig. 26 is a schematic view (eleven) of an electronic component test handler according to an embodiment of the present invention;
t9 in fig. 27 is a front view of a feeding pick-and-place mechanism according to an embodiment of the present invention;
t10 in fig. 27 is a side view of a feeding pick-and-place mechanism according to an embodiment of the present invention;
t11 in fig. 27 is a top view of a feeding pick-and-place mechanism according to an embodiment of the present invention;
t12 in fig. 27 is a perspective view of a feeding pick-and-place mechanism according to an embodiment of the present invention;
fig. 28 is a schematic view of a partial structure of a pick and place mechanism according to an embodiment of the present invention.
Description of reference numerals:
technical description relating to the market: a feeding and receiving mechanism-01; electronic component feed mechanism-011 to be measured; empty tray storage means-012; an empty tray putting mechanism-013; a tray type tested electronic component accommodating mechanism I-014; a tray type tested electronic element accommodating mechanism II-015; a tray type tested electronic component containing mechanism III-016; tray type tested electronic component receiving mechanism IV-017; tray-018; front side display-021; a rear display-022; carrying mechanism-03; a carrier-031; an empty tray transfer mechanism 04; testing mechanism-05; test seat-051; test circuit board-052; pick and place mechanism-06; a Y-direction fixed taking and placing mechanism-061; a first pick-and-place device-061A is fixed and measured; a second pick-and-place device-061B is fixed and measured; fixing a spline shaft measuring assembly-061C; a fixed measuring pulley assembly-061D; fixing and measuring a first driving motor-061E; fixing and measuring a second driving motor-061F; the Y-direction moving pick-and-place mechanism 062; mobile measuring and fetching device-062A; mobile measuring and fetching device-062B; moving the spline shaft measuring component-062C; moving the pulley assembly-062D; moving a first drive motor-062E; moving a second drive motor-062F; a Y-direction movement drive mechanism-063; y-direction drive motor-063A; y-direction pulley-063B; y-direction guide rail mechanism-063C; y-direction belt assembly-063D; y-direction transfer arm mechanism-07; x-direction transfer arm mechanism-08.
Description of the related art to the invention: receiving an electronic component tray-901 to be tested; accommodating a tray accommodating hole-901A for accommodating an electronic element to be tested; a tray-902 for receiving the tested electronic components; a tray accommodating hole-902A for accommodating the tested electronic element; electronic component feed mechanism-911 to be tested; empty tray discharge mechanism-912; an empty tray loading mechanism-913; tray type tested electronic component receiving mechanism one-914; a second tray type tested electronic component accommodating mechanism-915; tray type tested electronic component receiving mechanism three-916; tray type tested electronic component receiving mechanism four-917; tray type tested electronic component containing mechanism five-918; a tray type tested electronic component accommodating mechanism six-919; front side display-921; a rear display-922; a precooling/preheating mechanism I-931; a second precooling/preheating mechanism 932; feeding a rotating table-933; a material receiving rotary table-934; an empty tray transport mechanism-940; test mechanism-950; a test position Y-direction driving arm-951; a first driving arm-952 in the Z direction of the test position; a pick-and-place device-952A of the first driving arm in the test position Z direction; a second driving arm-953 in the Z direction of the test position; a pick-and-place device-953A of a second driving arm in the Z direction of the test position; the test position X is towards a first driving arm-954; a carrier-954A is fed into the first driving arm from the test position X; the test position X discharges a carrier-954B to the first driving arm; test position X is towards second driving arm-955; the test position X feeds a carrier-955A to the second driving arm; the test position X discharges a carrier-955B towards the second driving arm; a pan feeding pick-and-place mechanism-960; a first Z-direction drive source-960A; a second Z-direction drive source-960B; a third Z-direction drive source-960C; a fourth Z-direction drive source-960D; a fifth Z-direction drive source-960E; a sixth Z-direction drive source-960F; a seventh Z-direction drive source-960G; an eighth Z-direction drive source-960H; a first Z-direction motor-961A; a second Z-direction motor-961B; a third Z-direction motor-961C; a fourth Z-direction motor-961D; a fifth Z-direction motor-961E; a sixth Z-direction motor-961F; seventh Z motor-961G; an eighth Z-direction motor-961H; a first Z-direction transmission assembly-962A; a second Z-drive assembly-962B; a third Z-direction transmission assembly-962C; a fourth Z-direction transmission assembly-962D; a fifth Z-direction transmission assembly-962E; a sixth Z-direction transmission assembly-962F; a seventh Z-direction transmission assembly-962G; an eighth Z-direction transmission assembly-962H; a first pick-and-place device-963A; a second pick-and-place device-963B; a third pick-and-place device-963C; a fourth pick-and-place device-963D; a fifth pick-and-place device-963E; a sixth pick-and-place device-963F; a seventh pick-and-place device-963G; an eighth pick-and-place device-963H; x-axis motor-964A; y-axis motor-964B; spacing adjustment mechanism base plate-964C; a Y-direction driving source-965; y-axis pulley assembly-965A; y-axis ball screw mechanism-965B; a Y-axis linear guide mechanism-965C; y-direction follower rod mechanism-965D; a first X-guide rail mechanism 966A; a first slider 966a1 on the first X-guide rail; a second slider 966a2 on the first X-guide rail; a third slider 966a3 on the first X-guide rail; a second X-direction rail mechanism 966B; a first slider 966B1 on the second X-guide rail; a second slider 966B2 on the second X-guide rail; a third slider 966B3 on the second X-guide rail; a fifth drive source Y-guide rail assembly-966E; a sixth drive source Y-guide rail assembly-966F; a seventh drive source Y-guide rail assembly-966G; an eighth drive source Y-guide rail assembly-966H; a first X-Y directional sliding table mechanism-967A; a second X-Y directional sliding table mechanism-967B; a third X-Y directional sliding table mechanism-967C; a fourth X-Y directional sliding table mechanism-967D; a fifth driving source follower wheel mechanism-967E; a fifth drive source follower wheel mechanism 967F; an eighth follower wheel mechanism-967H for a drive source; x-direction large pulley assembly-968A; x-direction small pulley component-968B; a material receiving and placing mechanism-970; a feeding Y-direction transfer arm-981; a feeding X-direction transfer arm-982; a material receiving Y-direction transfer arm-983; a material receiving X-direction transfer arm-984; test device-990; test seat-991, test board-992.
Detailed Description
It should be noted that, in the present invention, the embodiments and features of the embodiments may be combined with each other without conflict.
In the description of the present invention, it is to be understood that the terms "center", "longitudinal", "lateral", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", and the like, indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings, and are used merely for convenience of description and for simplicity of description, and do not indicate or imply that the device or element being referred to must have a particular orientation, be constructed and operated in a particular orientation, and therefore, should not be construed as limiting the present invention. Furthermore, the terms "first", "second", etc. are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first," "second," etc. may explicitly or implicitly include one or more of that feature. In the description of the present invention, "a plurality" means two or more unless otherwise specified.
In the description of the present invention, it is to be noted that, unless otherwise explicitly specified or limited, the terms "mounted," "connected," and "connected" are to be construed broadly, and may be, for example, fixedly connected, detachably connected, or integrally connected; can be mechanically or electrically connected; they may be connected directly or indirectly through intervening media, or they may be interconnected between two elements. The specific meaning of the above terms in the present invention can be understood by those of ordinary skill in the art through specific situations.
The present invention will be described in detail below with reference to the accompanying drawings in conjunction with embodiments.
A pick-and-place mechanism comprises a first driving motor, a second driving motor, an X-direction spacing adjusting mechanism, a Y-direction spacing adjusting mechanism and eight driving sources capable of grabbing electronic components;
the output of first driving motor is connected to interval guiding mechanism with X, two driving sources are a set of driving source, every driving source of group all sets up on X is to interval guiding mechanism through a slip table subassembly, two driving source settings of every group are in X both sides around to interval guiding mechanism, at least one driving source can be followed Y in every driving source of group to the translation, every driving source that can follow Y to the translation all is connected to interval guiding mechanism with Y, second driving motor's output passes through the band pulley structure and is connected to interval guiding mechanism with Y.
The distance adjusting mechanism base plate is provided with two X-direction guide rails which are arranged in parallel, each X-direction guide rail is provided with three X-direction sliding blocks in a pair mode, and each X-direction sliding block of each X-direction guide rail is connected with a mounting plate of a sliding table assembly capable of doing linear motion in the X-Y direction.
In this embodiment, Y is to interval guiding mechanism including Y to drive mechanism and Y to follow-up mechanism, the band pulley structure passes through Y to drive mechanism and Y to be connected to follow-up mechanism, every can follow Y all to be connected to follow-up mechanism with Y to the driving source of translation, Y is to drive mechanism including ball, ball nut and location base, the location base sets up on interval guiding mechanism base plate, ball passes the location base, ball nut and ball are connected, ball nut and Y are connected to follow-up mechanism, ball is connected with drive mechanism. The Y-direction transmission mechanism further comprises a Y-direction linear guide rail mechanism, the Y-direction linear guide rail mechanism comprises a third Y-direction guide rail and a third Y-direction sliding block, the third Y-direction guide rail is arranged on the distance adjusting mechanism substrate, the third Y-direction sliding block is arranged on the third Y-direction guide rail in a sliding mode, and the ball nut is connected with the Y-direction follow-up mechanism through the third Y-direction sliding block.
In this embodiment, the X-direction distance adjusting mechanism includes a support structure, a rotating shaft, two first gears and two second gears, one first gear and one second gear are both mounted on an output shaft of the X-direction driving motor, the other first gear and the other second gear are both mounted on the rotating shaft, one first gear is connected to the other first gear through a first synchronous belt, one second gear is connected to the other second gear through a second synchronous belt, the rotating shaft is connected to the support structure, and the section radius of the first gear is twice the section radius of the second gear;
the four groups of driving sources are a first group of driving sources, a second group of driving sources, a third group of driving sources and a fourth group of driving sources from left to right in sequence, the first group of driving sources are connected with the lower side of a first synchronous belt through a sliding table assembly capable of performing linear motion in the X-Y direction, the second group of driving sources are connected with the lower side of a second synchronous belt through a sliding table assembly capable of performing linear motion in the X-Y direction, the third group of driving sources are connected with a support structure through a sliding table assembly capable of performing linear motion in the Y direction, and the fourth group of driving sources are connected with the upper side of the second synchronous belt through a sliding table assembly capable of performing linear motion in the X-Y direction.
When the pick-and-place mechanism picks and places electronic components, the X-direction distance adjusting mechanism can control the four groups of driving sources to open at equal intervals, when the pick-and-place device of the four groups of driving sources is adjusted to the minimum distance, lifting motors of the four groups of driving sources do not interfere with each other, the distance between two adjacent groups of driving sources is zero, the lifting motor of the first group of driving sources and the lifting motor of the third group of driving sources are positioned on a first plane, the lifting motor of the second group of driving sources and the lifting motor of the fourth group of driving sources are positioned on a second plane, the first plane is higher than or lower than the second plane, and the feeding pick-and-place mechanism and the receiving.
Can be at X-Y to being linear motion's slip table subassembly including first Y to the guide rail, first Y to the slider, can be connected with the driving source the mounting panel and can be connected with the driving source first installation base, be equipped with the locking device that can be connected with the hold-in range on the first installation base, first Y is to the one end tip of guide rail setting at the mounting panel, first Y is to guide rail and first Y to slider sliding connection, first Y passes through bolted connection to slider and first installation base, first Y is to the slider through a servo device and Y to follow-up mechanism connection.
Can be in Y to being linear motion's slip table subassembly include second Y to the guide rail, second Y is to the slider, second installation base and two fixed bases, symmetry sets up around two fixed bases, a fixed base can be connected with the driving source, second Y is to guide rail and another fixed base connection, second Y is to guide rail and second Y to slider sliding connection, second installation base passes through bolted connection with second Y to the slider, second installation base can be connected with the driving source, second Y all passes through bolted connection with Y to servo mechanism to slider and second installation base, symmetry sets up on interval guiding mechanism base plate around two fixed bases.
The Y-direction follow-up mechanism comprises two guide plates which are arranged in parallel, each follow-up device is arranged between the two guide plates, the second Y-direction sliding block and the second mounting base are connected with the two guide plates through bolts, and in the embodiment, the follow-up devices are follow-up wheel mechanisms for driving sources.
In a first embodiment, an electronic component testing and sorting machine, as shown in fig. 17-26, includes a main frame, a loading mechanism, a testing mechanism, a receiving mechanism, an automatic control device, and a transporting mechanism;
the feeding mechanism, the testing mechanism, the receiving mechanism and the transporting mechanism are all assembled on the main frame;
in the embodiment, the main frame and the testing mechanism are both conventional, and the automatic control device is a central control machine;
the transport mechanism comprises two transfer arms and two sets of the above pick-and-place mechanisms, one set of the pick-and-place mechanisms is a feeding pick-and-place mechanism, the other set of the pick-and-place mechanisms is a receiving pick-and-place mechanism, the feeding pick-and-place mechanism is arranged on one transfer arm, the receiving pick-and-place mechanism is arranged on the other transfer arm, when the test sorting machine tests the electronic elements, the feeding pick-and-place mechanism can pick one or more electronic elements on the feeding mechanism at one time, then the one or more electronic elements are simultaneously placed in the test seats of the test mechanism, the receiving pick-and-place mechanism can pick the tested electronic elements in one or more test seats on the test mechanism at one time, and then the one or more electronic elements are simultaneously placed in the receiving mechanism;
the automatic control device is used for controlling the feeding mechanism to feed materials, the automatic control device is used for controlling the material receiving mechanism to receive materials, the automatic control device is used for controlling the testing mechanism to test the materials, the automatic control device is used for controlling the two transfer arms to move and carry out transfer actions, the automatic control device is used for controlling the feeding taking and placing mechanism and the material receiving taking and placing mechanism to take and place actions, and the lifting motor of each driving source is connected with the automatic control device.
The feeding mechanism is a material tray feeding mechanism, the material tray feeding mechanism comprises an electronic component feeding mechanism to be tested, an empty tray discharging mechanism and an empty tray conveying mechanism, when the tray of the electronic component feeding mechanism to be tested is an empty tray, the empty tray conveying mechanism conveys the empty tray to the empty tray discharging mechanism, and the material receiving mechanism is an automatic material pipe material receiving mechanism.
The receiving mechanism comprises an empty tray feeding mechanism and three tray type measured electronic element receiving mechanisms, wherein the three tray type measured electronic element receiving mechanisms are a tray type measured electronic element receiving mechanism I914, a tray type measured electronic element receiving mechanism II 915 and a tray type measured electronic element receiving mechanism III 916 respectively, the three tray type measured electronic element receiving mechanisms are all arranged on the main frame, the empty tray feeding mechanism can convey an empty tray to any tray type measured electronic element receiving mechanism through the empty tray conveying mechanism, when any tray type measured electronic element receiving mechanism is filled with the tray, the empty tray conveying mechanism moves out the filled tray, then the empty tray conveying mechanism feeds the empty tray back to the position of the original tray, and the main frame is also provided with the three manual tray receiving mechanisms, the three manual tray storage mechanisms are a tray type measured electronic component storage mechanism four 917, a tray type measured electronic component storage mechanism five 918, and a tray type measured electronic component storage mechanism six 919, respectively.
In the second embodiment, the difference between the present embodiment and the first embodiment is as follows: the Y-direction distance adjusting mechanism comprises a magnetic linear motor and a Y-direction follow-up mechanism, and the output end of the magnetic linear motor is connected with the Y-direction follow-up mechanism;
in the third embodiment, the difference between the present embodiment and the first embodiment is as follows: the Y-direction distance adjusting mechanism comprises a voice coil linear motor and a Y-direction follow-up mechanism, and the output end of the voice coil linear motor is connected with the Y-direction follow-up mechanism;
working mode of the example
Referring to fig. 5, the working process and mechanism devices of the feeding mechanism and the receiving mechanism of the electronic component testing and sorting machine of the present invention are as follows. On the loading side, a tray 901 containing a plurality of electronic components to be tested is sent to a working position by the electronic component loading mechanism 911 to wait for the transporting mechanism to take away the electronic components to be tested. The empty tray 901, which has picked up the electronic components to be tested, is transported to the empty tray storage mechanism 912 by the empty tray transport mechanism 940 (it should be noted here that the distribution of the positions of the accommodating holes 901A in the trays 901 of different electronic components is different due to the diversity of the electronic components, that is, the X-Y pitches of the accommodating holes 901A in the trays 901 are various). On the receiving side, the empty tray 902 on which a plurality of electronic components to be tested are placed is conveyed to the working position by the empty tray loading mechanism 913, and then conveyed to the working position of the tray-type tested electronic component accommodating mechanism one 914, the working position of the tray-type tested electronic component accommodating mechanism two 915, and the working position of the tray-type tested electronic component accommodating mechanism three 916 by the empty tray conveying mechanism 940. And when the tray 902 containing the already-loaded electronic components is automatically moved out, the empty tray transfer mechanism 940 will continue to replenish the new empty tray 902 to the corresponding working position. In addition, there are three mechanisms that can manually place the empty tray 902, namely, the tray-type measured electronic component storage mechanism four 917, the tray-type measured electronic component storage mechanism five 918, and the tray-type measured electronic component storage mechanism six 919, and when the tray 902 in the three manual storage mechanisms is full of the measured electronic components, a new empty tray 902 needs to be manually replaced (it should be noted here that the location distribution of the containing holes 902A in different electronic component trays 902 is different because of the diversity of the electronic components, and may even be different from the above-mentioned distribution of the containing holes 901A in the tray 901 of the electronic components to be measured).
Referring to fig. 5, the testing mechanism of the electronic device testing and sorting machine according to the present invention is as follows. Use the embodiment of the utility model provides an example, as shown in the figure testing arrangement 990 is provided with 8 test seat 991, is X-Y direction 4X2 arrangement (X is listed as Y to 2 rows to 4 promptly), and is provided with special survey test panel 992, can carry out 8 electronic component's test work in step, the test result passes through communication protocol and transmits for automatic control device (not mark in the picture), automatic control device redrives the transport mechanism and puts into the tray 902 of different positions respectively according to the test result to the electronic component that the corresponding test was accomplished. The utility model discloses a accredited testing organization 950 is provided with a test position Y to actuating arm 951, installs two test positions Z to the actuating arm 951 at test position Y, and test position Z is respectively to first actuating arm 952, test position Z to second actuating arm 953, and above-mentioned two Z can carry out Y-Z axial displacement motion to the actuating arm. Each test position Z-direction driving arm is provided with a plurality of test position Z taking and placing devices, namely a plurality of test position Z-direction taking and placing devices 952A of the first driving arm and a plurality of test position Z-direction taking and placing devices 953A of the second driving arm. Use the embodiment of the utility model provides an example, every Z can install 8 test position Z on the actuating arm and get and put the ware, this 8 test position Z gets and puts ware 952A and 953A's arrangement and interval and above-mentioned 8 test seat 991's arrangement and interval are identical completely, also adopt X-Y direction 4X2 arrangement (being X to 4 rows Y to 2 rows), so a plurality of test position Z get and put ware 952A and 953A adopt fixed interval structural design can satisfy the operating requirement. Take the embodiment of the present invention as an example, both sides around testing arrangement 990 are equipped with test position X to first actuating arm 954, test position X to second actuating arm 955 respectively. And a feeding carrier and a discharging carrier are arranged on each X-direction driving arm of the test position and are respectively used for loading untested electronic elements and transporting tested electronic elements out. Specifically, the carrier 954A is fed into the first driving arm at the test position X, and the carrier 954B is discharged from the test position X to the first driving arm; test site X feeds carrier 955A to the second drive arm and test site X feeds carrier 955B to the second drive arm. The arrangement and pitch of the positioning holes in the carrier are also identical to those of the 8 test sockets 991, and the arrangement of the positioning holes in the X-Y direction 4X2 (i.e., X-direction 4 rows and Y-direction 2 rows) is also adopted. Due to the design, all the X-axis carriers can be fully compatible with the pick-and-place mechanisms 952A and 953A of the first and second Z-direction driving arms of the test site, and the pick-and-place movement of the test area can be smoothly completed.
Referring to fig. 5 and 13, the transporting mechanism of the testing and sorting machine for electronic components according to the present invention is as follows. Take the embodiment of the utility model as an example, this transport mechanism divide into the regional transport mechanism of pan feeding and the regional transport mechanism of receipts material. The regional mechanism that transports of pan feeding is the same basically with the design idea of receiving the regional mechanism that transports of material, and only pan feeding is got and is put mechanism 960 and is received the material and get and put mechanism 970 and adopt the mirror image mode design, with the embodiment of the utility model provides an example to pan feeding side transports the mechanism and carries out the key explanation.
The transfer arm of the feeding area includes a feeding Y-direction transfer arm 981 and a feeding X-direction transfer arm 982, the feeding Y-direction transfer arm 981 is provided with a feeding X-direction transfer arm 982, and the feeding X-direction transfer arm 982 is provided with a feeding pick-and-place mechanism 960. The feeding pick-and-place mechanism 960 can perform an X-Y-Z axial displacement motion between a tray 901 for receiving an electronic device to be tested on the electronic device feeding mechanism 911 and a first or second driving arm feeding carrier 954A or 955A at a test site X, and then the electronic device to be tested can be carried from the tray 901 to the first or second driving arm feeding carrier 954A or 955A. The arrangement and pitch of the receiving holes 901A in the tray 901 for receiving electronic components to be tested may be different for different electronic components to be tested. The arrangement and spacing of the positioning cavities of the first or second drive arm pan feed carriers 954A, 955A may also be different due to different test schemes or test mechanisms. Therefore, if the material taking and placing mechanism 960 wants to complete the material taking and placing actions at one time, it must have the degrees of freedom in three directions of X-Y-Z, so that it can be ensured that the material taking and placing mechanism 960 takes the materials above the tray 901 at the X-Y distribution intervals of the accommodating cavities 901A in the tray 901, and when moving to the first or second driving arm above the material carrier 954A or 955A, it automatically changes to another interval consistent with the X-Y distribution intervals of the positioning cavity intervals of the material carrier 954A or 955A, and only such a material taking and placing mechanism can ensure the material taking and placing actions at one time. In addition, if the testing process includes high and low temperature testing, the electronic device to be tested needs to be heated or cooled first and then the testing is started. In this test flow, the feeding pick-and-place mechanism 960 needs to take out the electronic component to be tested from the tray 901, then put into the pre-cooling \ preheating mechanism 931 or 932, and after the pre-cooling \ preheating is completed, take out the electronic component and then send it into the feeding carrier 954A or 955A. Here, the distribution and the spacing of the positioning holes in the pre-cooling \ pre-heating mechanism 931 or 932 are different from the distribution and the spacing of the accommodating holes 901A in the tray 901 to be measured and the distribution and the spacing of the positioning holes in the feeding carriers 954A or 955A. If the one-time pick-and-place action is to be finished, a pick-and-place device with X-Y-Z degrees of freedom is required. For another example, in some test processes, the untested electronic components need to be subjected to Z-axis rotation before the test, that is, the electronic components to be tested are taken out from the tray 901 to be tested by the feeding pick-and-place mechanism 960 and then placed in the feeding rotating table 933, and after the rotation is completed, the electronic components to be tested are taken out and then placed in the first or second driving arm feeding carrier 954A or 955A. Here, the same problem is encountered, the distribution and the spacing of the positioning holes in the feeding rotary table 933 are only one, while the distribution and the spacing of the accommodating holes 901A in the tray 901 are various according to different products, and if one-time picking and placing movement is to be completed, a picking and placing device with three degrees of freedom in X-Y-Z directions is required.
Take the embodiment of the utility model as an example, receive the material regional be equipped with receive material Y to moving to carry arm 983, receive material X to moving to carry arm 984 to moving to being equipped with on receiving material Y to moving to carry arm 983, receive material X to moving to be equipped with on carrying arm 984 and receive material and get and put mechanism 970. The material receiving and placing mechanism 970 can complete the X-Y-Z axial displacement motion between the tested electronic component receiving carriers 954B and 955B and the tested electronic component receiving mechanisms (tray type tested electronic component receiving mechanism one 914, tray type tested electronic component receiving mechanism two 915, tray type tested electronic component receiving mechanism three 916, tray type tested electronic component receiving mechanism four 917, tray type tested electronic component receiving mechanism five 918 and tray type tested electronic component receiving mechanism six 955), can take out the tested electronic components from the test position X to the tested electronic component receiving mechanism (receiving mechanism one 914, receiving mechanism two 915, receiving mechanism three 916, receiving mechanism four 917, receiving mechanism five 918 and receiving mechanism six 919) and then place the tested electronic components into the tested electronic component tray 902 on the tested electronic component receiving mechanism (receiving mechanism one 914, receiving mechanism two 915, receiving mechanism three 916, receiving mechanism four 917, receiving mechanism five 918 and receiving mechanism six 919), and finishing the test and sorting of the products. Similar to the feeding area, the arrangement and pitch size of the receiving cavities 902A in the tray 902 for receiving the tested electronic components may be different for different electronic components to be tested. The positioning cavities of the X-direction first or second drive arm material receiving carriers 954B, 955B may be arranged in different ways and have different pitch sizes due to different test schemes or test mechanisms. Because of the difference between the two arrangements and the spacing, the material pick-and-place mechanism 970 has to have the freedom of X-Y-Z directions if it wants to complete the one-time material pick-and-place operation. As mentioned above, some test processes require Z-axis rotation of the tested electronic components after the test, that is, the material receiving and placing mechanism 970 takes the tested electronic components out of the material receiving carriers 954B, 955B of the first or second driving arm from X and places the tested electronic components into the material receiving rotary table 934, and after the rotation is completed, the tested electronic components are taken out of the material receiving rotary table 934 and placed into the tested electronic component accommodating mechanisms (tray type tested electronic component accommodating mechanism one 914, tray type tested electronic component accommodating mechanism two 915, tray type tested electronic component accommodating mechanism three 916, tray type tested electronic component accommodating mechanism four 917, tray type tested electronic component accommodating mechanism five 918, and tray type tested electronic component accommodating mechanism six 919). Here, the same problem is encountered, the distribution and the spacing of the positioning holes in the receiving rotary table 934 are only one, while the distribution and the spacing of the accommodating holes 902A in the tested electronic component tray 902 are various due to different products, and if one-time picking and placing motion is to be completed, a picking and placing device with three degrees of freedom in X-Y-Z directions is required.
Take the embodiment of the utility model as an example, the ware is got and put in pan feeding region and receipts material region all adopts a plurality ofly to the displacement to have X-Y to and Z gets to the material loading of degree of freedom and puts mechanism 960 and receive the material and get and put mechanism 970 to the operation requirement is got to getting of the different electronic component of better cooperation, accomplishes once getting as far as and puts, improves the product greatly and gets and put efficiency, thereby saves test time, improves efficiency of software testing.
Please refer to fig. 5, fig. 6, fig. 7, fig. 8, fig. 9, fig. 10, fig. 11, fig. 12, and fig. 13. Use the embodiment of the utility model provides an example, this transport mechanism divide into the regional transport mechanism of pan feeding and receive the material regional transport mechanism, and the regional transport mechanism of pan feeding is the same basically with the design idea of receiving the regional transport mechanism of material, uses the regional transport mechanism of pan feeding to make the detailed description as follows as the example now. The feeding area conveying mechanism is composed of a feeding Y-direction transfer arm 981, a feeding X-direction transfer arm 982 and a feeding pick-and-place mechanism 960. As described above, the feeding pick-and-place mechanism 960 is driven by the Y-direction transfer arm 981 to perform the Y-direction overall displacement motion in the feeding region, and is driven by the X-direction transfer arm 982 to perform the X-direction overall displacement motion in the feeding region. The feeding pick-and-place mechanism 960 also includes an X-direction spacing adjustment mechanism, a Y-direction spacing adjustment mechanism, and a plurality of Z-axis up-and-down movement mechanisms. Take the embodiment of the utility model as an example, pan feeding pick and place mechanism 960 is equipped with 8Z to the driving source altogether, is called first, two, three, four, five, six, seven, eight Z respectively and is 960A, 960B, 960C, 960D, 960E,960F, 960G, 960H to the driving source, wherein 960C is the benchmark driving source. In order to enable the Z-direction driving sources to have smaller spacing when the Z-direction driving sources perform X-direction closing action, the 8Z-direction driving sources adopt a high-low spacing design, so that the minimum X-direction adjustable spacing can be greatly reduced, which is to meet the current trend of miniaturization of electronic components. Wherein the first, third, fifth, seventh Z-direction drive sources, i.e., 960A, 960C, 960E, 960G, are high, and the second, fourth, sixth, eighth Z-direction drive sources, i.e., 960B, 960D, 960F, 960H, are low. The eight Z-direction driving sources include 8Z-direction driving motors 961A, 961B, 961C, 961D, 961E, 961F, 961G, and 961H, and eight Z-direction transmission assemblies 962A, 962B, 962C, 962D, 962E, 962F, 962G, and 962H, wherein the Z-direction transmission assemblies include a Z-direction linear guide, a Z-direction pulley assembly, a Z-direction displacement sensor, and the like. The eight Z-direction driving sources further include eight pick-and-place devices 963A, 963B, 963C, 963D, 963E, 963F, 963G, and 963H, respectively, wherein the 963C is a reference pick-and-place device, and the other pick-and-place devices are required to perform the distance adjustment in the X-Y direction based on the 963C. In actual work, each Z-direction driving motor drives the pick-and-place device arranged on the Z-direction transmission assembly to move up and down in a Z direction.
Please refer to fig. 5, fig. 6, fig. 7, fig. 8, fig. 9, fig. 10, fig. 11, fig. 12. Use the embodiment of the utility model provides an example, the regional transport mechanism of pan feeding in get put X in the mechanism possess a set of X axial drive source to interval guiding mechanism, it contains X axle driving motor 964A, X axle driving motor 964A is first driving motor promptly, two sets of band pulley subassemblies are X respectively to big band pulley subassembly 968A and X to little band pulley subassembly 968B, two sets of X are first X respectively to guide rail mechanism 966A and second X to guide rail mechanism 966B to linear guide mechanism. The two X-guide rails are a first X-guide rail mechanism 966A and a second X-guide rail mechanism 966B, the first X-guide rail mechanism 966A is provided with three sets of sliders, which are respectively referred to as 966A1,966A2,966A3, the second X-guide rail mechanism 966B is provided with three sets of sliders, which are respectively referred to as 966B1,966B2,966B3, and neither of the X-guide rails is shown in 966B1,966B2,966B3 in the drawings. Two groups of X-direction linear guide rails are installed in parallel to the X axis direction. The pick-and-place mechanism further comprises four groups of X-Y directional sliding table mechanisms which are respectively a first X-Y directional sliding table mechanism 967A; a second X-Y direction slide mechanism 967B; a third X-Y direction slide mechanism 967C; the fourth X-Y direction sliding table mechanism 967D, the first X-Y direction sliding table mechanism 967A, the second X-Y direction sliding table mechanism 967B, and the fourth X-Y direction sliding table mechanism 967D are all sliding table assemblies capable of making linear motion in the X-Y direction, and the third X-Y direction sliding table mechanism 967C is a sliding table assembly capable of making linear motion in the Y direction; each group of sliding tables is provided with a linear guide rail mechanism in the Y direction. Three of the slide table mechanisms are supported by the two slide blocks, a first X-Y direction slide table mechanism 967A (supported by the slide block 966A1,966B1), a second X-Y direction slide table mechanism 967B (supported by the slide block 966A2,966B2), and a fourth X-Y direction slide table mechanism 967D (supported by the slide block 966A3,966B3), and the three X-Y direction slide tables can move linearly in the X-Y direction. The third X-Y sliding table mechanism 967C is directly fixed to the spacing adjustment mechanism substrate 964C, so that the third X-Y sliding table mechanism 967C can only move in the Y direction and cannot move in the X direction. The four sets of sliding tables are respectively connected with the Z-direction driving sources to form a pick-and-place mechanism which can be changed at equal intervals, wherein the first X-Y-direction sliding table mechanism 967A is provided with a first and a fifth Z-direction driving source 960A, 960E, a Y-direction rail guide assembly 966E for the fifth driving source and a follower wheel mechanism 967E for the fifth driving source, which can enable the fifth Z-direction driving source 960E to move in the Y direction; the second X-Y slide table mechanism 967B is provided with second and sixth drive sources 960B,960F, a Y-direction rail assembly 966F for the sixth drive source and a follower wheel mechanism 967F for the sixth drive source, which allow the sixth Z-direction drive 960F to perform Y-direction movement; a seventh Z-direction drive source 960G and a Y-direction rail assembly 966G for a seventh drive source capable of Y-direction movement of the seventh Z-direction drive 960G are mounted on the third X-Y-direction slide table mechanism 967C; the fourth X-Y slide table mechanism 967D is provided with fourth and eighth drive sources 960D,960H, an eighth drive source Y-guide rail assembly 966H and an eighth drive source follower wheel mechanism 967H for allowing the eighth Z-drive 960H to move in the Y direction. The third Z-direction drive source 960C is a reference drive source, and is directly fixed to the pitch adjustment mechanism substrate 964C, and cannot move in the X-Y axial direction, but can move integrally with the pitch adjustment mechanism.
There are two sets of X axial band pulley subassemblies 968A and 968B in the X is to interval guiding mechanism, 968A band pulley subassembly includes first hold-in range and two first gears, 968B band pulley subassembly includes second hold-in range and two second gears, wherein the band pulley tooth number in 968A band pulley subassembly is the two times of the band pulley tooth number in 968B band pulley subassembly, and this kind of proportional relation can guarantee that X only needs single motor drive can output 1 times and 2 times equal proportional movement speed simultaneously to interval guiding mechanism. Taking the embodiment of the utility model as an example, the fourth X-Y is fixed at X to the belt upside of little pulley subassembly 968B to slip table mechanism 967D, the second X-Y is fixed at X to the belt downside of little pulley subassembly 968B to slip table mechanism 967B, first X-Y is fixed at X to the belt downside of big pulley subassembly 968A to slip table mechanism 967A, above-mentioned three slip tables all can carry out X-Y axial displacement, and the third X-Y is fixed directly on interval adjustment mechanism base plate 964C to slip table mechanism 967C, so the third X-Y can only be done Y to the removal to slip table mechanism 967C, can not do X to the removal. In actual operation, only the X-axis driving motor 964A needs to rotate clockwise, so that the second and sixth Z-direction driving sources 960B and 960F can move leftward at a speed twice as fast as the first and sixth Z-direction driving sources 960D and 960H, and the first and fifth Z-direction driving sources 960A and 960E can move leftward at a speed twice as fast as the second and eighth Z-direction driving sources 960D and 960H, respectively, and finally the 6 sets of Z-direction driving sources can move to open the third and seventh Z-direction driving sources 960C and 960G at equal intervals in the X-axis direction. In contrast, if the X-axis drive motor 964A is rotated counterclockwise, the second, sixth, and eighth Z-direction drive sources 960B,960F may be driven to the right at a speed twice as fast as the right, the fourth, eighth, and 960H may be driven to the left at a speed twice as fast as the first, fifth Z-direction drive sources 960A, 960E may be driven to the right at a speed twice as fast as the left, and finally 6 sets of Z-direction drive sources may be driven to perform a movement of closing at equal intervals in the X-axis direction with respect to the third, seventh Z-direction drive sources 960C, 960G. Therefore, the X-direction equidistant automatic adjustment movement of 8 groups of Z-direction driving sources can be easily completed by only one driving motor, and the movement efficiency and the stability of the pick-and-place mechanism are greatly improved.
Please refer to fig. 6, fig. 7, fig. 8, fig. 9, fig. 10, fig. 11, fig. 12. Use the embodiment of the utility model provides an example, be equipped with a set of Y in the above-mentioned interval guiding mechanism to driving source 965, it contains Y axial motor 964B, Y axial band pulley subassembly 965A, Y axial ball screw mechanism 965B, Y axial linear guide mechanism 965C, Y is to follower rod mechanism 965D etc.. In operation, a Y-axis motor 964B drives the screw of the Y-axis ball screw mechanism 965B to rotate through the Y-axis pulley assembly 965A, and the screw nut of the Y-axis ball screw mechanism 965B drives the Y-axis follower mechanism 965D mounted on the Y-axis linear guide mechanism 965C to move back and forth in the Y-direction. The follower rod mechanism 965D has one end connected to the slider of the Y-axis linear guide mechanism 965C and the other end connected to the slider of the Y-guide rail assembly 966G for the seventh driving source, and can move only in the Y direction. The slider of the Y-guide rail assembly 966G for the seventh driving source is further connected to the seventh Z-driving source 960G, i.e., the seventh Z-driving source 960G can move only in the Y-direction and the Z-direction. Still taking the Y-direction spacing adjustment mechanism as an example, for the sake of convenience of description, the driving source that can only perform the X-direction movement and the Z-direction pick-and-place movement is referred to as a Y-direction fixed driving source group, and the driving source group includes 4Z-direction driving sources (a first Z-direction driving source 960A, a second Z-direction driving source 960B, a third Z-direction driving source 960C, and a fourth Z-direction driving source 960D), and the 4Z-direction driving sources can only perform the X-direction movement and the Z-direction movement and cannot perform the Y-direction movement. In addition, the driving source capable of doing X-Y axial movement and Z-direction picking and placing movement is called as a Y-direction movable driving source group. A total of 4Z-direction drive sources (a fifth Z-direction drive source 960E, a sixth Z-direction drive source 960F, a seventh Z-direction drive source 960G, and an eighth Z-direction drive source 960H) are included. The fifth, sixth and eighth Z-direction driving sources 960E,960F and 960H are respectively connected with the fifth and sixth eighth driving source Y-guide rail assemblies 966E, 966F and 966H and the fifth and sixth eighth driving source follower wheel mechanisms 967E, 967F and 967H of the first, second and fourth X-Y-direction sliding table mechanisms 967A, 967B and 967D, so that the driving sources can move in the Z-axis direction while moving in the X-Y axis direction. Specifically, during operation, the Y-axis motor 964B can drive the screw to rotate, so as to drive the seventh Z-direction driving source 960G, the slide block of the Y-direction rail guide assembly 966G for the seventh driving source and the follower rod 965D mounted thereon to complete Y-direction movement, and the follower rod drives the fifth, sixth, and eighth Z-direction driving sources 960E,960F, 960H to perform Y-direction movement through the fifth, sixth, and eighth driving source follower wheel mechanisms 967E, 967F, 967H. Finally, the automatic adjustment of the distance between the 8 groups of Z-direction driving sources in the Y direction can be easily finished only by the forward and reverse rotation of one Y-axis motor 964B. Meanwhile, since the first, second, third, fourth, fifth, sixth, seventh, eighth pick-and-place devices 963A, 963B, 963C, 963D, 963E, 963F, 963G, and 963H are all designed to be eccentric, the minimum distance adjustable in the Y direction is greatly reduced, which is also in order to meet the current trend of miniaturization of electronic components.
To make things convenient for the patent to examine the committee right the utility model discloses a practical work flow further understands, now the utility model discloses the in-service use flow of board introduces as follows for the better understanding of patent examination committee the utility model discloses an innovation point and breakthrough point.
Referring to fig. 5, 8, 10, 14, 15, 16, and 17, after the electronic device testing handler of the present invention starts to work, the testing position X moves to the left side of the testing position, i.e. the position to be tested, toward the first and second driving arms 954 and 955, and at the same time, the 4 carriers (954A, 954B, 955A, 954B) are empty and there is no electronic device in the middle. The electronic component feeding mechanism 911 feeds the tray 901 filled with the electronic component to be tested to the position to be tested, and at the same time, the feeding Y-direction transfer arm 981 and the feeding X-direction transfer arm 982 work together to drive the feeding pick-and-place mechanism 960 to perform X-Y translation, move to the position to be picked above the tray 901 of the electronic component to be tested, and prepare to pick up the electronic component to be tested in the tray 901 of the electronic component to be tested. The picking position is an optimum picking position automatically calculated by an automatic control device based on the distribution pattern of the tray accommodating holes 901A and using the third Z-direction drive source 960C on the feeding side as a positioning reference. While the feeding pick-and-place mechanism 960 is in X-Y translational motion, the X-Y pitch adjusting mechanism thereon is driven by the automatic control device to complete X-Y pitch adjusting action, so that the first two, three, four, five, six, seven, eight Z-direction driving sources 960A, 960B, 960C, 960D, 960E,960F, 960G and 960H all move to the position which is most matched with the distribution form of the tray accommodating cavities 901A. Take the embodiment of the present invention as an example, the above-mentioned driving source needs to use the reference driving source 960C as the reference to make the closing motion in the X direction and the Y direction. In the specific working process, in the X direction, the X-axis motor 964A rotates counterclockwise to drive the belts on the X-direction large pulley assembly 968A and the X-direction small pulley assembly 968B to rotate counterclockwise, and the two belts drive the first, second, fourth, X-Y-direction sliding table mechanisms 967A, 967B, and 967D to perform the equidistant X-direction closing movement relative to the Z-direction driving sources 960C and 960G, so as to drive the two sets of Z-direction driving sources 960A, 960E,960B,960F,960D, and 960H mounted on each sliding table to perform the equidistant X-direction closing movement relative to the Z-direction driving sources 960C and 960G, and finally all the Z-direction driving sources complete the adjustment movement of the X-direction equidistant reduction. In the Y direction, Y axis motor 964B rotates counterclockwise, driving Y axis ball screw mechanism 965B to rotate counterclockwise through Y axis pulley assembly 965A, and the sliding table mounted on Y axis linear guide mechanism 965C is driven by the screw nut on the 965B to make Y direction closing motion. The Y-follower mechanism 965D has one end mounted on a slide table of the Y-axis linear guide mechanism 965C and the other end mounted on a slider of a Y-guide rail assembly 966G for a seventh driving source on a third slide table 967C, and the slider of the Y-guide rail assembly 966G for the seventh driving source is connected to the seventh Z-drive source 960G, so that the Y-follower mechanism 965D and the seventh Z-drive source 960G perform the Y-closing movement in synchronization with the lead screw nut of the Y-axis ball screw mechanism 965B. Meanwhile, the Y-direction follower rod mechanism 965D drives the Z-direction driving source to perform Y-direction closing movement on the fifth, sixth, eighth, Z-direction driving source 960E,960F, 960H by the fifth, sixth, eighth, Z-direction driving source follower wheel mechanisms 967E, 967F, 967H, respectively. Finally, the Y-axis moving driving source group, i.e. the 4Z-direction pick-and-place driving sources (the fifth Z-direction driving source 960E, the sixth Z-direction driving source 960F, the seventh Z-direction driving source 960G, and the eighth Z-direction driving source 960H) performs the Y-direction closing movement relative to the Y-axis fixed driving source group, i.e. the 4Z-direction pick-and-place driving sources (the first Z-direction driving source 960A, the second Z-direction driving source 960B, the third Z-direction driving source 960C, and the fourth Z-direction driving source 960D) to complete the adjustment movement of the pitch reduction of the Y-direction driving sources. After all the Z-direction driving sources complete the adjustment movement of the distance reduction in the X direction and the Y direction, the driving motors (961A, 961B, 961C, 961D, 961E, 961F, 961G, 961H) on each driving source (960A, 960B, 960C, 960D, 960E,960F, 960G, 960H) respectively drive eight pickers (963A, 963B, 963C, 963D, 963E, 963F, 963G, 963H) to perform Z-direction picking action through the respective Z-direction transmission assemblies (962A, 962B, 962C, 962D, 962E, 962F, 962G, 962H) to take out the unmeasured electronic components from the tray 901, so that the 8Z-direction driving sources can pick up 8 unmeasured electronic components at one time.
Referring to fig. 18, after the untested electronic components are taken out, the feeding Y-direction transfer arm 981 and the feeding X-direction transfer arm 982 work together, so that the feeding pick-and-place mechanism 960 picking up the untested electronic components moves to the next station, i.e. the test station X moves to the upper side of the feeding side of the first driving arm feeding carrier 954A or the test station X moves to the second driving arm feeding carrier 955A, in an X-Y translational manner, and the untested electronic components are ready to be placed in the feeding carriers. Meanwhile, the pitch adjusting mechanism on the feeding pick-and-place mechanism 960 also works synchronously, so that the pitch of the 8Z-direction driving sources is completely consistent with the pitch of the positioning holes of the feeding carriers 954A or 955A, and the 8Z-direction driving sources can release 8 electronic components into the positioning holes of the feeding carriers 954A or 955A at the same time. Take the embodiment of the present invention as an example, the drive source on the pan feeding pick-and-place mechanism 960 needs to make the opening movement in the X direction and the Y direction with the Z direction drive source 960C as the reference. The mode of action is the reverse of the closing motion described above. In the X direction, the X-axis motor 964A rotates clockwise to drive the belts on the X-direction large pulley assembly 968A and the X-direction small pulley assembly 968B to rotate clockwise, and the two belts drive the first, second, fourth, X-Y-direction sliding table mechanisms 967A, 967B, 967D to perform an equally spaced X-direction stretching motion with respect to the Z-direction driving sources 960C and 960G, respectively, and further drive the two sets of Z-direction driving sources 960A, 960E,960B,960F,960D,960H mounted on each sliding table to perform an equally spaced X-direction stretching motion with respect to the Z-direction driving sources 960C and 960G, and finally all the Z-direction driving sources complete an X-direction equally spaced stretching adjustment motion. Similarly, the Y-axis motor 964B rotates clockwise to finally drive the Y-follower rod mechanism 965D, the seventh Z-drive source 960G, and the fifth, eighth, Z-drive sources 960E,960F, 960H to perform Y-expanding motion. Finally, the Y-axis moving drive source group, i.e., the 4Z-direction drive sources (the fifth Z-direction drive source 960E, the sixth Z-direction drive source 960F, the seventh Z-direction drive source 960G, and the eighth Z-direction drive source 960H) are fixed relative to the Y-axis, i.e., the 4Z-direction drive sources (the first Z-direction drive source 960A, the second Z-direction drive source 960B, the third Z-direction drive source 960C, and the fourth Z-direction drive source 960D) perform Y-direction expanding movement, thereby completing the adjustment movement of expanding the distance between the Y-direction drive sources. After all the Z-direction driving sources complete the adjusting movement of the distance expansion in the X direction and the Y direction, the Z-direction driving motors (961A, 961B, 961C, 961D, 961E, 961F, 961G, 961H) on each Z-direction driving source (960A, 960B, 960C, 960D, 960E,960F, 960G, 960H) respectively drive eight pick-up devices (963A, 963B, 963C, 963D, 963E, 963F, 963G, 963H) to do Z-direction releasing actions through the respective Z-direction transmission assemblies (962A, 962B, 962C, 962E, 962F, 962G, 962H), so that 8 unmeasured electronic components are synchronously placed into 8 positioning holes of the feeding carrier 954A at one time, and the first releasing action is completed.
Referring to fig. 17, 18, and 19, after releasing the electronic component to be tested, the feeding Y-direction transfer arm 981 and the feeding X-direction transfer arm 982 work together to make the feeding pick-and-place mechanism 960 return to the upper side of the tray 901 again to start the next picking operation. The pitch adjustment mechanisms of the pan feeding pick and place mechanisms 960 are also operated in synchronization with each other to adjust the pitch of the Z-direction driving sources 960A, 960B, 960C, 960D, 960E,960F, 960G, 960H to a pitch (small pitch) suitable for the tray 901, and the pick-up and place devices 963A, 963B, 963C, 963D, 963E, 963F, 963G, 963H of the Z-direction driving sources 960A, 960B, 960E,960F, 960G, 960H perform the pick-up operation again after the pitch is adjusted to the proper position. After picking up 8 untested electronic components simultaneously at one time, the feeding pick-and-place mechanism 960 is moved to the test position X above the feeding side of the second driving arm feeding carrier 955A, and simultaneously the pitch adjustment mechanism of the feeding pick-and-place mechanism 960 is also operated simultaneously again to adjust the pitch of the Z-direction driving source picks-and-place devices 963A, 963B, 963C, 963D, 963E, 963F, 963G, 963H to the pitch (large pitch) suitable for the positioning cavity of the feeding carrier 955A. After the above operations are completed, the pick-and-place devices 963A, 963B, 963C, 963D, 963E, 963F, 963G, and 963H start releasing, and simultaneously place 8 untested electronic components into the 8 positioning holes of the second driving arm feeding carrier 955A at the testing position X at one time, thereby completing the second releasing operation.
Referring to fig. 17, 18, 19, 20, 21, and so on, the feeding pick-and-place mechanism 960 at the feeding side continuously picks up and releases untested electronic components between the tray 901 and the test site X to the first or second driving arm feeding carriers 954A, 955A according to the above beat. The Z-direction driving sources 960A, 960B, 960C, 960D, 960E,960F, 960G, 960H on the feeding pick-and-place mechanism 960 are also different in position with the same, and the spacing is changed continuously to adapt to the fastest and most efficient pick-and-place action.
Referring to fig. 18 and fig. 19, after the releasing operation of the untested electronic components is completed, the test site X moves to the right toward the first driving arm 940, the test site X carrying 8 untested electronic components is moved to the first driving arm feeding carrier 954A, the test site X moves to the test area to be taken and placed, meanwhile, the test site Y driving arm 951 drives the test site Z to the first driving arm 952, the test site Y moves to the test site X above the first driving arm feeding carrier 954A, then the test site Z completes the Z-direction picking operation to the first driving arm picking device 952A, and the test site X picks up 8 untested electronic components in the first driving arm feeding carrier 954A. After the picking action of the pick-and-place device 952A of the test position Z towards the first driving arm is completed, the test position X towards the first driving arm 954 will perform an X leftward movement action, so that the empty test position X returns to the feeding side position towards the first driving arm feeding carrier 954A, and waits for the next feeding action; the test position X at the same time moves to the area to be picked and placed in the test area to the first driving arm discharging carrier 954B, and waits for the picking and placing device 952A of the Z-direction first driving arm to pick and place the tested electronic component.
After the picking operation is completed, the test position Y-direction driving arm 951 drives the test position Z to move to the position above the test area to be picked and placed of the test position X to the second driving arm feeding carrier 955A, and after the test position X filled with the untested electronic component moves to the test area to be picked and placed of the second driving arm feeding carrier 955A, the Z-direction picking operation is completed by the pick-and-place device 953A of the second driving arm, and the next test operation is prepared in advance. Meanwhile, the test position Y-direction driving arm 951 can also drive the test position Z-direction first driving arm 952 synchronously, and after the Y-direction movement is right above the test device 990, the pick-and-place device 952A of the test position Z-direction first driving arm completes the Z-direction test action, and synchronously presses 8 untested electronic components into 8 test seats 991 to start the synchronous test. Similar to the above actions, after the pick-up action of the pick-up device 953A of the second driving arm in the test position Z is completed, the test position X moves leftward to the second driving arm 955, so that the empty test position X returns to the feeding side position to the feeding carrier 955A of the second driving arm, and waits for the next feeding action; the test site X in the same time and space moves to the area to be picked and placed in the test area toward the second driving arm discharge carrier 955B, and waits for the pick-and-place device 953A of the Z-direction second driving arm to pick and place the tested electronic component.
After the test of the above 8 electronic components is completed, the pick-and-place device 952A of the Z-direction first driving arm completes the Z-direction test action, and the tested electronic component is taken out from the 8 test seats 991, the test position Y-direction driving arm 951 synchronously drives the test position Z-direction first driving arm 952, and the test position Z-direction second driving arm 953 to move in the Y-direction. Respectively sending the test position Z to the first driving arm 952 to the upper part of a to-be-taken and placed area of a test area of a first driving arm discharging carrier 954B; test site Z is fed directly above test device 990 by second drive arm 953, which is then operated similarly to the previous operation. The pick-and-place device 952A of the Z-direction first driving arm puts the tested 8 electronic components into the X-direction first driving arm ejection-of-material carrier 954B; the pick-and-place device 953A of the second driving arm in the Z direction of the test position completes the Z direction test action, and synchronously presses 8 untested electronic components into 8 test seats 991 to continue the synchronous test. From then on, the test area is operated to start a reciprocating movement, the first drive arm and the second drive arm alternately starting a test action.
After 8 tested electronic components are placed in the X-direction first driving arm discharging carrier 954B, the test site X moves to the X-direction right towards the first driving arm 954B, the first driving arm feeding carrier 954A with untested electronic components is sent to the area to be taken and placed in the test area, meanwhile, the test site X with tested electronic components is sent to the first driving arm discharging carrier 954B to the material receiving side position, and the tested electronic components are waited to be taken away by the material receiving and placing mechanism 970.
Referring to fig. 22 and 23, the following operations are completely similar to those of the material feeding side, the material collecting/placing mechanism 970 is driven by the material Y-direction transfer arm 983 and the material X-direction transfer arm 984 to move to a position above the material receiving side of the first driving arm discharging carrier 954B at the test position X, and the Z-direction driving source of the material collecting/placing mechanism 970 automatically adjusts the distance (large distance) according to the distance between the test position X and the positioning cavity of the first driving arm discharging carrier 954B, and finally completes the picking operation. After the tested 8 electronic components are taken out from the positioning holes of the first driving arm discharging carrier 954B from the test position X by the Z-direction taking and placing device on the material receiving and taking mechanism 970 at one time, the material receiving Y-direction transfer arm 983 and the material receiving X-direction transfer arm 984 jointly act again to move the material receiving and taking mechanism 970 to the receiving mechanism required by the test result. Use the embodiment of the utility model provides an example, supposing that the test result all goes into receiving mechanism 914 for 8 electronic component, then receive material pick-and-place mechanism 970 can take 8 electronic component that survey to move to surveying electronic component receiving mechanism 914 top, receive interval guiding mechanism on the material pick-and-place mechanism 970 simultaneously and also can be according to the interval (the booth interval) of taking in tested electronic component tray holding cave 902A on taking in tested electronic component tray 902, carry out 8Z to the synchronous release action of taking in the ware after the position unanimous with the interval of tray holding cave 902A of automatic adjustment, finally 8 electronic component that test will be sorted according to the test result in the electronic component tray 902 on their corresponding receiving mechanism, once complete electronic component's test sorting work is to this end.
Referring to fig. 24 and fig. 25, after the receiving/picking mechanism 970 has released the tested electronic components, the tested electronic components are driven by the receiving/picking mechanism Y to the transfer arm 983 and the receiving/picking mechanism X to the transfer arm 984, and then moved to the position above the receiving side of the second driving arm discharging carrier 955B at the testing position X, and meanwhile, the distance adjusting mechanism on the receiving/picking mechanism 970 can automatically adjust the distance (large distance) again according to the distance between the positioning holes of the second driving arm discharging carrier 955B, and finally 8Z-direction picking/picking units complete the synchronous picking operation. After the tested 8 electronic components are taken out from the positioning holes of the X-direction second driving arm discharging carrier 955B by the Z-direction pick-and-place device on the material receiving pick-and-place mechanism 970 at one time, the material receiving Y-direction transfer arm 983 and the material receiving X-direction transfer arm 984 act together again to move the material receiving pick-and-place mechanism 970 to the receiving mechanism required by the test result.
Referring to fig. 22, 23, 24, 25, 26, after that, the material receiving and picking mechanism 970 starts to perform reciprocating movement on the material receiving side of the X-direction first and second driving arm discharging carriers 954B, 955B and on the receiving mechanism (receiving mechanism one 914, receiving mechanism two 915, receiving mechanism three 916, receiving mechanism four 917, receiving mechanism five 918, and receiving mechanism six 919), and the corresponding pitch adjusting mechanism will automatically complete the reduction or enlargement of the pitch due to the different picking and placing positions, thereby completing the efficient picking and placing work and finally completing the testing and sorting work of all the electronic components.
Finally, the core idea of the present invention is summarized, please refer to fig. 27, the electronic component testing and sorting machine provided by the present invention can greatly increase the number of the pick-and-place devices, so that more electronic components can be picked and placed at one time, and the pick-and-place efficiency is greatly improved; simultaneously the utility model provides a new-type get and put interval guiding mechanism, especially proposed the mechanism that can carry out the interval adjustment simultaneously in X axle and Y axle and as far as the design of interval adjustment scope. Such design utility model can reduce the time of getting and putting among the test sorting process by a wide margin to improve test sorting efficiency, make the test of machine sort the productivity and have promotion by a wide margin.
The above description is only a preferred embodiment of the present invention, and should not be taken as limiting the invention, and any modifications, equivalent replacements, improvements, etc. made within the spirit and principle of the present invention should be included in the protection scope of the present invention.

Claims (15)

1. A pick and place mechanism is characterized in that: the electronic component grabbing device comprises a first driving motor, a second driving motor, an X-direction spacing adjusting mechanism, a Y-direction spacing adjusting mechanism and eight driving sources capable of grabbing electronic components;
first driving motor's output with X is connected to interval guiding mechanism, two the driving source is a set of driving source, every group the driving source all sets up through a slip table subassembly X is to interval guiding mechanism is last, two of every group the driving source sets up X is to both sides around interval guiding mechanism, every group in the driving source at least one the driving source can be followed Y to the translation, every can follow Y all with the driving source of translation Y is connected to interval guiding mechanism, second driving motor's output pass through drive mechanism with Y is connected to interval guiding mechanism.
2. The pick and place mechanism of claim 1, wherein: y is to interval guiding mechanism including Y to drive mechanism and Y to follow-up mechanism, drive mechanism passes through Y to drive mechanism with Y is to follow-up mechanism connects, every can follow Y to the driving source of translation all with Y is to follow-up mechanism connects.
3. A pick and place mechanism as recited in claim 2, wherein: when the pick-and-place mechanism picks and places electronic components, the X-direction distance adjusting mechanism can control the four groups of driving sources to open at equal intervals, and when the pick-and-place devices of the four groups of driving sources are adjusted to the minimum distance, the distance between two adjacent groups of driving sources is zero.
4. A pick and place mechanism as recited in claim 3, wherein: the X-direction distance adjusting mechanism comprises a support structure, a rotating shaft, two first gears and two second gears, wherein one first gear and one second gear are arranged on an output shaft of the X-direction driving motor, the other first gear and the other second gear are arranged on the rotating shaft, one first gear is connected with the other first gear through a first synchronous belt, one second gear is connected with the other second gear through a second synchronous belt, the rotating shaft is connected with the support structure, and the section radius of the first gear is twice that of the second gear;
the four driving sources are a first group of driving sources, a second group of driving sources, a third group of driving sources and a fourth group of driving sources in sequence from left to right, the first group of driving sources can be connected with the lower side of a first synchronous belt through a sliding table assembly capable of doing linear motion in the X-Y direction, the second group of driving sources can be connected with the lower side of a second synchronous belt through a sliding table assembly capable of doing linear motion in the X-Y direction, the third group of driving sources can be connected with the support structure through a sliding table assembly capable of doing linear motion in the Y direction, and the fourth group of driving sources can be connected with the upper side of the second synchronous belt through a sliding table assembly capable of doing linear motion in the X-Y direction.
5. The pick and place mechanism of claim 4, wherein: can include first Y to guide rail, first Y to the slider to the mounting panel that is done linear motion and can be connected with the driving source the first installation base that can be connected with the driving source at X-Y, be equipped with the locking device that can be connected with the hold-in range on the first installation base, first Y sets up to the guide rail the one end tip of mounting panel, first Y to the guide rail with first Y is to slider sliding connection, first Y to the slider with the connection can be dismantled to first installation base, first Y to the slider through a servo device with Y is connected to servo mechanism.
6. The pick and place mechanism of claim 5, wherein: can include second Y to guide rail, second Y to slider, second installation base and two fixed bases, two in Y to the slip table subassembly that is linear motion fixed base front and back symmetry sets up, one fixed base can with the driving source is connected, second Y to guide rail and another fixed base connects, second Y to the guide rail with second Y is to slider sliding connection, second installation base with second Y can dismantle the connection to the slider, second installation base can be connected with the driving source, second Y to slider and second installation base all with Y can dismantle the connection to servo mechanism.
7. The pick and place mechanism of claim 6, wherein: y is to servo mechanism includes two deflectors that set up side by side, each servo device all sets up two between the deflector, second Y is to slider and second installation base all with two the deflector can dismantle the connection.
8. The pick and place mechanism of claim 7, wherein: the follow-up device is a follow-up wheel mechanism for a driving source.
9. A pick and place mechanism according to any one of claims 6 to 8, wherein: still include interval guiding mechanism base plate, be equipped with two X that set up side by side on the interval guiding mechanism base plate to the guide rail, each X is to being equipped with three X to the slider on to the guide rail, X all is connected with a mounting panel that can be at X-Y to the slip table subassembly that is linear motion to the slider to each X of guide rail.
10. The pick and place mechanism of claim 9, wherein: the two fixing bases are symmetrically arranged on the distance adjusting mechanism substrate in a front-back mode.
11. The pick and place mechanism of claim 9, wherein: the Y-direction transmission mechanism comprises a ball screw, a ball nut and a positioning base, the positioning base is arranged on the distance adjusting mechanism base plate, the ball screw penetrates through the positioning base, the ball nut is connected with the ball screw, the ball nut is connected with the Y-direction follow-up mechanism, and the ball screw is connected with the transmission mechanism.
12. The pick and place mechanism of claim 11, wherein: y is still including Y axial linear guide mechanism to drive mechanism, Y axial linear guide mechanism includes third Y to guide rail and third Y to the slider, third Y is to the guide rail setting on the interval guiding mechanism base plate, third Y slides to the slider and sets up on the third Y is to the guide rail, ball nut passes through third Y to the slider with Y is to follow-up mechanism connects.
13. An electronic component testing and sorting machine, characterized in that: the automatic material collecting device comprises a main frame, a feeding mechanism, a testing mechanism, a material collecting mechanism, an automatic control device and a conveying mechanism;
the feeding mechanism, the testing mechanism, the receiving mechanism and the conveying mechanism are all assembled on the main rack;
the transportation mechanism comprises two transfer arms and two sets of pick-and-place mechanisms according to any one of claims 1 to 8, 11 and 12, one set of pick-and-place mechanisms is a feeding pick-and-place mechanism, the other set of pick-and-place mechanisms is a receiving pick-and-place mechanism, the feeding, taking and placing mechanism is arranged on one of the transfer arms, the receiving, taking and placing mechanism is arranged on the other transfer arm, when the test sorting machine tests the electronic components, the feeding, picking and placing mechanism can grab one or more electronic components on the feeding mechanism at one time, then one or more electronic components are placed in the test seats of the test mechanism at the same time, and the receiving and taking mechanism can grasp the tested electronic components in the one or more test seats on the test mechanism at one time and then place the one or more electronic components in the receiving mechanism at the same time;
the automatic control device can control the feeding mechanism to feed materials, the automatic control device can control the material receiving mechanism to receive materials, the automatic control device can control the testing mechanism to test the materials, the automatic control device can control the two transfer arms to perform transfer movement, and the automatic control device can control the feeding taking and placing mechanism and the material receiving taking and placing mechanism to perform taking and placing movement.
14. The electronic component testing handler of claim 13, wherein: the feeding mechanism is a material tray feeding mechanism, the material tray feeding mechanism comprises an electronic component feeding mechanism to be detected, an empty tray discharging mechanism and an empty tray conveying mechanism, when the tray of the electronic component feeding mechanism to be detected is an empty tray, the empty tray conveying mechanism conveys the empty tray to the empty tray discharging mechanism, and the material receiving mechanism is an automatic material receiving mechanism.
15. The electronic component testing handler of claim 14, wherein: receiving agencies has surveyed electronic component receiving mechanism including empty tray income set mechanism and three tray formula, and is three electronic component receiving mechanism has been surveyed to the tray formula has all been installed on the main frame, empty tray income set mechanism can pass through empty tray transport mechanism has surveyed empty tray of electronic component receiving mechanism conveying to any tray formula, works as any when the tray formula has surveyed the tray on the electronic component receiving mechanism and has filled with electronic component, empty tray transport mechanism will shift out the tray of having filled, then empty tray transport mechanism mends an empty tray back to the position of former tray.
CN202021323910.0U 2020-07-08 2020-07-08 Pick-and-place mechanism and electronic element testing and sorting machine Active CN212494002U (en)

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CN202021323910.0U CN212494002U (en) 2020-07-08 2020-07-08 Pick-and-place mechanism and electronic element testing and sorting machine

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202021323910.0U CN212494002U (en) 2020-07-08 2020-07-08 Pick-and-place mechanism and electronic element testing and sorting machine

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